المؤلفون: Sorin Liviu Jurj, Raul Rotar

المصدر: IEEE Access, Vol 12, Pp 37715-37730 (2024)

مصطلحات موضوعية: Online built-in self-test, bit-flip mechanism, extended hamming codes, stuck-at faults, solar tracking, Electrical engineering. Electronics. Nuclear engineering, TK1-9971

وصف الملف: electronic resource

Relation: https://ieeexplore.ieee.org/document/10464275/; https://doaj.org/toc/2169-3536

URL الوصول: https://doaj.org/article/9fa9745b43e84e9fbeb7243c43a0c9a7

المؤلفون: Yannick Wenger, Bernd Meinerzhagen, Vadim Issakov

المصدر: IEEE Access, Vol 12, Pp 78572-78588 (2024)

مصطلحات موضوعية: Built-in self-test, CMOS, millimeter-wave transceivers, SiGe, silicon, Electrical engineering. Electronics. Nuclear engineering, TK1-9971

وصف الملف: electronic resource

Relation: https://ieeexplore.ieee.org/document/10540118/; https://doaj.org/toc/2169-3536

URL الوصول: https://doaj.org/article/b79a76d139c845c78c3ea5bd6981df00

المؤلفون: Callegari, Sergio

المساهمون: P.Y.P. Chen, V. Martinez-Luaces, Callegari, Sergio

مصطلحات موضوعية: analog to digital converter (ADC), digital to analog converter (DAC), oscillation based test (OBT), built-in self test (BIST), entropy source, chaotic map

وصف الملف: STAMPA

Relation: info:eu-repo/semantics/altIdentifier/isbn/978-1-83769-450-1; ispartofbook:Nonlinear Systems and Matrix Analysis - Recent Advances in Theory and Applications; volume:chapter 4; firstpage:1; lastpage:21; numberofpages:21; alleditors:P.Y.P. Chen, V. Martinez-Luaces; https://hdl.handle.net/11585/995125; https://www.intechopen.com/chapters/1182748

الاتاحة: https://hdl.handle.net/11585/995125
https://doi.org/10.5772/intechopen.1005654
https://www.intechopen.com/chapters/1182748

المؤلفون: Vadim Geurkov, Valeri Kirischian, Lev Kirischian

مصطلحات موضوعية: Electrical energy systems, n.e.c, analog-to-digital converter, built-in self-test, signature analysis

الاتاحة: https://doi.org/10.32920/21493938.v1
https://figshare.com/articles/conference_contribution/Signature_Testing_of_Analog-To-Digital_Converters/21493938

المؤلفون: Ayush Yadav, K.B.Ramesh

المصدر: Recent Trends in Analog Design and Digital Devices, 7(3), 17-22, (2024-09-04)

مصطلحات موضوعية: Computational logic unit, Built in self-test (BIST), Parallelism, Pipelining, Bitwidth optimization, Multiplexer optimization, Decoder optimization

Relation: https://zenodo.org/communities/elepub; https://doi.org/10.5281/zenodo.13682075; https://doi.org/10.5281/zenodo.13682076; oai:zenodo.org:13682076

الاتاحة: https://doi.org/10.5281/zenodo.13682076

المؤلفون: Vijay Sontakke, Delsikreo Atchina

المصدر: International Journal of Electrical and Computer Engineering (IJECE), 14(1), (2024-02-01)

مصطلحات موضوعية: Built-in repair analysis, Built-in self-repair, Built-in self-test, Error correcting codes, Memory testing, Yield

Relation: oai:zenodo.org:10457155

الاتاحة: https://doi.org/10.11591/ijece.v14i1.pp140-156

المؤلفون: Sontakke, Vijay, Atchina, Delsikreo

المصدر: International Journal of Electrical and Computer Engineering (IJECE), 14(2), 1406-1423, (2024-04-01)

مصطلحات موضوعية: 3D memory test, Built-in self test, In-system test, Linear feedback shift register, March algorithm, Power-on self test

Relation: oai:zenodo.org:11206635

الاتاحة: https://doi.org/10.11591/ijece.v14i2.pp1406-1423

المؤلفون: Annavarapu Praneeth, Govardhani Immadi, V. S. V. Prabhakar, Venkata Narayana Madhava Reddy

المصدر: Engineering, Technology & Applied Science Research, Vol 14, Iss 3 (2024)

مصطلحات موضوعية: USB, JTAG, scan chains, logic vision, Design-for-Testability (DFT), Logic Built-In Self-Test (LBIST), Engineering (General). Civil engineering (General), TA1-2040, Technology (General), T1-995, Information technology, T58.5-58.64

