المؤلفون: Ramdin, Daram N., Huang, Hsien-Lien, Chae, Christopher, Dhara, Sushovan, Rajan, Siddharth, Hwang, Jinwoo, Brillson, Leonard J.

المصدر: APL Materials; Oct2024, Vol. 12 Issue 10, p1-12, 12p

مصطلحات موضوعية: ENERGY dispersive X-ray spectroscopy, SCANNING transmission electron microscopy, SCHOTTKY barrier diodes, DIELECTRIC breakdown, ULTRAHIGH vacuum

المؤلفون: Lee, Joonbum, Choi, Wonjun, Kim, Dong-Hwan, McCurdy, Cameron, Chae, Christopher, Hwang, Jinwoo, Kim, Woo Kyun, Lee, Kichoon

المصدر: Scientific Reports; 8/20/2024, Vol. 14 Issue 1, p1-6, 6p

مصطلحات موضوعية: BACTERIAL adhesion, JAPANESE quail, CUTICLE, GENETIC mutation, SCANNING electron microscopes, GENETIC regulation

المؤلفون: Lee, Hyunsoo, McGlone, Joe F., Ifatur Rahman, Sheikh, Chae, Christopher, Joishi, Chandan, Hwang, Jinwoo, Rajan, Siddharth

المصدر: Physica Status Solidi - Rapid Research Letters; Aug2024, Vol. 18 Issue 8, p1-7, 7p

مصطلحات موضوعية: TWO-dimensional electron gas, ELECTRON density, STRAY currents, ALUMINUM oxide, TRANSISTORS

المؤلفون: Chae, Christopher, Lee, Hyunsoo, Dheenan, Ashok, Yang, Fengyuan, Rajan, Siddharth, Hwang, Jinwoo

المصدر: Microscopy & Microanalysis; 2024 Supplement, Vol. 30, p1-4, 4p

المؤلفون: Chae, Christopher, Zhu, Menglin, Huang, Hsien-Lien, Islam, Minhazul, Hwang, Jinwoo

المصدر: Microscopy & Microanalysis; 2024 Supplement, Vol. 30, p1-4, 4p

المؤلفون: Lee, Hyunsoo, McGlone, Joe F., Ifatur Rahman, Sheikh, Chae, Christopher, Joishi, Chandan, Hwang, Jinwoo, Rajan, Siddharth

المساهمون: Intel Corporation

المصدر: physica status solidi (RRL) – Rapid Research Letters ; volume 18, issue 8 ; ISSN 1862-6254 1862-6270

الاتاحة: http://dx.doi.org/10.1002/pssr.202400042
https://onlinelibrary.wiley.com/doi/pdf/10.1002/pssr.202400042

المؤلفون: Chae, Christopher, Zhu, Menglin, Huang, Hsien-Lien, Islam, Minhazul, Hwang, Jinwoo

المصدر: Microscopy and Microanalysis ; volume 30, issue Supplement_1 ; ISSN 1431-9276 1435-8115

الاتاحة: http://dx.doi.org/10.1093/mam/ozae044.068
https://academic.oup.com/mam/article-pdf/30/Supplement_1/ozae044.068/58670832/ozae044.068.pdf

المؤلفون: Chae, Christopher, Zhang, Kaitian, Ramdin, Daram, Vangipuram, Vijay Gopal Thirupakuzi, Brillson, Leonard J, Zhao, Hongping, Hwang, Jinwoo

المصدر: Microscopy and Microanalysis ; volume 30, issue Supplement_1 ; ISSN 1431-9276 1435-8115

الاتاحة: http://dx.doi.org/10.1093/mam/ozae044.529
https://academic.oup.com/mam/article-pdf/30/Supplement_1/ozae044.529/58671347/ozae044.529.pdf

المؤلفون: Chae, Christopher, Lee, Hyunsoo, Dheenan, Ashok, Yang, Fengyuan, Rajan, Siddharth, Hwang, Jinwoo

