المؤلفون: A. Parlato, E. Tomarchio, C. Calligaro, C. Pace

المساهمون: A. Parlato, E. Tomarchio, C. Calligaro, C. Pace

مصطلحات موضوعية: Testing methodologies, Electronic Devices, Total Ionizing Dose, Single Event Effects, Gamma rays, Settore ING-IND/20 - Misure E Strumentazione Nucleari

Relation: info:eu-repo/semantics/altIdentifier/wos/WOS:000436369300005; volume:33; issue:1; firstpage:53; lastpage:60; numberofpages:8; journal:NUCLEAR TECHNOLOGY & RADIATION PROTECTION; http://hdl.handle.net/10447/353494; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-85051527015; http://ntrp.vinca.rs/2018_1/Parlato_2018_1.pdf

الاتاحة: http://hdl.handle.net/10447/353494
https://doi.org/10.2298/NTRP1801053P
http://ntrp.vinca.rs/2018_1/Parlato_2018_1.pdf

المؤلفون: C. Calligaro, U. Gatti

المصدر: 2021 IEEE 32nd International Conference on Microelectronics (MIEL).

مصطلحات موضوعية: business.industry, Computer science, String (computer science), Electrical engineering, Hardware_PERFORMANCEANDRELIABILITY, law.invention, Matrix (mathematics), Bit (horse), CMOS, law, Total dose, Hardware_INTEGRATEDCIRCUITS, Microelectronics, Resistor, business, Hardware_LOGICDESIGN, Electronic circuit

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::3d3b609dc1b3a4d5a45fddfe6d9df471
https://doi.org/10.1109/miel52794.2021.9569131

المؤلفون: C. Calligaro, Marko Andjelkovic, Felipe A. Kuentzer, Oliver Schrape, Milos Krstic, U. Gatti

المصدر: 2021 IEEE 32nd International Conference on Microelectronics (MIEL).

مصطلحات موضوعية: Computer science, Hardware_PERFORMANCEANDRELIABILITY, Propagation delay, Decoupling capacitor, law.invention, Capacitor, Reliability (semiconductor), CMOS, law, Robustness (computer science), Hardware_INTEGRATEDCIRCUITS, Electronic engineering, Sensitivity (control systems), Voltage

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::c61e05ed09c2b91006a6ed17f6ef84fd
https://doi.org/10.1109/miel52794.2021.9569110

المؤلفون: C. Calligaro, Umberto Gatti

المصدر: Next-Generation ADCs, High-Performance Power Management, and Technology Considerations for Advanced Integrated Circuits ISBN: 9783030252663

مصطلحات موضوعية: Dosimeter, CMOS, Computer science, Absorbed dose, visual_art, Electronic component, Electronic engineering, visual_art.visual_art_medium, Mixed-signal integrated circuit, Integrated circuit design, Avionics, Radiation hardening

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::93745a8d8f9c56548623e25e41b91b58
https://doi.org/10.1007/978-3-030-25267-0_17

المؤلفون: C. M. Andreou, A. Paccagnella, D. M. Gonzalez Castano, F. Gomez, A. V. Prokofiev, C. Calligaro, A. Javanainen, A. Virtanen, D. Nahmad, J. Georgiou, V. Liberali

المساهمون: C.M. Andreou, A. Paccagnella, D.M. Gonzalez Castano, F. Gomez, V. Liberali, A.V. Prokofiev, C. Calligaro, A. Javanainen, A. Virtanen, D. Nahmad, J. Georgiou

مصطلحات موضوعية: bandgap reference circuit, voltage reference, CMOS technology, temperature, Settore ING-INF/01 - Elettronica

Relation: info:eu-repo/semantics/altIdentifier/isbn/9781479983919; info:eu-repo/semantics/altIdentifier/wos/WOS:000371471002145; ispartofbook:Circuits and Systems (ISCAS), 2015 IEEE International Symposium on; IInternational Symposium on Circuits and Systems; firstpage:2245; lastpage:2248; numberofpages:4; http://hdl.handle.net/2434/514598; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-84946235250

الاتاحة: http://hdl.handle.net/2434/514598
https://doi.org/10.1109/ISCAS.2015.7169129

المؤلفون: C. M. Andreou, A. Javanainen, A. Rominski, A. Virtanen, C. Calligaro, A. V. Prokofiev, S. Gerardin, M. Bagatin, A. Paccagnella, D. M. Gonzalez Castano, F. Gomez, D. Nahmad, J. Georgiou, V. Liberali

