المؤلفون: S. Nuttinck, E.A. Hijzen, C.J.J. Dachs, Andries J. Scholten, F. Cubaynes, C. Detcheverry, L.F. Tiemeijer

المصدر: IEEE Transactions on Electron Devices. 53:153-157

مصطلحات موضوعية: Engineering, business.industry, Transistor, Hardware_PERFORMANCEANDRELIABILITY, Noise figure, Electronic, Optical and Magnetic Materials, law.invention, CMOS, law, MOSFET, Hardware_INTEGRATEDCIRCUITS, Electronic engineering, Miniaturization, RFIC, Electrical and Electronic Engineering, business, NMOS logic, Degradation (telecommunications)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::616810d4dfa775462b1ed4238eb3331a
https://doi.org/10.1109/ted.2005.861246

المؤلفون: C.J.J. Dachs, P.A. Stolk, Youri Victorovitch Ponomarev, Andreas H. Montree

المصدر: IEEE Transactions on Electron Devices. 47:1507-1513

مصطلحات موضوعية: Cmos fabrication, Profiling (computer programming), Materials science, Doping, Mixed-signal integrated circuit, Hardware_PERFORMANCEANDRELIABILITY, Electronic, Optical and Magnetic Materials, CMOS, Low-power electronics, Hardware_INTEGRATEDCIRCUITS, Electronic engineering, Electrical and Electronic Engineering, Low voltage, Communication channel

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::a960443b8ec1e9e4c58eba888f6bb90b
https://doi.org/10.1109/16.848300

المؤلفون: R. van Langevelde, D.B.M. Klaassen, M. Durand, A.J. Scholten, G.D.J. Smit, C.J.J. Dachs

المصدر: Scopus-Elsevier

مصطلحات موضوعية: Materials science, Physics::Instrumentation and Detectors, business.industry, Semiconductor device modeling, Condensed Matter::Mesoscopic Systems and Quantum Hall Effect, Avalanche breakdown, Computer Science::Other, PMOS logic, Computer Science::Hardware Architecture, CMOS, Condensed Matter::Superconductivity, Optoelectronics, business, Quantum tunnelling, NMOS logic, Leakage (electronics)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::8b4479cce1894a939c3dffc724a479cd
https://doi.org/10.1109/iedm.2005.1609306

المؤلفون: C.J.J. Dachs, Tom Schram, R. J. P. Lander, B. Kaczer, S. Biesemans, J.-L. Everaert, M. Demand, Zsolt Tokei, Werner Boullart, Johan Vertommen, Stephan Beckx, J.C. Hooker, Kirklen Henson, O. Richard, Hugo Bender, F. N. Cubaynes, B. Coenegrachts, M. Jurczak, W. Vandervorst, Monja Kaiser, Wim Deweerd

المصدر: IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004..

مصطلحات موضوعية: Electron mobility, Materials science, business.industry, Physical vapor deposition, Electrode, MOSFET, Electrical engineering, Optoelectronics, business, Metal gate, Capacitance, NMOS logic, Leakage (electronics)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::a446618b6aa9a2361273ee79a3341304
https://doi.org/10.1109/iedm.2004.1419312

المؤلفون: C.J.J. Dachs, Marc Schaekers, Aude Rothschild, Malgorzata Jurczak, Christopher S. Olsen, Robert O'Connor, Anabela Veloso, L. Date, Sofie Mertens, Robin Degraeve, F.N. Cubaynes

المصدر: Electrical Performance of Electrical Packaging (IEEE Cat. No. 03TH8710).

مصطلحات موضوعية: Electron mobility, Materials science, Annealing (metallurgy), business.industry, Plasma parameters, Analytical chemistry, Oxide, Dielectric, chemistry.chemical_compound, CMOS, chemistry, MOSFET, Optoelectronics, business, Leakage (electronics)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::9ffc1ff99e87eed646d218e8fec42979
https://doi.org/10.1109/essderc.2003.1256858

المؤلفون: Stefan Kubicek, Richard Lindsay, F.N. Cubaynes, C.J.J. Dachs, Z.M. Rittersma, J.C. Hooker, Josine Loo, Gerben Doornbos, Kirklen Henson, R. J. P. Lander, Youri Victorovitch Ponomarev, R. Surdeanu

المصدر: Electrical Performance of Electrical Packaging (IEEE Cat. No. 03TH8710).

مصطلحات موضوعية: Materials science, business.industry, Transistor, Gate dielectric, Process (computing), Hardware_PERFORMANCEANDRELIABILITY, Dielectric, Laser, law.invention, CMOS, Hardware_GENERAL, law, MOSFET, Hardware_INTEGRATEDCIRCUITS, Electronic engineering, Optoelectronics, Cmos process, business, Hardware_LOGICDESIGN

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::e84eb6a8fa471d0341ea0788c1a513a3
https://doi.org/10.1109/essderc.2003.1256802

المؤلفون: Richard Lindsay, A. Satta, X. Pages, Radu Surdeanu, Kirklen Henson, C.J.J. Dachs, Bartek Pawlak, Anne Lauwers, Simone Severi, S. McCoy, J. Gelpey

المصدر: Extended Abstracts of the 2004 International Conference on Solid State Devices and Materials.

