يعرض 1 - 20 نتائج من 39 نتيجة بحث عن '"Ceuninck, W. De"', وقت الاستعلام: 0.74s تنقيح النتائج
  1. 1
    Academic Journal
    A simple method of calculating an energy spectrum from isothermal measurements, using Fourier techniques

    المؤلفون: Knuyt, G., Stulens, H., Ceuninck, W. De, Bex, G. J., Stals, L. M.

    المصدر: Philosophical Magazine B ; volume 65, issue 5, page 1053-1065 ; ISSN 1364-2812 1463-6417

    الاتاحة: http://dx.doi.org/10.1080/13642819208217920
    https://www.tandfonline.com/doi/pdf/10.1080/13642819208217920

    View record in BASE

    أضف إلى المفضلة
  2. 2
    Academic Journal
    Improving the sensitivity of the heat‐transfer method (HTM) for cancer cell detection with optimized sensor chips

    المؤلفون: Eersels, K., van Grinsven, B., Vandenryt, T., Jiménez‐Monroy, K. L., Peeters, M., Somers, V., Püttmann, C., Stein, C., Barth, S., Bos, G. M. J., Germeraad, W. T. V., Diliën, H., Cleij, T. J., Thoelen, R., Ceuninck, W. De, Wagner, P.

    المصدر: physica status solidi (a) ; volume 212, issue 6, page 1320-1326 ; ISSN 1862-6300 1862-6319

    الاتاحة: http://dx.doi.org/10.1002/pssa.201431709
    https://api.wiley.com/onlinelibrary/tdm/v1/articles/10.1002%2Fpssa.201431709
    https://onlinelibrary.wiley.com/doi/pdf/10.1002/pssa.201431709

    View record in BASE

    أضف إلى المفضلة
  3. 3
    Academic Journal
    Heat-Transfer Resistance Measurement Method (HTM)-Based Cell Detection at Trace Levels Using a Progressive Enrichment Approach with Highly Selective Cell-Binding Surface Imprints

    المؤلفون: Bers, K., Eersels, K., Grinsven, B. van, Daemen, M., Bogie, J.F.J., Hendriks, J.J.A., Bouwmans, E.E., Püttmann, C., Stein, C., Barth, S., Bos, G.M.J., Germeraad, W.T.V., Ceuninck, W. de, Wagner, P.

    Time: 540, 571, 572

    Relation: Langmuir. The ACS journal of surfaces and colloids; https://publica.fraunhofer.de/handle/publica/238819

    الاتاحة: https://publica.fraunhofer.de/handle/publica/238819
    https://doi.org/10.1021/la5001232

    View record in BASE

    أضف إلى المفضلة
  4. 4
    Academic Journal
    Combining electrochemical impedance spectroscopy and surface plasmon resonance into one simultaneous read-out system for the detection of surface interactions

    المؤلفون: Vandenryt, T., Pohl, A., Grinsven, B. van, Thoelen, R., Ceuninck, W. de, Wagner, P., Opitz, J.

    Time: 547

    Relation: Sensors. Online journal; https://publica.fraunhofer.de/handle/publica/234470

    الاتاحة: https://publica.fraunhofer.de/handle/publica/234470
    https://doi.org/10.3390/s131114650

    View record in BASE

    أضف إلى المفضلة
  5. 5
    Academic Journal
    Electronic monitoring of chemical DNA denaturation on nanocrystalline diamond electrodes with different molarities and flow rates

    المؤلفون: Murib, M. S., van Grinsven, B., Grieten, L., Janssens, S. D., Vermeeren, V., Eersels, K., Broeders, J., Ameloot, M., Michiels, L., Ceuninck, W. De, Haenen, K., Schöning, M. J., Wagner, P.

