المؤلفون: Guendalina Simoncini, Daniele Dal Maistro, Federico Alimenti

المصدر: IEEE Access, Vol 10, Pp 85606-85618 (2022)

مصطلحات موضوعية: Microwave noise sources, avalanche noise, noise diodes, built-in test equipments (BITE), user compiled model, Electrical engineering. Electronics. Nuclear engineering, TK1-9971

وصف الملف: electronic resource

Relation: https://ieeexplore.ieee.org/document/9856675/; https://doaj.org/toc/2169-3536

URL الوصول: https://doaj.org/article/5ca28e2478c8487e8c5dd18a3177553c

المؤلفون: Yuseok Jeon

المصدر: Electronics, Vol 13, Iss 1, p 48 (2023)

مصطلحات موضوعية: front-end, synthesizer, ultra-wideband frequency, phase noise, local circuit, built-in test, Electronics, TK7800-8360

Relation: https://www.mdpi.com/2079-9292/13/1/48; https://doaj.org/toc/2079-9292; https://doaj.org/article/5201ce62e25c46b18ed0b66b8bbd41f4

الاتاحة: https://doi.org/10.3390/electronics13010048
https://doaj.org/article/5201ce62e25c46b18ed0b66b8bbd41f4

المؤلفون: Jianping YUAN, Hanbing SUN

المصدر: Zhongguo Jianchuan Yanjiu, Vol 16, Iss 3, Pp 207-214 (2021)

مصطلحات موضوعية: electro-hydraulic servo-valve amplifier, built-in test (bit), fault detection and isolation, fault code, Naval architecture. Shipbuilding. Marine engineering, VM1-989

وصف الملف: electronic resource

Relation: https://doaj.org/toc/1673-3185

URL الوصول: https://doaj.org/article/112cfe5cc64143d0928e269b5ae29506

المؤلفون: Seungjun Kim, Junghoon Jin, Jongsun Kim

المصدر: Electronics; Volume 11; Issue 21; Pages: 3630

مصطلحات موضوعية: jitter attenuator, jitter cleaner, phase interpolator, MDLL, built-off-test, automatic test

وصف الملف: application/pdf

Relation: Circuit and Signal Processing; https://dx.doi.org/10.3390/electronics11213630

الاتاحة: https://doi.org/10.3390/electronics11213630

المؤلفون: Federico Alimenti, Guendalina Simoncini, Gianluca Brozzetti, Daniele Dal Maistro, Marc Tiebout

المصدر: IEEE Access, Vol 8, Pp 178976-178990 (2020)

مصطلحات موضوعية: Microwave noise sources, avalanche noise, noise diodes, built-in test equipment (BITE), Electrical engineering. Electronics. Nuclear engineering, TK1-9971

وصف الملف: electronic resource

Relation: https://ieeexplore.ieee.org/document/9207893/; https://doaj.org/toc/2169-3536

URL الوصول: https://doaj.org/article/a8a21a927587483e8e3070069b051f7d

المؤلفون: Altet Sanahujes, Josep, Barajas Ojeda, Enrique, Mateo Peña, Diego, Billong, Alexandre, Aragonès Cervera, Xavier, Perpiñà Gilabet, Xavier, Reverter Cubarsí, Ferran

المساهمون: Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica, Universitat Politècnica de Catalunya. HIPICS - Grup de Circuits i Sistemes Integrats d'Altes Prestacions, Universitat Politècnica de Catalunya. e-CAT - Circuits i Transductors Electrònics

مصطلحات موضوعية: Àrees temàtiques de la UPC::Enginyeria electrònica::Circuits electrònics, Àrees temàtiques de la UPC::Enginyeria electrònica::Instrumentació i mesura::Sensors i actuadors, Electronic circuits, Detectors, CMOS thermal sensor, CMOS built-in sensor, CMOS integrated circuits, Measurement of RF CMOS circuits, Built-in test and measurement, Circuits electrònics

وصف الملف: application/pdf

Relation: https://www.mdpi.com/1424-8220/21/3/805; info:eu-repo/grantAgreement/AEI/Plan Estatal de Investigación Científica y Técnica y de Innovación 2017-2020/PID2019-103869RB-C33/ES/THE VARIABILITY CHALLENGE IN NANO-CMOS AND BEYOND-CMOS: NOVEL IC DESIGN PARADIGMS FOR MITIGATION AND EXPLOITATION (VIGILANT-UPC)/; Altet, J. [et al.]. BPF-based thermal sensor circuit for on-chip testing of RF circuits. "Sensors (Switzerland)", 2021, vol. 21, núm. article 805.; http://hdl.handle.net/2117/360553

الاتاحة: http://hdl.handle.net/2117/360553
https://doi.org/10.3390/s21030805

المؤلفون: Ahmed Raza, Vladimir Ulansky

المصدر: Applied Sciences; Volume 11; Issue 2; Pages: 715

مصطلحات موضوعية: avionics maintenance, intermittent fault, permanent failure, in-flight false-positive, automated test equipment, mean time between unscheduled removals, built-in test equipment, warranty maintenance, post-warranty maintenance

جغرافية الموضوع: agris

وصف الملف: application/pdf

Relation: Aerospace Science and Engineering; https://dx.doi.org/10.3390/app11020715

الاتاحة: https://doi.org/10.3390/app11020715

المؤلفون: Simoncini G., Palazzi V., Orecchini G., Alimenti F.

