المؤلفون: Wang, C., Nam, S. W., Cotte, J. M., Peng, H., Jahnes, C. V., Wang, D., Bruce, R., Guillorn, M., Gignac, L. M., Advocate, W. H., Breslin, C. M., Brink, M., Bucchignano, J., Duch, E. A., Galan, A., Kratschmer, E., Litwinowicz, P. J., Lofaro, M. F., Price, W., Rossnagel, S. M., Goldblatt, R. D., Joseph, E. A., Pfeiffer, D., Rao, S. Papa, Royyuru, A., Stolovitzky, G. A., Colgan, E. G., Lin, Q., Polonsky, S.

المصدر: 2013 IEEE International Electron Devices Meeting ; page 14.1.1-14.1.4

الاتاحة: http://dx.doi.org/10.1109/iedm.2013.6724627
http://xplorestaging.ieee.org/ielx7/6709840/6724533/06724627.pdf?arnumber=6724627

المؤلفون: Colgan, E. G., Polastre, R. J., Knickerbocker, J., Wakil, J., Gambino, J., Tallman, K.

المصدر: 29th IEEE Semiconductor Thermal Measurement and Management Symposium

الاتاحة: http://dx.doi.org/10.1109/semi-therm.2013.6526800
http://xplorestaging.ieee.org/ielx7/6520965/6526787/06526800.pdf?arnumber=6526800

المؤلفون: Colgan, E. G., Andry, P., Dang, B., Magerlein, J. H., Maria, J., Polastre, R. J., Wakil, J.

المصدر: 2012 28th Annual IEEE Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM) ; page 1-7

الاتاحة: http://dx.doi.org/10.1109/stherm.2012.6188818
http://xplorestaging.ieee.org/ielx5/6182937/6188805/06188818.pdf?arnumber=6188818

المؤلفون: Colgan, E. G., d’Heurle, F. M.

المصدر: Journal of Applied Physics. 4/15/1996, Vol. 79 Issue 8, p4087. 9p. 1 Chart, 6 Graphs.

مصطلحات موضوعية: *SILICIDES, *THIN films, *DIFFUSION, *HEATING

المؤلفون: Colgan, E. G., Cabral, C., Kotecki, D. E.

المصدر: Journal of Applied Physics. 1/15/1995, Vol. 77 Issue 2, p614. 6p. 1 Chart, 5 Graphs.

مصطلحات موضوعية: *COBALT compounds, *SILICIDES, *ENERGY-band theory of solids, *RAPID thermal processing

المؤلفون: Colgan, E. G., Rodbell, K. P., Cabral, C., Harper, J. M. E.

المصدر: Journal of Applied Physics. 9/1/1994, Vol. 76 Issue 5, p2781. 10p. 1 Diagram, 12 Graphs.

مصطلحات موضوعية: *ALUMINUM, *COPPER

المؤلفون: Colgan, E. G., Rodbell, K. P.

المصدر: Journal of Applied Physics. 4/1/1994, Vol. 75 Issue 7, p3423. 12p. 5 Diagrams, 10 Graphs.

مصطلحات موضوعية: *COPPER, *ELECTRODIFFUSION, *MICROSTRUCTURE, *ANNEALING of metals

المؤلفون: Colgan, E. G.

المصدر: Journal of Applied Physics. 9/15/1987, Vol. 62 Issue 6, p2269. 6p.

مصطلحات موضوعية: *THIN films, *PALLADIUM, *ALUMINUM

المؤلفون: Hung, L. S., Colgan, E. G., Mayer, J. W.

المصدر: Journal of Applied Physics. 12/15/1986, Vol. 60 Issue 12, p4177. 5p. 1 Black and White Photograph, 4 Graphs.

مصطلحات موضوعية: *ALLOYS, *DIFFUSION, *METALLIZING, *ALUMINUM, *GOLD

المؤلفون: Colgan, E. G., Nastasi, M., Mayer, J. W.

المصدر: Journal of Applied Physics. 12/1/1985, Vol. 58 Issue 11, p4125. 5p.

مصطلحات موضوعية: *THIN films, *NICKEL, *ALUMINUM

المؤلفون: Clevenger, L.A., Arcot, B., Ziegler, W., Colgan, E. G., Hong, Q. Z., d'Heurle, F. M., Cabral, Jr., C., Gallo, T. A., Harper, J. M. E.

