المؤلفون: Chanwoo Park, Hyunbo Cho, Jungwoo Lee

المصدر: IEEE Journal of the Electron Devices Society, Vol 12, Pp 495-501 (2024)

مصطلحات موضوعية: Neural compact models, interpretability, latent vector interpolation, design-technology co-optimization, Electrical engineering. Electronics. Nuclear engineering, TK1-9971

وصف الملف: electronic resource

Relation: https://ieeexplore.ieee.org/document/10547540/; https://doaj.org/toc/2168-6734

URL الوصول: https://doaj.org/article/8e362d1f2b75420297ce1ef9640ab19f

المؤلفون: Seungjoon Eom, Hyeok Yun, Hyundong Jang, Kyeongrae Cho, Seunghwan Lee, Jinsu Jeong, Rock‐Hyun Baek

المصدر: Advanced Intelligent Systems, Vol 6, Iss 4, Pp n/a-n/a (2024)

مصطلحات موضوعية: compact models, machine learnings, neural networks, technology computer‐aided designs, transistors, Computer engineering. Computer hardware, TK7885-7895, Control engineering systems. Automatic machinery (General), TJ212-225

وصف الملف: electronic resource

Relation: https://doaj.org/toc/2640-4567

URL الوصول: https://doaj.org/article/672e3f12053448a7829c5f701e2b5340

المؤلفون: Capeletto, Natália Machado

المساهمون: Delgado, Cecília, RUN

مصطلحات موضوعية: Desenvolvimento Sustentável, Modelos de Compactação Urbana, Agricultura Urbana, Planejamento Urbano, Ordenamento Territorial, Sustainable development, Urban compact models, Urban agriculture, Urban planning, Spatial planning, Domínio/Área Científica::Ciências Sociais::Geografia Económica e Social

وصف الملف: application/pdf

الاتاحة: http://hdl.handle.net/10362/167774

المؤلفون: Autran, Jean-Luc, Munteanu, Daniela

المساهمون: Institut des Matériaux, de Microélectronique et des Nanosciences de Provence (IM2NP), Aix Marseille Université (AMU)-Université de Toulon (UTLN)-Centre National de la Recherche Scientifique (CNRS), Institut de Physique de Rennes (IPR), Université de Rennes (UR)-Centre National de la Recherche Scientifique (CNRS)

المصدر: ISSN: 0018-9499.

مصطلحات موضوعية: circuit simulation, compact models, device modeling and simulation, digital circuits, digital single-event transient, radiation effects, single-event effects, soft error rate, transport models, radiation transport codes, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, [PHYS]Physics [physics]

Relation: hal-04333942; https://amu.hal.science/hal-04333942; https://amu.hal.science/hal-04333942/document; https://amu.hal.science/hal-04333942/file/TNS_Review_Autran_Munteanu_2023_HAL.pdf

الاتاحة: https://amu.hal.science/hal-04333942
https://amu.hal.science/hal-04333942/document
https://amu.hal.science/hal-04333942/file/TNS_Review_Autran_Munteanu_2023_HAL.pdf
https://doi.org/10.1109/TNS.2023.3337288

المؤلفون: Juan B. Roldán, Antonio Cantudo, David Maldonado, Cristina Aguilera-Pedregosa, Enrique Moreno, Timm Swoboda, Francisco Jiménez-Molinos, Yue Yuan, Kaichen Zhu, Mario Lanza, Miguel Muñoz Rojo

مصطلحات موضوعية: Biophysics, Medicine, Biotechnology, Ecology, Cancer, Hematology, Plant Biology, Biological Sciences not elsewhere classified, Chemical Sciences not elsewhere classified, Physical Sciences not elsewhere classified, resistive switching analysis, scanning thermal microscopy, top device surface, thermal measurements instead, thermal compact modeling, standard electrical characterization, thermal responses, thermal resistance, experimental measurements, compact models, device variability, device simulation, whose value, titanium oxide, single fitting, simultaneously recorded, series resistance, reset voltages, operando tracking, indirectly supported

Relation: https://figshare.com/articles/journal_contribution/Thermal_Compact_Modeling_and_Resistive_Switching_Analysis_in_Titanium_Oxide-Based_Memristors/25224732

