المؤلفون: Bryan A. Biegel, Mario G. Ancona, Conor S. Rafferty, Zhiping Yu

المساهمون: The Pennsylvania State University CiteSeerX Archives

المصدر: http://www.nas.nasa.gov/News/Techreports/2004/PDF/nas-04-008.pdf.

وصف الملف: application/pdf

Relation: http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.139.8022; http://www.nas.nasa.gov/News/Techreports/2004/PDF/nas-04-008.pdf

الاتاحة: http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.139.8022
http://www.nas.nasa.gov/News/Techreports/2004/PDF/nas-04-008.pdf

المؤلفون: B. Elolampi, K. Dowling, K. Lucas, D. Davis, Conor S. Rafferty, R. Ghaffari, Yung-Yu Hsu

المصدر: IEEE Transactions on Electron Devices. 60:2338-2345

مصطلحات موضوعية: Interconnection, Materials science, business.industry, Structural engineering, Conformable matrix, Strain relief, Finite element method, Flexible electronics, Electronic, Optical and Magnetic Materials, Stress (mechanics), Integrated circuit packaging, Electrical and Electronic Engineering, Thin film, Composite material, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::f89dbd75cdbbf9f03f1cc7bbd40e6ace
https://doi.org/10.1109/ted.2013.2264217

المؤلفون: Conor S. Rafferty, Yung-Yu Hsu, Lauren Klinker, Briana Morey, Dan Davis, Brian Elolampi, Mitul Dalal, Stephen P. Lee

المصدر: International Symposium on Microelectronics. 2012:000156-000161

مصطلحات موضوعية: Flexibility (engineering), Materials science, Silicon, Continuous monitoring, Active components, chemistry.chemical_element, Nanotechnology, chemistry, CMOS, visual_art, Automotive Engineering, Electronic component, visual_art.visual_art_medium, Wafer, Electronics

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::0fc7f278399367cba28de46fa73d505b
https://doi.org/10.4071/isom-2012-ta53

المؤلفون: Gaofeng Wang, Conor S. Rafferty, Robert W. Dutton

المصدر: IEEE Transactions on Microwave Theory and Techniques. 50:1127-1136

مصطلحات موضوعية: Physics, Radiation, Discretization, Wave propagation, Mathematical analysis, Equations of motion, Condensed Matter Physics, Finite element method, symbols.namesake, Nonlinear system, Classical mechanics, Maxwell's equations, Frequency domain, symbols, Electrical and Electronic Engineering, Newton's method

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::eaf1cf0abeb1f5b070d6e4afdc5837e6
https://doi.org/10.1109/22.993416

المؤلفون: Dale Conrad Jacobson, Ramki Kalyanaraman, M Yoon, H.-J. Gossmann, Conor S. Rafferty, T. E. Haynes, B.C Larson

المصدر: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. :182-186

مصطلحات موضوعية: Nuclear and High Energy Physics, Ion implantation, Dopant, Chemistry, Vacancy defect, Microbeam, Atmospheric temperature range, Diffusion (business), Atomic physics, Instrumentation, Fluence, Ion

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::ceecbc9de2b45b78eaae13316dd27a8d
https://doi.org/10.1016/s0168-583x(00)00662-5

المؤلفون: M.R. Frei, H.-H. Vuong, Lourdes Pelaz, Gerhard Hobler, Conor S. Rafferty, Ya-Hong Xie

المصدر: IEEE Transactions on Electron Devices. 47:1401-1405

مصطلحات موضوعية: inorganic chemicals, Materials science, Computer simulation, Silicon, Annealing (metallurgy), Analytical chemistry, chemistry.chemical_element, Molecular physics, Electronic, Optical and Magnetic Materials, Bismuth, Ion implantation, chemistry, Electrical and Electronic Engineering, Solubility, Boron, Junction depth

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::62cd2f8c08546312b3d54465061a2cc7
https://doi.org/10.1109/16.848283

المؤلفون: Conor S. Rafferty

المصدر: Solid-State Electronics. 44:863-868

مصطلحات موضوعية: Engineering, Dopant, Workstation, business.industry, Monte Carlo method, Process design, Condensed Matter Physics, Electronic, Optical and Magnetic Materials, law.invention, Front and back ends, law, Materials Chemistry, Electronic engineering, Transient (oscillation), Electrical and Electronic Engineering, Diffusion (business), Process simulation, business, Simulation

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::81e47cc355172450eef20feb4906d3a6
https://doi.org/10.1016/s0038-1101(99)00283-x

المؤلفون: George H. Gilmer, Pedro Castrillo, Juan Barbolla, Luis Bailón, Conor S. Rafferty, E. Rubio, Martín Jaraíz, Lourdes Pelaz