    المساهمون: Life-Science Initiative of the Province of Limburg and the Research Foundation Flanders FWO

    المصدر: physica status solidi (a) ; volume 210, issue 5, page 911-917 ; ISSN 1862-6300 1862-6319

    الاتاحة: http://dx.doi.org/10.1002/pssa.201200934
    https://api.wiley.com/onlinelibrary/tdm/v1/articles/10.1002%2Fpssa.201200934
    https://onlinelibrary.wiley.com/doi/pdf/10.1002/pssa.201200934

    View record in BASE

    أضف إلى المفضلة
  6. 6
    Academic Journal
    Derivation of an activation energy spectrum for defect processes from isothermal measurements, using a minimization principle and Fourier analysis

    المؤلفون: Knuyt, G, Stulens, H, Ceuninck, W De, Stals, L M

    المصدر: Modelling and Simulation in Materials Science and Engineering ; volume 1, issue 4, page 437-448 ; ISSN 0965-0393 1361-651X

    الاتاحة: http://dx.doi.org/10.1088/0965-0393/1/4/007

    View record in BASE

    أضف إلى المفضلة
  7. 7
    Periodical
    Electronic monitoring of chemical DNAdenaturation on nanocrystalline diamond electrodes with different molarities and flow rates

    المؤلفون: Murib, M. S., van Grinsven, B., Grieten, L., Janssens, S. D., Vermeeren, V., Eersels, K., Broeders, J., Ameloot, M., Michiels, L., Ceuninck, W. De, Haenen, K., Schöning, M. J., Wagner, P.

    المصدر: Physica Status Solidi (A) - Applications and Materials Science; May 2013, Vol. 210 Issue: 5 p911-917, 7p


    أضف إلى المفضلة
  8. 8
    Academic Journal
    ACCELERATED AGEING WITH IN SITU ELECTRICAL TESTING: A POWERFUL TOOL FOR THE BUILDING-IN APPROACH TO QUALITY AND RELIABILITY IN ELECTRONICS.

    المؤلفون: Schepper, L. De1, Ceuninck, W. De1, Lekens, G.1, Stals, L.1, Vanhecke, B.2, Roggen, J.2, Beyne, E.2, Tielemans, L.3

    المصدر: Quality & Reliability Engineering International. Jan/Feb94, Vol. 10 Issue 1, p15-26. 12p.

    مصطلحات موضوعية: *TESTING, *QUALITY, *ELECTRONICS, *RELIABILITY in engineering, *MATHEMATICAL optimization, *MAINTAINABILITY (Engineering)


    أضف إلى المفضلة
  9. 9
    Periodical
    A comparison between state-of-the-art `gilch` and `sulphinyl` synthesised MDMO-PPV/PCBM bulk hetero-junction solar cells

    المؤلفون: Munters, T., Martens, T., Goris, L., Vrindts, V., Manca, J., Lutsen, L., Ceuninck, W. De, Vanderzande, D., Schepper, L. De, Gelan, J.

    المصدر: Thin Solid Films; 2002, Vol. 403 Issue: 1 p247-251, 5p


    أضف إلى المفضلة
  10. 10
    Periodical
    High-resolution in-situ of gold electromigration: test time reduction

    المؤلفون: Croes, K., Dreesen, R., Manca, J., Ceuninck, W. De, Schepper, L. De, Tielemans, L., Wel, P. van Der

    المصدر: Microelectronics Reliability; 2001, Vol. 41 p1439-1442, 4p


    أضف إلى المفضلة
  11. 11
    Periodical
    Determination of the thermal resistance and current exponent of heterojunction bipolar transistors for reliability evaluation

    المؤلفون: Petersen, R., Ceuninck, W. De, Schepper, L. De, Vendier, O., Blanck, H., Pons, D.

    المصدر: Microelectronics Reliability; 2001, Vol. 41 p1591-1596, 6p


    أضف إلى المفضلة
  12. 12
    Periodical
    A new degradation model and lifetime extrapolation technique for lightly doped drain nMOSFETs under hot-carrier degradation

    المؤلفون: Dreesen, R., Croes, K., Manca, J., Ceuninck, W. De, Schepper, L. De, Pergoot, A., Groeseneken, G.

