المؤلفون: Gilbert, P.B., Huang, Y., deCamp, A.C., Karuna, S., Zhang, Y., Magaret, C.A., Giorgi, E.E., Korber, B., Edlefsen, P.T., Rossenkhan, R., Juraska, M., Rudnicki, E., Kochar, N., Carpp, L.N., Barouch, D.H., Mkhize, N.N., Hermanus, T., Kgagudi, P., Bekker, V., Kaldine, H., Mapengo, R.E., Eaton, A., Domin, E., West, C., Feng, W., Tang, H., Seaton, K.E., Heptinstall, J., Brackett, C., Chiong, K., Tomaras, G.D., Andrew, P., Mayer, B.T., Reeves, D.B., Sobieszczyk, M.E., Garrett, N., Sanchez, J., Gay, C., Makhema, J., Williamson, C., Mullins, J.I., Hural, J., Cohen, M.S., Corey, L., Montefiori, D.C., Morris, L.

المصدر: Nature Medicine, 28(9)

مصطلحات موضوعية: antibody titer, unclassified drug, Human immunodeficiency virus antibody, neutralizing antibody, human, in vitro study, controlled study, HIV Antibodies, primate, clinical trial (topic), predicted serum neutralization 80 percent inhibitory dilution titer, Adenosine Monophosphate, adenosine phosphate, tenofovir, Humans, HIV Infections, virus isolation, drug blood level, virus neutralization, immunological parameters, placebo, HIV-1, infection prevention, nonhuman, drug efficacy, Broadly Neutralizing Antibodies, Human immunodeficiency virus 1, case control study, Article, Human immunodeficiency virus infection

Relation: https://doi.org/10.17615/5a1m-e268; https://cdr.lib.unc.edu/downloads/hd76s9249?file=thumbnail; https://cdr.lib.unc.edu/downloads/hd76s9249

الاتاحة: https://doi.org/10.17615/5a1m-e268
https://cdr.lib.unc.edu/downloads/hd76s9249?file=thumbnail
https://cdr.lib.unc.edu/downloads/hd76s9249

المؤلفون: Chiong, K. S., Mohamad, Z. F., Abdul Aziz, A. R.

المساهمون: Ministry of Higher Education, Malaysia, Institut Pengurusan dan Pemantauan Penyelidikan, Universiti Malaya

المصدر: International Journal of Environmental Science and Technology ; volume 14, issue 4, page 911-922 ; ISSN 1735-1472 1735-2630

الاتاحة: http://dx.doi.org/10.1007/s13762-016-1164-3
http://link.springer.com/content/pdf/10.1007/s13762-016-1164-3.pdf
http://link.springer.com/article/10.1007/s13762-016-1164-3/fulltext.html

المؤلفون: Simon, P., Carrillo-Cabrera, W., Zhongjia, T., Chiong, K., Baitinger, M., Grin, Y., Guloy, A.

المصدر: Nanofair 2010 - 8th International Nanotechnology Symposium

Relation: info:eu-repo/semantics/altIdentifier/urn/http://www.nanofair.com/; http://hdl.handle.net/11858/00-001M-0000-0015-24A2-0

الاتاحة: http://hdl.handle.net/11858/00-001M-0000-0015-24A2-0

المؤلفون: Simon, P., Tang, Z., Carrillo-Cabrera, W., Chiong, K., Böhme, B., Baitinger, M., Lichte, H., Grin, Y., Guloy, A.

المصدر: Journal of the American Chemical Society

Relation: http://hdl.handle.net/11858/00-001M-0000-0015-227B-B

الاتاحة: http://hdl.handle.net/11858/00-001M-0000-0015-227B-B

المؤلفون: Chiong, K., Mohamad, Z., Abdul Aziz, A.

المصدر: International Journal of Environmental Science & Technology (IJEST); Apr2017, Vol. 14 Issue 4, p911-922, 12p

المؤلفون: Hiraoka, H., Hinsberg, W., Clecak, N., Patlach, A., Chiong, K. N.

المصدر: Journal of Vacuum Science & Technology: Part B-Microelectronics Processing & Phenomena; 1988, Vol. 6 Issue 6, p2294-2297, 4p

المؤلفون: Reeves, C. M., Hohn, F. J., Wind, S. J., Lii, Y. T., Newman, T. H., Bucchignano, J. J., Klaus, D. P., Chiong, K. N.

