المؤلفون: Canute I. Vaz, Changze Liu, Jason P. Campbell, Jason T. Ryan, Richard G. Southwick III, David Gundlach, Anthony S. Oates, Ru Huang, Kin. P. Cheung

المصدر: AIP Advances, Vol 6, Iss 6, Pp 065212-065212-9 (2016)

مصطلحات موضوعية: Physics, QC1-999

وصف الملف: electronic resource

Relation: https://doaj.org/toc/2158-3226

URL الوصول: https://doaj.org/article/3c8469cce313441ba2472d9316506c9b

المؤلفون: Krishna K. Bhuwalka, Hao Wu, Wenbo Zhao, Gerhard Rzepa, Oskar Baumgartner, Francis Benistant, Yijian Chen, Changze Liu

المصدر: IEEE Transactions on Electron Devices. 69:4088-4094

مصطلحات موضوعية: Electrical and Electronic Engineering, Electronic, Optical and Magnetic Materials

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::7e34ed313aec86b4d9684e2fca650611
https://doi.org/10.1109/ted.2022.3178665

المؤلفون: Huatao Yu, Canhui Zhan, Tinghuan Chen, Qi Sun, Bei Yu, Changze Liu

المصدر: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 41:1990-2003

مصطلحات موضوعية: Speedup, Computer science, Transistor, Multigraph, Topology (electrical circuits), Integrated circuit, Computer Graphics and Computer-Aided Design, law.invention, law, Scalability, Bipartite graph, Electronic engineering, Electrical and Electronic Engineering, Software, Hot-carrier injection

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::a0b2446523f55eb0e42219d8d65e6229
https://doi.org/10.1109/tcad.2021.3107250

المؤلفون: Gerhard Rzepa, Krishna K. Bhuwalka, Oskar Baumgartner, Daniele Leonelli, Hui-Wen Karner, Franz Schanovsky, Christian Kernstock, Zlatan Stanojevic, Hao Wu, Francis Benistant, Changze Liu, Markus Karner

المصدر: 2022 International Electron Devices Meeting (IEDM).

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::1ac321212b937440301d2eabb9cd4b31
https://doi.org/10.1109/iedm45625.2022.10019528

المؤلفون: Xiangyu Liu, Yongsheng Sun, Junlin Huang, Xiaolu Shang, Changze Liu

المصدر: 2022 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::74b2df33bf2a8749c2b4bc3aa655957b
https://doi.org/10.1109/ipfa55383.2022.9915742

المؤلفون: Geert Hellings, Krishna K. Bhuwalka, Julien Ryckaert, Bjorn Vermeersch, Hao Wu, Philippe Matagne, Amita Rawat, Changze Liu

المصدر: ESSCIRC

مصطلحات موضوعية: Stress (mechanics), Reduction (complexity), Parasitic capacitance, Computer science, Logic gate, Benchmark (computing), Field-effect transistor, Nanosheet, Reliability engineering, Communication channel

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::052202e5894171f3b917a37d9176d3c7
https://doi.org/10.1109/esscirc53450.2021.9567879

المؤلفون: Junnan, Zhou, Yuhang, Mao, Xiaotian, Shi, Yudie, Zhang, Xiaolu, Yu, Xuan, Liu, Li, Diao, Xue, Yang, Changze, Liu, Dan, Liu, Xin, Tan, Mei, Liu

المصدر: International Immunopharmacology. 111:109181

مصطلحات موضوعية: Pharmacology, Tumor Necrosis Factor-alpha, Immunology, Fibroblasts, Arthritis, Experimental, Synoviocytes, Rats, Arthritis, Rheumatoid, Animals, Cytokines, Immunology and Allergy, Cells, Cultured, Cell Proliferation, Cevanes

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::b6f0acea7acb50a0e5c9d95cf837ab4a
https://doi.org/10.1016/j.intimp.2022.109181

المؤلفون: Qi Sun, Huatao Yu, Canhui Zhan, Bei Yu, Tinghuan Chen, Changze Liu

المصدر: ASP-DAC

مصطلحات موضوعية: 010302 applied physics, Speedup, Computer science, Reliability (computer networking), Transistor, Multigraph, 02 engineering and technology, Integrated circuit, 01 natural sciences, 020202 computer hardware & architecture, law.invention, Computer engineering, law, 0103 physical sciences, 0202 electrical engineering, electronic engineering, information engineering, Graph (abstract data type), Node (circuits), Hot-carrier injection

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::b822be064ad20558045a9ff2930be9d2
https://doi.org/10.1145/3394885.3431546

المؤلفون: Yongsheng Sun, Weichun Luo, Changze Liu, Dan Gao, Zanfeng Chen, Yu Xia, Pengpeng Ren

المصدر: 2020 IEEE 15th International Conference on Solid-State & Integrated Circuit Technology (ICSICT).

