المؤلفون: Buiu, O., Hall, S., Engstrom, O., Raeissi, B., Lemme, M., Hurley, P.K., Cherkaoui, K.

المصدر: Microelectronics Reliability ; volume 47, issue 4-5, page 678-681 ; ISSN 0026-2714

الاتاحة: https://doi.org/10.1016/j.microrel.2007.01.006
https://api.elsevier.com/content/article/PII:S002627140700011X?httpAccept=text/xml
https://api.elsevier.com/content/article/PII:S002627140700011X?httpAccept=text/plain

المؤلفون: Engström, O., Raeissi, B., Hall, S., Buiu, O., Lemme, M.C., Gottlob, H.D.B., Hurley, P.K., Cherkaoui, K.

المصدر: Solid-State Electronics ; volume 51, issue 4, page 622-626 ; ISSN 0038-1101

الاتاحة: https://doi.org/10.1016/j.sse.2007.02.021
https://api.elsevier.com/content/article/PII:S0038110107000652?httpAccept=text/xml
https://api.elsevier.com/content/article/PII:S0038110107000652?httpAccept=text/plain

المؤلفون: Lu, Y., Buiu, O., Hall, S., Mitrovic, I.Z., Davey, W., Potter, R.J., Chalker, P.R.

المصدر: Microelectronics Reliability ; volume 47, issue 4-5, page 722-725 ; ISSN 0026-2714

الاتاحة: https://doi.org/10.1016/j.microrel.2007.01.052
https://api.elsevier.com/content/article/PII:S0026271407000583?httpAccept=text/xml
https://api.elsevier.com/content/article/PII:S0026271407000583?httpAccept=text/plain

المؤلفون: Serban, BC, Brezeanu, M, De Luca, A, Ali, SZ, Buiu, O, Cobianu, C, Stratulat, A, Udrea, F, Avramescu, V, Varachiu, N, Ionescu, O, Ionescu, G

وصف الملف: application/pdf

Relation: https://www.repository.cam.ac.uk/handle/1810/297689

الاتاحة: https://www.repository.cam.ac.uk/handle/1810/297689
https://doi.org/10.17863/CAM.44743

المؤلفون: Avramescu, V, De Luca, A, Brezeanu, M, Ali, SZ, Udrea, F, Buiu, O, Cobianu, C, Serban, B, Gardner, J, Dumitru, V, Stratulat, A

مصطلحات موضوعية: 4605 Data Management and Data Science, 46 Information and Computing Sciences, 40 Engineering, 4016 Materials Engineering

وصف الملف: application/pdf

Relation: https://www.repository.cam.ac.uk/handle/1810/286845

الاتاحة: https://www.repository.cam.ac.uk/handle/1810/286845
https://doi.org/10.17863/CAM.34151

المؤلفون: Serbanescu, M., Ionescu, O., Georgescu, I., Dumitru, V., Buiu, O.

المصدر: 2016 International Semiconductor Conference (CAS) ; page 213-216

الاتاحة: http://dx.doi.org/10.1109/smicnd.2016.7783089
http://xplorestaging.ieee.org/ielx7/7777314/7783010/07783089.pdf?arnumber=7783089

المؤلفون: Serban, B., Avramescu, V., Brezeanu, M., Gavrila, R., Dinescu, A., Buiu, O., Cobianu, C., Beck, S., Moffat, B.

المصدر: 2015 International Semiconductor Conference (CAS) ; page 109-112

الاتاحة: http://dx.doi.org/10.1109/smicnd.2015.7355178
http://xplorestaging.ieee.org/ielx7/7347913/7355133/07355178.pdf?arnumber=7355178

المؤلفون: Raeissi, Bahman, 1979, Piscator, Johan, 1977, Engström, Olof, 1943, Hall, S., Buiu, O., Lemme, M.C., Gottlob, H.D.B., Hurley, P.K., Cherkaoui, K., Osten, H.J.

المصدر: Solid-State Electronics. 52(9):1274-1279

مصطلحات موضوعية: Gd2O3, Capacitance frequency spectroscopy, High-k, HfO2, MOS, Capture cross section

URL الوصول: https://research.chalmers.se/publication/73380

المؤلفون: Hurley, P.K., Cherkaoui, K., O'Connor, E, Lemme, M.C., Gottlob, H.D.B., Schmidt, M., Hall, S., Lu, Y., Buiu, O., Raeissi, Bahman, 1979, Piscator, Johan, 1977, Engström, Olof, 1943, Newcomb, S.B.

المصدر: J. Electrochem. Soc.. 155(2):G13-G20

URL الوصول: https://research.chalmers.se/publication/73278

المؤلفون: Hurley, P. K., Cherkaoui, K., O'Connor, E., Lemme, Max C., 1970, Gottlob, H. D. B., Schmidt, M., Hall, S., Lu, Y., Buiu, O., Raeissi, B., Piscator, J., Engstrom, O., Newcomb, S. B.

