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1Academic Journal
المؤلفون: Zhihao Zheng, Christopher S. Own, Adrian A. Wanner, Randal A. Koene, Eric W. Hammerschmith, William M. Silversmith, Nico Kemnitz, Ran Lu, David W. Tank, H. Sebastian Seung
المصدر: Nature Communications, Vol 15, Iss 1, Pp 1-11 (2024)
مصطلحات موضوعية: Science
وصف الملف: electronic resource
Relation: https://doaj.org/toc/2041-1723
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2Academic Journal
المؤلفون: Andrew C Payne, Michael Andregg, Kent Kemmish, Mark Hamalainen, Charlotte Bowell, Andrew Bleloch, Nathan Klejwa, Wolfgang Lehrach, Ken Schatz, Heather Stark, Adam Marblestone, George Church, Christopher S Own, William Andregg
المصدر: PLoS ONE, Vol 8, Iss 7, p e69058 (2013)
وصف الملف: electronic resource
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3Academic Journal
المؤلفون: Wenjing Yin, Derrick Brittain, Jay Borseth, Marie E. Scott, Derric Williams, Jedediah Perkins, Christopher S. Own, Matthew Murfitt, Russel M. Torres, Daniel Kapner, Gayathri Mahalingam, Adam Bleckert, Daniel Castelli, David Reid, Wei-Chung Allen Lee, Brett J. Graham, Marc Takeno, Daniel J. Bumbarger, Colin Farrell, R. Clay Reid, Nuno Macarico da Costa
المصدر: Nature Communications, Vol 11, Iss 1, Pp 1-12 (2020)
مصطلحات موضوعية: Science
Relation: https://doi.org/10.1038/s41467-020-18659-3; https://doaj.org/toc/2041-1723; https://doaj.org/article/1636c301c307427c8f6136be5b12c53a
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المؤلفون: Zhihao Zheng, Christopher S. Own, Adrian A. Wanner, Randal A. Koene, Eric W. Hammerschmith, William M. Silversmith, Nico Kemnitz, David W. Tank, H. Sebastian Seung
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5
المؤلفون: Lawrence S. Own, Katherine Thomas-Keprta, Donald R. Pettit, Zachary Morales, James Martinez, Theodore DeRego, Zia Ur Rahman, Christopher S. Own
المصدر: Microscopy and Microanalysis. 26:1578-1581
مصطلحات موضوعية: Physics, Optics, business.industry, law, International Space Station, Electron microscope, business, Instrumentation, law.invention
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6Academic Journal
المؤلفون: Wharton Sinkler, Christopher S Own, Laurence D Marks
المساهمون: The Pennsylvania State University CiteSeerX Archives
وصف الملف: application/pdf
Relation: http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.1081.3549; http://www.numis.northwestern.edu/Research/Articles/2007/sinkler.pdf
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المؤلفون: Marie E. Scott, Marc Takeno, Daniel Kapner, Daniel J. Bumbarger, Christopher S. Own, R. Clay Reid, M.F. Murfitt, Adam Bleckert, Derric Williams, Brett J. Graham, Wenjing Yin, David Reid, Daniel Castelli, Wei-Chung Allen Lee, Nuno Macarico da Costa, Colin Farrell, Derrick Brittain, Jed Perkins, Jay Borseth, Russel Torres
مصطلحات موضوعية: Microscope, business.industry, Computer science, Pipeline (computing), Resolution (electron density), law.invention, Petascale computing, Transmission (telecommunications), law, Transmission electron microscopy, Electron microscope, business, Throughput (business), Computer hardware
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8
المؤلفون: Theodore DeRego, Ashwin Vishwanathan, Adrian A. Wanner, Gerward Weppelman, Eric Hammerschmith, Sebastian Ströh, H. Sebastian Seung, Lawrence S. Own, Christopher S. Own
المصدر: Microsc Microanal
مصطلحات موضوعية: Materials science, Order (business), business.industry, Transmission electron microscopy, Optoelectronics, business, Instrumentation, Throughput (business), Scaling, Article
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9
المؤلفون: Christopher S. Own, Matthew P. Galeano, Donald R. Pettit, James Martinez, Gerward Weppelman
المصدر: Microscopy and Microanalysis. 25:700-701
مصطلحات موضوعية: Ethernet, business.product_category, business.industry, Payload, Computer science, Local area network, High voltage, Safety standards, Space exploration, Rocket, International Space Station, Aerospace engineering, business, Instrumentation
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10
المؤلفون: A McManama-Smith, Ondrej L. Krivanek, Peter D. Nellist, Niklas Dellby, M.F. Murfitt, Christopher S. Own
مصطلحات موضوعية: Diffraction, Optics, Materials science, business.industry, business, Instrumentation
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11
المؤلفون: James Martinez, Donald R. Pettit, M.F. Murfitt, Lawrence S. Own, Jesse Cushing, Katherine Thomas-Keprta, Christopher S. Own
المصدر: Microscopy and Microanalysis. 23:1082-1083
مصطلحات موضوعية: 010302 applied physics, Materials science, Analytical chemistry, 02 engineering and technology, 021001 nanoscience & nanotechnology, 01 natural sciences, Microanalysis, law.invention, law, 0103 physical sciences, Extreme environment, Electron microscope, 0210 nano-technology, Instrumentation
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12