المصدر: Journal of Vacuum Science & Technology: Part B-Microelectronics & Nanometer Structures; 1991, Vol. 9 Issue 6, p2851-2855, 5p

المؤلفون: Molzen, W W., Rosenfield, M G., Kwietniak, K T., Chiong, K G., Wilson, A D., Hohn, F J.

المساهمون: Yanof, Arnold W.

المصدر: SPIE Proceedings ; Electron-Beam, X-Ray, and Ion Beam Technology: Submicrometer Lithographies VII ; ISSN 0277-786X

الاتاحة: http://dx.doi.org/10.1117/12.945642

المؤلفون: Chiong, K., Hiraoka, H.

المساهمون: Bowden, Murrae J.

المصدر: Advances in Resist Technology and Processing IV ; SPIE Proceedings ; ISSN 0277-786X

الاتاحة: http://dx.doi.org/10.1117/12.940327
http://proceedings.spiedigitallibrary.org/proceeding.aspx?doi=10.1117/12.940327

المؤلفون: WISEMAN, J. R., PENDERY, J. J., OTTO, C. A., CHIONG, K. G.

المصدر: Chemischer Informationsdienst ; volume 11, issue 21 ; ISSN 0009-2975 2199-2924

الاتاحة: http://dx.doi.org/10.1002/chin.198021190
http://api.wiley.com/onlinelibrary/tdm/v1/articles/10.1002%2Fchin.198021190
https://api.wiley.com/onlinelibrary/tdm/v1/articles/10.1002%2Fchin.198021190
https://onlinelibrary.wiley.com/doi/pdf/10.1002/chin.198021190

المؤلفون: WISEMAN, J. R., FRENCH, N. I., HALLMARK, R. K., CHIONG, K. G.

المصدر: Chemischer Informationsdienst ; volume 10, issue 4 ; ISSN 0009-2975 2199-2924

الاتاحة: http://dx.doi.org/10.1002/chin.197904317
http://api.wiley.com/onlinelibrary/tdm/v1/articles/10.1002%2Fchin.197904317
https://api.wiley.com/onlinelibrary/tdm/v1/articles/10.1002%2Fchin.197904317
https://onlinelibrary.wiley.com/doi/pdf/10.1002/chin.197904317

المؤلفون: CHIONG, K. N. G., LEWIS, S. D., SHAFER, J. A.

المصدر: Chemischer Informationsdienst ; volume 6, issue 14 ; ISSN 0009-2975 2199-2924

الاتاحة: http://dx.doi.org/10.1002/chin.197514101
http://api.wiley.com/onlinelibrary/tdm/v1/articles/10.1002%2Fchin.197514101
https://api.wiley.com/onlinelibrary/tdm/v1/articles/10.1002%2Fchin.197514101
https://onlinelibrary.wiley.com/doi/pdf/10.1002/chin.197514101

المؤلفون: BOBBITT, J. M., KULKARNI, C. L., DUTTA, C. P., KOFOD, H., CHIONG, K. N.

المصدر: Chemischer Informationsdienst ; volume 10, issue 7 ; ISSN 0009-2975 2199-2924

الاتاحة: http://dx.doi.org/10.1002/chin.197907199
http://api.wiley.com/onlinelibrary/tdm/v1/articles/10.1002%2Fchin.197907199
https://api.wiley.com/onlinelibrary/tdm/v1/articles/10.1002%2Fchin.197907199
https://onlinelibrary.wiley.com/doi/pdf/10.1002/chin.197907199

المؤلفون: Chiong, K. N. G., Lewis, S. D., Shafer, J. A.

المصدر: Journal of the American Chemical Society ; volume 97, issue 2, page 418-423 ; ISSN 0002-7863 1520-5126

الاتاحة: http://dx.doi.org/10.1021/ja00835a034
https://pubs.acs.org/doi/pdf/10.1021/ja00835a034

المؤلفون: Wang, L. K., Taur, Y., Moy, D., Dennard, R. H., Chiong, K., Hohn, F., Coane, P. J., Edenfeld, A., Carbaugh, S., Kenney, D., Schnur, S.

المصدر: 1986 Symposium on VLSI Technology Digest of Technical Papers; 1986, p13-14, 2p