-
1Conference
المؤلفون: Ganguly, J., Arimura, H., Ritzenthaler, R., Bana, H., Maes, J. W., Lai, J. G., Brus, S., Maqsood, W., Sarkar, R., Kannan, B., Capogreco, E., Machkaoutsan, V., Yoon, S., Spessot, A., Givens, M., Horiguchi, N.
المصدر: 2024 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) ; page 1-2
-
2Conference
المؤلفون: Bastos, J. P., O'Sullivan, B. J., Higashi, Y., Chasin, A., Franco, J., Arimura, H., Ganguly, J., Capogreco, E., Spessot, A., Horiguchi, N.
المصدر: 2024 IEEE International Reliability Physics Symposium (IRPS)
-
3Academic Journal
المؤلفون: Spessot, A., Matagne, P., Arimura, H., Ganguly, J., Ritzenthaler, R., Bastos, J., Sarkar, R., Capogreco, E., Chen, Y., Horiguchi, N.
المصدر: Japanese Journal of Applied Physics ; volume 63, issue 3, page 03SP12 ; ISSN 0021-4922 1347-4065
-
4Conference
المؤلفون: Bastos, J. P., O'Sullivan, B. J., Franco, J., Tyaginov, S., Truijen, B., Chasin, A., Degraeve, R., Kaczer, B., Ritzenthaler, R., Capogreco, E., Litta, E. D., Spessot, A., Higashi, Y., Yoon, Y., Machkaoutsan, V., Fazan, P., Horiguchi, N.
المصدر: 2022 IEEE International Reliability Physics Symposium (IRPS)
-
5Conference
المؤلفون: Subramanian, S., Hosseini, M., Chiarella, T., Sarkar, S., Schuddinck, P., Chan, B. T., Radisic, D., Mannaert, G., Hikavyy, A., Rosseel, E., Sebaai, F., Peter, A., Hopf, T., Morin, P., Wang, S., Devriendt, K., Batuk, D., Martinez, G. T., Veloso, A., Litta, E. Dentoni, Baudot, S., Siew, Y. K., Zhou, X., Briggs, B., Capogreco, E., Hung, J., Koret, R., Spessot, A., Ryckaert, J., Demuynck, S., Horiguchi, N., Boemmels, J.
المصدر: 2020 IEEE Symposium on VLSI Technology
-
6Conference
المؤلفون: Arimura, H., Wostyn, K., Ragnarsson, L.-A., Capogreco, E., Chasin, A., Conard, T., Brus, S., Favia, P., Franco, J., Mitard, J., Demuynck, S., Horiguchi, N.
المصدر: 2019 IEEE International Electron Devices Meeting (IEDM)
-
7Conference
المؤلفون: Mitard, J., Jang, D., Eneman, G., Arimura, H., Parvais, B., Richard, O., Van Marcke, P., Witters, L., Capogreco, E., Bender, H., Ritzenthaler, R., Mertens, H., Hikavyy, A., Loo, R., Dekkers, H., Sebaai, F., Milenin, A., Horiguchi, N., Mocuta, A., Mocuta, D., Collaert, N.
المصدر: 2018 IEEE Symposium on VLSI Technology
-
8Academic Journal
المؤلفون: Favia, P, Richard, O, Eneman, G, Mertens, H, Arimura, H, Capogreco, E, Hikavyy, A, Witters, L, Kundu, P, Loo, R, Vancoille, E, Bender, H
المصدر: Semiconductor Science and Technology ; volume 34, issue 12, page 124003 ; ISSN 0268-1242 1361-6641
-
9Periodical
المؤلفون: Bannister, Julie, Mohanty, Nihar, Gupta, A., Tao, Z., Radisic, D., Mertens, H., Pedreira, O. Varela, Demuynck, S., Bömmels, J., Devriendt, K., Heylen, N., Wang, S., Kenis, K., Teugels, L., Sebaai, F., Lorant, C., Jourdan, N., Chan, B. T., Subramanian, S., Schleicher, F., Peter, A., Rassoul, N., Siew, Y., Briggs, B., Zhou, D., Rosseel, E., Capogreco, E., Mannaert, G., Sepúlveda, A., Dupuy, E., Vandersmissen, K., Chehab, B., Murdoch, G., Altamirano Sanchez, E., Biesemans, S., Tőkei, Zs., Litta, E. Dentoni, Horiguchi, N.
