المؤلفون: Jóźwik, Iwona, Jagielski, Jacek, Caban, Piotr, Kamiński, Maciej, Kentsch, Ulrich

المساهمون: Narodowe Centrum Nauki, Helmholtz Association, European Commission, Helmholtz-Zentrum Dresden-Rossendorf

المصدر: Materials Science in Semiconductor Processing ; volume 138, page 106293 ; ISSN 1369-8001

الاتاحة: http://dx.doi.org/10.1016/j.mssp.2021.106293
https://api.elsevier.com/content/article/PII:S1369800121006284?httpAccept=text/xml
https://api.elsevier.com/content/article/PII:S1369800121006284?httpAccept=text/plain

المؤلفون: Dumiszewska, Ewa, Caban, Piotr, Jóźwik, Iwona, Ciepielewski, Paweł, Baranowski, Jacek M.

المصدر: Journal of Materials Science: Materials in Electronics ; volume 32, issue 7, page 8958-8964 ; ISSN 0957-4522 1573-482X

الاتاحة: http://dx.doi.org/10.1007/s10854-021-05566-6
https://link.springer.com/content/pdf/10.1007/s10854-021-05566-6.pdf
https://link.springer.com/article/10.1007/s10854-021-05566-6/fulltext.html

المؤلفون: Popok, Vladimir, Caban, Piotr, Michalowski, Pawel Piotr, Thorpe, Ryan, Feldman, Leonard, Pedersen, Kjeld

المصدر: Popok , V , Caban , P , Michalowski , P P , Thorpe , R , Feldman , L & Pedersen , K 2020 , ' Two-dimensional electron gas at the AlGaN/GaN interface : Layer thickness dependence ' , Journal of Applied Physics , vol. 127 , no. 11 , 115703 . https://doi.org/10.1063/1.5142766

وصف الملف: application/pdf

Relation: https://vbn.aau.dk/da/publications/1a6a45ae-4653-4d2b-beb6-fa4a6dde95fc

الاتاحة: https://vbn.aau.dk/da/publications/1a6a45ae-4653-4d2b-beb6-fa4a6dde95fc
https://doi.org/10.1063/1.5142766
https://vbn.aau.dk/ws/files/383857171/JAP19_AR_07619.pdf
https://vbn.aau.dk/ws/files/330464515/2020JApplPhys_127_2DEG.pdf
http://www.scopus.com/inward/record.url?scp=85082653929&partnerID=8YFLogxK

المؤلفون: Michałowski, Paweł Piotr, Knyps, Piotr, Ciepielewski, Paweł, Caban, Piotr A., Dumiszewska, Ewa, Kowalski, Grzegorz, Tokarczyk, Mateusz, Baranowski, Jacek M.

المساهمون: Horizon 2020 Framework Programme, Narodowe Centrum Nauki

المصدر: Physical Chemistry Chemical Physics ; volume 21, issue 37, page 20641-20646 ; ISSN 1463-9076 1463-9084

الاتاحة: http://dx.doi.org/10.1039/c9cp03846a
http://pubs.rsc.org/en/content/articlepdf/2019/CP/C9CP03846A

المؤلفون: Michałowski, Paweł Piotr, Knyps, Piotr, Ciepielewski, Paweł, Caban, Piotr, Dumiszewska, Ewa, Baranowski, Jacek

المساهمون: Horizon 2020 Framework Programme

المصدر: Physical Chemistry Chemical Physics ; volume 21, issue 17, page 8837-8842 ; ISSN 1463-9076 1463-9084

الاتاحة: http://dx.doi.org/10.1039/c9cp00613c
http://pubs.rsc.org/en/content/articlepdf/2019/CP/C9CP00613C

المؤلفون: Michałowski, Paweł Piotr, Caban, Piotr, Baranowski, Jacek

المساهمون: Horizon 2020 Framework Programme

المصدر: Journal of Analytical Atomic Spectrometry ; volume 34, issue 5, page 848-853 ; ISSN 0267-9477 1364-5544

الاتاحة: http://dx.doi.org/10.1039/c9ja00004f
http://pubs.rsc.org/en/content/articlepdf/2019/JA/C9JA00004F

