المؤلفون: S. Pullanchery, S. Kulik, T. Schönfeldová, C. K. Egan, G. Cassone, A. Hassanali, S. Roke

المصدر: Nature Communications, Vol 15, Iss 1, Pp 1-13 (2024)

مصطلحات موضوعية: Science

وصف الملف: electronic resource

Relation: https://doaj.org/toc/2041-1723

URL الوصول: https://doaj.org/article/a7f92f12c3af4350afb335457b9a9f17

المؤلفون: Simon D. M. Jacques, Vesna Middelkoop, Robert J. Cernik, Marco Di Michiel, Antonios Vamvakeros, C. K. Egan, Andrew M. Beale

المصدر: Journal of Applied Crystallography. 48:1943-1955

مصطلحات موضوعية: Diffraction tomography, Diffraction, Optics, Tomographic reconstruction, Materials science, business.industry, X-ray crystallography, Streak, Tomography, business, Projection (set theory), General Biochemistry, Genetics and Molecular Biology, Powder diffraction

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::2a853563dba9323ea6401c3a9f597eec
https://doi.org/10.1107/s1600576715020701

المؤلفون: Robert J. Cernik, Philip J. Withers, Matthew C. Veale, Paul Seller, Simon D. M. Jacques, Matthew D. Wilson, C. K. Egan

المصدر: Journal of Applied Crystallography. 48:269-272

مصطلحات موضوعية: Diffraction, Materials science, Pixel, business.industry, Detector, Synchrotron radiation, General Biochemistry, Genetics and Molecular Biology, Collimated light, law.invention, Condensed Matter::Materials Science, Crystallinity, Optics, law, Computer Science::Computer Vision and Pattern Recognition, Pinhole camera, business, Powder diffraction

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::3ca4bb473bcbd2a520edaf5559be252a
https://doi.org/10.1107/s1600576715000801

المؤلفون: Matthew C. Veale, Matthew D. Wilson, C. K. Egan, Robert J. Cernik, Paul Seller, Simon D. M. Jacques

المصدر: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 324:25-28

مصطلحات موضوعية: Physics, Nuclear and High Energy Physics, Range (particle radiation), Photon, business.industry, media_common.quotation_subject, Attenuation, Detector, X-ray, X-ray detector, Optics, Contrast (vision), business, Instrumentation, Energy (signal processing), media_common

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::919cc27c267607b205ba1021d0a5ae6c
https://doi.org/10.1016/j.nimb.2013.11.021

المؤلفون: Peter D. Lee, Robert J. Cernik, Andrew M. Beale, C. K. Egan, Mathijs W. Zandbergen, Marco Di Michiel, Biao Cai, Simon D. M. Jacques

المصدر: Acta Biomaterialia. 9:8337-8345

مصطلحات موضوعية: Molar, Diffraction, Materials science, Biomedical Engineering, Mineralogy, Crystal structure, Crystallography, X-Ray, computer.software_genre, Sensitivity and Specificity, Biochemistry, Molecular physics, Biomaterials, stomatognathic system, Voxel, Human tooth, medicine, Humans, Molecular Biology, Attenuation, Reproducibility of Results, General Medicine, medicine.anatomical_structure, X-ray crystallography, Radiographic Image Interpretation, Computer-Assisted, Molar, Third, Tomography, Tomography, X-Ray Computed, computer, Biotechnology

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::171eeb39f642a2e0d2210828ecca43d6
https://doi.org/10.1016/j.actbio.2013.06.018

المؤلفون: Steven Bell, Paul J. Sellin, Silvia Pani, C Christodoulou, Matthew D. Wilson, Matthew C. Veale, Paul Seller, Robert J. Cernik, C. K. Egan, Simon D. M. Jacques, James Scuffham, Daniel O’Flynn, Robert D. Speller

المصدر: IEEE Transactions on Nuclear Science. 60:1197-1200

مصطلحات موضوعية: Physics, Nuclear and High Energy Physics, Pixel, Physics::Instrumentation and Detectors, business.industry, Detector, Resolution (electron density), X-ray detector, Cadmium telluride photovoltaics, Full width at half maximum, Optics, Nuclear Energy and Engineering, Nuclear electronics, Optoelectronics, High Energy Physics::Experiment, Electrical and Electronic Engineering, business, Energy (signal processing)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::caa938c7a486da0cfa27400dab11a1ce
https://doi.org/10.1109/tns.2013.2240694

