المؤلفون: Garba-Seybou, Tidjani, Federspiel, Xavier, Monsieur, Frederic, Sicre, Mathieu, Cacho, Florian, Hai, Joycelyn, Bravaix, Alain

المساهمون: STMicroelectronics Crolles (ST-CROLLES), Institut des Matériaux, de Microélectronique et des Nanosciences de Provence (IM2NP), Aix Marseille Université (AMU)-Université de Toulon (UTLN)-Centre National de la Recherche Scientifique (CNRS)

المصدر: 2023 IEEE International Reliability Physics Symposium (IRPS 2023)
https://hal.science/hal-04604661
2023 IEEE International Reliability Physics Symposium (IRPS 2023), Mar 2023, Monterey, CA, United States. ⟨10.1109/IRPS48203.2023.10117725⟩

مصطلحات موضوعية: CMOS, charge trapping, hard breakdown, interface traps, Off-state damage, soft breakdown, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics

جغرافية الموضوع: Monterey, CA, United States

Relation: hal-04604661; https://hal.science/hal-04604661; https://hal.science/hal-04604661/document; https://hal.science/hal-04604661/file/IRPS%202023%20Garba-Seybou%20T%20-%20VFF.pdf

الاتاحة: https://hal.science/hal-04604661
https://hal.science/hal-04604661/document
https://hal.science/hal-04604661/file/IRPS%202023%20Garba-Seybou%20T%20-%20VFF.pdf
https://doi.org/10.1109/IRPS48203.2023.10117725

المؤلفون: Hai, Joycelyn, Cacho, Florian, Federspiel, Xavier, Garba-Seybou, Tidjani, Divay, Alexis, Lauga-Larroze, Estelle, Arnould, Jean-Daniel

المساهمون: STMicroelectronics Crolles (ST-CROLLES), Commissariat à l'énergie atomique et aux énergies alternatives - Laboratoire d'Electronique et de Technologie de l'Information (CEA-LETI), Direction de Recherche Technologique (CEA) (DRT (CEA)), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA), Reliable RF and Mixed-signal Systems (TIMA-RMS), Techniques de l'Informatique et de la Microélectronique pour l'Architecture des systèmes intégrés (TIMA), Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes (UGA)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP), Université Grenoble Alpes (UGA)-Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes (UGA)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP), Université Grenoble Alpes (UGA)

المصدر: IRPS 2023 - IEEE International Reliability Physics Symposium ; https://hal.science/hal-04105262 ; IRPS 2023 - IEEE International Reliability Physics Symposium, Mar 2023, Monterey, United States. pp.10.1109/IRPS48203.2023.10117885, ⟨10.1109/IRPS48203.2023.10117885⟩ ; https://ieeexplore.ieee.org/document/10117885

مصطلحات موضوعية: degradation mode, dynamic stress, integrated test circuit, off-state reliability, TDDB, PACS 85.42, [SPI.TRON]Engineering Sciences [physics]/Electronics

جغرافية الموضوع: Monterey, United States

الاتاحة: https://hal.science/hal-04105262
https://hal.science/hal-04105262v1/document
https://hal.science/hal-04105262v1/file/Hai_IRPS2023.pdf
https://doi.org/10.1109/IRPS48203.2023.10117885

المؤلفون: Garba-Seybou, Tidjani, Federspiel, Xavier, Bravaix, Alain, Cacho, Florian

المساهمون: Institut des Matériaux, de Microélectronique et des Nanosciences de Provence (IM2NP), Aix Marseille Université (AMU)-Université de Toulon (UTLN)-Centre National de la Recherche Scientifique (CNRS), STMicroelectronics Crolles (ST-CROLLES), Yncréa Méditerranée campus de Toulon

المصدر: 2022 IEEE International Reliability Physics Symposium (IRPS)
https://hal.science/hal-03659269
2022 IEEE International Reliability Physics Symposium (IRPS), Mar 2022, Dallas, United States. pp.11A.3-1-11A.3-7, ⟨10.1109/IRPS48227.2022.9764431⟩

مصطلحات موضوعية: CMOS, off-state damage, aging, TDDB, gate oxide breakdown, leakage current, [SPI]Engineering Sciences [physics]