المصدر: Proceedings of SPIE; May 2022, Vol. 12056 Issue: 1 p120560B-120560B-5, 1085046p
-
10Academic Journal
المؤلفون: Capogreco, E., Witters, L., Arimura, H., Sebaai, F., Porret, C., Hikavyy, A., Loo, R., Milenin, A. P., Eneman, G., Favia, P., Bender, H., Wostyn, K., Dentoni Litta, E., Schulze, A., Vrancken, C., Opdebeeck, A., Mitard, J., Langer, R., Holsteyns, F., Waldron, N., Barla, K., De Heyn, V., Mocuta, D., Collaert, N.
المساهمون: imec
المصدر: IEEE Transactions on Electron Devices ; volume 65, issue 11, page 5145-5150 ; ISSN 0018-9383 1557-9646
-
11Conference
المؤلفون: Celano, U., Capogreco, E., Lisoni, J.G., Arreghini, A., Kunert, B., Guo, W., Van den Bosch, G., Van Houdt, J., De Meyer, K., Furnemont, A., Vandervorst, W.
المصدر: 2016 IEEE Symposium on VLSI Technology ; page 1-2
-
12Conference
المؤلفون: Lisoni, J. G., Arreghini, A., Congedo, G., Toledano-Luque, M., Toque-Tresonne, I., Huet, K., Capogreco, E., Liu, L., Tan, C.-L., Degraeve, R., Van den bosch, G., Van Houdt, J.
المصدر: 2014 Symposium on VLSI Technology (VLSI-Technology): Digest of Technical Papers ; page 1-2
-
13Conference
المؤلفون: Congedo, G., Arreghini, A., Liu, L., Capogreco, E., Lisoni, J. G., Huet, K., Toque-Tresonne, I., Van Aerde, S., Toledano-Luque, M., Tan, C.-L., Van den bosch, G., Van Houdt, J.
المصدر: 2014 IEEE 6th International Memory Workshop (IMW) ; page 1-4
-
14Conference
المؤلفون: Degraeve, R., Toledano-Luque, M., Arreghini, A., Tang, B., Capogreco, E., Lisoni, J., Roussel, Ph., Kaczer, B., Van den bosch, G., Groeseneken, G., Van Houdt, J.
المصدر: 2013 IEEE International Electron Devices Meeting
-
15Conference
المؤلفون: Collaert, N., Alian, A., De Jaeger, B., Peralagu, U., Vais, A., Walke, A., Witters, L., Yua, H., Capogreco, E., Devriendt, K., Hopf, T., Kenis, K., Mannaert, G., Milenin, A., Peter, A., Sebaai, F., Teugels, L., Van Dorp, D., Wostyn, K., Horiguchi, N.
المصدر: Proceedings of SPIE; 2/16/2019, Vol. 10984, p1-9, 9p
-
16Academic Journal
المؤلفون: Capogreco, E.1, Subirats, A.1, Lisoni, J. G.2, Arreghini, A.1, Kunert, B.1, Guo, W.1, Tan, C.-L.1, Delhougne, R.1, Van den bosch, G.1, De Meyer, K.1, Furnemont, A.1, Van Houdt, J.1
المصدر: IEEE Transactions on Electron Devices. Jan2017, Vol. 64 Issue 1, p130-136. 7p.
مصطلحات موضوعية: POLYCRYSTALLINE silicon, ELECTRICAL conductors, SEMICONDUCTOR devices, ELECTRIC conductivity, SEMICONDUCTORS, TRANSISTORS
-
17Periodical
المؤلفون: Wise, Richard S., Labelle, Catherine B., Collaert, N., Alian, A., De Jaeger, B., Peralagu, U., Vais, A., Walke, A., Witters, L., Yu, H., Capogreco, E., Devriendt, K., Hopf, T., Kenis, K., Mannaert, G., Milenin, A., Peter, A., Sebaai, F., Teugels, L., van Dorp, D., Wostyn, K., Horiguchi, N., Waldron, N.
المصدر: Proceedings of SPIE; March 2019, Vol. 10963 Issue: 1 p1096305-1096305-9
-
18Conference
المؤلفون: Capogreco, E., Lisoni, J. G., Arreghini, A., Subirats, A., Kunert, B., Guo, W., Maurice, T., Tan, C.-L., Degraeve, R., De Meyer, K., Van den bosch, G., Van Houdt, J.
المصدر: 2015 IEEE International Electron Devices Meeting (IEDM); 1/1/2015, p1-3.1.4, 0p