الاتاحة: https://doi.org/10.1021/acsaelm.3c01727.s001
https://figshare.com/articles/journal_contribution/Thermal_Compact_Modeling_and_Resistive_Switching_Analysis_in_Titanium_Oxide-Based_Memristors/25224732

المؤلفون: Krzysztof Górecki, Kalina Detka

المصدر: Energies, Vol 16, Iss 6568, p 6568 (2023)

مصطلحات موضوعية: inductors, transformers, coupled inductors, power losses, compact models, windings, Technology

Relation: https://www.mdpi.com/1996-1073/16/18/6568; https://doaj.org/toc/1996-1073; https://doaj.org/article/0486802f856948f4b7b5601473aba0e5

الاتاحة: https://doi.org/10.3390/en16186568
https://doaj.org/article/0486802f856948f4b7b5601473aba0e5

المؤلفون: Su-in Yi, A. Alec Talin, Matthew J. Marinella, R. Stanley Williams

المصدر: Advanced Intelligent Systems, Vol 4, Iss 9, Pp n/a-n/a (2022)

مصطلحات موضوعية: compact models, memristors, neuromorphic circuit designs, SONOS, three-terminal synaptic devices, Computer engineering. Computer hardware, TK7885-7895, Control engineering systems. Automatic machinery (General), TJ212-225

وصف الملف: electronic resource

Relation: https://doaj.org/toc/2640-4567

URL الوصول: https://doaj.org/article/4aae21d7c201413c88e056300ee6ce0a

المؤلفون: NIDHIN, K., BALANETHIRAM, Suresh, NAIR, Deleep, D'ESPOSITO, Rosario, MOHAPATRA, Nihar, FREGONESE, Sebastien, ZIMMER, Thomas, CHAKRAVORTY, Anjan

مصطلحات موضوعية: SiGe HBTs, self heating, thermal resistance, back-end-of-line (BEOL), parameter extraction, compact models, Sciences de l'ingénieur [physics]

Relation: https://oskar-bordeaux.fr/handle/20.500.12278/172104

الاتاحة: https://oskar-bordeaux.fr/handle/20.500.12278/172104
https://hdl.handle.net/20.500.12278/172104
https://doi.org/10.1109/TED.2022.3215715

المؤلفون: Hutchins, Jack Robert

المصدر: Masters Theses

مصطلحات موضوعية: Machine Learning, Deep Learning, Compact Models, Memristors, Cryotrons, Artificial Intelligence and Robotics

وصف الملف: application/pdf

Relation: https://trace.tennessee.edu/utk_gradthes/11386; https://trace.tennessee.edu/context/utk_gradthes/article/12046/viewcontent/Thesis.pdf

الاتاحة: https://trace.tennessee.edu/utk_gradthes/11386
https://trace.tennessee.edu/context/utk_gradthes/article/12046/viewcontent/Thesis.pdf

المؤلفون: Arnal, August, Terés, Lluís, Ramon, Eloi

المساهمون: orcid

مصطلحات موضوعية: Compact models | Electric simulation | Organic electronics | Organic thin-film transistor (OTFT) | Printed electronics | Process design kit (PDK)

Relation: Flexible and Printed Electronics; Postprint; https://iopscience.iop.org/article/10.1088/2058-8585/ac1d39; Sí; http://hdl.handle.net/10261/349525; 2-s2.0-85114446346; https://api.elsevier.com/content/abstract/scopus_id/85114446346

الاتاحة: http://hdl.handle.net/10261/349525
https://doi.org/10.1088/2058-8585/ac1d39
https://api.elsevier.com/content/abstract/scopus_id/85114446346

المؤلفون: Olalekan Afuye, Xiang Li, Felicia Guo, Debdeep Jena, Daniel C. Ralph, Alyosha Molnar, Huili Grace Xing, Alyssa Apsel

المصدر: IEEE Journal on Exploratory Solid-State Computational Devices and Circuits, Vol 5, Iss 2, Pp 197-205 (2019)

