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1Academic Journal
المؤلفون: Czechowski, G., Czerkas, S., Jadżyn, J.
المصدر: Zeitschrift für Naturforschung A ; volume 56, issue 3-4, page 257-261 ; ISSN 1865-7109 0932-0784
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2Academic Journal
المؤلفون: Czerkas, S., Burczyk, A., JadŻyn, J., Stockhausen, M.
المصدر: Physics and Chemistry of Liquids ; volume 37, issue 1, page 1-7 ; ISSN 0031-9104 1029-0451
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3Conference
المؤلفون: Chou, William, Chang, Hsien-Min, Chen, Chao Yin, Wagner, M., Roeth, K.-D., Czerkas, S., Ferber, M., Daneshpanah, M., Laske, F., Chiang, R., Klein, S.
المساهمون: Cain, Jason P., Sanchez, Martha I.
المصدر: Metrology, Inspection, and Process Control for Microlithography XXVIII ; SPIE Proceedings ; ISSN 0277-786X
الاتاحة: http://dx.doi.org/10.1117/12.2049000
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4Conference
المؤلفون: Daneshpanah, M., Laske, F., Wagner, M., Roeth, K.-D., Czerkas, S., Yamaguchi, H., Fujii, N., Yoshikawa, S., Kanno, K., Takamizawa, H.
المساهمون: Kato, Kokoro
المصدر: SPIE Proceedings ; Photomask and Next-Generation Lithography Mask Technology XXI ; ISSN 0277-786X
الاتاحة: http://dx.doi.org/10.1117/12.2072074
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5Conference
المؤلفون: Laske, F., Kunitani, S., Kamibayashi, T., Yamana, M., Fuse, A., Wagner, M., Roeth, K.-D., Ferber, M., Daneshpanah, M., Czerkas, S., Sakaguchi, H.
المساهمون: Faure, Thomas B., Ackmann, Paul W.
المصدر: SPIE Proceedings ; Photomask Technology 2013 ; ISSN 0277-786X
الاتاحة: http://dx.doi.org/10.1117/12.2027200
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6Periodical
المؤلفون: Adan, Ofer, Robinson, John C., Czerkas, S., Gutman, N., Gronheid, R., Gurevich, E., Wang, R., Feler, Y., Zaberchik, M., Grauer, Y., Stoschus, H., Uziel, Y., Pohlmann, U., Laske, F.
المصدر: Proceedings of SPIE; February 2021, Vol. 11611 Issue: 1 p116110B-116110B-6, 1044997p
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7Periodical
المؤلفون: Adan, Ofer, Robinson, John C., Gutman, N., Tarshish, I., Gronheid, R., Dror, C., Michelsson, D., Backhauss, H., Levin, L., Levinski, V., Paskover, Y., Yerushalmi, L., Heidrich, T., Czerkas, S., Pohlmann, U., Laske, F.
المصدر: Proceedings of SPIE; March 2020, Vol. 11325 Issue: 1 p113251X-113251X-7, 1019267p
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8Conference
المؤلفون: Gans, F., Liebe, R., Heins, Th., Richter, J., Häβler-Grohne, W., Frase, C. G., Bodermann, B., Czerkas, S., Dirscherl, K., Bosse, H.
المصدر: 22nd European Mask and Lithography Conference ; SPIE Proceedings ; ISSN 0277-786X
الاتاحة: http://dx.doi.org/10.1117/12.692736
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9Conference
المؤلفون: Häßler-Grohne, W., Frase, C.G., Czerkas, S., Dirscherl, K., Bodermann, B., Mirandé, W., Ehret, G., Bosse, H.
المساهمون: Weed, J. Tracy, Martin, Patrick M.
المصدر: SPIE Proceedings ; 25th Annual BACUS Symposium on Photomask Technology ; ISSN 0277-786X
الاتاحة: http://dx.doi.org/10.1117/12.632779
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10Conference
المؤلفون: Gans, F., Liebe, R., Richter, J., Schatz, Th., Hauffe, B., Hillmann, F., Dobereiner, S., Bruck, H.-J., Scheuring, G., Brendel, B., Bettin, L., Roth, K.-D., Steinberg, W., Schluter, G., Speckbacher, P., Sedlmeier, W., Scherubl, T., Hassler-Grohne, W., Frase, C. G., Czerkas, S., Dirscherl, K., Bodermann, B., Mirande, W., Bosse, H.