المصدر: Scopus-Elsevier

مصطلحات موضوعية: Materials science, Mechanical Engineering, Monte Carlo method, Ab initio, Condensed Matter Physics, Computational physics, Condensed Matter::Materials Science, Molecular dynamics, Mechanics of Materials, Ab initio quantum chemistry methods, Dynamic Monte Carlo method, General Materials Science, Kinetic Monte Carlo, Statistical physics, Process simulation, Monte Carlo molecular modeling

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::e724132801e0ca0204dee1a5bbe4cc94
https://doi.org/10.1016/s1369-8001(00)00013-5

المؤلفون: K.K. Ng, P. Keys, H.-J. Gossmann, Conor S. Rafferty

المصدر: Superlattices and Microstructures. 27:125-136

مصطلحات موضوعية: Limiting factor, Materials science, Ion implantation, Spreading resistance profiling, Equivalent series resistance, MOSFET, General Materials Science, Node (circuits), Electrical and Electronic Engineering, Condensed Matter Physics, Engineering physics, Sheet resistance, Communication channel

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::7df678e50b8b0bb1b07b4da9a968eb68
https://doi.org/10.1006/spmi.1999.0809

المؤلفون: Gerhard Hobler, Conor S. Rafferty, Lourdes Pelaz

المصدر: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 153:172-176

مصطلحات موضوعية: Physics, Nuclear and High Energy Physics, Spatial correlation, Recoil, Continuum (measurement), Annealing (metallurgy), Cascade, Monte Carlo method, Probability density function, Atomic physics, Instrumentation, Molecular physics, Recombination

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::fd4b3c2c0b53debe8e25e49b0f346034
https://doi.org/10.1016/s0168-583x(99)00045-2

المؤلفون: J. Bude, J. Ning, P. J. Silverman, Conor S. Rafferty, K Evans-Lutterodt, Yi Ma, Steven James Hillenius, H. H. Vuong, J Mcmacken, H.-J. Gossmann, Frieder H. Baumann

المصدر: Solid-State Electronics. 43:985-988

مصطلحات موضوعية: inorganic chemicals, Materials science, Silicon, Doping, technology, industry, and agriculture, Oxide, chemistry.chemical_element, Condensed Matter Physics, Capacitance, Electronic, Optical and Magnetic Materials, law.invention, Capacitor, chemistry.chemical_compound, chemistry, Gate oxide, law, Materials Chemistry, Surface roughness, Electronic engineering, Electrical and Electronic Engineering, Composite material, Boron

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::d967551efcee5a37306a87dba962be95
https://doi.org/10.1016/s0038-1101(99)00050-7

المؤلفون: Hans-Joachim Ludwig Gossmann, Anthony T. Fiory, Peter Frisella, Conor S. Rafferty, Aditya Agarwal

المصدر: Materials Science in Semiconductor Processing. 1:237-241

مصطلحات موضوعية: Materials science, business.industry, Annealing (metallurgy), Mechanical Engineering, Analytical chemistry, Condensed Matter Physics, Mechanics of Materials, Rapid thermal processing, Shallow junction, Optoelectronics, Junction formation, General Materials Science, Rapid thermal annealing, business, Sheet resistance, Junction depth

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::f7bc0d4283ffd168605980d709248272
https://doi.org/10.1016/s1369-8001(98)00030-4

المؤلفون: G. H. Gilmer, Dale Conrad Jacobson, H. S. Luftman, D. J. Eaglesham, Peter Stolk, T. E. Haynes, H.-J. Gossmann, Conor S. Rafferty, Martín Jaraíz, J. M. Poate

المصدر: Journal of Applied Physics. 81:6031-6050

مصطلحات موضوعية: Ostwald ripening, Materials science, Dopant, Silicon, Annealing (metallurgy), Doping, General Physics and Astronomy, chemistry.chemical_element, Molecular physics, Crystallographic defect, symbols.namesake, Crystallography, Ion implantation, chemistry, symbols, Molecular beam epitaxy

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::8f0c7ead5b7d204ac879ffb85e2bc951
https://doi.org/10.1063/1.364452

المؤلفون: Barry G. Ives, Lauren Klinker, Kevin Dowling, Briana Morey, Conor S. Rafferty, Pinghung Wei, Yung-Yu Hsu, Timothy Dyson, Sasha Gazman, Nick McMahon

المصدر: 2013 IEEE SENSORS.