مصطلحات موضوعية: Beyond CMOS, compact models, ferroelectric field-effect transistor (FeFET), logic-in-memory, multiferroics (MFs), nonvolatile memory, Computer engineering. Computer hardware, TK7885-7895

وصف الملف: electronic resource

Relation: https://ieeexplore.ieee.org/document/8894388/; https://doaj.org/toc/2329-9231

URL الوصول: https://doaj.org/article/934b0ab922534de6b58c431afd366a0b

المؤلفون: Nihat Akkan, Mustafa Altun, Herman Sedef

المصدر: IEEE Access, Vol 7, Pp 180438-180450 (2019)

مصطلحات موضوعية: Compact models, organic field effect transistor (ofet), parameter extraction, artificial bee colony algorithm, bacterial foraging algorithm, genetic algorithm, Electrical engineering. Electronics. Nuclear engineering, TK1-9971

وصف الملف: electronic resource

Relation: https://ieeexplore.ieee.org/document/8932354/; https://doaj.org/toc/2169-3536

URL الوصول: https://doaj.org/article/f1c4caa658d64498a47e374c79d7c076

المؤلفون: Bhudia, Shiv Jyotindra

المساهمون: Nathan, Arokia, Barquinha, Pedro, RUN

مصطلحات موضوعية: IGZO, TFT, Static models, Dynamic models, Compact models, small signal, Domínio/Área Científica::Engenharia e Tecnologia::Engenharia dos Materiais

وصف الملف: application/pdf

الاتاحة: http://hdl.handle.net/10362/31864

المؤلفون: Arya Lekshmi Jagath, Chee Hock Leong, T. Nandha Kumar, HaiderA.F. Almurib

المصدر: The Journal of Engineering (2019)

مصطلحات موضوعية: resistive RAM, electrical resistivity, electrical conductivity transitions, integrated circuit modelling, oxidation, reduction (chemical), physics-based RRAM models, compact models, oxide-based RRAM devices, electrical parameters, thermal parameters, drift diffusion, redox, electric field, conductive filament, current conduction mechanisms, resistive switching, filament radius, generalised hopping mechanisms, Schottky hopping mechanisms, conductive filament geometry, 3D models, 2D models, resistive switching behaviour, Engineering (General). Civil engineering (General), TA1-2040

وصف الملف: electronic resource

Relation: https://digital-library.theiet.org/content/journals/10.1049/joe.2018.5234; https://doaj.org/toc/2051-3305

URL الوصول: https://doaj.org/article/848f6f444b8e48c68d40e03e91806881

المؤلفون: Lorenz, Jürgen, Bär, Eberhard, Barraud, Sylvain, Brown, Andrew, R., Evanschitzky, Peter, Klüpfel, Fabian, Wang, Liping

المساهمون: Fraunhofer Institute for Integrated Circuits (Fraunhofer IIS), Fraunhofer (Fraunhofer-Gesellschaft), Commissariat à l'énergie atomique et aux énergies alternatives - Laboratoire d'Electronique et de Technologie de l'Information (CEA-LETI), Direction de Recherche Technologique (CEA) (DRT (CEA)), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA), Synopsys Inc., European Project: 688101,H2020,H2020-ICT-2015,SUPERAID7(2016)

المصدر: ISSN: 2072-666X ; Micromachines ; https://cea.hal.science/cea-02965982 ; Micromachines, 2019, 10 (1), pp.6. ⟨10.3390/mi10010006⟩.

مصطلحات موضوعية: process simulation, device simulation, compact models, process variations, systematic variations, statistical variations, FinFETs, nanowires, nanosheets, [SPI]Engineering Sciences [physics]

Relation: info:eu-repo/grantAgreement//688101/EU/Stability Under Process Variability for Advanced Interconnects and Devices Beyond 7 nm node/SUPERAID7; cea-02965982; https://cea.hal.science/cea-02965982; https://cea.hal.science/cea-02965982/document; https://cea.hal.science/cea-02965982/file/Lor11.pdf

الاتاحة: https://cea.hal.science/cea-02965982
https://cea.hal.science/cea-02965982/document
https://cea.hal.science/cea-02965982/file/Lor11.pdf
https://doi.org/10.3390/mi10010006