Relation: https://etasr.com/index.php/ETASR/article/view/7163; https://doaj.org/toc/2241-4487; https://doaj.org/toc/1792-8036; https://doaj.org/article/f3fa369be970464586b099605b11ee36

الاتاحة: https://doi.org/10.48084/etasr.7163
https://doaj.org/article/f3fa369be970464586b099605b11ee36

المؤلفون: Paolo Bernardi, Gabriele Filipponi, Giusy Iaria, Claudia Bertani, Vincenzo Tancorre

المساهمون: Bernardi, Paolo, Filipponi, Gabriele, Iaria, Giusy, Bertani, Claudia, Tancorre, Vincenzo

مصطلحات موضوعية: functional safety, Logic Built-In Self-Test (LBIST), Silicon Lifecycle Management (SLM), logic diagnosi, Multiple Input Signature Register (MISR), in-field data collection

Relation: volume:13; issue:21; numberofpages:29; journal:ELECTRONICS; https://hdl.handle.net/11583/2993857

الاتاحة: https://hdl.handle.net/11583/2993857
https://doi.org/10.3390/electronics13214234
https://www.mdpi.com/2079-9292/13/21/4234

المؤلفون: Xiaojian Wang, Xiaoye Sun, Zixuan Wang

المصدر: IET Circuits, Devices and Systems, Vol 17, Iss 3, Pp 149-159 (2023)

مصطلحات موضوعية: built‐in self test, visual programing, Computer engineering. Computer hardware, TK7885-7895

وصف الملف: electronic resource

Relation: https://doaj.org/toc/1751-858X; https://doaj.org/toc/1751-8598

URL الوصول: https://doaj.org/article/f1906cb631304326aff328d272e4bf0b

المؤلفون: Irith Pomeranz

المصدر: IEEE Access, Vol 11, Pp 139335-139344 (2023)

مصطلحات موضوعية: Full scan design, linear-feedback shift-register (LFSR), logic built-in self-test (LBIST), on-chip test generation, test data compression, Electrical engineering. Electronics. Nuclear engineering, TK1-9971

وصف الملف: electronic resource

Relation: https://ieeexplore.ieee.org/document/10352137/; https://doaj.org/toc/2169-3536

URL الوصول: https://doaj.org/article/02faa3d876e44bc691d77b637b1639a7

المؤلفون: Hendrik P. Nel, Fortunato Carlos Dualibe, Tinus Stander

المصدر: IEEE Open Journal of Circuits and Systems, Vol 4, Pp 70-84 (2023)

مصطلحات موضوعية: Built-in self-test, circuit simulation, CMOS, design for testability, LNA, microwave integrated circuits, Electric apparatus and materials. Electric circuits. Electric networks, TK452-454.4

وصف الملف: electronic resource

Relation: https://ieeexplore.ieee.org/document/10002329/; https://doaj.org/toc/2644-1225

URL الوصول: https://doaj.org/article/fc9c8e8e603c40a692be84e985220816

المؤلفون: Kenneth K. O, Wooyeol Choi, Yukun Zhu, Haidong Guo

المصدر: IEEE Open Journal of the Solid-State Circuits Society, Vol 3, Pp 17-31 (2023)

مصطلحات موضوعية: Built-in self-test (BIST), Complementary Metal Oxide Semiconductor (CMOS), everyday applications, integrated circuits (IC’s), interconnects, nonlinear devices, Electric apparatus and materials. Electric circuits. Electric networks, TK452-454.4

وصف الملف: electronic resource

Relation: https://ieeexplore.ieee.org/document/9951399/; https://doaj.org/toc/2644-1349

URL الوصول: https://doaj.org/article/1713f8ae58b64e8b8d7337ba0bb645de

المؤلفون: Nel, Hendrik P., Dualibe, Fortunato, Stander, Tinus

المساهمون: Electronics and Microelectronics, Numediart

المصدر: IEEE Open Journal of Circuits and Systems, 4, 70-84 (2023-03-02)

مصطلحات موضوعية: Built-in self-test, circuit simulation, CMOS, design for testability, LNA, microwave integrated circuits, oscillation-based testing, PVT, Engineering, computing & technology, Electrical & electronics engineering, Ingénierie, informatique & technologie, Ingénierie électrique & électronique