مصطلحات موضوعية: Negative-bias temperature instability, business.industry, Computer science, Transistor, Electrical engineering, Time-dependent gate oxide breakdown, Circuit reliability, law.invention, Reliability (semiconductor), law, Shape optimization, Node (circuits), Static random-access memory, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::2c8865f10e0a9ebfa7151d6d572f4d81
https://doi.org/10.1109/icsict49897.2020.9278355

المؤلفون: Yu Xia, Yongsheng Sun, Pengpeng Ren, Zanfeng Chen, Changze Liu, Dan Gao, Weichun Luo

المصدر: 2020 4th IEEE Electron Devices Technology & Manufacturing Conference (EDTM).

مصطلحات موضوعية: Computer science, business.industry, Transistor, Electrical engineering, Time-dependent gate oxide breakdown, law.invention, Trap (computing), Reliability (semiconductor), law, Node (circuits), Shape optimization, Static random-access memory, business, Degradation (telecommunications)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::45aefb4aafc275468a1ad982ff304937
https://doi.org/10.1109/edtm47692.2020.9117822

المؤلفون: Yangyuan Wang, Pengpeng Ren, Runsheng Wang, Shaofeng Guo, Changze Liu, Xiaobo Jiang, Ru Huang, Mulong Luo

المصدر: Microelectronics Reliability. 81:101-111

مصطلحات موضوعية: 010302 applied physics, Digital electronics, Negative-bias temperature instability, Computer science, business.industry, Circuit design, 020207 software engineering, Hardware_PERFORMANCEANDRELIABILITY, 02 engineering and technology, Ring oscillator, Condensed Matter Physics, Circuit reliability, 01 natural sciences, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, Reliability (semiconductor), CMOS, 0103 physical sciences, 0202 electrical engineering, electronic engineering, information engineering, Electronic engineering, Electrical and Electronic Engineering, Safety, Risk, Reliability and Quality, business, Electronic circuit

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::ef863c92491d2f7b125346682bb079c3
https://doi.org/10.1016/j.microrel.2017.11.028

المؤلفون: Changze Liu, Yulin Feng, H. Z. Yang, Runze Han, P. Huang, K. L. Wang, Xiang Yachen, Jinfeng Kang, X. Y. Liu, Wensheng Shen

المصدر: 2019 IEEE International Electron Devices Meeting (IEDM).

مصطلحات موضوعية: Artificial neural network, Computer science, business.industry, 020208 electrical & electronic engineering, Word error rate, 02 engineering and technology, 021001 nanoscience & nanotechnology, Programming method, Flash (photography), Software, 0202 electrical engineering, electronic engineering, information engineering, Key (cryptography), Data retention, 0210 nano-technology, business, Simulation, Reliability (statistics)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::e956ef3263d4abfb3eefdc4b0d3ba9ab
https://doi.org/10.1109/iedm19573.2019.8993508

المؤلفون: Changze Liu, Fei Liu, P. Huang, Hangbing Lv, X. Y. Liu, Y. D. Zhao, X. X. Xu, Qing Luo, Jinfeng Kang

المصدر: 2018 IEEE International Electron Devices Meeting (IEDM).

مصطلحات موضوعية: 010302 applied physics, Materials science, Condensed matter physics, Dopant, chemistry.chemical_element, Electron, 01 natural sciences, Ferroelectricity, Oxygen, chemistry, Electric field, 0103 physical sciences, Density functional theory, Kinetic Monte Carlo, Polarization (electrochemistry)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::d923257cb17268676136b78f722481f4
https://doi.org/10.1109/iedm.2018.8614540

المؤلفون: Hong Wu, Xiang Yachen, Y. D. Zhao, Jinfeng Kang, Changze Liu, He Qian, Bin Gao, X. Y. Liu, P. Huang

المصدر: 2018 IEEE International Electron Devices Meeting (IEDM).

مصطلحات موضوعية: 010302 applied physics, Artificial neural network, Computer science, Analytic model, 02 engineering and technology, 021001 nanoscience & nanotechnology, Topology, 01 natural sciences, Instability, Resistive random-access memory, Reliability (semiconductor), Diffusion process, 0103 physical sciences, State (computer science), Diffusion (business), 0210 nano-technology

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::fd4af02f5cef856f2513568ff545f2ea
https://doi.org/10.1109/iedm.2018.8614567

المؤلفون: Changze Liu, Zhenghao Gan, Dan Gao, Canhui Zhan, Yu Xia, Waisum Wong, Pengpeng Ren, Zanfeng Chen

المصدر: 2018 14th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT).