مصطلحات موضوعية: Materials science, CMOS, Engineering physics

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::f3e9274a303ff1e0037120984aedc292
https://doi.org/10.7567/ssdm.2004.b-3-1

المؤلفون: Pierre H. Woerlee, P.A. Stolk, Andreas H. Montree, C.J.J. Dachs, Jurriaan Schmitz, R.F.M. Roes, Youri Victorovitch Ponomarev, A.C.M.C. van Brandenburg, Monja Kaiser

المصدر: 1999 Symposium on VLSI Technology: digest of technical papers : June 14-16, 1999, Kyoto, 65-66
STARTPAGE=65;ENDPAGE=66;TITLE=1999 Symposium on VLSI Technology

مصطلحات موضوعية: Materials science, business.industry, Electrical engineering, Hardware_PERFORMANCEANDRELIABILITY, Ring oscillator, Threshold voltage, Process variation, CMOS, Low-power electronics, MOSFET, Hardware_INTEGRATEDCIRCUITS, Optoelectronics, Work function, business, Low voltage, Hardware_LOGICDESIGN

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::6d6a3af3cd8e751e212c871377ec7c2a
https://doi.org/10.1109/vlsit.1999.799342

المؤلفون: A.C.M.C. van Brandenburg, Jurriaan Schmitz, W.M. Baks, P.A. Stolk, C.J.J. Dachs, S.F.M. Roes, Youri Victorovitch Ponomarev, Andreas H. Montree, H. Tuinhout

المصدر: Scopus-Elsevier

مصطلحات موضوعية: Materials science, business.industry, Circuit performance, Transistor, law.invention, Ion implantation, CMOS, law, MOSFET, Electronic engineering, Optoelectronics, business, NMOS logic, Communication channel

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::8fbd8ec07e3b3da8d6b4f80b5f3f6cc8
https://doi.org/10.1109/vtsa.1999.785987

المؤلفون: Jeroen Croon, E. Augendre, F.R.J. Huisman, R.M.D.A. Velghe, K.N. Sreerambhatla, Youri Victorovitch Ponomarev, L.P. Bellefroid, M.N. Webster, M. Da Rold, E. Seevinck, Ray Duffy, M.J.B. Bolt, R.F.M. Roes, A.T.A. Zegers-van Duijnhoven, R. Surdeanu, M. Vertregt, Hans Tuinhout, A.J. Moonen, Peter Stolk, N.K.J. van Winkelhoff, C.J.J. Dachs

المصدر: International Electron Devices Meeting. Technical Digest (Cat. No.01CH37224).

مصطلحات موضوعية: Engineering, FO4, business.industry, Transistor, Process (computing), Electrical engineering, Mixed-signal integrated circuit, Hardware_PERFORMANCEANDRELIABILITY, Process control monitoring, law.invention, Integrated injection logic, CMOS, law, Hardware_INTEGRATEDCIRCUITS, Electronic engineering, business, Metal gate

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::9f377a49c742ede27965176cd3b9e48c
https://doi.org/10.1109/iedm.2001.979469

المؤلفون: J. Bolk, Marcel A. Verheijen, J. G. M. van Berkum, Stefan Kubicek, F.N. Cubaynes, M. Rovers, Josine Loo, C.J.J. Dachs, Monja Kaiser, Youri Victorovitch Ponomarev

المصدر: 2001 Symposium on VLSI Technology. Digest of Technical Papers (IEEE Cat. No.01 CH37184).

مصطلحات موضوعية: Materials science, business.industry, Semiconductor device modeling, Nanotechnology, Design for manufacturability, law.invention, Planar, CMOS, Resist, law, MOSFET, Optoelectronics, Photolithography, business, Lithography

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::5294fc87b57ea222959cc8e1c3034583
https://doi.org/10.1109/vlsit.2001.934933

المؤلفون: F.N. Cubaynes, Aude Rothschild, Husam N. Alshareef, Kirklen Henson, V. C. Venezia, Jurriaan Schmitz, L. Date, Robin Degraeve, R.W. Murto, J. Petry, A. Zegers, D. Pique, Marc Schaekers, Thierry Conard, M. Da Rold, C.J.J. Dachs, Malgorzata Jurczak, Gonçal Badenes, C. Detcheverry, P.A. Stolk

المصدر: 32nd European Solid-State Device Research Conference.