جغرافية الموضوع: Dallas, United States

Relation: hal-03659269; https://hal.science/hal-03659269; https://hal.science/hal-03659269/document; https://hal.science/hal-03659269/file/Paper%20IRPS%202022_GARBA%20SEYBOU%20Tidjani%20-%20TDDB%20OFF%20STATE%20-%20Final.pdf

الاتاحة: https://hal.science/hal-03659269
https://hal.science/hal-03659269/document
https://hal.science/hal-03659269/file/Paper%20IRPS%202022_GARBA%20SEYBOU%20Tidjani%20-%20TDDB%20OFF%20STATE%20-%20Final.pdf
https://doi.org/10.1109/IRPS48227.2022.9764431

المؤلفون: Cacho, Florian

مصطلحات موضوعية: [SPI:MECA] Engineering Sciences/Mechanics, siliciuration, nickel, CMOS, modélisation, simulation, système Ni-Si

الاتاحة: http://tel.archives-ouvertes.fr/tel-00159435
http://tel.archives-ouvertes.fr/docs/00/15/94/35/PDF/Cacho.pdf

المؤلفون: Divay, Alexis, Dehos, Cedric, Antonijevic, Jasmina, Charlet, Ismael, Hai, Joycelyn, Revil, Nathalie, Forest, Jérémie, Knopik, Vincent, Cacho, Florian, Roy, David, Federspiel, Xavier, Crémer, S., Chevalier, Pascal, Gaillard, F., Duriez, Blandine, Garros, Xavier

المساهمون: Commissariat à l'énergie atomique et aux énergies alternatives - Laboratoire d'Electronique et de Technologie de l'Information (CEA-LETI), Direction de Recherche Technologique (CEA) (DRT (CEA)), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA), Département Systèmes (DSYS), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Direction de Recherche Technologique (CEA) (DRT (CEA)), STMicroelectronics Crolles (ST-CROLLES)

المصدر: IRPS 2024 - 2024 IEEE International Reliability Physics Symposium ; https://cea.hal.science/cea-04557422 ; IRPS 2024 - 2024 IEEE International Reliability Physics Symposium, Apr 2024, Dallas, United States. pp.1 ; https://www.irps.org/

مصطلحات موضوعية: [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics

جغرافية الموضوع: Dallas, United States

Relation: cea-04557422; https://cea.hal.science/cea-04557422; https://cea.hal.science/cea-04557422/document; https://cea.hal.science/cea-04557422/file/IRPS_paper_Divay_v3.pdf

الاتاحة: https://cea.hal.science/cea-04557422
https://cea.hal.science/cea-04557422/document
https://cea.hal.science/cea-04557422/file/IRPS_paper_Divay_v3.pdf

المؤلفون: IEEE International Symposium on Reliability Physics 2024, Antonijevic, Jasmina, Bouvot, Simon, Cacho, Florian, Castorina, Alessandro, Cathelin, Philippe, Cavarra, Andrea, Debroucke, Romain, Federspiel, Xavier, Finocchiaro, Alessandro, Hai, Joycelyn, Jan, Sebastien, Martinez, Mathias, Nocera, Claudio, Nowakowski, Jean-Francois, Palmisano, Giuseppe, Papotto, Giuseppe, Parisi, Alessandro, Paulin, Raphael, Planes, Nicolas

مصطلحات موضوعية: Reliability Physics

Relation: https://dx.doi.org/10.1109/IRPS48228.2024.10529364

الاتاحة: https://dx.doi.org/10.48448/pxm9-rz37
https://underline.io/lecture/96039-robustness-assessment-through-77ghz-operating-life-test-of-power-amplifier-for-radar-application-in-28nm-fd-soi-cmos

المؤلفون: IEEE International Symposium on Reliability Physics 2024, Arunachalam, Balraj, Cacho, Florian, Diouf, Cheikh, Federspiel, Xavier, Roy, David

مصطلحات موضوعية: Reliability Physics

Relation: https://dx.doi.org/10.1109/IRPS48228.2024.10529353

الاتاحة: https://dx.doi.org/10.48448/ghqy-v371
https://underline.io/lecture/96185-non-conducting-hot-carrier-temperature-activation-and-temperature-sense-effect