المؤلفون: Robert J. Cernik, C. K. Egan, Simon D. M. Jacques

المصدر: X-Ray Spectrometry. 42:151-157

مصطلحات موضوعية: Chemical imaging, Multivariate statistics, Multivariate analysis, Pixel, business.industry, Imaging spectrometer, Hyperspectral imaging, Pattern recognition, Optics, Tomography, Artificial intelligence, Focus (optics), business, Spectroscopy

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::1fba9e8d332817d7315427c6360cbc69
https://doi.org/10.1002/xrs.2448

المؤلفون: Robert J. Cernik, Taha Sochi, Paul Barnes, Olivier Lazzari, M. Di Michiel, C. K. Egan, S.D.M. Jacques

المصدر: Journal of Synchrotron Radiation. 19:471-477

مصطلحات موضوعية: Physics, Diffraction, Nuclear and High Energy Physics, Radiation, business.industry, Phase-contrast X-ray imaging, Resolution (electron density), Collimator, law.invention, Optics, law, Temporal resolution, Diffraction topography, Energy-dispersive X-ray diffraction, business, Instrumentation, Image resolution

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::e5b14538f5285dc4238f32c4c6024496
https://doi.org/10.1107/s0909049512015543

المؤلفون: A. Choubey, Moreton Moore, C. K. Egan, Robert J. Cernik

المصدر: Journal of Crystal Growth. 343:1-6

مصطلحات موضوعية: Materials science, business.industry, X-ray, Condensed Matter Physics, Cadmium telluride photovoltaics, Particle detector, Synchrotron, Cadmium zinc telluride, law.invention, Inorganic Chemistry, chemistry.chemical_compound, Crystallography, chemistry, law, Materials Chemistry, Optoelectronics, Diffraction topography, Wafer, Grain boundary, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::13242ed900fa836865b2f2823fa54504
https://doi.org/10.1016/j.jcrysgro.2012.01.003

المؤلفون: C. K. Egan, A. Choubey, Andy Brinkman

المصدر: Surface Science. 604:1825-1831

مصطلحات موضوعية: Condensed matter physics, Chemistry, Scanning tunneling spectroscopy, Analytical chemistry, Spin polarized scanning tunneling microscopy, Surfaces and Interfaces, Conductive atomic force microscopy, Condensed Matter::Mesoscopic Systems and Quantum Hall Effect, Condensed Matter Physics, Electrochemical scanning tunneling microscope, Surfaces, Coatings and Films, law.invention, Scanning probe microscopy, law, Materials Chemistry, Scanning tunneling microscope, Surface reconstruction, Surface states

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::be7a58fcb115ecfb1b219684935ba181
https://doi.org/10.1016/j.susc.2010.07.014

المؤلفون: Z. Klusek, Andy Brinkman, P. Dabrowski, C. K. Egan

المصدر: Journal of Electronic Materials. 38:1528-1532

مصطلحات موضوعية: Local density of states, Annealing (metallurgy), business.industry, Chemistry, Scanning tunneling spectroscopy, Polishing, Condensed Matter Physics, Electronic, Optical and Magnetic Materials, law.invention, Scanning probe microscopy, Optics, Lapping, law, Materials Chemistry, Density of states, Optoelectronics, Electrical and Electronic Engineering, Scanning tunneling microscope, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::9f7c3bd5198aa551428d1812e413d447
https://doi.org/10.1007/s11664-009-0693-7

المؤلفون: Paul Seller, C. K. Egan, Matthew C. Veale, Matthew D. Wilson, Robert J. Cernik, James Scuffham

المصدر: Egan, C, Scuffham, J W, Veale, M C, Wilson, MD, Seller, P & Cernik, R 2016, ' Energy calibration and gain correction of pixelated spectroscopic x-ray detectors using correlation optimised warping ', Measurement Science and Technology . https://doi.org/10.1088/1361-6501/28/1/017001

مصطلحات موضوعية: Physics, Pixel, business.industry, Physics::Instrumentation and Detectors, Applied Mathematics, 010401 analytical chemistry, Detector, X-ray detector, 02 engineering and technology, 021001 nanoscience & nanotechnology, 01 natural sciences, Spectral line, Particle detector, 0104 chemical sciences, Optics, Calibration, Image warping, 0210 nano-technology, business, Instrumentation, Engineering (miscellaneous), Energy (signal processing)

وصف الملف: application/pdf

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::d806863084d20f487d62971ca5bb991c
https://www.research.manchester.ac.uk/portal/en/publications/energy-calibration-and-gain-correction-of-pixelated-spectroscopic-xray-detectors-using-correlation-optimised-warping(8fa4788d-0442-4a86-8db5-390e2f458c14).html