المساهمون: C.M. Andreou, A. Javanainen, A. Rominski, A. Virtanen, V. Liberali, C. Calligaro, A.V. Prokofiev, S. Gerardin, M. Bagatin, A. Paccagnella, D.M. Gonzalez-Castano, F. Gomez, D. Nahmad, J. Georgiou

مصطلحات موضوعية: Analog single-event transient (ASET), bandgap voltage reference (BGR), charge sharing, CMOS analog integrated circuit, heavy ion, ionization, parasitic bipolar effect, pulse quenching, radiation effect, radiation hardening by design (RHBD), reference circuit, single-event effects (SEE), single-event transient (SET), space electronic, Voltage reference, Nuclear and High Energy Physic, Nuclear Energy and Engineering, Electrical and Electronic Engineering, Settore ING-INF/01 - Elettronica

Relation: info:eu-repo/semantics/altIdentifier/wos/WOS:000391693100027; volume:63; issue:6; firstpage:2950; lastpage:2961; numberofpages:12; journal:IEEE TRANSACTIONS ON NUCLEAR SCIENCE; http://hdl.handle.net/2434/514234; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-85012937717

الاتاحة: http://hdl.handle.net/2434/514234
https://doi.org/10.1109/TNS.2016.2611639

المؤلفون: C. Calligaro, V. Liberali, A. Stabile, M. Bagatin, S. Gerardin, A. Paccagnella

المساهمون: C. Calligaro, V. Liberali, A. Stabile, M. Bagatin, S. Gerardin, A. Paccagnella

مصطلحات موضوعية: static RAM, radiation hardening by design, Settore ING-INF/01 - Elettronica

Relation: info:eu-repo/semantics/altIdentifier/isbn/9781612841496; info:eu-repo/semantics/altIdentifier/isbn/9781612841519; info:eu-repo/semantics/altIdentifier/wos/WOS:000290617900095; ispartofbook:2010 International Conference on Microelectronics; ICM : International conference on microelectronics; firstpage:375; lastpage:378; numberofpages:4; http://hdl.handle.net/2434/150981; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-79951704645

الاتاحة: http://hdl.handle.net/2434/150981
https://doi.org/10.1109/ICM.2010.5696165

المؤلفون: BENIGNI, MARCELLO, V. Liberali, A. Stabile, C. Calligaro

المساهمون: M. Benigni, V. Liberali, A. Stabile, C. Calligaro

مصطلحات موضوعية: static random-access memory, rad-hard, Settore ING-INF/01 - Elettronica

Relation: info:eu-repo/semantics/altIdentifier/isbn/978-1-4244-7201-7; ispartofbook:2010 27th International Conference on Microelectronics, MIEL 2010 - Proceedings; International conference on microelectronics; firstpage:279; lastpage:282; numberofpages:4; http://hdl.handle.net/2434/144476; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-77955214898

الاتاحة: http://hdl.handle.net/2434/144476
https://doi.org/10.1109/MIEL.2010.5490481

المؤلفون: E. Do, V. Liberali, A. Stabile, C. Calligaro

المساهمون: E. Do, V. Liberali, A. Stabile, C. Calligaro

مصطلحات موضوعية: charge collection simulation, hardening by design, Radiation effect, single-event effects, Settore ING-INF/01 - Elettronica

Relation: info:eu-repo/semantics/altIdentifier/isbn/9781457704922; info:eu-repo/semantics/altIdentifier/isbn/9781457704932; info:eu-repo/semantics/altIdentifier/isbn/9781457704925; ispartofbook:2009 European Conference on Radiation and Its Effects on Components and Systems; European conference on radiation and its effects on components and systems : RADECS; firstpage:217; lastpage:224; numberofpages:8; serie:ESA SP; http://hdl.handle.net/2434/161699; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-80052716497

الاتاحة: http://hdl.handle.net/2434/161699
https://doi.org/10.1109/RADECS.2009.5994583

المؤلفون: C. Calligaro, V. Liberali, A. Stabile

المساهمون: C. Calligaro, V. Liberali, A. Stabile

مصطلحات موضوعية: CMOS digital integrated circuit, SRAM chip, integrated circuit layout, Settore ING-INF/01 - Elettronica