المؤلفون: IEEE International Symposium on Reliability Physics 2024, Antonijevic, Jasmina, Cacho, Florian, Charlet, Ismaël, Chevalier, Pascal, Crémer, Sébastien, Dehos, Cédric, Divay, Alexis, Duriez, Blandine, Federspiel, Xavier, Forest, Jérémie, Gaillard, Fred, Garros, Xavier, Hai, Joycelyn, Knopik, Vincent, Revil, Nathalie, Roy, David

مصطلحات موضوعية: Reliability Physics

Relation: https://dx.doi.org/10.1109/IRPS48228.2024.10529462

الاتاحة: https://dx.doi.org/10.48448/0ndg-ns07
https://underline.io/lecture/96038-a-methodology-to-address-rf-aging-of-40nm-cmos-pa-cells-under-5g-mmw-modulation-profiles

المؤلفون: Garba-Seybou, Tidjani, Federspiel, Xavier, Hai, Joycelyn, Diouf, Cheikh, Cacho, Florian, Bravaix, Alain

المصدر: IEEE Transactions on Device and Materials Reliability ; volume 24, issue 3, page 466-466 ; ISSN 1530-4388 1558-2574

الاتاحة: https://doi.org/10.1109/tdmr.2024.3429780
http://xplorestaging.ieee.org/ielx8/7298/10667659/10668825.pdf?arnumber=10668825

المؤلفون: Garba-Seybou, Tidjani, Bravaix, Alain, Federspiel, Xavier, Hai, Joycelyn, Diouf, Cheikh, Cacho, Florian

المساهمون: STMicroelectronics Crolles (ST-CROLLES), Institut des Matériaux, de Microélectronique et des Nanosciences de Provence (IM2NP), Aix Marseille Université (AMU)-Université de Toulon (UTLN)-Centre National de la Recherche Scientifique (CNRS), ISEN Yncréa Méditerranée campus de Toulon

المصدر: ISSN: 1530-4388 ; IEEE Transactions on Device and Materials Reliability ; https://hal.science/hal-04604648 ; IEEE Transactions on Device and Materials Reliability, 2024, pp.1-1. ⟨10.1109/TDMR.2024.3387271⟩.

مصطلحات موضوعية: [SPI]Engineering Sciences [physics]

Relation: hal-04604648; https://hal.science/hal-04604648

الاتاحة: https://hal.science/hal-04604648
https://doi.org/10.1109/TDMR.2024.3387271

المؤلفون: Garba-Seybou, Tidjani, Bravaix, Alain, Federspiel, Xavier, Hai, Joycelyn, Diouf, Cheikh, Cacho, Florian

المصدر: 2023 IEEE International Integrated Reliability Workshop (IIRW)

الاتاحة: http://dx.doi.org/10.1109/iirw59383.2023.10477634
http://xplorestaging.ieee.org/ielx7/10477668/10477631/10477634.pdf?arnumber=10477634

المؤلفون: Bravaix, Alain, Pitard, Hugo, Federspiel, Xavier, Cacho, Florian

المصدر: Micromachines; Feb2024, Vol. 15 Issue 2, p205, 11p

مصطلحات موضوعية: AVALANCHE diodes, HOT carriers, METAL oxide semiconductors, PHOTONS, AUTOMATIC timers, CELL anatomy, ELECTROSTATIC discharges

المؤلفون: Anghel, Lorena, Cacho, Florian

المساهمون: SPINtronique et TEchnologie des Composants (SPINTEC), Centre National de la Recherche Scientifique (CNRS)-Institut de Recherche Interdisciplinaire de Grenoble (IRIG), Direction de Recherche Fondamentale (CEA) (DRF (CEA)), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Direction de Recherche Fondamentale (CEA) (DRF (CEA)), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Université Grenoble Alpes (UGA), STMicroelectronics Crolles (ST-CROLLES)

المصدر: ISSN: 2168-6750 ; IEEE Transactions on Emerging Topics in Computing ; https://hal.science/hal-03599345 ; IEEE Transactions on Emerging Topics in Computing, 2022, 10 (2), pp.581-590. ⟨10.1109/TETC.2021.3136288⟩ ; https://ieeexplore.ieee.org/document/9662261.