المؤلفون: Richard A. D. Pattrick, Matthew C. Veale, C. K. Egan, Paul Seller, Robert J. Cernik, Andrew M. Beale, Philip J. Withers, Matthew D. Wilson, Simon D. M. Jacques

المصدر: Scientific Reports
Egan, C K, Jacques, S, Wilson, M D, Veale, M C, Seller, P, Beale, A M, Pattrick, R, Withers, P & Cernik, R 2015, ' 3D chemical imaging in the laboratory by hyperspectral X-ray computed tomography ', Scientific Reports, vol. 5, 15979 . https://doi.org/10.1038/srep15979

مصطلحات موضوعية: Chemical imaging, Multidisciplinary, synchrotron-radiation, Chemistry, Detector, Resolution (electron density), Mineralogy, Hyperspectral imaging, Synchrotron radiation, system, gold, Data science, Sample (graphics), Article, surface, Tomography, recognition, Absorption (electromagnetic radiation), medipix2, time, detectors, ct

وصف الملف: application/octet-stream

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::4196cb73a2fb95d493eb480234614136
https://pubmed.ncbi.nlm.nih.gov/26514938

المؤلفون: Antonis Vamvakeros, Andrew M. Beale, I. Z. Ismagilov, C. K. Egan, Vesna Middelkoop, Paul R. Shearing, Fausto Gallucci, Simon D. M. Jacques, M. van Sint Annaland, Gavin Vaughan, M. Di Michiel, Robert J. Cernik

المساهمون: UCL, Dept Chem, London WC1H 0AJ, England, UK Catalysis Hub, Didcot OX11 0FA, Oxon, England, Univ Manchester, Sch Mat, Manchester M13 9PL, Lancs, England, Flemish Institute for Technological Research (VITO), European Synchrotron Radiation Facility (ESRF), Boreskov Institute of Catalysis, Siberian Branch of the Russian Academy of Sciences (SB RAS), Eindhoven Univ Technol, Dept Chem Engn, Chem Proc Intensificat, NL-5600 MB Eindhoven, Netherlands, UCL, Dept Chem Engn, London WC1E 7JE, England, Chemical Process Intensification

المصدر: Chemical Communications
Chemical Communications, Royal Society of Chemistry, 2015, 51 (64), pp.12752-12755. ⟨10.1039/c5cc03208c⟩
'Chemical Communications ', vol: 51, pages: 12752-12755 (2015)
Chemical Communications, ChemComm, 51(64), 12752-12755. Royal Society of Chemistry

مصطلحات موضوعية: Solid-state chemistry, Ethylene, business.industry, Metals and Alloys, Oxygen transport, General Chemistry, 7. Clean energy, Catalysis, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, chemistry.chemical_compound, Membrane, Ceramic membrane, chemistry, Chemical engineering, Natural gas, Materials Chemistry, Ceramics and Composites, [CHIM]Chemical Sciences, Oxidative coupling of methane, business

وصف الملف: application/pdf

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::4b2e80d82a6be66eeb9baf97f55c874c
https://pubmed.ncbi.nlm.nih.gov/26041252

المؤلفون: C. K. Egan, Matthew C. Veale, Robert J. Cernik, Simon D. M. Jacques, Paul Seller, Richard A. D. Pattrick, Matthew D. Wilson, Philip J. Withers

المصدر: Egan, C K, Jacques, S D M, Wilson, M D, Veale, M C, Seller, P, Pattrick, R A D, Withers, P J & Cernik, R J 2017, ' 3D elemental mapping of materials and structures by laboratory scale spectroscopic X-ray tomography ', Journal of Physics: Conference Series, vol. 849, no. 1, 012013 . https://doi.org/10.1088/1742-6596/849/1/012013, https://doi.org/{10.1088/1742-6596/849/1/012013}

مصطلحات موضوعية: History, X-ray spectroscopy, ResearchInstitutes_Networks_Beacons/dalton_nuclear_institute, Absorption spectroscopy, Resolution (electron density), X-ray, Analytical chemistry, Dalton Nuclear Institute, Tomography, Laboratory scale, Spectroscopy, Computer Science Applications, Education

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::71228a237e932a40850c11221dc7af37
https://doi.org/10.1088/1742-6596/849/1/012013

المؤلفون: Paul Seller, Matthew D. Wilson, Simon D. M. Jacques, Matthew C. Veale, Robert J. Cernik, C. K. Egan, Thomas Connolley