Relation: info:eu-repo/semantics/altIdentifier/isbn/9781424450909; ispartofbook:2009 16th IEEE International Conference on Electronics, Circuits and Systems - (ICECS 2009); IEEE International conference on electronics, circuits, and systems, ICECS; firstpage:655; lastpage:658; numberofpages:4; http://hdl.handle.net/2434/141845; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-77951439238

الاتاحة: http://hdl.handle.net/2434/141845
https://doi.org/10.1109/ICECS.2009.5410804

المؤلفون: A. Stabile, V. Liberali, C. Calligaro

المساهمون: A. Stabile, V. Liberali, C. Calligaro

مصطلحات موضوعية: CMOS digital integrated circuit, cosmic background radiation, logic design, logic gate, radiation effect, design methodology, radiation, rad-hard, single event effect, fault injection, Settore ING-INF/01 - Elettronica

Relation: info:eu-repo/semantics/altIdentifier/isbn/9781424421827; info:eu-repo/semantics/altIdentifier/isbn/9781424421824; ispartofbook:ICECS 2008 : 15th IEEE international conference on electronics, circuits and systems; ICECS : IEEE International Conference on Electronics, Circuits and Systems; firstpage:149; lastpage:152; numberofpages:4; http://hdl.handle.net/2434/50791; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-57849136655

الاتاحة: http://hdl.handle.net/2434/50791
https://doi.org/10.1109/ICECS.2008.4674813

المؤلفون: L. Pascolo, A. Gianoncelli, C. Rizzardi, M. Salomé, C. Calligaro, F. Salvi, D. Paterson, TISATO, Veronica, ZAMBONI, Paolo

المساهمون: L., Pascolo, A., Gianoncelli, C., Rizzardi, Tisato, Veronica, M., Salomé, C., Calligaro, F., Salvi, D., Paterson, Zamboni, Paolo

وصف الملف: ELETTRONICO

Relation: info:eu-repo/semantics/altIdentifier/wos/000342907600003; volume:4; firstpage:6540; lastpage:6549; numberofpages:10; journal:SCIENTIFIC REPORTS; http://hdl.handle.net/11392/2179412; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-84923287864

الاتاحة: http://hdl.handle.net/11392/2179412

المؤلفون: C. Calligaro, A. Manstretta, A. Pierin, P. Rolandi, TORELLI, GUIDO

المساهمون: C., Calligaro, A., Manstretta, A., Pierin, P., Rolandi, Torelli, Guido

مصطلحات موضوعية: SENSE AMPLIFIER, NON-VOLATILE MEMORY, MULTILEVEL MEMORY, FLASH MEMORY

وصف الملف: STAMPA

Relation: ispartofbook:Proceedings European Conference on Circuit Theory and Design ECCTD ’99; European Conference on Circuit Theory and Design (ECCTD 99); firstpage:137; lastpage:140; http://hdl.handle.net/11571/4126

الاتاحة: http://hdl.handle.net/11571/4126

المؤلفون: C. Calligaro, R. Gastaldi, A. Manstretta, TORELLI, GUIDO

المساهمون: C., Calligaro, R., Gastaldi, A., Manstretta, Torelli, Guido

مصطلحات موضوعية: MULTILEVEL MEMORIES, FLASH MEMORIES, NON-VOLATILE MEMORIES, PARALLEL SENSING

وصف الملف: STAMPA

Relation: info:eu-repo/semantics/altIdentifier/isbn/0818680997; ispartofbook:Proceedings 1997 IEEE International Workshop on Memory Technology, Design and Testing; IEEE International Workshop on Memory Technology, Design and Testing (MTDT 97); firstpage:96; lastpage:101; http://hdl.handle.net/11571/465144

الاتاحة: http://hdl.handle.net/11571/465144
https://doi.org/10.1109/MTDT.1997.619401

المؤلفون: C. Calligaro, A. Manstretta, P. Rolandi, TORELLI, GUIDO

المساهمون: C., Calligaro, A., Manstretta, P., Rolandi, Torelli, Guido

مصطلحات موضوعية: MULTILEVEL MEMORIES, FLASH MEMORIES, NON-VOLATILE MEMORIES, PARALLEL SENSING

وصف الملف: STAMPA

Relation: ispartofbook:Proceedings 4th IEEE International Conference on Electronics, Circuits, and Systems; IEEE International Conference on Electronics, Circuits, and Systems (ICECS 97); firstpage:541; lastpage:544; http://hdl.handle.net/11571/465151