مصطلحات موضوعية: SWEAT, Materials science, Transmission (telecommunications), business.industry, Capacitive sensing, Acoustics, Electro-optical sensor, Weight change, Electrical engineering, Wireless, business, Capacitance, Sensitivity (electronics)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::a718ecd2f3641ce80b871c4c172cb5cb
https://doi.org/10.1109/icsens.2013.6688376

المؤلفون: Brian Elolampi, Yung-Yu Hsu, Conor S. Rafferty, Kevin Dowling, Greg Levesque, Mitul Dalal, Briana Morey, Gil Huppert, Henry Wei, Dan Davis

المصدر: 2013 IEEE 63rd Electronic Components and Technology Conference.

مصطلحات موضوعية: Materials science, business.industry, Electrical engineering, Elastomer, Flexible electronics, Die (integrated circuit), Die preparation, visual_art, Electronic component, visual_art.visual_art_medium, Electronics, Integrated circuit packaging, business, Electronic circuit

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::23424f8739d7feb8ccce43a74f073fc3
https://doi.org/10.1109/ectc.2013.6575618

المؤلفون: Brian Elolampi, Dan Davis, John Work, Stephen P. Lee, Kevin Dowling, Mitul Dalal, Conor S. Rafferty, Rooz Ghaffari, Yung-Yu Hsu, Kylie Lucas

المصدر: 2013 IEEE 63rd Electronic Components and Technology Conference.

مصطلحات موضوعية: Reliability (semiconductor), Materials science, business.industry, Numerical analysis, Complex system, Mechanical engineering, Structural engineering, Electronics, Thin film, Conformable matrix, business, Multi layer, Electronic systems

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::c88f89d78ce8ccbb10f353e82ef1a6ee
https://doi.org/10.1109/ectc.2013.6575638

المؤلفون: J.L. Lentz, Steven James Hillenius, P.M. Zeitzoff, M.R. Pinto, S.A. Eshraghi, H.-H. Vuong, Conor S. Rafferty

المصدر: IEEE Transactions on Electron Devices. 43:1144-1152

مصطلحات موضوعية: Materials science, Dopant, business.industry, Doping, Short-channel effect, Drain-induced barrier lowering, Electronic, Optical and Magnetic Materials, PMOS logic, Threshold voltage, Electronic engineering, Optoelectronics, Transient (oscillation), Electrical and Electronic Engineering, Diffusion (business), business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::b39dbd4640e5fd31ccccf4ed74085710
https://doi.org/10.1109/16.502426

المؤلفون: H.-H. Vuong, H.-J. Gossmann, R. E. Ahrens, Conor S. Rafferty, T. Boone, F. C. Unterwald, D. C. Jacobson, P. M. Zeitzoff, H. S. Luftman

المصدر: Journal of Applied Physics. 77:3056-3060

مصطلحات موضوعية: Materials science, Ion implantation, Silicon, chemistry, Annealing (metallurgy), Superlattice, Doping, Analytical chemistry, General Physics and Astronomy, chemistry.chemical_element, Epitaxy, Thermal diffusivity, Ion

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::b0c0bbad3f26cec8ceabaa0573ab8158
https://doi.org/10.1063/1.358656

المؤلفون: Peter Lloyd, Janet L. Lentz, Colin C. McAndrew, Michael J. McLennan, Ken Haruta, Kishore Singhal, Sani R. Nassif, Conor S. Rafferty, M.R. Pinto, Peter M. Zeitzoff, Mohamed N. Darwish, Hong-Ha Vuong, Kumud Singhal, Isik C. Kizilyalli

المصدر: Microelectronics Journal. 26:79-97

مصطلحات موضوعية: Engineering, Computer simulation, Process (engineering), business.industry, General Engineering, Interval (mathematics), Integrated circuit, computer.software_genre, law.invention, Reliability engineering, law, Hardware_INTEGRATEDCIRCUITS, Computer Aided Design, Sensitivity (control systems), business, Technology CAD, computer, Simulation, Design technology

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::a1a859575b2e80331963c88dcbadc22d
https://doi.org/10.1016/0026-2692(95)98915-e

المؤلفون: Conor S. Rafferty, T. Boone, H.-J. Gossmann, F. C. Unterwald, G. H. Gilmer, W. Frank, J. M. Poate, H. S. Luftman

المصدر: Journal of Applied Physics. 77:1948-1951

مصطلحات موضوعية: Self-diffusion, Materials science, Silicon, chemistry, Dopant, Chemical physics, Annealing (metallurgy), Superlattice, Doping, General Physics and Astronomy, chemistry.chemical_element, Trapping, Thermal diffusivity

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::bb9db7621be19e67f5216a43d10556f2
https://doi.org/10.1063/1.358828