المساهمون: Simoncini, G., Palazzi, V., Orecchini, G., Alimenti, F.

مصطلحات موضوعية: Built-In Self Test (BIST), Built-In Test Equipments (BITE), Low-Noise Amplifier (LNA), avalanche noise diodes, noise measurements, BiCMOS technology

Relation: info:eu-repo/semantics/altIdentifier/wos/WOS:001098971500092; ispartofbook:2023 18th European Microwave Integrated Circuits Conference (EuMIC); European Microwave Integrated Circuits Conference (EuMIC); firstpage:374; lastpage:377; numberofpages:4; https://hdl.handle.net/11391/1581575

الاتاحة: https://hdl.handle.net/11391/1581575
https://doi.org/10.23919/EuMIC58042.2023.10288783

المؤلفون: Lyu Yongle, Pang Zhuo, Zhou Chuang, Zhao Peng

المصدر: MATEC Web of Conferences, Vol 309, p 04009 (2020)

مصطلحات موضوعية: radar system, prognostics, health management, built-in test, Engineering (General). Civil engineering (General), TA1-2040

Relation: https://www.matec-conferences.org/articles/matecconf/pdf/2020/05/matecconf_cscns2020_04009.pdf; https://doaj.org/toc/2261-236X; https://doaj.org/article/6541dc996ffb40baadcbdcee1aaae6e8

الاتاحة: https://doi.org/10.1051/matecconf/202030904009
https://doaj.org/article/6541dc996ffb40baadcbdcee1aaae6e8

المؤلفون: Simoncini G., Palazzi V., Orecchini G., Alimenti F.

المساهمون: Simoncini, G., Palazzi, V., Orecchini, G., Alimenti, F.

مصطلحات موضوعية: Avalanche noise diodes, BiCMOS technology, built-in test equipment (BITE), noise measurements, reproducibility, stability

وصف الملف: ELETTRONICO

Relation: info:eu-repo/semantics/altIdentifier/wos/WOS:001071932700001; volume:33; issue:11; firstpage:1525; lastpage:1528; numberofpages:4; journal:IEEE MICROWAVE AND WIRELESS TECHNOLOGY LETTERS; https://hdl.handle.net/11391/1581573; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-85174838371

الاتاحة: https://hdl.handle.net/11391/1581573
https://doi.org/10.1109/LMWT.2023.3312915

المؤلفون: Nordin, Ludvig

مصطلحات موضوعية: Felsökning, Diagnostisering, Built-in test, No fault found, Intermittenta fel, Dynamiskt bayesianskt nätverk, Support vector machine., Other Mechanical Engineering, Annan maskinteknik, Mechanical Engineering, Maskinteknik

وصف الملف: application/pdf

الاتاحة: http://urn.kb.se/resolve?urn=urn:nbn:se:umu:diva-216413

المؤلفون: Nordin, Ludvig

مصطلحات موضوعية: Felsökning, Diagnostisering, Built-in test, No fault found, Intermittenta fel, Dynamiskt bayesianskt nätverk, Support vector machine, Other Mechanical Engineering, Annan maskinteknik, Mechanical Engineering, Maskinteknik

وصف الملف: application/pdf

Relation: http://urn.kb.se/resolve?urn=urn:nbn:se:umu:diva-216413

الاتاحة: http://urn.kb.se/resolve?urn=urn:nbn:se:umu:diva-216413

المؤلفون: Kumar Motamarri, Hemanth, Kumari, B. Leela

المصدر: Bulletin of Electrical Engineering and Informatics; Vol 6, No 1: March 2017; 36-46 ; 2302-9285 ; 2089-3191 ; 10.11591/eei.v6i1

مصطلحات موضوعية: Built-in test generation, functional tests, reachable states, Bit Swapping LFSR (BS-LFSR)

وصف الملف: application/pdf

Relation: https://beei.org/index.php/EEI/article/view/570/892; https://beei.org/index.php/EEI/article/view/570

الاتاحة: https://beei.org/index.php/EEI/article/view/570
https://doi.org/10.11591/eei.v6i1.570

المؤلفون: Motamarri, H. K. (Hemanth), Kumari, B. L. (B)

المصدر: Bulletin of Electrical Engineering and Informatics

مصطلحات موضوعية: Indonesia, Bit Swapping LFSR (BS-LFSR), reachable states, functional tests, Built-in test generation

