المؤلفون: J.A. Patrick, Allen H. Gabor, D. Slisher, T. Su, Chien Yu, D. Wehella-Gamage, C. Collins, E. Meyette, George Richard Goth, P. Lindo, R. Van Roijen, M. Rutten, V. Nastasi, R. Amos, Qingyun Yang, Rich Wise, T. Rust, Brian L. Tessier, D.P. Prakash, Shahid Butt, Bryant C. Colwill, A. Santiago, B. Davies, Amanda Piper, Jeffrey J. Brown, N. Le, Kevin E. Mello, A. Chan, J. Tetzloff, R. Gehres, Rajeev Malik, R. Divakaruni

المصدر: The 17th Annual SEMI/IEEE ASMC 2006 Conference.

مصطلحات موضوعية: Engineering, Yield (engineering), business.industry, Process design, Automotive engineering, law.invention, Dual (category theory), Power (physics), Microprocessor, CMOS, law, Electronic engineering, IBM, business, Electronic circuit

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::a25d0c4d8d5325534258d76aee5e2c95
https://doi.org/10.1109/asmc.2006.1638793