المؤلفون: Zampa, Francesco, Bandey, Helen, Beardah, Matthew, Bécue, Andy, Bouzaid, Eric, Branco, Maria Joao, Buegler, Jürgen, Kambosos, Maria, Kneppers, Alexander L.J., Kriiska-Maiväli, Kairi, Mattei, Aldo, Zatkalikova, Livia

المساهمون: European Commission, Internal Security Fund - Police

المصدر: Science & Justice ; volume 65, issue 1, page 5-20 ; ISSN 1355-0306

الاتاحة: https://doi.org/10.1016/j.scijus.2024.12.001
https://api.elsevier.com/content/article/PII:S1355030624001199?httpAccept=text/xml
https://api.elsevier.com/content/article/PII:S1355030624001199?httpAccept=text/plain

المؤلفون: Koenig, Agnès, Bügler, Jürgen, Kirsch, Dieter, Köhler, Fritz, Weyermann, Céline

المساهمون: Swiss National Science Foundation

المصدر: Journal of Forensic Sciences ; volume 60, issue s1 ; ISSN 0022-1198 1556-4029

الاتاحة: http://dx.doi.org/10.1111/1556-4029.12603
https://api.wiley.com/onlinelibrary/tdm/v1/articles/10.1111%2F1556-4029.12603
https://onlinelibrary.wiley.com/doi/pdf/10.1111/1556-4029.12603

المؤلفون: Buegler, Juergen H., Frickinger, J., Zielonka, G., Pfitzner, Lothar, Ryssel, Heiner, Schottler, M.

المساهمون: Kissinger, Gudrun, Weiland, Larg H.

المصدر: SPIE Proceedings ; In-Line Characterization, Yield, Reliability, and Failure Analysis in Microelectronic Manufacturing II ; ISSN 0277-786X

الاتاحة: http://dx.doi.org/10.1117/12.425279

المؤلفون: Weyermann, Céline, Almog, Joseph, Bügler, Jürgen, Cantu, Antonio A.

المساهمون: Swiss National Foundation

المصدر: Forensic Science International ; volume 214, issue 1-3, page 214 ; ISSN 0379-0738

الاتاحة: http://dx.doi.org/10.1016/j.forsciint.2011.07.051
https://api.elsevier.com/content/article/PII:S0379073811003902?httpAccept=text/xml
https://api.elsevier.com/content/article/PII:S0379073811003902?httpAccept=text/plain

المؤلفون: Schönherr, Holger, Beulen, Marcel W. J., Bügler, Jürgen, Huskens, Jurriaan, van Veggel, Frank C. J. M., Reinhoudt, David N., Vancso, G. Julius

المصدر: ACS Symposium Series ; Interfacial Properties on the Submicrometer Scale ; page 113-128 ; ISSN 0097-6156 1947-5918 ; ISBN 9780841236912 9780841218482

الاتاحة: http://dx.doi.org/10.1021/bk-2001-0781.ch007
https://pubs.acs.org/doi/pdf/10.1021/bk-2001-0781.ch007

المؤلفون: Weyermann, Céline, Almog, Joseph, Bügler, Jürgen, Cantu, Antonio A.

المصدر: Forensic Science International ; volume 210, issue 1-3, page 52-62 ; ISSN 0379-0738

الاتاحة: http://dx.doi.org/10.1016/j.forsciint.2011.01.034
https://api.elsevier.com/content/article/PII:S0379073811000491?httpAccept=text/xml
https://api.elsevier.com/content/article/PII:S0379073811000491?httpAccept=text/plain

المؤلفون: Bügler, Jürgen H., de Jong, Menno, Engbersen, Johan F. J., Reinhoudt, David N.

