المؤلفون: Verhage, Michael, Çiftçi, Tunç H., Reul, Michiel, Cromwijk, Tamar, van Stralen, Thijs J. N., Koopmans, Bert, Kurnosikov, Oleg, Flipse, Kees

مصطلحات موضوعية: Physics - Instrumentation and Detectors

URL الوصول: http://arxiv.org/abs/2302.11387

المؤلفون: Verhage, Michael, Çiftçi, H. Tunç, Reul, Michiel, Cromwijk, Tamar, van Stralen, Thijs J. N., Koopmans, Bert, Kurnosikov, Oleg, Flipse, Kees

المصدر: Journal of Applied Physics; 11/14/2024, Vol. 136 Issue 18, p1-9, 9p

مصطلحات موضوعية: MAGNETIC force microscopy, MAGNETIC domain, TRANSITION metal oxides, MAGNETIC structure, CURIE temperature

المؤلفون: Çiftçi, H. Tunç, Verhage, Michael, Cromwijk, Tamar, Van, Laurent Pham, Koopmans, Bert, Flipse, Kees, Kurnosikov, Oleg

المصدر: Microsyst Nanoeng 8, 51 (2022)

مصطلحات موضوعية: Physics - Instrumentation and Detectors, Condensed Matter - Mesoscale and Nanoscale Physics

URL الوصول: http://arxiv.org/abs/2202.00952

المؤلفون: Van Gardingen-Cromwijk, Tamar, Mathijssen, Simon G.J., Noordam, Marc, Witte, Stefan, De Boer, Johannes F., Den Boef, Arie

المصدر: Van Gardingen-Cromwijk , T , Mathijssen , S G J , Noordam , M , Witte , S , De Boer , J F & Den Boef , A 2024 , ' Enhancing diffraction-based overlay metrology capabilities in digital holographic microscopy using model-based signal separation ' , Journal of Micro/Nanopatterning, Materials and Metrology , vol. 23 , no. 4 , 044006 , pp. 1-14 . https://doi.org/10.1117/1.JMM.23.4.044006

مصطلحات موضوعية: computational imaging, holographic microscopy, overlay metrology

الاتاحة: https://research.vu.nl/en/publications/ef7a15b9-bffe-44f5-b953-11cd4228614e
https://doi.org/10.1117/1.JMM.23.4.044006
https://hdl.handle.net/1871.1/ef7a15b9-bffe-44f5-b953-11cd4228614e
http://www.scopus.com/inward/record.url?scp=85214134790&partnerID=8YFLogxK
http://www.scopus.com/inward/citedby.url?scp=85214134790&partnerID=8YFLogxK

المؤلفون: van Gardingen-Cromwijk, Tamar, Konijnenberg, Sander, Witte, Stefan, de Boer, Johannes F., Den Boef, Arie

المصدر: van Gardingen-Cromwijk , T , Konijnenberg , S , Witte , S , de Boer , J F & Den Boef , A 2024 , ' Computational vibration mitigation using phase interpolation in digital holographic microscopy for overlay metrology ' , Optics Express , vol. 32 , no. 21 , pp. 36315-36328 . https://doi.org/10.1364/OE.534958

الاتاحة: https://research.vu.nl/en/publications/bb269de7-5204-45ea-b8c5-6edfda622e1d
https://doi.org/10.1364/OE.534958
https://hdl.handle.net/1871.1/bb269de7-5204-45ea-b8c5-6edfda622e1d
http://www.scopus.com/inward/record.url?scp=85205951060&partnerID=8YFLogxK
http://www.scopus.com/inward/citedby.url?scp=85205951060&partnerID=8YFLogxK

المؤلفون: van Gardingen-Cromwijk, Tamar, Adhikary, Manashee, Messinis, Christos, Konijnenberg, Sander, Coene, Wim, Witte, Stefan, de Boer, Johannes F., Den Boef, Arie

المصدر: van Gardingen-Cromwijk , T , Adhikary , M , Messinis , C , Konijnenberg , S , Coene , W , Witte , S , de Boer , J F & Den Boef , A 2023 , ' Field-position dependent apodization in dark-field digital holographic microscopy for semiconductor metrology ' , Optics Express , vol. 31 , no. 1 , pp. 411-425 . https://doi.org/10.1364/OE.476157

الاتاحة: https://research.vu.nl/en/publications/eeecf63e-25a0-4df9-9e45-ecc09009340a
https://doi.org/10.1364/OE.476157
https://hdl.handle.net/1871.1/eeecf63e-25a0-4df9-9e45-ecc09009340a
http://www.scopus.com/inward/record.url?scp=85144625721&partnerID=8YFLogxK
http://www.scopus.com/inward/citedby.url?scp=85144625721&partnerID=8YFLogxK

المؤلفون: Adhikary, Manashee, van Gardingen-Cromwijk, Tamar, de Wit, Jo, Witte, Stefan, de Boer, Johannes F., den Boef, Arie

المصدر: Adhikary , M , van Gardingen-Cromwijk , T , de Wit , J , Witte , S , de Boer , J F & den Boef , A 2023 , ' Illumination spot profile correction in digital holographic microscopy for overlay metrology ' , Journal of Micro/Nanopatterning, Materials and Metrology , vol. 22 , no. 2 , 024001 . https://doi.org/10.1117/1.JMM.22.2.024001