المصدر: Egan, C K, Jacques, SDM, Connolley, T, Wilson, M D, Veale, M C, Seller, P & Cernik, R J 2014, ' Dark-field hyperspectral X-ray imaging ', PROCEEDINGS OF THE ROYAL SOCIETY A-MATHEMATICAL PHYSICAL AND ENGINEERING SCIENCES, vol. 470, no. 2165, 20130629 . https://doi.org/10.1098/Rspa.2013.0629, https://doi.org/10.1098/rspa.2013.0629
Egan, C K, Jacques, S D M, Connolley, T, Wilson, M D, Veale, M C, Seller, P & Cernik, R J 2014, ' Dark-field hyperspectral X-ray imaging ' Proceedings of the Royal Society A: Mathematical, Physical and Engineering Sciences, vol 470, no. 2165, 20130629 . DOI: 10.1098/rspa.2013.0629

مصطلحات موضوعية: Mathematics(all), medicine.medical_specialty, Engineering, General Mathematics, General Physics and Astronomy, Physics and Astronomy(all), Radiation, system, Optics, medicine, Engineering(all), Research Articles, energy-dispersive X-ray diffraction, materials characterization, business.industry, Detector, X-ray imaging, General Engineering, diffraction computed-tomography, active phase evolution, Hyperspectral imaging, computed tomography, Dark field microscopy, Pencil (optics), Spectral imaging, scanning tomography, Energy-dispersive X-ray diffraction, Raster scan, business, Biomedical engineering

وصف الملف: text; application/pdf; application/octet-stream

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::bf00abb9ee216f0d707d107defa9e274
http://www.manchester.ac.uk/escholar/uk-ac-man-scw:231266

المؤلفون: Paul Seller, Robert J. Cernik, C. K. Egan, Simon D. M. Jacques, Matthew D. Wilson, Matthew C. Veale

المصدر: The Analyst. 138(3)

مصطلحات موضوعية: Chemical imaging, Computer science, business.industry, Attenuation, Analytical chemistry, Hyperspectral imaging, computer.software_genre, Biochemistry, Analytical Chemistry, Chemical species, Printed circuit board, Transmission (telecommunications), Voxel, Electrochemistry, Environmental Chemistry, Computer vision, Tomography, Artificial intelligence, business, computer, Spectroscopy

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::d9d6fce5fedfdaabc9cce6851da79389
https://pubmed.ncbi.nlm.nih.gov/23145429

المؤلفون: Matthew C. Veale, Brian D. Ramsey, Steven Bell, Silvia Pani, Matthew D. Wilson, Paul Seller, C. K. Egan, Jessica A. Gaskin, Paul J. Sellin, Robert J. Cernik, Simon D. M. Jacques, James Scuffham, Robert D. Speller, C Christodoulou, C. Reid

المصدر: Journal of instrumentation : an IOP and SISSA journal. 6(12)

مصطلحات موضوعية: Physics, Interconnection, business.industry, Detector, X-ray detector, Cadmium telluride photovoltaics, Article, law.invention, Cadmium zinc telluride, chemistry.chemical_compound, Full width at half maximum, Data acquisition, chemistry, law, Optoelectronics, business, Instrumentation, Mathematical Physics, Gamma camera

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::36648eb83caacbb022ed5ba28b1cf069
https://pubmed.ncbi.nlm.nih.gov/22737179

المؤلفون: Andy Brinkman, Q. Z. Jiang, C. K. Egan

المصدر: Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films. 29:011021

مصطلحات موضوعية: Surface (mathematics), Materials science, Morphology (linguistics), Surfaces and Interfaces, Condensed Matter Physics, Surface energy, Cadmium telluride photovoltaics, Surfaces, Coatings and Films, law.invention, Faceting, Crystallography, law, Vacancy defect, Scanning tunneling microscope, Surface reconstruction

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::58f1d1677e76ff46d0c9b86f2b8bb5fd
https://doi.org/10.1116/1.3525914

المؤلفون: C. K. Egan, Andy Brinkman, A. Choubey

المصدر: Journal of Applied Physics. 108:024310

مصطلحات موضوعية: Materials science, Band gap, business.industry, Analytical chemistry, General Physics and Astronomy, Surface finish, law.invention, Surface conductivity, Semiconductor, Chemical physics, law, Surface roughness, Scanning tunneling microscope, business, Surface states, Hillock

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::55c5102cbd52e4061fa72df1571a4e21
https://doi.org/10.1063/1.3460638