وصف الملف: application/pdf

Relation: https://www.neliti.com/publications/61565/on-chip-generation-of-functional-tests-with-reduced-delay-and-power

الاتاحة: https://www.neliti.com/publications/61565/on-chip-generation-of-functional-tests-with-reduced-delay-and-power

المؤلفون: Wang, Xian

Thesis Advisors: Chatterjee, Abhijit

مصطلحات موضوعية: Signature test, RF signal generation, Power converter test, Built-in test, DFT, Alternative testing

وصف الملف: application/pdf

الاتاحة: http://hdl.handle.net/1853/53521

المؤلفون: Dušan Korolija

المصدر: Vojnotehnički Glasnik, Vol 47, Iss 6, Pp 15-32 (1999)

مصطلحات موضوعية: electronic system, built-in test equipment, corrective maintenance, operational availability, life cycle costs, optimization, optimal variant of built-in test equipment, Military Science, Engineering (General). Civil engineering (General), TA1-2040

وصف الملف: electronic resource

Relation: https://scindeks.ceon.rs/article.aspx?artid=0042-84699906015K; https://doaj.org/toc/0042-8469; https://doaj.org/toc/2217-4753

URL الوصول: https://doaj.org/article/fccf2ec64fa248b6bab026c0a9a9d287

المؤلفون: Vlcek, K.

مصطلحات موضوعية: VHDL behavioural model, TV-interactive decoder, built-in test, boundary-scan test, mixed signal test, FPGA, cryptolgraphic system

وصف الملف: text; 9-12; application/pdf

Relation: Radioengineering; http://www.radioeng.cz/fulltexts/1995/95_04_01.pdf; Radioengineering. 1995, vol. 4, č. 4, s. 9-12. ISSN 1210-2512; http://hdl.handle.net/11012/58464

الاتاحة: http://hdl.handle.net/11012/58464

المؤلفون: Diego Mateo, Josep Altet, Ferran Reverter, Enrique Barajas, Xavier Perpiñà, Alexandre Billong, Xavier Aragones

المساهمون: Ministerio de Ciencia, Innovación y Universidades (España), Agencia Estatal de Investigación (España), Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica, Universitat Politècnica de Catalunya. HIPICS - Grup de Circuits i Sistemes Integrats d'Altes Prestacions, Universitat Politècnica de Catalunya. e-CAT - Circuits i Transductors Electrònics

المصدر: Sensors, Vol 21, Iss 805, p 805 (2021)
UPCommons. Portal del coneixement obert de la UPC
Universitat Politècnica de Catalunya (UPC)
Sensors (Basel, Switzerland)
Digital.CSIC. Repositorio Institucional del CSIC
instname
Sensors
Volume 21
Issue 3

مصطلحات موضوعية: Materials science, CMOS built-in sensor, Circuits electrònics, Enginyeria electrònica::Circuits electrònics [Àrees temàtiques de la UPC], Topology (electrical circuits), 02 engineering and technology, Integrated circuit, Hardware_PERFORMANCEANDRELIABILITY, lcsh:Chemical technology, 01 natural sciences, Biochemistry, Article, Analytical Chemistry, law.invention, CMOS thermal sensor, Enginyeria electrònica::Instrumentació i mesura::Sensors i actuadors [Àrees temàtiques de la UPC], law, Hardware_GENERAL, Electronic circuits, 0202 electrical engineering, electronic engineering, information engineering, Hardware_INTEGRATEDCIRCUITS, lcsh:TP1-1185, Electrical and Electronic Engineering, Instrumentation, Electronic circuit, built-in test and measurement, business.industry, Amplifier, 020208 electrical & electronic engineering, 010401 analytical chemistry, Transistor, Measurement of RF CMOS circuits, Electrical engineering, measurement of RF CMOS circuits, Detectors, CMOS integrated circuits, Atomic and Molecular Physics, and Optics, 0104 chemical sciences, Built-in test and measurement, CMOS, Voltmeter, business, Voltage, Hardware_LOGICDESIGN

وصف الملف: application/pdf

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::e305164e6aad0208c31d2c9e66c91d15
https://www.mdpi.com/1424-8220/21/3/805

المؤلفون: Hsiao, Sen-Wen

Thesis Advisors: Chatterjee, Abhijit

مصطلحات موضوعية: Phase-locked loop, Built-in test, Built-in self-test, Calibration, Analog sensor, Reference spur, Frequency synthesizers, Telecommunication systems, Phase detectors, Phase-locked loops

وصف الملف: application/pdf

الاتاحة: http://hdl.handle.net/1853/51790

المؤلفون: Onabajo, Marvin Olufemi

Thesis Advisors: Silva-Martinez, Jose

مصطلحات موضوعية: Built-in test (BIT), loopback, offset mixer, RF front-end testing, RF current injection, low-noise amplifier (LNA), integrated transceiver

وصف الملف: electronic; application/pdf; born digital

الاتاحة: http://hdl.handle.net/1969.1/ETD-TAMU-2501