المؤلفون: Park, Kyungchul, Hwang, Sungmin, Chang, Jeesoo, Min, Kyungkyu, Jang, Taejin, Jeon, Bosung, Cha, Youngsan, Lee, Jong-Ho, Park, Byung-Gook

المساهمون: Park, Byung-Gook

Relation: 2021 SILICON NANOELECTRONICS WORKSHOP (SNW), pp.67-68; https://hdl.handle.net/10371/186459; 000712433900034; 2-s2.0-85124874768; 172259

الاتاحة: https://hdl.handle.net/10371/186459

المؤلفون: Cha, Youngsan, Park, Kyungchul, Lee, Jong-Ho, Park, Byung-Gook

المساهمون: Samsung, Seoul National University

المصدر: Solid-State Electronics ; volume 197, page 108435 ; ISSN 0038-1101

الاتاحة: http://dx.doi.org/10.1016/j.sse.2022.108435
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