مصطلحات موضوعية: Materials science, business.industry, Electrical engineering, Hardware_PERFORMANCEANDRELIABILITY, Dielectric, Plasma nitridation, CMOS, Hardware_GENERAL, Rapid thermal processing, Hardware_INTEGRATEDCIRCUITS, Optoelectronics, System on a chip, business, Leakage (electronics)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::6cbe6b32e3b5e79b29d40e41c30e94a3
https://doi.org/10.1109/essderc.2002.194959

المؤلفون: A. Al-Shareef, F.N. Cubaynes, Anabela Veloso, Sofie Mertens, Marc Schaekers, Gonçal Badenes, R.W. Murto, Aude Rothschild, Rita Rooyackers, M. Jurczak, C.J.J. Dachs

المصدر: 32nd European Solid-State Device Research Conference.

مصطلحات موضوعية: Materials science, CMOS, business.industry, Gate oxide, Gate dielectric, Electrical engineering, Optoelectronics, Ion current, Dielectric, business, NMOS logic, PMOS logic, Leakage (electronics)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::931b44b0d8c6ee6657384dd8bb7ba00e
https://doi.org/10.1109/essderc.2002.194894

المؤلفون: P.A. Stolk, A. Parlangeli, C.J.J. Dachs, D. Guyot, Youri Victorovitch Ponomarev, R. Surdeanu

المصدر: 31st European Solid-State Device Research Conference.

مصطلحات موضوعية: Materials science, CMOS, business.industry, Junction leakage, Optoelectronics, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::ec6733ca560ebebf9c14b7e20fae8284
https://doi.org/10.1109/essderc.2001.195229

المؤلفون: P.A. Stolk, F.N. Cubaynes, Youri Victorovitch Ponomarev, C.J.J. Dachs, R. Surdeanu

المصدر: 31st European Solid-State Device Research Conference.

مصطلحات موضوعية: Space technology, medicine.medical_specialty, Offset (computer science), Materials science, Annealing (metallurgy), business.industry, Medical simulation, Doping, chemistry.chemical_element, chemistry, CMOS, Impurity, medicine, Electronic engineering, Optoelectronics, Boron, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::54ed66710ff32b7682828663a2e7cdc1
https://doi.org/10.1109/essderc.2001.195293

المؤلفون: A. Schoonveld, V. Moroz, C.J.J. Dachs

المصدر: 31st European Solid-State Device Research Conference.

مصطلحات موضوعية: Thermal oxidation, Materials science, Silicon, Oxide, chemistry.chemical_element, chemistry.chemical_compound, Planar, chemistry, Shallow trench isolation, MOSFET, Electronic engineering, Composite material, Anisotropy, Leakage (electronics)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::e968b9367667d07d11de18f4832d39fb
https://doi.org/10.1109/essderc.2001.195278

المؤلفون: Marcel A. Verheijen, Monja Kaiser, F.N. Cubaynes, C.J.J. Dachs, Youri Victorovitch Ponomarev, Josine Loo

المصدر: 31st European Solid-State Device Research Conference.

مصطلحات موضوعية: Space technology, Materials science, Silicon, chemistry, Resist, business.industry, Annealing (metallurgy), Electronic engineering, Optoelectronics, chemistry.chemical_element, Mosfet circuits, business, Lithography

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::81aa34066fe1ccdac1c1a453f341557b
https://doi.org/10.1109/essderc.2001.195222

المؤلفون: Peter Stolk, Willem van de Wijgert, Jeroen van Zijl, Veerle Meyssen, Jurgen van Berkum, Giovanni Mannino, C.J.J. Dachs, N.E.B. Cowern, Richard Lindsay

المصدر: Scopus-Elsevier

مصطلحات موضوعية: Ion implantation, Fabrication, Materials science, CMOS, business.industry, Annealing (metallurgy), Shallow junction, Optoelectronics, Rapid thermal annealing, business, Scaling

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::443010e03fad81720c56f17fdc4e1a94
https://doi.org/10.1557/proc-669-j3.5

المؤلفون: Pierre H. Woerlee, Youri Victorovitch Ponomarev, C.J.J. Dachs, P.A. Stolk

المصدر: 30th European Solid-State Device Research Conference.

مصطلحات موضوعية: Materials science, business.industry, Annealing (metallurgy), Doping, chemistry.chemical_element, Ion implantation, chemistry, MOSFET, Electronic engineering, Optoelectronics, Dielectric loss, Mosfet circuits, business, Boron, Energy exchange

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::6652480ef33a10e081c83ae3cbca94c9
https://doi.org/10.1109/essderc.2000.194731

المؤلفون: C.J.J. Dachs, Marcel A. Verheijen, Monja Kaiser, Youri Victorovitch Ponomarev, P.A. Stolk

المصدر: 30th European Solid-State Device Research Conference.

مصطلحات موضوعية: Profiling (computer programming), Materials science, Dopant, chemistry, Preferential etching, CMOS, Atomic force microscopy, Etching (microfabrication), Scientific method, chemistry.chemical_element, Nanotechnology, Hafnium

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::967567d4e975915ced9f996933063e22
https://doi.org/10.1109/essderc.2000.194789