الاتاحة: http://hdl.handle.net/11571/465151

المؤلفون: C. Calligaro, A. Manstretta, A. Pierin, TORELLI, GUIDO

المساهمون: C., Calligaro, A., Manstretta, A., Pierin, Torelli, Guido

مصطلحات موضوعية: MULTILEVEL MEMORIES, FLASH MEMORIES, NON-VOLATILE MEMORIES, MEMORY READING, MEMORY SENSING

وصف الملف: STAMPA

Relation: info:eu-repo/semantics/altIdentifier/isbn/0780342763; ispartofbook:Proceedings Second Annual IEEE International Conference on Innovative Systems in Silicon; Annual IEEE International Conference on Innovative Systems in Silicon (ISIS 97); firstpage:266; lastpage:273; http://hdl.handle.net/11571/465149

الاتاحة: http://hdl.handle.net/11571/465149
https://doi.org/10.1109/ICISS.1997.630269

المؤلفون: C. Calligaro, Michel Mosser, Marc Nothisen, S. A. Jacques, Alain Wagner, Jean-Serge Remy, D. Weltin, C. Egloff

المصدر: Chemical communications (Cambridge, England). 50(70)

مصطلحات موضوعية: Chemistry, Metals and Alloys, Analytical chemistry, Nanotechnology, General Chemistry, Living cell, 3T3 Cells, Fluorescence, Catalysis, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, Molecular Imaging, Mice, Förster resonance energy transfer, Materials Chemistry, Ceramics and Composites, Dark quencher, Fluorescence Resonance Energy Transfer, Animals, Sulfhydryl Compounds, Molecular imaging, Fluorescent Dyes

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::cbda09bfbd376f0b383b7e96db750368
https://pubmed.ncbi.nlm.nih.gov/25034617

المؤلفون: C. Calligaro, P. Rolandi, N. Telecco, TORELLI, GUIDO

المساهمون: C., Calligaro, P., Rolandi, N., Telecco, Torelli, Guido

مصطلحات موضوعية: SENSE AMPLIFIER, NON-VOLATILE MEMORIES, FLASH MEMORIES, MEMORY READING, MEMORY SENSING, CURRENT MODE SENSING

وصف الملف: STAMPA

Relation: info:eu-repo/semantics/altIdentifier/isbn/0780336399; ispartofbook:Proceedings Eighth Annual IEEE International Conference on Innovative Systems in Silicon; Annual IEEE International Conference on Innovative Systems in Silicon (ISIS 96); firstpage:141; lastpage:147; http://hdl.handle.net/11571/465126

الاتاحة: http://hdl.handle.net/11571/465126
https://doi.org/10.1109/ICISS.1996.552421

المؤلفون: C. Calligaro, A. Manstretta, P. Rolandi, TORELLI, GUIDO

المساهمون: C., Calligaro, A., Manstretta, P., Rolandi, Torelli, Guido

مصطلحات موضوعية: MULTILEVEL MEMORIES, FLASH MEMORIES, NON-VOLATILE MEMORIES, SERIAL/PARALLEL SENSING

وصف الملف: STAMPA

Relation: info:eu-repo/semantics/altIdentifier/isbn/0780336399; ispartofbook:Proceedings Eighth Annual IEEE International Conference on Innovative Systems in Silicon; Annual IEEE International Conference on Innovative Systems in Silicon (ISIS 96); firstpage:133; lastpage:140; http://hdl.handle.net/11571/465123

الاتاحة: http://hdl.handle.net/11571/465123
https://doi.org/10.1109/ICISS.1996.552420

المؤلفون: C. Calligaro, A. Manstretta, A. Modelli, TORELLI, GUIDO

المساهمون: C., Calligaro, A., Manstretta, A., Modelli, Torelli, Guido

مصطلحات موضوعية: FLASH MEMORIES, NON-VOLATILE MEMORIES, MULTILEVEL MEMORIES, PROGRAMMING ALGORITHM

وصف الملف: STAMPA

Relation: info:eu-repo/semantics/altIdentifier/isbn/078033650X; ispartofbook:Proceedings 3rd IEEE International Conference on Electronics, Circuits, and Systems; IEEE International Conference on Electronics, Circuits, and Systems (ICECS 96); volume:2; firstpage:1005; lastpage:1008; http://hdl.handle.net/11571/465138

الاتاحة: http://hdl.handle.net/11571/465138
https://doi.org/10.1109/ICECS.1996.584556