المؤلفون: Zhou, Kuan-Ju, Chang, Ting-Chang, Yen, Po-Yu, Chen, Yu-An, Chien, Ya-Ting, Huang, Bo-Shen, Lee, Po-Yi, Juan, Tzu-Hsuan, Sze, Simon M., Fan, Yang-Shun, Huang, Chen-Shuo, Tsai, Chih-Hung

المساهمون: Hsinchu Science Park Bureau, Ministry of Science and Technology, Taiwan, Taiwan Semiconductor Research Institute

المصدر: IEEE Electron Device Letters ; volume 45, issue 4, page 593-596 ; ISSN 0741-3106 1558-0563

الاتاحة: https://doi.org/10.1109/led.2024.3363131
http://xplorestaging.ieee.org/ielx7/55/10479122/10431683.pdf?arnumber=10431683

المؤلفون: Tu, Hong-Yi, Chang, Ting–Chang, Tsai, Tsung–Ming, Sun, Li–Chan, Kuo, Chen–Wei, Wu, Chia–Chuan, Chien, Ya–Ting

المصدر: 2024 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) ; page 01-06

الاتاحة: http://dx.doi.org/10.1109/ipfa61654.2024.10691163
http://xplorestaging.ieee.org/ielx8/10690276/10690850/10691163.pdf?arnumber=10691163

المؤلفون: Yen, Po-Yu, Zhou, Kuan-Ju, Sun, Pei-Jun, Chen, Yu-An, Chien, Ya-Ting, Huang, Bo-Shen, Lee, Po-Yi, Juan, Tzu-Hsuan, You Shao, Kui, Shan Lin, Yu, Sze, Simon M., Chang, Ting-Chang

المساهمون: National Sun Yat-sen University Joint Center for high value Instruments, Center for Nano Science and Nano Technology Core Facilities Lab, National Science and Technology Council

المصدر: IEEE Electron Device Letters ; volume 45, issue 9, page 1586-1589 ; ISSN 0741-3106 1558-0563

الاتاحة: http://dx.doi.org/10.1109/led.2024.3424579
http://xplorestaging.ieee.org/ielx8/55/10648890/10587280.pdf?arnumber=10587280

المؤلفون: Chien, Ya-Ting, Zhou, Kuan-Ju, Tai, Mao-Chou, Chen, Yu-An, Sun, Pei-Jun, Lee, Ya-Huan, Chang, Ting-Chang, Tsai, Tsung-Ming, Fan, Yang-Shun, Huang, Chen-Shuo, Chen, Kuo-Kuang, Tsai, Chih-Hung

المساهمون: National Science and Technology Council in Taiwan

المصدر: IEEE Transactions on Electron Devices ; volume 70, issue 3, page 1089-1094 ; ISSN 0018-9383 1557-9646

الاتاحة: http://dx.doi.org/10.1109/ted.2023.3237506
http://xplorestaging.ieee.org/ielx7/16/10053598/10025687.pdf?arnumber=10025687

المؤلفون: Chien, Ya-Ting, Tu, Hong-Yi, Chen, Wen-Chung, Zheng, Yu-Zhe, Chou, Sheng-Yao, Sun, Pei-Jun, Tsai, Xin-Ying, Chang, Liu-Wen, Chou, Ming-Chi, Tsai, Tsung-Ming

المصدر: Materials Science in Semiconductor Processing ; volume 158, page 107343 ; ISSN 1369-8001

الاتاحة: http://dx.doi.org/10.1016/j.mssp.2023.107343
https://api.elsevier.com/content/article/PII:S1369800123000367?httpAccept=text/xml
https://api.elsevier.com/content/article/PII:S1369800123000367?httpAccept=text/plain

المؤلفون: Zhou, Kuan-Ju, Chang, Ting-Chang, Tai, Mao-Chou, Chen, Yu-An, Chien, Ya-Ting, Sun, Pei-Jun, Yen, Po-Yu, Sze, Simon M., Fan, Yang-Shun, Huang, Chen-Shuo, Chen, Kuo-Kuang, Tsai, Chih-Hung

المساهمون: Ministry of Science and Technology, Taiwan

المصدر: ACS Applied Electronic Materials ; volume 5, issue 2, page 1183-1188 ; ISSN 2637-6113 2637-6113

الاتاحة: http://dx.doi.org/10.1021/acsaelm.2c01629
https://pubs.acs.org/doi/pdf/10.1021/acsaelm.2c01629

المؤلفون: Zhou, Kuan-Ju, Chen, Po-Hsun, Zheng, Yu-Zhe, Tai, Mao-Chou, Wang, Yu-Xuan, Chien, Ya-Ting, Sun, Pei-Jun, Huang, Hui-Chun, Chang, Ting-Chang, Sze, Simon M.