    المصدر: Microelectronics Reliability; 2001, Vol. 41 Issue: 3 p437-443, 7p


    أضف إلى المفضلة
  13. 13
    Heat-transfer-based detection of L-nicotine, histamine, and serotonin using molecularly imprinted polymers as biomimetic receptors

    المؤلفون: Peeters, Marloes, Gruber, Jonas, Ceuninck, W. de, Cleij, T. J, Troost, F. J, Wagner, P, Csipai, P, Geerets, B, Weustenraed, A, Grinsven, B. Van

    مصطلحات موضوعية: RECEPTORES, ESPECTROSCOPIA

    Relation: http://dx.doi.org/10.1007/s00216-013-7024-9

    الاتاحة: https://doi.org/10.1007/s00216-013-7024-9

    View record in BASE

    أضف إلى المفضلة
  14. 14
    Periodical
    Modelling hot-carrier degradation of LDD NMOSFETs by using a high-resolution measurement technique

    المؤلفون: Dreesen, R., Croes, K., Manca, J., Ceuninck, W. De, Schepper, L. De, Pergoot, A., Groeseneken, G.

    المصدر: Microelectronics Reliability; 1999, Vol. 39 Issue: 6 p785-790, 6p


    أضف إلى المفضلة
  15. 15
    Periodical
    High electrical resistivity of CVD-diamond

    المؤلفون: Manca, J.V., Nesladek, M., Neelen, M., Quaeyhaegens, C., Schepper, L. De, Ceuninck, W. De

    المصدر: Microelectronics Reliability; 1999, Vol. 39 Issue: 2 p269-273, 5p


    أضف إلى المفضلة
  16. 16
    Periodical
    The kinetics of the early stages of electromigration and concurrent temperature induced processes in thin film metallisations studied by means of an in-situ high resolution resistometric technique

    المؤلفون: Olmen, J. Van, Manca, J.V., Ceuninck, W. De, Schepper, L. De, D'Haeger, V., Witvrouw, A., Maex, K., Vandevelde, B., Beyne, E., Tielemans, L.

    المصدر: Microelectronics Reliability; 1999, Vol. 39 Issue: 11 p1657-1665, 9p


    أضف إلى المفضلة
  17. 17
    Periodical
    Dynamics of electromigration induced void/hillock growth and precipitation/dissolution of addition elements studied by in-situ scanning electron microscopy resistance measurements

    المؤلفون: D'Haen, J., Cosemans, P., Manca, J.V., Lekens, G., Martens, T., Ceuninck, W. De, D'Olieslaeger, M., Schepper, L. De, Maex, K.

    المصدر: Microelectronics Reliability; 1999, Vol. 39 Issue: 11 p1617-1630, 14p


    أضف إلى المفضلة
  18. 18
    Periodical
    The dependence of stress induced voiding on line width studied by conventional and high resolution resistance measurements

    المؤلفون: Witvrouw, A., Maex, K., Ceuninck, W. De, Lekens, G., D'Haen, J., Schepper, L. De

    المصدر: Microelectronics Reliability; 1998, Vol. 38 Issue: 6 p1035-1040, 6p


    أضف إلى المفضلة
  19. 19
    Periodical
    Overview of the kinetics of the early stages of electromigration under low (= realistic) current density stress

    المؤلفون: Olmen, J. Van, Manca, J. V., Ceuninck, W. De, Schepper, L. De, D'Haeger, V., Witvrouw, A., Maex, K.

    المصدر: Microelectronics Reliability; 1998, Vol. 38 Issue: 6 p1009-1014, 6p


    أضف إلى المفضلة
  20. 20
    Periodical
    The time of guessing your failure time distribution is over?

    المؤلفون: Croes, K., Manca, J. V., Ceuninck, W. De, Schepper, L. De, Molenberghs, G.

    المصدر: Microelectronics Reliability; 1998, Vol. 38 Issue: 6 p1187-1192, 6p


    أضف إلى المفضلة
أدوات البحث: أحصل على تغذية RSS – أرسل هذا البحث بالبريد الإلكتروني – حفظ البحث – جدول التنبيهات: لا شيء