مصطلحات موضوعية: Materials science, Reliability (semiconductor), Stress induced, Electronic engineering, Node (circuits), State (computer science), Device parameters, Device degradation, Electronic circuit, Degradation (telecommunications)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::abe3a4af4549bd2bd9045ac95b85714e
https://doi.org/10.1109/icsict.2018.8564811

المؤلفون: Yongsheng Sun, Sanping Wan, Waisum Wong, Canhui Zhan, Jiayang Zhang, Yu Xia, Ru Huang, Zhenghao Gan, Changze Liu, Nie Liu, Pengpeng Ren, Zhuoqing Yu, Runsheng Wang

المصدر: IRPS

مصطلحات موضوعية: Stress (mechanics), law, Circuit design, Transistor, Hardware_INTEGRATEDCIRCUITS, Electronic engineering, Pass gate, Hardware_PERFORMANCEANDRELIABILITY, Hardware_LOGICDESIGN, law.invention, Degradation (telecommunications)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::1fcc29aaf1311c5a573601b87bb2a315
https://doi.org/10.1109/irps.2018.8353656

المؤلفون: Peng Huang, Z. Q. Su, Runze Han, Zhen Dong, Changze Liu, Xiang Yachen, Yang Liu, Xiaoyan Liu, Jinfeng Kang, L. Liu

المصدر: ISCAS

مصطلحات موضوعية: 010302 applied physics, business.industry, Computer science, 020208 electrical & electronic engineering, Feature extraction, 02 engineering and technology, Energy consumption, Frame rate, 01 natural sciences, CMOS, Kernel (image processing), 0103 physical sciences, 0202 electrical engineering, electronic engineering, information engineering, business, Computer hardware, Efficient energy use

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::c7cd8277bed738e16088f576c067585a
https://doi.org/10.1109/iscas.2018.8351030

المؤلفون: Changze Liu, Runsheng Wang, Zhuoqing Yu, Ru Huang, Jiayang Zhang, Shaofeng Guo

المصدر: 2017 IEEE International Electron Devices Meeting (IEDM).

مصطلحات موضوعية: 010302 applied physics, Materials science, Analogue electronics, Circuit design, 020207 software engineering, 02 engineering and technology, Circuit reliability, 01 natural sciences, Trap (computing), Reliability (semiconductor), 0103 physical sciences, 0202 electrical engineering, electronic engineering, information engineering, Electronic engineering, Hot carrier degradation

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::64d6b4d701e9566d96b8e07f2c7590d1
https://doi.org/10.1109/iedm.2017.8268344

المؤلفون: P. Huang, L. F. Liu, Dongbin Zhu, Zhiping Zhou, X. Y. Liu, Jinfeng Kang, Changze Liu, Wensheng Shen, Zhen Dong, Hai Jiang

المصدر: 2017 IEEE International Electron Devices Meeting (IEDM).

مصطلحات موضوعية: 010302 applied physics, Materials science, business.industry, Monte Carlo method, Oxide, 02 engineering and technology, 021001 nanoscience & nanotechnology, 01 natural sciences, Oxygen vacancy, Characterization (materials science), Resistive random-access memory, Protein filament, chemistry.chemical_compound, Reliability (semiconductor), chemistry, Phase (matter), 0103 physical sciences, Optoelectronics, 0210 nano-technology, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::396d5cea0bc845a82ba85528654efd60
https://doi.org/10.1109/iedm.2017.8268435

المؤلفون: P. Huang, X. Y. Liu, Yuning Jiang, Jinfeng Kang, Zhen Dong, Changze Liu, Zhiping Zhou, Zefan Li, L. F. Liu

المصدر: 2017 Silicon Nanoelectronics Workshop (SNW).

مصطلحات موضوعية: 010302 applied physics, Quantification methods, business.industry, Computer science, Online learning, 020208 electrical & electronic engineering, Feature extraction, Binary number, Pattern recognition, 02 engineering and technology, 01 natural sciences, Convolutional neural network, Resistive random-access memory, Kernel (image processing), 0103 physical sciences, 0202 electrical engineering, electronic engineering, information engineering, Artificial intelligence, business, MNIST database

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::51e7b6fb3d412e72bb3e3401645663fd
https://doi.org/10.23919/snw.2017.8242339