المصدر: SPIE Proceedings ; 21st European Mask and Lithography Conference ; ISSN 0277-786X
الاتاحة: http://dx.doi.org/10.1117/12.637313
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11
المؤلفون: Czerkas, S·lawomir
المصدر: LF.
مصطلحات موضوعية: Tunnelmagnetowiderstand. Elektrischer Durchbruch. Rastertunnelmikroskopie. Aluminiumoxide. Dünne Schicht.
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12Academic Journal
المؤلفون: Lucinski, T, Czerkas, S, Brückl, Hubert, Reiss, Günter
مصطلحات موضوعية: ferromagnetic thin films, in-situ conductance, measurements, thin film growth, atomic force microscopy, magnetisation processes
Relation: info:eu-repo/semantics/altIdentifier/issn/0304-8853; info:eu-repo/semantics/altIdentifier/wos/000166183700011; https://pub.uni-bielefeld.de/record/1618191
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13Periodical
المؤلفون: Kato, Kokoro, Daneshpanah, M., Laske, F., Wagner, M., Roeth, K.-D., Czerkas, S., Yamaguchi, H., Fujii, N., Yoshikawa, S., Kanno, K., Takamizawa, H.
المصدر: Proceedings of SPIE; July 2014, Vol. 9256 Issue: 1 p92560F-92560F-7, 833048p
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14Periodical
المؤلفون: Cain, Jason P., Sanchez, Martha I., Chou, William, Chang, Hsien-Min, Chen, Chao Yin, Wagner, M., Roeth, K.-D., Czerkas, S., Ferber, M., Daneshpanah, M., Laske, F., Chiang, R., Klein, S.
المصدر: Proceedings of SPIE; April 2014, Vol. 9050 Issue: 1 p90501Q-90501Q-7, 814517p
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15Academic Journal
المؤلفون: Jadzyn, J., Czerkas, S., Czechowski, G., Burczyk, A., Dabrowski, R.
المصدر: Liquid Crystals. Mar1999, Vol. 26 Issue 3, p437-442. 6p.
مصطلحات موضوعية: *LIQUID crystals, *DIELECTRICS
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16Conference
المؤلفون: Adan, Ofer, Robinson, John C., Czerkas, S., Gutman, N., Gronheid, R., Gurevich, E., Wang, R., Feler, Y., Zaberchik, M., Grauer, Y., Stoschus, H., Uziel, Y., Pohlmann, U., Laske, F.
المصدر: Proceedings of SPIE; 11/4/2020, Vol. 11611, p116110B-116110B-6, 1p
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17PeriodicalGrowth and properties of Co/Al-Ox/Ni(80)Fe(20) trilayers monitored in-situ during deposition process
المؤلفون: Lucinski, T., Czerkas, S., Bruckl, H., Reiss, G.
المصدر: Journal of Magnetism and Magnetic Materials; 2000, Vol. 222 Issue: 3 p327-336, 10p
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18
المؤلفون: Czerkas, S., Dziomba, T., Bosse, H.
المصدر: Nanoscale Calibration Standards and Methods ; page 311-320 ; ISBN 9783527405022 9783527606665
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19
المؤلفون: Frase, C. G., Czerkas, S., Bosse, H., Novikov, Yu. A., Rakov, A. V.
المصدر: Nanoscale Calibration Standards and Methods ; page 375-384 ; ISBN 9783527405022 9783527606665
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20Periodical
المؤلفون: Faure, Thomas B., Ackmann, Paul W., Laske, F., Kunitani, S., Kamibayashi, T., Yamana, M., Fuse, A., Wagner, M., Roeth, K.-D., Ferber, M., Daneshpanah, M., Czerkas, S., Sakaguchi, H.
المصدر: Proceedings of SPIE; September 2013, Vol. 8880 Issue: 1 p888024-888024-8