المؤلفون: Popok, Vladimir N., Caban, Piotr A., Michalowski, Pawel Piotr, Thorpe, Ryan, Feldman, Leonard C., Pedersen, Kjeld

المصدر: Journal of Applied Physics; 3/21/2020, Vol. 127 Issue 11, p1-7, 7p, 3 Diagrams, 3 Charts, 3 Graphs

مصطلحات موضوعية: TWO-dimensional electron gas, ELECTRON gas, KELVIN probe force microscopy, SURFACE potential, THIN films, ELECTRON density

المؤلفون: Popok, Vladimir, Aunsborg, Thore Stig, Godiksen, Rasmus Hjelmgart, Kristensen, Peter Kjær, Juluri, Raghavendra Rao, Caban, Piotr, Pedersen, Kjeld

المصدر: Popok , V , Aunsborg , T S , Godiksen , R H , Kristensen , P K , Juluri , R R , Caban , P & Pedersen , K 2018 , ' Structural Characterization of MOVPE Grown AlGaN/GaN for HEMT Formation ' , Reviews on Advanced Materials Science , vol. 57 , no. 1 , pp. 72-81 . < http://www.ipme.ru/e-journals/RAMS/no_15718/08_15718_popok.html >

وصف الملف: application/pdf

Relation: https://vbn.aau.dk/da/publications/3f3d206f-9d19-4e53-990e-b60a14f511d5

الاتاحة: https://vbn.aau.dk/da/publications/3f3d206f-9d19-4e53-990e-b60a14f511d5
https://vbn.aau.dk/ws/files/292302757/2018RevAdvMater_57_GaN.pdf
http://www.ipme.ru/e-journals/RAMS/no_15718/08_15718_popok.html

المؤلفون: Caban, Piotr, Thorpe, Ryan, Feldman, Leonard, Pedersen, Kjeld, Popok, Vladimir

المساهمون: Odzaev, V.B.

المصدر: Caban , P , Thorpe , R , Feldman , L , Pedersen , K & Popok , V 2018 , AlGaN/GaN Heterostructures in High Electron Mobility Transistors . in V B Odzaev (ed.) , Proceedings of VIII International Conference on Materials and Structures of Modern Electronics . Minsk: BSU , pp. 5-8 , Materials and Structures of Modern Electronics , Belarus , 10/10/2018 . < http://elib.bsu.by/bitstream/123456789/215190/1/5-8.pdf >

وصف الملف: application/pdf

الاتاحة: https://vbn.aau.dk/da/publications/f07fb6c5-0edf-4b94-b2b4-ce39c860e25e
https://vbn.aau.dk/ws/files/297674952/2018Mater_StructModernElectron_Minsk.pdf
http://elib.bsu.by/bitstream/123456789/215190/1/5-8.pdf

المؤلفون: Gokkavas, Mutlu, Butun, Serkan, Caban, Piotr, Strupinski, Wlodek, Ozbay, Ekmel

Relation: https://aperta.ulakbim.gov.tr/record/40857; oai:zenodo.org:40857

الاتاحة: https://aperta.ulakbim.gov.tr/record/40857

المؤلفون: Michałowski, Paweł Piotr, Maciążek, Dawid, Postawa, Zbigniew, Caban, Piotr A., Kozdra, Sylwia, Wójcik, Adrianna, Baranowski, Jacek M.

مصطلحات موضوعية: secondary ion mass spectrometry, molecular dynamics, sputtering, boron nitride, 2D materials

Relation: Measurement, T. 179; https://ruj.uj.edu.pl/xmlui/handle/item/274275

الاتاحة: https://ruj.uj.edu.pl/xmlui/handle/item/274275
https://doi.org/10.1016/j.measurement.2021.109487

المؤلفون: Gokkavas, Mutlu, Butun, Serkan, Caban, Piotr, Strupinski, Wlodek, Ozbay, Ekmel

المصدر: SEMICONDUCTOR SCIENCE AND TECHNOLOGY 27(6)

Relation: https://aperta.ulakbim.gov.tr/record/87345; oai:zenodo.org:87345

الاتاحة: https://aperta.ulakbim.gov.tr/record/87345

المؤلفون: Dumiszewska, Ewa, Ciepielewski, Paweł, Caban, Piotr A., Jóźwik, Iwona, Gaca, Jaroslaw, Baranowski, Jacek M.

