المؤلفون: Seiji Takahashi, Yi-Min Huang, Jhy-Jyi Sze, Tung-Ting Wu, Fu-Sheng Guo, Wei-Cheng Hsu, Tung-Hsiung Tseng, King Liao, Chin-Chia Kuo, Tzu-Hsiang Chen, Wei-Chieh Chiang, Chun-Hao Chuang, Keng-Yu Chou, Chi-Hsien Chung, Kuo-Yu Chou, Chien-Hsien Tseng, Chuan-Joung Wang, Dun-Nien Yaung

المصدر: Sensors, Vol 17, Iss 12, p 2816 (2017)

مصطلحات موضوعية: submicron pixel, image sensor, stacked CMOS image sensor, dark current, read noise, random telegraph noise, full well capacity, optical crosstalk, Chemical technology, TP1-1185

وصف الملف: electronic resource

Relation: https://www.mdpi.com/1424-8220/17/12/2816; https://doaj.org/toc/1424-8220

URL الوصول: https://doaj.org/article/e943c9552b8649ad8783b651839b2c7f

المؤلفون: Chung-Wei Chang, Shou-Gwo Wuu, Dun-Nian Yaung, Chien-Hsien Tseng, Han-Chi Liu, David Yen, Yi-Jiun Lin, Chun-Ming Su, Chun-Yao Ko, C.Y. Yu, C.H. Lo, F.J.Hsiu, C.S.Tsai, Chung S. Wang, Mingo Liu, Chrong-Jung Lin, Ya-Chin King

المساهمون: 林崇榮

مصطلحات موضوعية: CMOS

Time: 45

Relation: IEEE International Image Sensor Workshop (IISW), Ogunquit, ME, June 6-10, 2007, Pages 207-211; http://nthur.lib.nthu.edu.tw/dspace/handle/987654321/68463

الاتاحة: http://nthur.lib.nthu.edu.tw/dspace/handle/987654321/68463

المؤلفون: Chien-Hsien Tseng, Shou-Gwo Wuu

المصدر: IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. ; page 997-1000

الاتاحة: http://dx.doi.org/10.1109/iedm.2004.1419356
http://xplorestaging.ieee.org/ielx5/9719/30682/01419356.pdf?arnumber=1419356

المؤلفون: Shou-Gwo Wuu, Dun-Nian Yaung, Chien-Hsien Tseng, Ho-Ching Chien, Wang, C.S., Yean-Kuen Hsiao, Chin-Kung Chang, Chang, B.J.

المصدر: International Electron Devices Meeting 2000. Technical Digest. IEDM (Cat. No.00CH37138) ; page 705-708

الاتاحة: http://dx.doi.org/10.1109/iedm.2000.904416
http://xplorestaging.ieee.org/ielx5/7241/19535/00904416.pdf?arnumber=904416

المؤلفون: Shou-Gwo Wuu, Ho-Ching Chien, Dun-Nian Yaung, Chien-Hsien Tseng, Wang, C.S., Chin-Kung Chang, Yu-Kung Hsaio

المصدر: International Electron Devices Meeting. Technical Digest (Cat. No.01CH37224)

الاتاحة: http://dx.doi.org/10.1109/iedm.2001.979567
http://xplorestaging.ieee.org/ielx5/7704/21092/00979567.pdf?arnumber=979567

المؤلفون: Y.K. Fang, T.H. Hsu, C.S. Wang, Chien-Hsien Tseng, D.N. Yaung, Ho-Ching Chien, S.G. Wuu, L.L. Yao, S.F. Chen, W.D. Wang

المصدر: IEEE Electron Device Letters. 26:634-636

مصطلحات موضوعية: In situ, Crosstalk, Microlens, Materials science, Optics, CMOS, Pixel, business.industry, Optoelectronics, Electrical and Electronic Engineering, Image sensor, business, Electronic, Optical and Magnetic Materials

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::6d70b43e392d0372ad8d2f2fb8118688
https://doi.org/10.1109/led.2005.854373

المؤلفون: Shou-Gwo Wuu, Dun-Nian Yaung, Tse-Heng Chou, T.H. Hsu, Jeng-Shyan Lin, Yean-Kuen Fang, S.F. Chen, Chih-Wei Lin, Ho-Ching Chien, C.S. Wang, Chien-Hsien Tseng, Cheng-I Lin

المصدر: IEEE Electron Device Letters. 26:547-549

مصطلحات موضوعية: Materials science, business.industry, Dielectric, Electronic, Optical and Magnetic Materials, Photodiode, law.invention, chemistry.chemical_compound, chemistry, CMOS, law, Shallow trench isolation, Silicide, Electronic engineering, Optoelectronics, Quantum efficiency, Electrical and Electronic Engineering, Image sensor, business, Sensitivity (electronics)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::45c74ad940d82df3391576ace20e5204
https://doi.org/10.1109/led.2005.852536