المصدر: Microscopy and Microanalysis ; volume 30, issue Supplement_1 ; ISSN 1431-9276 1435-8115

الاتاحة: http://dx.doi.org/10.1093/mam/ozae044.075
https://academic.oup.com/mam/article-pdf/30/Supplement_1/ozae044.075/58671707/ozae044.075.pdf

المؤلفون: Zhang, Kaitian, Thirupakuzi Vangipuram, Vijay Gopal, Chae, Christopher, Hwang, Jinwoo, Zhao, Hongping

المساهمون: AFOSR

المصدر: Applied Physics Letters ; volume 124, issue 12 ; ISSN 0003-6951 1077-3118

الاتاحة: http://dx.doi.org/10.1063/5.0200125
https://pubs.aip.org/aip/apl/article-pdf/doi/10.1063/5.0200125/19837084/122106_1_5.0200125.pdf

المؤلفون: Huang, Hsien-Lien¹ (AUTHOR) huang.3527@osu.edu, Chae, Christopher¹ (AUTHOR), Hwang, Jinwoo¹ (AUTHOR) hwang.458@osu.edu

المصدر: Journal of Applied Physics. 5/21/2022, Vol. 131 Issue 19, p1-17. 17p.

مصطلحات موضوعية: *POINT defects, *SCANNING transmission electron microscopy, *ELECTRON microscope techniques, *CRYSTAL growth, *GALLIUM

المؤلفون: Zhang, Kaitian, Thirupakuzi Vangipuram, Vijay Gopal, Chae, Christopher, Hwang, Jinwoo, Zhao, Hongping

المصدر: Applied Physics Letters; 3/18/2024, Vol. 124 Issue 12, p1-6, 6p

المؤلفون: Huang, Hsien-Lien, Chae, Christopher, Johnson, Jared M., Senckowski, Alexander, Sharma, Shivam, Singisetti, Uttam, Wong, Man Hoi, Hwang, Jinwoo

Relation: https://repository.hkust.edu.hk/ir/Record/1783.1-128078; Microscopy & Microanalysis, v. 29, (Supplement 1), August 2023, p. 1472-1473; https://doi.org/10.1093/micmic/ozad067.756; http://lbdiscover.ust.hk/uresolver?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rfr_id=info:sid/HKUST:SPI&rft.genre=article&rft.issn=&rft.volume=&rft.issue=&rft.date=2023&rft.spage=&rft.aulast=Huang&rft.aufirst=Hsien-Lien&rft.atitle=Atomic-level+insights+into+the+radiation+damage+and+recovery+of+%CE%B2-Ga2O3+for+high-performance+semiconductors&rft.title=; http://www.scopus.com/record/display.url?eid=2-s2.0-85168620810&origin=inward

الاتاحة: https://repository.hkust.edu.hk/ir/Record/1783.1-128078
https://doi.org/10.1093/micmic/ozad067.756
http://lbdiscover.ust.hk/uresolver?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rfr_id=info:sid/HKUST:SPI&rft.genre=article&rft.issn=&rft.volume=&rft.issue=&rft.date=2023&rft.spage=&rft.aulast=Huang&rft.aufirst=Hsien-Lien&rft.atitle=Atomic-level+insights+into+the+radiation+damage+and+recovery+of+%CE%B2-Ga2O3+for+high-performance+semiconductors&rft.title=
http://www.scopus.com/record/display.url?eid=2-s2.0-85168620810&origin=inward

المؤلفون: Zhang, Kaitian, Hu, Chenxi, Thirupakuzi Vangipuram, Vijay Gopal, Meng, Lingyu, Chae, Christopher, Zhu, Menglin, Hwang, Jinwoo, Kash, Kathleen, Zhao, Hongping

المصدر: Journal of Vacuum Science & Technology: Part B-Nanotechnology & Microelectronics; Dec2023, Vol. 41 Issue 6, p1-8, 8p