المصدر: Sensor Technology in the Netherlands: State of the Art ; page 305-309 ; ISBN 9789401061032 9789401150101

الاتاحة: http://dx.doi.org/10.1007/978-94-011-5010-1_49
http://link.springer.com/content/pdf/10.1007/978-94-011-5010-1_49

المؤلفون: Bügler, Jürgen H., Buchner, Hans, Dallmayer, Anton

المصدر: Journal of Forensic Sciences ; volume 53, issue 4, page 982-988 ; ISSN 0022-1198 1556-4029

الاتاحة: http://dx.doi.org/10.1111/j.1556-4029.2008.00745.x
https://api.wiley.com/onlinelibrary/tdm/v1/articles/10.1111%2Fj.1556-4029.2008.00745.x
https://onlinelibrary.wiley.com/doi/pdf/10.1111/j.1556-4029.2008.00745.x

المؤلفون: Beulen, Marcel W. J., Bügler, Jürgen, de Jong, Menno R., Lammerink, Ben, Huskens, Jurriaan, Schönherr, Holger, Vancso, G. Julius, Boukamp, Bernard A., Wieder, Herbert, Offenhäuser, Andreas, Knoll, Wolfgang, van Veggel, Frank C. J. M., Reinhoudt, David N.

المصدر: Chemistry - A European Journal ; volume 6, issue 7, page 1176-1183 ; ISSN 0947-6539 1521-3765

الاتاحة: http://dx.doi.org/10.1002/(sici)1521-3765(20000403)6:7%3C1176::aid-chem1176%3E3.3.co%3B2-t
http://api.wiley.com/onlinelibrary/tdm/v1/articles/10.1002%2F(SICI)1521-3765(20000403)6:7%3C1176::AID-CHEM1176%3E3.3.CO%3B2-T
https://onlinelibrary.wiley.com/doi/full/10.1002/(SICI)1521-3765(20000403)6:7%3C1176::AID-CHEM1176%3E3.3.CO%3B2-T

المؤلفون: Schönherr, Holger, Beulen, Marcel W. J., Bügler, Jürgen, Huskens, Jurriaan, van Veggel, Frank C. J. M., Reinhoudt, David N., Vancso, G. Julius

المصدر: Journal of the American Chemical Society ; volume 122, issue 20, page 4963-4967 ; ISSN 0002-7863 1520-5126

الاتاحة: http://dx.doi.org/10.1021/ja994040i
https://pubs.acs.org/doi/pdf/10.1021/ja994040i

المؤلفون: Bügler, Jürgen, Engbersen, Johan F.J., Reinhoudt, David N.

وصف الملف: application/pdf

Relation: http://doc.utwente.nl/11083/1/Bugler98Novel.pdf; http://purl.utwente.nl/publications/11083

الاتاحة: http://purl.utwente.nl/publications/11083

المؤلفون: Beulen, Marcel W. J., Bügler, Jürgen, Lammerink, Ben, Geurts, Frank A. J., Biemond, Ed M. E. F., van Leerdam, Kees G. C., van Veggel, Frank C. J. M., Engbersen, Johan F. J., Reinhoudt, David N.

المصدر: Langmuir ; volume 14, issue 22, page 6424-6429 ; ISSN 0743-7463 1520-5827

الاتاحة: http://dx.doi.org/10.1021/la980936+
https://pubs.acs.org/doi/pdf/10.1021/la980936%2B

المؤلفون: Bügler, Jürgen, Sommerdijk, Nico A. J. M., Visser, Antonie J. W. G., van Hoek, Arie, Nolte, Roeland J. M., Engbersen, Johan F. J., Reinhoudt, David N.

المصدر: Journal of the American Chemical Society ; volume 121, issue 1, page 28-33 ; ISSN 0002-7863 1520-5126

الاتاحة: http://dx.doi.org/10.1021/ja9828657
https://pubs.acs.org/doi/pdf/10.1021/ja9828657

المؤلفون: Bügler, Jürgen, Engbersen, Johan F. J., Reinhoudt, David N.

المصدر: The Journal of Organic Chemistry ; volume 63, issue 16, page 5339-5344 ; ISSN 0022-3263 1520-6904

الاتاحة: http://dx.doi.org/10.1021/jo9723321
https://pubs.acs.org/doi/pdf/10.1021/jo9723321