المؤلفون: Chein, Wei-Hsin, Pandey, Gaurav, Das, Surajit, Chen, Liang-Chia

المساهمون: de Groot, Peter J., Picart, Pascal, Guzman, Felipe

المصدر: Optics and Photonics for Advanced Dimensional Metrology III

الاتاحة: http://dx.doi.org/10.1117/12.3024745

المؤلفون: Cheng, Yu-Ting, Lee, Wei-Yun, Liu, Ming-Jie, Chein, Wei-Hsin, Chen, Liang-Chia

المساهمون: Sendelbach, Matthew J., Schuch, Nivea G.

المصدر: Metrology, Inspection, and Process Control XXXVIII

الاتاحة: http://dx.doi.org/10.1117/12.3010986

المؤلفون: de Groot, Peter J., Guzman, Felipe, Picart, Pascal, Chein, Wei-Hsin, Pandey, Gaurav, Das, Surajit, Chen, Liang-Chia

المصدر: Proceedings of SPIE; June 2024, Vol. 12997 Issue: 1 p129970R-129970R-16, 12867047p

المؤلفون: Chein, Wei-Hsin, Yang, Fu-Sheng, Fu, Zih-Ying, Chen, Liang-Chia

المساهمون: Barnes, Bryan M., Bodermann, Bernd, Frenner, Karsten

المصدر: Modeling Aspects in Optical Metrology IX

الاتاحة: http://dx.doi.org/10.1117/12.2673318

المؤلفون: Fu, Zih-Ying, Chein, Wei-Hsin, Yang, Fu-Sheng, Chen, Liang-Chia

المساهمون: Robinson, John C., Sendelbach, Matthew J.

المصدر: Metrology, Inspection, and Process Control XXXVII

الاتاحة: http://dx.doi.org/10.1117/12.2657642

المؤلفون: Sendelbach, Matthew J., Schuch, Nivea G., Cheng, Yu-Ting, Lee, Wei-Yun, Liu, Ming-Jie, Chein, Wei-Hsin, Chen, Liang-Chia

المصدر: Proceedings of SPIE; April 2024, Vol. 12955 Issue: 1 p129553D-129553D-8, 1165986p

المؤلفون: Chein, Wei-Hsin, Yang, Fu-Sheng, Fu, Zi-Ying, Chen, Liang-Chia

المصدر: Surface Topography: Metrology and Properties ; volume 11, issue 2, page 024004 ; ISSN 2051-672X

الاتاحة: http://dx.doi.org/10.1088/2051-672x/acd0c5
https://iopscience.iop.org/article/10.1088/2051-672X/acd0c5
https://iopscience.iop.org/article/10.1088/2051-672X/acd0c5/pdf

المؤلفون: Chein, Wei-Hsin, Yang, Fu-Sheng, Thakur, Komal, Wu, Guo-Wei, Chen, Liang-Chia

المصدر: Optics and Lasers in Engineering ; volume 166, page 107563 ; ISSN 0143-8166

الاتاحة: http://dx.doi.org/10.1016/j.optlaseng.2023.107563
https://api.elsevier.com/content/article/PII:S0143816623000921?httpAccept=text/xml
https://api.elsevier.com/content/article/PII:S0143816623000921?httpAccept=text/plain

المؤلفون: Chein, Wei-Hsin, Yang, Fu-Sheng, Thakur, Komal, Wu, Guo-Wei, Chen, Liang-Chia

المساهمون: de Groot, Peter J., Leach, Richard K., Picart, Pascal

المصدر: Optics and Photonics for Advanced Dimensional Metrology II

الاتاحة: http://dx.doi.org/10.1117/12.2621895

المؤلفون: CHEIN, WEI-HSIN, YANG, FU-SHENG, THAKUR, KOMAL, WU, GUO-WEI, Chen, Liang-Chia

المصدر: SSRN Electronic Journal ; ISSN 1556-5068

الاتاحة: http://dx.doi.org/10.2139/ssrn.4139613

المؤلفون: Bodermann, Bernd, Frenner, Karsten, Barnes, Bryan M., Chein, Wei-Hsin, Yang, Fu-Sheng, Fu, Zi-Ying, Chen, Liang-Chia

المصدر: Proceedings of SPIE; August 2023, Vol. 12619 Issue: 1 p126190H-126190H-9, 1135720p

المؤلفون: Robinson, John C., Sendelbach, Matthew J., Fu, Zih-Ying, Chein, Wei-Hsin, Yang, Fu-Sheng, Chen, Liang-Chia

المصدر: Proceedings of SPIE; April 2023, Vol. 12496 Issue: 1 p124960E-124960E-11, 12371052p

المؤلفون: de Groot, Peter J., Leach, Richard K., Picart, Pascal, Chein, Wei-Hsin, Yang, Fu-Sheng, Thakur, Komal, Wu, Guo-Wei, Chen, Liang-Chia

المصدر: Proceedings of SPIE; May 2022, Vol. 12137 Issue: 1 p121370E-121370E-9, 1092340p