المؤلفون: Paul S. Bagus, Connie J. Nelin, C. Richard. Brundle, B. Vincent Crist, Eugene S. Ilton, Nabajit Lahiri, Kevin M. Rosso

المصدر: Inorganic Chemistry. 61:18077-18094

مصطلحات موضوعية: Inorganic Chemistry, Physical and Theoretical Chemistry

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::1f942fc82b8853f250b150e684c60d99
https://doi.org/10.1021/acs.inorgchem.2c02549

المؤلفون: William Skinner, Sven Tougaard, Christopher D. Easton, Thomas R. Gengenbach, Jeff Terry, Matthew R. Linford, Cedric J. Powell, Kateryna Artyushkova, Mark C. Biesinger, Mark H. Engelhard, Andreas Thissen, Peter M. A. Sherwood, Paul Dietrich, George H. Major, Karen J. Gaskell, Alberto Herrera-Gomez, C. Richard Brundle, John T. Grant, Jean-Jacques Pireaux, Christopher F McConville, Vincent S. Smentkowski, Donald R. Baer

المساهمون: Linford, Matthew R, Smentkowski, Vincent S, Grant, John T, Brundle, C Richard, Skinner, William, Baer, Donald R

المصدر: Linford, M R, Smentkowski, V S, Grant, J T, Brundle, C R, Sherwood, P M A, Biesinger, M C, Terry, J, Artyushkova, K, Herrera-Gómez, A, Tougaard, S, Skinner, W, Pireaux, J J, McConville, C F, Easton, C D, Gengenbach, T R, Major, G H, Dietrich, P, Thissen, A, Engelhard, M, Powell, C J, Gaskell, K J & Baer, D R 2019, ' Proliferation of Faulty Materials Data Analysis in the Literature ', Microscopy and Microanalysis, vol. 26, no. 1, pp. 1-2 . https://doi.org/10.1017/s1431927619015332
Linford, M R, Smentkowski, V S, Grant, J T, Brundle, C R, Sherwood, P M A, Biesinger, M C, Terry, J, Artyushkova, K, Herrera-Gómez, A, Tougaard, S, Skinner, W, Pireaux, J J, McConville, C F, Easton, C D, Gengenbach, T R, Major, G H, Dietrich, P, Thissen, A, Engelhard, M, Powell, C J, Gaskell, K J & Baer, D R 2020, ' Proliferation of Faulty Materials Data Analysis in the Literature ', Microscopy and Microanalysis, vol. 26, no. 1, pp. 1-2 . https://doi.org/10.1017/S1431927619015332

مصطلحات موضوعية: Information retrieval, Materials science, Text mining, business.industry, X-ray photoelectron spectroscopy (XPS), business, Instrumentation, documentary standards, incorrect materials data analysis, materials characterization

وصف الملف: application/pdf

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::8daa34111813397a5f5b2ed1200de8ee
https://pubmed.ncbi.nlm.nih.gov/31948499

المؤلفون: Alexander G. Shard, Kateryna Artyushkova, Karen J. Gaskell, Richard T. Haasch, Cedric J. Powell, John T. Grant, Matthew R. Linford, James Castle, Mark H. Engelhard, Peter M. A. Sherwood, Vincent S. Smentkowski, C. Richard Brundle, Donald R. Baer

المصدر: Journal of vacuum sciencetechnology. A, Vacuum, surfaces, and films : an official journal of the American Vacuum Society. 37

مصطلحات موضوعية: Materials science, X-ray photoelectron spectroscopy, 02 engineering and technology, Surfaces and Interfaces, 010402 general chemistry, 021001 nanoscience & nanotechnology, 0210 nano-technology, Condensed Matter Physics, 01 natural sciences, Engineering physics, Article, 0104 chemical sciences, Surfaces, Coatings and Films

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::f054f97f27a024258ec6107cb0928d05
https://pubmed.ncbi.nlm.nih.gov/31579351

المؤلفون: C. Richard Brundle, Roger I. Bickley

المصدر: Journal of the Chemical Society, Faraday Transactions 2. 75:1030

مصطلحات موضوعية: chemistry.chemical_compound, Auger electron spectroscopy, Adsorption, Chemistry, Chemisorption, Photoemission spectroscopy, Oxide, Analytical chemistry, chemistry.chemical_element, Zinc, Penetration (firestop), Oxygen

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::2ea54a4a4a7ed495c38a4c96fd325516
https://doi.org/10.1039/f29797501030