المصدر: Journal of the Electrochemical Society. 155(2):G13-G20

وصف الملف: print

URL الوصول: https://urn.kb.se/resolve?urn=urn:nbn:se:kth:diva-50513

المؤلفون: Raeissi, Bahman, 1979, Piscator, Johan, 1977, Engström, Olof, 1943, Hall, S., Buiu, O, Lemme, M.C., Gottlob, H.D.B., Hurley, P.K, Cherkaoui, K., Osten, H.J.

المصدر: ESSDERC th European Solid-State Device Research Conference; Munich; Germany; 11 September 2007 through 13 September 2007. 2007:283-286

URL الوصول: https://research.chalmers.se/publication/67383
http://dx.doi.org/10.1109/ESSDERC.2007.4430933

المؤلفون: Gomeniuk, Y., Nazarov, A., Vovk, Ya., Lu, Yi, Buiu, O., Hall, S., Efavi, J. K., Lemme, Max C., 1970

المصدر: Materials Science in Semiconductor Processing. 9(6):980-984

مصطلحات موضوعية: high-k dielectrics, gate stack, interface state density, G/omega measurements

وصف الملف: print

URL الوصول: https://urn.kb.se/resolve?urn=urn:nbn:se:kth:diva-50561

المؤلفون: Kennedy, G.P., Buiu, O.

المصدر: Journal of Applied Physics. 3/15/1999, Vol. 85 Issue 6, p3319. 8p. 8 Graphs.

مصطلحات موضوعية: *CHEMICAL vapor deposition, *SILICON nitride

المؤلفون: Serban, B., Costea, S., Buiu, O., Cobianu, C., Diaconu, C.

المصدر: CAS 2012 (International Semiconductor Conference) ; page 265-268

الاتاحة: http://dx.doi.org/10.1109/smicnd.2012.6400789
http://xplorestaging.ieee.org/ielx5/6384624/6400721/06400789.pdf?arnumber=6400789

المؤلفون: Brezeanu, M., Dumitru, V., Costea, S., Ali, S. Z., Udrea, F., Gologanu, M., Bostan, C., Georgescu, I., Avramescu, V., Buiu, O.

المصدر: CAS 2012 (International Semiconductor Conference) ; page 153-156

الاتاحة: http://dx.doi.org/10.1109/smicnd.2012.6400669
http://xplorestaging.ieee.org/ielx5/6384624/6400640/06400669.pdf?arnumber=6400669

المؤلفون: Udrea, Florin, Ali, Syed Z., Brezeanu, M., Dumitru, V., Buiu, O., Poenaru, I., Chowdhury, M. F., De Luca, A., Gardner, J. W.

Relation: Udrea, Florin, Ali, Syed Z., Brezeanu, M., Dumitru, V., Buiu, O., Poenaru, I., Chowdhury, M. F., De Luca, A. and Gardner, J. W. (2012) SOI sensing technologies for harsh environment. In: 35th International Semiconductor Conference, CAS 2012 , Sinaia, Romania, 15-17 Oct 2012. Published in: Proceedings of the International Semiconductor Conference, CAS, Volume 1 pp. 3-10. doi:10.1109/SMICND.2012.6400708

الاتاحة: http://wrap.warwick.ac.uk/58035/
https://doi.org/10.1109/SMICND.2012.6400708

المؤلفون: Gologanu, M., Bostan, C. G., Avramescu, V., Buiu, O.

المصدر: CAS 2012 (International Semiconductor Conference)

الاتاحة: http://dx.doi.org/10.1109/smicnd.2012.6400695
http://xplorestaging.ieee.org/ielx5/6384624/6400640/06400695.pdf?arnumber=6400695

المؤلفون: Serban, B., Kumar, A. K. Sarin, Brezeanu, M., Cobianu, C., Buiu, O., Bostan, C., Varachiu, N., Costea, S.

المصدر: CAS 2011 Proceedings (2011 International Semiconductor Conference) ; page 127-130

الاتاحة: http://dx.doi.org/10.1109/smicnd.2011.6095734
http://xplorestaging.ieee.org/ielx5/6088027/6095684/06095734.pdf?arnumber=6095734

المؤلفون: Serban, B, Sarin Kumar, A K, Cobianu, C, Buiu, O, Costea, S, Bostan, C, Varachiu, N

المصدر: CAS 2010 Proceedings (International Semiconductor Conference) ; page 247-250

الاتاحة: http://dx.doi.org/10.1109/smicnd.2010.5650619
http://xplorestaging.ieee.org/ielx5/5640539/5649029/05650619.pdf?arnumber=5650619

المؤلفون: Serban, B., Mihaila, M., Costea, S., Buiu, O.

المصدر: 2009 International Semiconductor Conference ; page 81-84

الاتاحة: http://dx.doi.org/10.1109/smicnd.2009.5336604
http://xplorestaging.ieee.org/ielx5/5319023/5336525/05336604.pdf?arnumber=5336604