المؤلفون: T.H. Hsu, Dun-Nian Yaung, Chien-Hsien Tseng, Jeng-Shyan Lin, C.S. Lin, S.F. Chen, Y.K. Fang, Shou-Gwo Wuu, C.Y. Lin, C.S. Wang, Ho-Ching Chien

المصدر: IEEE Electron Device Letters. 26:301-303

مصطلحات موضوعية: Materials science, Pixel, business.industry, Peak shift, Spectral response, Electronic, Optical and Magnetic Materials, Optics, CMOS, Guard ring, Color mixing, Electrical and Electronic Engineering, Image sensor, Air gap (plumbing), business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::8c312deafe9639130ac141491b8e34a9
https://doi.org/10.1109/led.2005.846574

المؤلفون: Shou-Gwo Wuu, S.F. Chen, T.H. Hsu, Jeng-Shyan Lin, Y.K. Fang, Dun-Nian Yaung, Chien-Hsien Tseng, Cheng-I Lin, Chih-Wei Lin, Ho-Ching Chien, C.S. Wang

المصدر: IEEE Electron Device Letters. 25:427-429

مصطلحات موضوعية: CMOS sensor, Materials science, Pixel, business.industry, Transistor, equipment and supplies, Signal, Electronic, Optical and Magnetic Materials, Photodiode, law.invention, body regions, Impact ionization, law, Optoelectronics, sense organs, Electrical and Electronic Engineering, Image sensor, business, Degradation (telecommunications)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::6b085a07cb0636d675f5cfcadb430376
https://doi.org/10.1109/led.2004.829000

المؤلفون: T.H. Hsu, Y.K. Fang, Shou-Gwo Wuu, Chih-Wei Lin, Cheng-I Lin, Ho-Ching Chien, C.S. Wang, S.F. Chen, Jeng-Shyan Lin, Dun-Nian Yaung, Chien-Hsien Tseng

المصدر: IEEE Electron Device Letters. 25:375-377

مصطلحات موضوعية: Total internal reflection, Materials science, Pixel, business.industry, Dielectric, Ray, Electronic, Optical and Magnetic Materials, Optics, CMOS, Optoelectronics, Electrical and Electronic Engineering, Image sensor, Air gap (plumbing), business, Refractive index

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::127052148fabc7e71b6d8f8e7441f56b
https://doi.org/10.1109/led.2004.828995

المؤلفون: T.H. Hsu, Shou-Gwo Wuu, Ho-Ching Chien, Chien-Hsien Tseng, C.S. Wang, S.F. Chen, Chih-Wei Lin, Y.K. Fang, Cheng-I Lin, Dun-Nian Yaung, Jeng-Shyan Lin

المصدر: IEEE Electron Device Letters. 25:22-24

مصطلحات موضوعية: Physics, Total internal reflection, Pixel, business.industry, Light guide, Dielectric, Ray, Electronic, Optical and Magnetic Materials, Crosstalk, Optics, Optoelectronics, Electrical and Electronic Engineering, Image sensor, business, Refractive index

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::21193f18010e284f1dfdc31fbcd02215
https://doi.org/10.1109/led.2003.821597

المؤلفون: Chien-Hsien Tseng, Shou-Gwo Wuu, Ho-Ching Chien, Dun-Nian Yaung, Tze-Hsuan Hsu, Jeng-Shyan Lin, Hung-Jen Hsu, Chung-Yi Yu, Chin-Hsin Lo, Wang, C.S.

المصدر: IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004; 2004, p997-1000, 4p

المؤلفون: Ho-Ching Chien, Shou-Gwo Wuu, Dun-Nian Yaung, Chien-Hsien Tseng, Jeng-Shyan Lin, Wang, C.S., Chin-Kung Chang, Yu-Kung Hsiao

المصدر: Digest. International Electron Devices Meeting; 2002, p813-816, 4p

المؤلفون: Shou-Gwo Wuu, Dun-Nian Yaung, Chien-Hsien Tseng, Ho-Ching Chien, Wang, C.S., Yean-Kuen Hsiao, Chin-Kung Chang, Chang, B.J.

المصدر: International Electron Devices Meeting 2000. Technical Digest. IEDM (Cat. No.00CH37138); 2000, p705-708, 4p

المؤلفون: Dun-Nian Yaung, Shou-Gwo Wuu, Yean-Kuen Fang, Wang, C.S., Chien-Hsien Tseng, Mon-Song Lian

المصدر: IEEE Electron Device Letters; Feb2001, Vol. 22 Issue 2, p71-73, 3p