المصدر: Molecules; Jun2022, Vol. 27 Issue 11, p3636-3636, 12p

مصطلحات موضوعية: GRAPHENE, WATER use, ATOMIC force microscopy, SCANNING electron microscopy, RAMAN spectroscopy, WATER vapor

المؤلفون: Kondracka, Kinga, Firek, Piotr, Caban, Piotr, Przewłoka, Aleksandra, Szmidt, Jan

المساهمون: Romaniuk, Ryszard S., Linczuk, Maciej

المصدر: Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2019

الاتاحة: http://dx.doi.org/10.1117/12.2536746

المؤلفون: Knyps, Piotr, Caban, Piotr A., Ciepielewski, Paweł, Michałowski, Paweł P., Dumiszewska, Ewa, Baranowski, Jacek M.

المساهمون: Romaniuk, Ryszard S., Linczuk, Maciej

المصدر: Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2019

الاتاحة: http://dx.doi.org/10.1117/12.2533912

المؤلفون: Caban, Piotr A., Wojcik, Marek, Gaca, Jaroslaw, Knyps, Piotr, Teklinska, Dominika, Dumiszewska, Ewa

المساهمون: Romaniuk, Ryszard S., Linczuk, Maciej

المصدر: Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2019

الاتاحة: http://dx.doi.org/10.1117/12.2536751

المؤلفون: Możdżonek Małgorzata, Caban Piotr, Gaca Jarosław, Wójcik Marek, Piątkowska Anna

المصدر: ITME, sygn. dostępny ; http://katalog.pan.pl/webpac-bin/218bitmePL/wgbroker.exe?new+-access+top+search+open+NR+gg96601114

مصطلحات موضوعية: h-BN layers, ATR, ITR, XRR, thickness measurement, Al2O3, warstwy h-BN, IRR, pomiar grubości, Elektronika - czasopismo - materiały, Materiały elektroniczne

وصف الملف: application/octet-stream

Relation: Electronic Materials; oai:rcin.org.pl:publication:190436; Materiały Elektroniczne; https://rcin.org.pl/dlibra/publication/edition/156161/content; oai:rcin.org.pl:156161

الاتاحة: https://rcin.org.pl/dlibra/publication/edition/156161/content

المؤلفون: Możdżonek, Małgorzata, Caban, Piotr, Gaca, Jarosław, Wójcik, Marek, Piątkowska, Anna

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::058833f1c78921d178125e043e89a7a4

المؤلفون: Baranowski, Jacek M., Knyps, Piotr, Michałowski, Paweł Piotr, Kowalski, Grzegorz, Dumiszewska, Ewa, Caban, Piotr A., Tokarczyk, Mateusz, Ciepielewski, Paweł

Relation: Physical Chemistry Chemical Physics; 20641-20646; https://repozytorium.uw.edu.pl//handle/item/108192

الاتاحة: https://repozytorium.uw.edu.pl//handle/item/108192
https://doi.org/10.1039/C9CP03846A

المؤلفون: Krukowski, Pawel, Kowalczyk, Dorota Anna, Piskorski, Michal, Dabrowski, Pawel, Rogala, Maciej, Caban, Piotr, Ciepielewski, Pawel, Jung, Jaroslaw, Baranowski, Jacek M., Ulanski, Jacek, Klusek, Zbigniew

المساهمون: Narodowe Centrum Nauki, Narodowe Centrum Badań i Rozwoju

المصدر: Advanced Engineering Materials ; volume 22, issue 4 ; ISSN 1438-1656 1527-2648

الاتاحة: http://dx.doi.org/10.1002/adem.201900955
https://onlinelibrary.wiley.com/doi/pdf/10.1002/adem.201900955
https://onlinelibrary.wiley.com/doi/full-xml/10.1002/adem.201900955