-
1Academic Journal
المؤلفون: Im, Ki-Sik, Atmaca, Gokhan, Won, Chul-Ho, Caulmilone, Raphael, Cristoloveanu, Sorin, Kim, Yong-Tae, Lee, Jung-Hee
المصدر: IEEE JOURNAL OF THE ELECTRON DEVICES SOCIETY 6(1) 354-359
Relation: https://aperta.ulakbim.gov.tr/record/110700; oai:zenodo.org:110700
-
2Academic Journal
المؤلفون: Mallem, Siva Pratap Reddy, Im, Ki-Sik, Thingujam, Terirama, Lee, Jung-Hee, Caulmilone, Raphael, Cristoloveanu, Sorin
المصدر: Electronic Materials Letters ; volume 16, issue 5, page 433-440 ; ISSN 1738-8090 2093-6788
-
3Academic Journal
المؤلفون: Im, Ki-Sik, Reddy, M. Siva Pratap, Caulmilone, Raphaël, Theodorou, Christoforos, Ghibaudo, Gérard, Cristoloveanu, Sorin, Lee, Jung-Hee
المساهمون: Kumoh National Institute of Technology Gyeongsangbuk-do, Kyungpook National University Daegu (KNU), Silicon-on-Insulator Technologies (SOITEC), Parc Technologique des Fontaines, Institut de Microélectronique, Electromagnétisme et Photonique - Laboratoire d'Hyperfréquences et Caractérisation (IMEP-LAHC), Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP)-Université Savoie Mont Blanc (USMB Université de Savoie Université de Chambéry )-Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes 2016-2019 (UGA 2016-2019 ), National Research Foundation of Korea Grant funded by the KoreaGovernment (MSIP) under Grant NRF-2018R1A6A1A03025761 andGrant 2013R1A6A3A04057719
المصدر: ISSN: 0018-9383 ; IEEE Transactions on Electron Devices ; https://hal.science/hal-02047570 ; IEEE Transactions on Electron Devices, 2019, 66 (3), pp.1243 - 1248. ⟨10.1109/TED.2019.2894806⟩.
مصطلحات موضوعية: 2-D electron gas (2-DEG), AlGaN/GaN, carrier number fluctuation (CNF), correlated mobility fluctuation (CMF), gate-all-around (GAA), low-frequency noise (LFN), nanowire, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, [SPI.TRON]Engineering Sciences [physics]/Electronics
-
4Conference
المؤلفون: Im, Ki-Sik, Kim, Jeong-Gil, Vodapally, Sindhuri, Caulmilone, Raphaël, Cristoloveanu, Sorin, Lee, Jung-Hee
المساهمون: Kyungpook National University Daegu (KNU), Silicon-on-Insulator Technologies (SOITEC), Parc Technologique des Fontaines, Institut de Microélectronique, Electromagnétisme et Photonique - Laboratoire d'Hyperfréquences et Caractérisation (IMEP-LAHC), Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP)-Université Savoie Mont Blanc (USMB Université de Savoie Université de Chambéry )-Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes 2016-2019 (UGA 2016-2019 )
المصدر: 20th International Conference on Insulating Films on Semiconductors (INFOS 2017)
https://hal.science/hal-02071672
20th International Conference on Insulating Films on Semiconductors (INFOS 2017), Jun 2017, Potsdam, Germanyمصطلحات موضوعية: Frequency dispersion, GaN-on-insulator (GaNOI), C-V characteristics, Interface trap density, TMAH surface treatment, GaN, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics
الاتاحة: https://hal.science/hal-02071672
-
5Academic Journal
المساهمون: Kyungpook National University Daegu (KNU), Silicon-on-Insulator Technologies (SOITEC), Parc Technologique des Fontaines, Institut de Microélectronique, Electromagnétisme et Photonique - Laboratoire d'Hyperfréquences et Caractérisation (IMEP-LAHC), Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP)-Université Savoie Mont Blanc (USMB Université de Savoie Université de Chambéry )-Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes 2016-2019 (UGA 2016-2019 )
المصدر: ISSN: 1862-6300.
-
6Conference
المؤلفون: Iwinska, Malgorzata, Amilusik, Mikolaj, Fijalkowski, Michal, Sochacki, Tomasz, Lucznik, Boleslaw, Grzanka, Ewa, Litwin-Staszewska, Elzbieta, Nowakowska-Siwinska, Anna, Grzegory, Izabella, Guiot, Eric, Caulmilone, Raphael, Seiss, Martin, Mrotzek, Tobias, Bockowski, Michal
المساهمون: Chyi, Jen-Inn, Fujioka, Hiroshi, Morkoç, Hadis, Nanishi, Yasushi, Schwarz, Ulrich T., Shim, Jong-In
المصدر: SPIE Proceedings ; Gallium Nitride Materials and Devices XI ; ISSN 0277-786X
الاتاحة: http://dx.doi.org/10.1117/12.2208854
-
7Academic Journal
المؤلفون: Im, Ki-Sik, Won, Chul-Ho, Vodapally, Sindhuri, Caulmilone, Raphaël, Cristoloveanu, Sorin, Kim, Yong-Tae, Lee, Jung-Hee
المساهمون: Kyungpook National University Daegu (KNU), Silicon-on-Insulator Technologies (SOITEC), Parc Technologique des Fontaines, Institut de Microélectronique, Electromagnétisme et Photonique - Laboratoire d'Hyperfréquences et Caractérisation (IMEP-LAHC), Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP)-Université Savoie Mont Blanc (USMB Université de Savoie Université de Chambéry )-Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes 2016-2019 (UGA 2016-2019 ), Korea Advanced Institute of Science and Technology (KAIST)
المصدر: ISSN: 0003-6951.
-
8Periodical
المؤلفون: Huynh, Kenny, Liao, Michael Evan, Yan, Xingxu, Tomko, John, Pfeifer, Thomas, Dragoi, Viorel, Razek, Nasser, Guiot, Eric, Caulmilone, Raphael, Pan, Xiaoqing, Hopkins, Patrick E, Goorsky, Mark S.
المصدر: ECS Meeting Abstracts; 2023, Vol. MA2023-02 Issue 1, p1605-1605, 1p
-
9Periodical
المؤلفون: Dragoi, Viorel, Razek, Nasser, Guiot, Eric, Caulmilone, Raphael, Liao, Michael, Steven, Yekan, Goorsky, Mark S., Yates, Luke, Graham, Samuel
المصدر: ECS Transactions; July 2018, Vol. 86 Issue: 5 p23-29, 7p
-
10Periodical
المؤلفون: Chyi, Jen-Inn, Fujioka, Hiroshi, Morkoç, Hadis, Nanishi, Yasushi, Schwarz, Ulrich T., Shim, Jong-In, Iwinska, Malgorzata, Amilusik, Mikolaj, Fijalkowski, Michal, Sochacki, Tomasz, Lucznik, Boleslaw, Grzanka, Ewa, Litwin-Staszewska, Elzbieta, Nowakowska-Siwinska, Anna, Grzegory, Izabella, Guiot, Eric, Caulmilone, Raphael, Seiss, Martin, Mrotzek, Tobias, Bockowski, Michal
المصدر: Proceedings of SPIE; February 2016, Vol. 9748 Issue: 1 p974809-974809-9