المؤلفون: M.F. Murfitt, Lawrence S. Own, Jesse Cushing, Christopher S. Own
المصدر: Microscopy and Microanalysis. 23:32-33
مصطلحات موضوعية: 010302 applied physics, Materials science, business.industry, 02 engineering and technology, 021001 nanoscience & nanotechnology, 01 natural sciences, law.invention, law, 0103 physical sciences, Optoelectronics, Reel-to-reel audio tape recording, Electron microscope, 0210 nano-technology, business, Instrumentation
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13
المؤلفون: Stephen J. Pennycook, Timothy J. Pennycook, Niklas Dellby, Christopher S. Own, M.F. Murfitt, Matthew F. Chisholm, Z.S. Szilagyi, Sokrates T. Pantelides, Ondrej L. Krivanek, Valeria Nicolosi, Mark P. Oxley, G.J. Corbin
المصدر: Nature
مصطلحات موضوعية: Boron Compounds, Physics, Multidisciplinary, chemistry.chemical_element, Molecular physics, Dark field microscopy, Chemistry Techniques, Analytical, Microscopy, Electron, chemistry.chemical_compound, chemistry, Transmission electron microscopy, Boron nitride, Quantum mechanics, Monolayer, Atom, Scanning transmission electron microscopy, Density functional theory, Boron, Engineering sciences. Technology
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المؤلفون: Niklas Dellby, Christopher S. Own, M.F. Murfitt, N.J. Bacon, G.J. Corbin, Z.S. Szilagyi, Ondrej L. Krivanek, Petr Hrncirik, Jonathan P. Ursin
المصدر: Philosophical Transactions of the Royal Society A: Mathematical, Physical and Engineering Sciences. 367:3683-3697
مصطلحات موضوعية: Conventional transmission electron microscope, Materials science, Electron spectrometer, Physics::Instrumentation and Detectors, business.industry, General Mathematics, Electron energy loss spectroscopy, General Engineering, Scanning confocal electron microscopy, General Physics and Astronomy, law.invention, Optics, law, Scanning transmission electron microscopy, Physics::Accelerator Physics, Energy filtered transmission electron microscopy, Electron beam-induced deposition, Nuclear Experiment, business, Monochromator
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15
المؤلفون: Laurence D. Marks, Christopher S. Own, Wharton Sinkler
المصدر: Ultramicroscopy. 107:543-550
مصطلحات موضوعية: Electron crystallography, business.industry, Chemistry, Crystal structure, Atomic and Molecular Physics, and Optics, Electronic, Optical and Magnetic Materials, Computational physics, Data set, Amplitude, Optics, Direct methods, Precession electron diffraction, Minimal knowledge, Structure factor, business, Instrumentation
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المؤلفون: Laurence D. Marks, Wharton Sinkler, Christopher S. Own
المصدر: Ultramicroscopy. 107:534-542
مصطلحات موضوعية: Diffraction, Physics, Contrast transfer function, business.industry, Direct imaging, Electron, Atomic and Molecular Physics, and Optics, Electronic, Optical and Magnetic Materials, Reciprocal lattice, Optics, Electron diffraction, business, Instrumentation, Electron distribution
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17
المؤلفون: Christopher S. Own, Laurence D. Marks, Wharton Sinkler
المصدر: Ultramicroscopy. 106:114-122
مصطلحات موضوعية: Diffraction, Basis (linear algebra), business.industry, Chemistry, Electron, Atomic and Molecular Physics, and Optics, Electronic, Optical and Magnetic Materials, Computational physics, Optics, Amplitude, Electron diffraction, Direct methods, Atom, Precession, business, Instrumentation
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المؤلفون: Jing Zhao, Christopher S. Own, George C. Schatz, Shengli Zou, Laurence D. Marks, Amanda J. Haes, Richard P. Van Duyne
المصدر: The Journal of Physical Chemistry B. 109:11158-11162
مصطلحات موضوعية: Materials science, Dimer, Mie scattering, Physics::Medical Physics, Physics::Optics, Nanoparticle, Nanotechnology, Ag nanoparticles, Discrete dipole approximation, Solution phase, Silver nanoparticle, Surfaces, Coatings and Films, chemistry.chemical_compound, chemistry, Materials Chemistry, Nanosphere lithography, Physical and Theoretical Chemistry, Nuclear Experiment
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المؤلفون: Laurence D. Marks, Christopher S. Own, A. Subramanian
المصدر: Microscopy and Microanalysis. 10:96-104
مصطلحات موضوعية: Molybdenum, Diffraction, Reflection high-energy electron diffraction, Materials science, Analytical chemistry, Oxides, Electron, Computational physics, Microscopy, Electron, X-Ray Diffraction, Lanthanum, X-ray crystallography, Image Processing, Computer-Assisted, Precession, Precession electron diffraction, Selected area diffraction, Crystallization, Instrumentation, Copper, Electron backscatter diffraction
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20
المؤلفون: Lindsey Own, Christopher S. Own, Shaye Whitmer, Lawrence S. Own
المصدر: Microscopy and Microanalysis. 21:1073-1074
مصطلحات موضوعية: Scale (ratio), business.industry, Computer science, Aerospace engineering, business, Instrumentation