Relation: http://xplorestaging.ieee.org/ielx7/8784029/10019301/10002329.pdf?arnumber=10002329; urn:issn:2644-1225; https://orbi.umons.ac.be/handle/20.500.12907/47391; info:hdl:20.500.12907/47391; https://orbi.umons.ac.be/bitstream/20.500.12907/47391/1/Influence_of_PVT_Variation_and_Threshold_Selection_on_OBT_and_OBIST_Fault_Detection_in_RFCMOS_Amplifiers.pdf

الاتاحة: https://orbi.umons.ac.be/handle/20.500.12907/47391
https://hdl.handle.net/20.500.12907/47391
https://orbi.umons.ac.be/bitstream/20.500.12907/47391/1/Influence_of_PVT_Variation_and_Threshold_Selection_on_OBT_and_OBIST_Fault_Detection_in_RFCMOS_Amplifiers.pdf
https://doi.org/10.1109/ojcas.2022.3232638

المؤلفون: Anwer Sabah Ahmed, Qais Al-Gayem

المصدر: International Journal of Electrical and Computer Engineering (IJECE), 13(3), 3367-3374, (2023-06-01)

مصطلحات موضوعية: Akima interpolation, Built-in self-test, Cubic spline interpolation, Microelectromechanical system

Relation: oai:zenodo.org:7869968

الاتاحة: https://doi.org/10.11591/ijece.v13i3.pp3367-3374

المؤلفون: Renold Sam Vethamuthu Edward Alaises, Sivanantham Sathasivam

المصدر: Electronics; Volume 12; Issue 4; Pages: 908

مصطلحات موضوعية: TSV (through-silicon vias), BIST (built-in-self-test), yield, repair, read group, write group, test time, 3D stacked IC (3D-SICs)

وصف الملف: application/pdf

Relation: Circuit and Signal Processing; https://dx.doi.org/10.3390/electronics12040908

الاتاحة: https://doi.org/10.3390/electronics12040908

المؤلفون: Ahmad Menbari, Hemin Rahimi, Hadi Jahanirad, Daniel Ziener

مصطلحات موضوعية: Components, Circuits, Devices and Systems, 3D Monolithic Integrated Circuits, Inter-Layer Vias, Built-In Self-Test, Fault Detection and Localization

Relation: https://figshare.com/articles/preprint/A_Clustering-BIST_Design_for_Inter-Layer_Vias_in_3D_ICs_Based_on_Walking_Pattern_Approach/24604479

الاتاحة: https://doi.org/10.36227/techrxiv.24604479.v1
https://figshare.com/articles/preprint/A_Clustering-BIST_Design_for_Inter-Layer_Vias_in_3D_ICs_Based_on_Walking_Pattern_Approach/24604479

المؤلفون: Jaewon Park, Jae Hoon Lee, Sang-Kil Park, Ki Chul Chun, Kyomin Sohn, Sungho Kang

المصدر: IEEE Access, Vol 9, Pp 33487-33497 (2021)

مصطلحات موضوعية: Built-in self-test, DRAM chips, test, Electrical engineering. Electronics. Nuclear engineering, TK1-9971

وصف الملف: electronic resource

Relation: https://ieeexplore.ieee.org/document/9360743/; https://doaj.org/toc/2169-3536

URL الوصول: https://doaj.org/article/14bfe40df87d40c1a5cb37454d13b862

المؤلفون: Vishnupriya Shivakumar, Chinnaiyan Senthilpari, Zubaida Yusoff

المصدر: IEEE Access, Vol 9, Pp 29366-29379 (2021)

مصطلحات موضوعية: Built-in self-test (BIST), circuit under test (CUT), test-pattern generator (TPG), Electrical engineering. Electronics. Nuclear engineering, TK1-9971

وصف الملف: electronic resource

Relation: https://ieeexplore.ieee.org/document/9353528/; https://doaj.org/toc/2169-3536

URL الوصول: https://doaj.org/article/2c9285be1e6d41b787ca2fe3156380d0

المؤلفون: Donghyun Han, Hayoung Lee, Sungho Kang

المصدر: IEEE Access, Vol 9, Pp 76716-76729 (2021)

مصطلحات موضوعية: Built-in redundancy analysis (BIRA), built-in self-repair (BISR), built-in self-test (BIST), memory repair, repair rate, yield improvement, Electrical engineering. Electronics. Nuclear engineering, TK1-9971

وصف الملف: electronic resource

Relation: https://ieeexplore.ieee.org/document/9439471/; https://doaj.org/toc/2169-3536

URL الوصول: https://doaj.org/article/eb095466d6924cb1a15480fd52b3797c