مصطلحات موضوعية: DISLOCATION density, OPACITY (Optics), INDIUM gallium nitride, QUANTUM wells, OPTICAL properties, GALLIUM nitride, SCREW dislocations

المؤلفون: Huang, Hsien-Lien, Johnson, Jared M., Chae, Christopher, Senckowski, Alexander, Wong, Man Hoi, Hwang, Jinwoo

Relation: https://repository.hkust.edu.hk/ir/Record/1783.1-127269; Applied Physics Letters, v. 122, (25), June 2023, article number 251602; https://doi.org/10.1063/5.0156009; http://lbdiscover.ust.hk/uresolver?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rfr_id=info:sid/HKUST:SPI&rft.genre=article&rft.issn=&rft.volume=122&rft.issue=25&rft.date=2023&rft.spage=&rft.aulast=Huang&rft.aufirst=Hsien-Lien&rft.atitle=Atomic+scale+mechanism+of+%CE%B2+to+%CE%B3+phase+transformation+in+gallium+oxide&rft.title=Applied+Physics+Letters; http://www.scopus.com/record/display.url?eid=2-s2.0-85163155908&origin=inward; http://gateway.isiknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=LinksAMR&SrcApp=PARTNER_APP&DestLinkType=FullRecord&DestApp=WOS&KeyUT=001015340700004; https://repository.hkust.edu.hk/ir/bitstream/1783.1-127269/1/049374_1.pdf

الاتاحة: https://repository.hkust.edu.hk/ir/Record/1783.1-127269
https://doi.org/10.1063/5.0156009
http://lbdiscover.ust.hk/uresolver?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rfr_id=info:sid/HKUST:SPI&rft.genre=article&rft.issn=&rft.volume=122&rft.issue=25&rft.date=2023&rft.spage=&rft.aulast=Huang&rft.aufirst=Hsien-Lien&rft.atitle=Atomic+scale+mechanism+of+%CE%B2+to+%CE%B3+phase+transformation+in+gallium+oxide&rft.title=Applied+Physics+Letters
http://www.scopus.com/record/display.url?eid=2-s2.0-85163155908&origin=inward
http://gateway.isiknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=LinksAMR&SrcApp=PARTNER_APP&DestLinkType=FullRecord&DestApp=WOS&KeyUT=001015340700004
https://repository.hkust.edu.hk/ir/bitstream/1783.1-127269/1/049374_1.pdf

المؤلفون: Huang, Hsien-Lien, Chae, Christopher, Johnson, Jared M., Senckowski, Alexander, Sharma, Shivam, Singisetti, Uttam, Wong, Man Hoi, Hwang, Jinwoo

Relation: https://repository.hkust.edu.hk/ir/Record/1783.1-127268; APL Materials, v. 11, (6), June 2023, article number 061113; https://doi.org/10.1063/5.0134467; http://lbdiscover.ust.hk/uresolver?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rfr_id=info:sid/HKUST:SPI&rft.genre=article&rft.issn=&rft.volume=11&rft.issue=6&rft.date=2023&rft.spage=&rft.aulast=Huang&rft.aufirst=Hsien-Lien&rft.atitle=Atomic+scale+defect+formation+and+phase+transformation+in+Si+implanted+%CE%B2-Ga2O3&rft.title=APL+Materials; http://www.scopus.com/record/display.url?eid=2-s2.0-85161682752&origin=inward; http://gateway.isiknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=LinksAMR&SrcApp=PARTNER_APP&DestLinkType=FullRecord&DestApp=WOS&KeyUT=001003016200004; https://repository.hkust.edu.hk/ir/bitstream/1783.1-127268/1/049373_1.pdf