مصطلحات موضوعية: [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics

الاتاحة: https://hal.science/hal-03599345
https://doi.org/10.1109/TETC.2021.3136288

المؤلفون: Bravaix, Alain, Kussener, Edith, Ney, David, Federspiel, Xavier, Cacho, Florian

المساهمون: Yncréa Méditerrané, Institut des Matériaux, de Microélectronique et des Nanosciences de Provence (IM2NP), Aix Marseille Université (AMU)-Université de Toulon (UTLN)-Centre National de la Recherche Scientifique (CNRS), STMicroelectronics Crolles (ST-CROLLES)

المصدر: 2020 IEEE International Reliability Physics Symposium (IRPS)
https://hal.science/hal-03659275
2020 IEEE International Reliability Physics Symposium (IRPS), Apr 2020, Dallas, France. pp.1-8, ⟨10.1109/IRPS45951.2020.9129214⟩

مصطلحات موضوعية: Hot-Carrier, Breakdown, Off-mode, NEDMOS, Hot-Hole Injections, [SPI]Engineering Sciences [physics]

جغرافية الموضوع: Dallas, France

Relation: hal-03659275; https://hal.science/hal-03659275

الاتاحة: https://hal.science/hal-03659275
https://doi.org/10.1109/IRPS45951.2020.9129214

المؤلفون: Anghel, Lorena, Cacho, Florian, Shah, Riddhi Jitendrakumar

المصدر: Ageing of Integrated Circuits ; page 149-180 ; ISBN 9783030237806 9783030237813

الاتاحة: http://dx.doi.org/10.1007/978-3-030-23781-3_6
http://link.springer.com/content/pdf/10.1007/978-3-030-23781-3_6

المؤلفون: Li, Shuang, Bravaix, Alain, Kussener, Edith, Ney, David, Federspiel, Xavier, Cacho, Florian

المساهمون: French Direction Generale des Entreprise

المصدر: Microelectronics Reliability ; volume 114, page 113811 ; ISSN 0026-2714

الاتاحة: http://dx.doi.org/10.1016/j.microrel.2020.113811
https://api.elsevier.com/content/article/PII:S0026271420307022?httpAccept=text/xml
https://api.elsevier.com/content/article/PII:S0026271420307022?httpAccept=text/plain

المؤلفون: Mhira, Souhir, Huard, Vincent, Benhassain, Ahmed, Cacho, Florian, Naudet, Sylvain, Jain, Abhishek, Parthasarathy, Chittoor, Bravaix, Alain

المساهمون: Institut des Matériaux, de Microélectronique et des Nanosciences de Provence (IM2NP), Aix Marseille Université (AMU)-Université de Toulon (UTLN)-Centre National de la Recherche Scientifique (CNRS), STMicroelectronics Crolles (ST-CROLLES), Yncréa Méditerrané

المصدر: ISSN: 0102-3772 ; EISSN: 1806-3446.

مصطلحات موضوعية: MESH: NBTI, timing degradation, in-situ monitors, adaptive voltage scaling, control loop, DTMC, energy efficiency, [SPI]Engineering Sciences [physics]

Relation: hal-03654374; https://hal.science/hal-03654374

الاتاحة: https://hal.science/hal-03654374
https://doi.org/10.1109/IOLTS.2017.8046204

المؤلفون: Huard, Vincent, Cacho, Florian, Federspiel, Xavier, Mora, Pascal

المصدر: Hot Carrier Degradation in Semiconductor Devices ; page 401-444 ; ISBN 9783319089935 9783319089942

الاتاحة: http://dx.doi.org/10.1007/978-3-319-08994-2_14
https://link.springer.com/content/pdf/10.1007/978-3-319-08994-2_14

المؤلفون: Bravaix, Alain, Huard, Vincent, Cacho, Florian, Federspiel, Xavier, Roy, David

المصدر: Hot Carrier Degradation in Semiconductor Devices ; page 57-103 ; ISBN 9783319089935 9783319089942

الاتاحة: http://dx.doi.org/10.1007/978-3-319-08994-2_3
https://link.springer.com/content/pdf/10.1007/978-3-319-08994-2_3