المصدر: Journal of Applied Physics; 1/1/1998, Vol. 83 Issue 1, p90, 10p, 4 Black and White Photographs, 2 Charts, 8 Graphs

مصطلحات موضوعية: PHYSICS

المؤلفون: Harper, J.M.E., Rodbell, K.P., Colgan, E. G., Hammond, R. H.

المصدر: Journal of Applied Physics; 11/1/1997, Vol. 82 Issue 9, p4319, 8p, 8 Diagrams, 8 Graphs

مصطلحات موضوعية: MECHANICAL properties of thin films, ION bombardment, CRYSTAL texture

المؤلفون: Li, Jian, Mayer, J. W., Colgan, E. G.

المصدر: Journal of Applied Physics; 9/1/1991, Vol. 70 Issue 5, p2820, 8p

مصطلحات موضوعية: OXIDATION, THIN films, COPPER, LOW temperatures

المؤلفون: Allen, L. H., Zhang, M. Y., Mayer, J. W., Colgan, E. G., Young, R.

المصدر: Journal of Applied Physics; 7/1/1991, Vol. 70 Issue 1, p253, 6p, 4 Diagrams, 2 Graphs

مصطلحات موضوعية: ELECTRIC currents, ELECTRIC resistance, ELECTRIC contacts

المؤلفون: Olowolafe, J. O., Palmstro\m, C. J., Colgan, E. G., Mayer, J. W.

المصدر: Journal of Applied Physics; 11/1/1985, Vol. 58 Issue 9, p3440, 4p, 5 Graphs

مصطلحات موضوعية: CHEMICAL kinetics, ALUMINUM, ALLOYS, ANNEALING of metals

المؤلفون: Taira, Y., Nakano, D., Numata, H., Nishikai, A., Ono, S., Yamada, F., Suzuki, M., Noguchi, M., Singh, R., Colgan, E. G.

المصدر: SID Symposium Digest of Technical Papers ; volume 33, issue 1, page 1313-1315 ; ISSN 0097-966X 2168-0159

الاتاحة: http://dx.doi.org/10.1889/1.1830187
https://api.wiley.com/onlinelibrary/tdm/v1/articles/10.1889%2F1.1830187
https://onlinelibrary.wiley.com/doi/full/10.1889/1.1830187

المؤلفون: Colgan, E. G., Palmstro\m, C. J., Mayer, J. W.

المصدر: Journal of Applied Physics. 9/1/1985, Vol. 58 Issue 5, p1838. 3p. 1 Black and White Photograph, 5 Graphs.

مصطلحات موضوعية: *THIN films, *CHEMICAL reactions, *VANADIUM, *ALUMINUM

المؤلفون: Kinoshita, H., Scheleupen, K., Colgan, E. G., Nunes, R., Kitahara, H., Kodate, M., Tagsugi, S.

المصدر: SID Symposium Digest of Technical Papers ; volume 30, issue 1, page 736-739 ; ISSN 0097-966X 2168-0159

الاتاحة: http://dx.doi.org/10.1889/1.1834131
https://api.wiley.com/onlinelibrary/tdm/v1/articles/10.1889%2F1.1834131
https://onlinelibrary.wiley.com/doi/full/10.1889/1.1834131

المؤلفون: Kinoshita, H., Kitahara, H., Schleupen, K., Colgan, E. G., Nunes, R., Kodate, M., Takasugi, S.

المصدر: Journal of the Society for Information Display ; volume 7, issue 4, page 265-267 ; ISSN 1071-0922 1938-3657

الاتاحة: http://dx.doi.org/10.1889/1.1985293
https://api.wiley.com/onlinelibrary/tdm/v1/articles/10.1889%2F1.1985293
https://onlinelibrary.wiley.com/doi/full/10.1889/1.1985293

المؤلفون: Colgan, E. G., Doany, F., Lu, M., Rosenbluth, A., Yang, K.‐H., Uda, M., Shinohara, M., Tomooka, T., Tsukamoto, T.

المصدر: SID Symposium Digest of Technical Papers ; volume 29, issue 1, page 1071-1074 ; ISSN 0097-966X 2168-0159

الاتاحة: http://dx.doi.org/10.1889/1.1833671
https://api.wiley.com/onlinelibrary/tdm/v1/articles/10.1889%2F1.1833671
https://onlinelibrary.wiley.com/doi/full/10.1889/1.1833671