الاتاحة: https://repository.hkust.edu.hk/ir/Record/1783.1-127268
https://doi.org/10.1063/5.0134467
http://lbdiscover.ust.hk/uresolver?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rfr_id=info:sid/HKUST:SPI&rft.genre=article&rft.issn=&rft.volume=11&rft.issue=6&rft.date=2023&rft.spage=&rft.aulast=Huang&rft.aufirst=Hsien-Lien&rft.atitle=Atomic+scale+defect+formation+and+phase+transformation+in+Si+implanted+%CE%B2-Ga2O3&rft.title=APL+Materials
http://www.scopus.com/record/display.url?eid=2-s2.0-85161682752&origin=inward
http://gateway.isiknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=LinksAMR&SrcApp=PARTNER_APP&DestLinkType=FullRecord&DestApp=WOS&KeyUT=001003016200004
https://repository.hkust.edu.hk/ir/bitstream/1783.1-127268/1/049373_1.pdf

المؤلفون: Bhuiyan, A F M Anhar Uddin, Meng, Lingyu, Huang, Hsien-Lien, Chae, Christopher, Hwang, Jinwoo, Zhao, Hongping

المساهمون: Air Force Office of Scientific Research, National Science Foundation

المصدر: physica status solidi (RRL) – Rapid Research Letters ; volume 17, issue 10 ; ISSN 1862-6254 1862-6270

الاتاحة: http://dx.doi.org/10.1002/pssr.202300224
https://onlinelibrary.wiley.com/doi/am-pdf/10.1002/pssr.202300224
https://onlinelibrary.wiley.com/doi/pdf/10.1002/pssr.202300224

المؤلفون: Huang, Hsien-Lien, Chae, Christopher, Senckowski, Alexander, Wong, Man Hoi, Hwang, Jinwoo

Relation: https://repository.hkust.edu.hk/ir/Record/1783.1-120794; http://lbdiscover.ust.hk/uresolver?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rfr_id=info:sid/HKUST:SPI&rft.genre=article&rft.issn=&rft.volume=&rft.issue=&rft.date=2022&rft.spage=&rft.aulast=Huang&rft.aufirst=H.-L.&rft.atitle=Atomic+scale+investigation+of+point+and+extended+defects+in+ion+implanted+%CE%B2-Ga%3Csub%3E2%3C%2Fsub%3EO%3Csub%3E3%3C%2Fsub%3E&rft.title=

الاتاحة: https://repository.hkust.edu.hk/ir/Record/1783.1-120794
http://lbdiscover.ust.hk/uresolver?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rfr_id=info:sid/HKUST:SPI&rft.genre=article&rft.issn=&rft.volume=&rft.issue=&rft.date=2022&rft.spage=&rft.aulast=Huang&rft.aufirst=H.-L.&rft.atitle=Atomic+scale+investigation+of+point+and+extended+defects+in+ion+implanted+%CE%B2-Ga%3Csub%3E2%3C%2Fsub%3EO%3Csub%3E3%3C%2Fsub%3E&rft.title=

المؤلفون: Bhuiyan, A F M Anhar Uddin, Meng, Lingyu, Huang, Hsien-Lien, Chae, Christopher, Hwang, Jinwoo, Zhao, Hongping

المصدر: Physica Status Solidi - Rapid Research Letters; Oct2023, Vol. 17 Issue 10, p1-16, 16p

مصطلحات موضوعية: SCANNING transmission electron microscopy, CHEMICAL vapor deposition, THIN films, X-ray diffraction

المؤلفون: Huang, Hsien-Lien, Chae, Christopher, Johnson, Jared M., Senckowski, Alexander, Sharma, Shivam, Singisetti, Uttam, Wong, Man Hoi, Hwang, Jinwoo

المصدر: APL Materials; Jun2023, Vol. 11 Issue 6, p1-12, 12p

مصطلحات موضوعية: PHASE transitions, SCANNING transmission electron microscopy, SCREW dislocations, RUTHERFORD backscattering spectrometry, POINT defects, SECONDARY ion mass spectrometry