المؤلفون: William R. Eisenstadt, Mark Roos, Devin Morris, Jose Luis Gonzalez-Jimenez, Christopery Mounet, Manuel J. Barragan, Gildas Leger, Florent Cilici, Estelle Lauga-Larroze, Salvador Mir, Sylvain Bourdel, M. Margalef-Rovira, I. Alaji, H. Ghanem, G. Ducournau, C. Gaquiere

المصدر: 2022 IEEE European Test Symposium (ETS).

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::3b0e4909287782ded30c9a9d4503d979
https://doi.org/10.1109/ets54262.2022.9810461