المؤلفون: Capeletto, Natália Machado

المساهمون: Delgado, Cecília

مصطلحات موضوعية: Desenvolvimento Sustentável, Modelos de Compactação Urbana, Agricultura Urbana, Planejamento Urbano, Ordenamento Territorial, Sustainable development, Urban compact models, Urban agriculture, Urban planning, Spatial planning, Domínio/Área Científica::Ciências Sociais::Geografia Económica e Social

Relation: http://hdl.handle.net/10362/167774; 203333969

الاتاحة: http://hdl.handle.net/10362/167774

المؤلفون: Enrique G. Marin, Marta Perucchini, Damiano Marian, Giuseppe Iannaccone, Gianluca Fiori

المصدر: IEEE Transactions on Electron Devices, 65(10), 4167 - 4179, (2018-08-01)

مصطلحات موضوعية: two-dimensional materials, simulation, modeling, multiscale, density functional theory, GW, Monte Carlo, tight- binding, Wannier functions, k·p, non equilibrium Green functions, conditional wavefunction, drift-diffusion, compact models

Relation: https://zenodo.org/communities/pep2d; https://zenodo.org/communities/eu; https://doi.org/10.1109/TED.2018.2854902; oai:zenodo.org:4271442

الاتاحة: https://doi.org/10.1109/TED.2018.2854902

المؤلفون: S. Himavathi, A. Muthuramalingam, A. Venkadesan, K. Sedhuraman

المصدر: ICTACT Journal on Soft Computing, Vol 2, Iss 3, Pp 309-318 (2012)

مصطلحات موضوعية: Single Neuron Cascading, Neural Networks, Modeling, Compact Models, Real-time Applications, Computer engineering. Computer hardware, TK7885-7895

وصف الملف: electronic resource

Relation: http://ictactjournals.in/paper/IJSC_Vol2_Iss3_1_Paper_309_318.pdf; https://doaj.org/toc/0976-6561; https://doaj.org/toc/2229-6956

URL الوصول: https://doaj.org/article/b58be1a9e689468da6e468a585df7bc3

المؤلفون: Khandelwal, S., Bavi, D.

المصدر: Khandelwal , S & Bavi , D 2022 , ASM-ESD - a comprehensive physics-based compact model for ESD Diodes . in 2022 IEEE International Reliability Physics Symposium (IRPS) : proceedings . Piscataway, NJ , pp. 5C.1-1-5C.1-6 , 2022 IEEE International Reliability Physics Symposium, IRPS 2022 , Dallas , United States , 27/03/22 . https://doi.org/10.1109/IRPS48227.2022.9764453

مصطلحات موضوعية: ESD diodes, ESD modeling, SPICE model, Compact models

Relation: urn:ISBN:9781665479516

الاتاحة: https://researchers.mq.edu.au/en/publications/b4ad299f-a3aa-4bba-a3f2-d0756389c4dc
https://doi.org/10.1109/IRPS48227.2022.9764453
http://www.scopus.com/inward/record.url?scp=85130736432&partnerID=8YFLogxK

المؤلفون: Khandelwal, S., Kikuchi, K., Yamamoto, H.

المصدر: Khandelwal , S , Kikuchi , K & Yamamoto , H 2021 , A computationally-efficient self-consistent large signal model for GaN HEMTs based on ASM-HEMT . in 2021 16th European Microwave Integrated Circuits Conference proceedings . Piscataway, NJ , pp. 13-16 , 16th European Microwave Integrated Circuits Conference, EuMIC 2021 , London , United Kingdom , 3/04/22 . https://doi.org/10.23919/EuMIC50153.2022.9783975

مصطلحات موضوعية: GaN HEMTs, Compact models, Large signal, RF PAs, Physics-based compact models

Relation: urn:ISBN:9781665447225

الاتاحة: https://researchers.mq.edu.au/en/publications/320473cb-7c45-420f-b666-6b5abf355090
https://doi.org/10.23919/EuMIC50153.2022.9783975
http://www.scopus.com/inward/record.url?scp=85133029983&partnerID=8YFLogxK