Relation: https://research.vumc.nl/en/publications/c5927e09-2a8a-42a2-8441-567a93207ed1

الاتاحة: https://research.vumc.nl/en/publications/c5927e09-2a8a-42a2-8441-567a93207ed1
https://doi.org/10.1117/1.JMM.22.2.024001
http://www.scopus.com/inward/record.url?scp=85164218755&partnerID=8YFLogxK

المؤلفون: van Gardingen-Cromwijk, Tamar, Konijnenberg, Sander, Coene, Wim, Adhikary, Manashee, Tukker, Teus, Witte, Stefan, de Boer, Johannes F., den Boef, Arie

المصدر: van Gardingen-Cromwijk , T , Konijnenberg , S , Coene , W , Adhikary , M , Tukker , T , Witte , S , de Boer , J F & den Boef , A 2023 , ' Non-isoplanatic lens aberration correction in dark-field digital holographic microscopy for semiconductor metrology ' , Light: Advanced Manufacturing , vol. 4 , no. 4 , pp. 1-13 . https://doi.org/10.37188/lam.2023.041

الاتاحة: https://research.vumc.nl/en/publications/aab007bd-5fa8-497b-8191-ed629eba4e23
https://doi.org/10.37188/lam.2023.041
https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=85186316471&origin=inward

المؤلفون: Cromwijk, Tamar, Adhikary, Manashee, Konijnenberg, Sander, Coene, Wim, Tukker, Teus, de Boer, Johannes d., Witte, Stefan, den Boef, Arie

المساهمون: Lehmann, Peter, Osten, Wolfgang, Albertazzi Gonçalves, Armando

المصدر: Optical Measurement Systems for Industrial Inspection XIII

الاتاحة: http://dx.doi.org/10.1117/12.2673637

المؤلفون: Adhikary, Manashee, Cromwijk, Tamar, Witte, Stefan, de Boer, Johannes F., den Boef, Arie

المساهمون: Lehmann, Peter, Osten, Wolfgang, Albertazzi Gonçalves, Armando

المصدر: Optical Measurement Systems for Industrial Inspection XIII

الاتاحة: http://dx.doi.org/10.1117/12.2673583

المؤلفون: Adhikary, Manashee, Cromwijk, Tamar, Konijnenberg, Sander, Coene, Wim, Witte, Stefan, de Boer, Johannes, den Boef, Arie

المصدر: Adhikary , M , Cromwijk , T , Konijnenberg , S , Coene , W , Witte , S , de Boer , J & den Boef , A 2023 , Digital image correction methods using dark-field digital holographic microscopy for semiconductor metrology . in Proceedings Optica Imaging Congress (3D, COSI, DH, FLatOptics, IS, pcAOP) . Optica Publishing Group (formerly OSA) , 2023 Computational Optical Sensing and Imaging, COSI 2023 in Optica Imaging Congress - Part of Imaging and Applied Optics Congress 2023 , Boston , United States , 14/08/23 . https://doi.org/10.1364/COSI.2023.CM3B.5

Relation: urn:ISBN:9781957171289

الاتاحة: https://research.vu.nl/en/publications/b465bf02-9ade-40df-8f2b-7d59d71297e5
https://doi.org/10.1364/COSI.2023.CM3B.5
https://hdl.handle.net/1871.1/b465bf02-9ade-40df-8f2b-7d59d71297e5
http://www.scopus.com/inward/record.url?scp=85192574520&partnerID=8YFLogxK
http://www.scopus.com/inward/citedby.url?scp=85192574520&partnerID=8YFLogxK

المؤلفون: Lehmann, Peter, Osten, Wolfgang, Albertazzi Gonçalves, Armando, Cromwijk, Tamar, Adhikary, Manashee, Konijnenberg, Sander, Coene, Wim, Tukker, Teus, de Boer, Johannes, Witte, Stefan, den Boef, Arie

المصدر: Proceedings of SPIE; August 2023, Vol. 12618 Issue: 1 p126180Y-126180Y-4, 1135625p

المؤلفون: Lehmann, Peter, Osten, Wolfgang, Albertazzi Gonçalves, Armando, Adhikary, Manashee, Cromwijk, Tamar, Witte, Stefan, de Boer, Johannes F., den Boef, Arie

المصدر: Proceedings of SPIE; August 2023, Vol. 12618 Issue: 1 p126180W-126180W-5, 1135626p

المؤلفون: Cromwijk, Tamar C.

مصطلحات الفهرس: Master, Master

URL: https://pure.tue.nl/ws/files/188048261/1004045_Cromwijk_T.C._MSc_thesis_Thesis_MAP.pdf
https://pure.tue.nl/ws/files/188048261/1004045_Cromwijk_T.C._MSc_thesis_Thesis_MAP.pdf

المؤلفون: Cromwijk, Tamar C.

مصطلحات الفهرس: Bachelor, Bachelor

URL: https://pure.tue.nl/ws/files/147560991/1004045_Cromwijk_T.C._BEP_verslag.pdf
https://pure.tue.nl/ws/files/147560991/1004045_Cromwijk_T.C._BEP_verslag.pdf