المؤلفون: Nocairi, Safa, Compère, Nicolas, Bermond, Antonin, Roucoules, Christine, Sao Joao, Sergio, Lenci, Matthieu, Kermouche, Guillaume, Klöcker, Helmut

المساهمون: Valeo Lighting Systems (VLS), VALEO, Centre Science des Matériaux et des Structures (SMS-ENSMSE), École des Mines de Saint-Étienne (Mines Saint-Étienne MSE), Institut Mines-Télécom Paris (IMT)-Institut Mines-Télécom Paris (IMT), Laboratoire Georges Friedel (LGF-ENSMSE), Institut Mines-Télécom Paris (IMT)-Institut Mines-Télécom Paris (IMT)-Université de Lyon-Centre National de la Recherche Scientifique (CNRS), GIE Manutech-USD

المصدر: ISSN: 0026-2714.

مصطلحات موضوعية: Characterize assembled LED, Reflow, Damage, Focused Ion Beam, Femtosecond laser, Very high resolution tomography, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics

Relation: hal-03782555; https://hal.science/hal-03782555; https://hal.science/hal-03782555/document; https://hal.science/hal-03782555/file/SN_AB%20Microelectronics%20Reliability%202022.pdf

الاتاحة: https://hal.science/hal-03782555
https://hal.science/hal-03782555/document
https://hal.science/hal-03782555/file/SN_AB%20Microelectronics%20Reliability%202022.pdf
https://doi.org/10.1016/j.microrel.2022.114749