المؤلفون: Tomas L. Martin, M. Wu, Michael P. Moody, Peter R. Wilshaw, C.R.M. Grovenor, David Tweddle, C. Lotharukpong

المصدر: Lotharukpong, C, Tweddle, D, Martin, T L, Wu, M, Grovenor, C R M, Moody, M P & Wilshaw, P R 2017, ' Specimen preparation methods for elemental characterisation of grain boundaries and isolated dislocations in multicrystalline silicon using atom probe tomography ', Materials Characterization, vol. 131, pp. 472-479 . https://doi.org/10.1016/j.matchar.2017.07.038

مصطلحات موضوعية: Materials science, Silicon, chemistry.chemical_element, 02 engineering and technology, Atom probe, 01 natural sciences, Focused ion beam, Atomic units, law.invention, Impurity, law, 0103 physical sciences, Microscopy, General Materials Science, Composite material, 010302 applied physics, Mechanical Engineering, 021001 nanoscience & nanotechnology, Condensed Matter Physics, Isolated dislocations, Multicrystalline silicon, Atom probe tomography, Crystallography, chemistry, Mechanics of Materials, Grain boundaries, Grain boundary, Dislocation, 0210 nano-technology

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