المساهمون: Ministry of Science and Technology, Taiwan

المصدر: Journal of Materials Chemistry C ; volume 10, issue 24, page 9192-9197 ; ISSN 2050-7526 2050-7534

الاتاحة: http://dx.doi.org/10.1039/d2tc01460b
http://pubs.rsc.org/en/content/articlepdf/2022/TC/D2TC01460B

المؤلفون: Tu, Yu-Fa, Huang, Jen-Wei, Chang, Ting-Chang, Hung, Yang-Hao, Tai, Mao-Chou, Chen, Jian-Jie, Lin, Shih-Kai, Zhou, Kuan-Ju, Chien, Ya-Ting, Huang, Hui-Chun, Lien, Chen-Hsin

المصدر: IEEE Transactions on Electron Devices; September 2023, Vol. 70 Issue: 9 p4669-4673, 5p

المؤلفون: Chien, Ya-Ting, Tsai, Yu-Lin, Zhou, Kuan-Ju, Zheng, Yu-Zhe, Tai, Mao-Chou, Tu, Hong-Yi, Kuo, Chuan-Wei, Chang, Ting-Chang, Tsai, Tsung-Ming

المساهمون: National Science Council Core Facilities Laboratory for Nano-Science and Nano-Technology in Kaohsiung, Pingtung, Ministry of Science and Technology, Taiwan

المصدر: IEEE Electron Device Letters ; volume 42, issue 11, page 1611-1614 ; ISSN 0741-3106 1558-0563

الاتاحة: http://dx.doi.org/10.1109/led.2021.3116168
http://xplorestaging.ieee.org/ielx7/55/9584926/09570166.pdf?arnumber=9570166

المؤلفون: Wu, Chia-Chuan, Ma, William Cheng-Yu, Chang, Ting-Chang, Wang, Yu-Xuan, Tai, Mao-Chou, Tu, Yu-Fa, Chen, Yu-An, Tu, Hong-Yi, Chien, Ya-Ting, Chang, Han-Yu, Huang, Bo-Shen

المصدر: IEEE Transactions on Electron Devices; 2023, Vol. 70 Issue: 3 p1079-1084, 6p

المؤلفون: Tu, Hong-Yi, Chang, Ting-Chang, Tsao, Yu-Ching, Tai, Mao-Chou, Tsai, Yu-Lin, Huang, Shin-Ping, Zheng, Yu-Zhe, Wang, Yu-Xuan, Lin, Chih-Chih, Kuo, Chuan-Wei, Tsai, Tsung-Ming, Wu, Chia-Chuan, Chien, Ya-Ting, Huang, Hui-Chun

المساهمون: Ministry of Science and Technology, Taiwan

المصدر: Journal of Physics D: Applied Physics ; volume 53, issue 40, page 405104 ; ISSN 0022-3727 1361-6463

الاتاحة: http://dx.doi.org/10.1088/1361-6463/ab9918
https://iopscience.iop.org/article/10.1088/1361-6463/ab9918
https://iopscience.iop.org/article/10.1088/1361-6463/ab9918/pdf

المؤلفون: Tu, Hong-Yi, Chang, Ting-Chang, Tsao, Yu-Ching, Tai, Mao-Chou, Zheng, Yu-Zhe, Tu, Yu-Fa, Kuo, Chuan-Wei, Wu, Chia-Chuan, Tsai, Yu-Lin, Tsai, Tsung-Ming, Lin, Chih-Chih, Chien, Ya-Ting

المصدر: IEEE Electron Device Letters; May2022, Vol. 43 Issue 5, p721-724, 4p

مصطلحات موضوعية: ELECTRON impact ionization, TRANSISTORS, HOT carriers, THIN film transistors, ELECTRON traps, THRESHOLD voltage

المؤلفون: Tsai, Yu-Lin, Chang, Ting-Chang, Tsao, Yu-Ching, Tai, Mao-Chou, Tu, Hong-Yi, Chien, Ya-Ting, Jin, Fu-Yuan, Zheng, Hao-Xuan, Lin, Yu-Shan, Ciou, Fong-Min, Lin, Yun-Hsuan, Wu, Pei-Yu, Huang, Jen-Wei

المصدر: IEEE Transactions on Device & Materials Reliability; Sep2021, Vol. 21 Issue 3, p320-323, 4p

المؤلفون: Kuo, Chuan-Wei, Chang, Ting-Chang, Chien, Yu-Chieh, Tsai, Yu-Lin, Tu, Hong-Yi, Tsao, Yu-Ching, Chien, Ya-Ting, Chen, Hong-Chih, Chen, Jian-Jie, Tsai, Tsung-Ming, Sze, Simon M.

المصدر: IEEE Transactions on Electron Devices; Apr2021, Vol. 68 Issue 4, p1654-1658, 5p

مصطلحات موضوعية: INDIUM gallium zinc oxide, LIGHTING design, TRANSISTORS, THIN film transistors, SEMICONDUCTOR devices, STRUCTURAL design, ELECTRIC capacity