المؤلفون: Majumder, Neeta¹, Bhattacharya, Soumendu²

المصدر: Journal of Global Information and Business Strategy 10(1):30-43. 2018

المؤلفون: Bhattacharya, Soumendu

مصطلحات موضوعية: Wireless systems, Optimization, Production testing, Sensors, Built-in-test

وصف الملف: 3161082 bytes; application/pdf

الاتاحة: http://hdl.handle.net/1853/7200

المؤلفون: Bhattacharya, Soumendu, Majumder, Neeta

المصدر: Turkish Online Journal of Qualitative Inquiry; 2021, Vol. 12 Issue 10, p2370-2379, 10p

مصطلحات موضوعية: BANKING industry, MICROFINANCE, LOANS, DISBURSEMENTS, GOVERNMENT aid

مصطلحات جغرافية: INDIA

المؤلفون: Devarakond, Shyam Kumar, Sen, Shreyas, Bhattacharya, Soumendu, Chatterjee, Abhijit

المصدر: 2010 28th VLSI Test Symposium (VTS) ; page 337-342

الاتاحة: http://dx.doi.org/10.1109/vts.2010.5469536
http://xplorestaging.ieee.org/ielx5/5464131/5469528/05469536.pdf?arnumber=5469536

المؤلفون: Bhattacharya, Soumendu, Chatterjee, Abhijit

المصدر: System-on-Chip Test Architectures ; page 745-789 ; ISBN 9780123739735

الاتاحة: http://dx.doi.org/10.1016/b978-012373973-5.50021-8

المؤلفون: Senguttuvan, Rajarajan, Bhattacharya, Soumendu, Chatterjee, Abhijit

المصدر: 2006 49th IEEE International Midwest Symposium on Circuits and Systems ; volume 43, page 633-637 ; ISSN 1548-3746

الاتاحة: http://dx.doi.org/10.1109/mwscas.2006.381811
http://xplorestaging.ieee.org/ielx5/4267031/4267246/04267435.pdf?arnumber=4267435

المؤلفون: BHATTACHARYA, SOUMENDU, HUANG, LEAF

المصدر: Medical Applications of Liposomes ; page 371-394 ; ISBN 9780444829177

الاتاحة: http://dx.doi.org/10.1016/b978-044482917-7/50022-3
https://api.elsevier.com/content/article/PII:B9780444829177500223?httpAccept=text/xml
https://api.elsevier.com/content/article/PII:B9780444829177500223?httpAccept=text/plain

المؤلفون: Voorakaranam, Ram, Akbay, Selim Sermet, Bhattacharya, Soumendu, Cherubal, Sasikumar, Chatterjee, Abhijit

المصدر: IEEE Transactions on Circuits and Systems I: Regular Papers ; volume 54, issue 5, page 1018-1031 ; ISSN 1057-7122

الاتاحة: http://dx.doi.org/10.1109/tcsi.2007.895531
http://xplorestaging.ieee.org/ielx5/8919/4195621/04195649.pdf?arnumber=4195649

المؤلفون: Bhattacharya, Soumendu, Chatterjee, Abhijit

المصدر: IEEE Design and Test of Computers ; volume 23, issue 6, page 464-475 ; ISSN 0740-7475

الاتاحة: http://dx.doi.org/10.1109/mdt.2006.136
http://xplorestaging.ieee.org/ielx5/54/4042499/04042508.pdf?arnumber=4042508

المؤلفون: Bhattacharya, Soumendu, Halder, Achintya, Srinivasan, Ganesh, Chatterjee, Abhijit

المصدر: Journal of Electronic Testing ; volume 21, issue 3, page 323-339 ; ISSN 0923-8174 1573-0727

الاتاحة: http://dx.doi.org/10.1007/s10836-005-6361-9
http://link.springer.com/content/pdf/10.1007/s10836-005-6361-9.pdf
http://link.springer.com/article/10.1007/s10836-005-6361-9/fulltext.html
http://link.springer.com/content/pdf/10.1007/s10836-005-6361-9

المؤلفون: Bhattacharya, Soumendu, Chatterjee, Abhijit

المصدر: ACM Transactions on Design Automation of Electronic Systems ; volume 10, issue 2, page 303-329 ; ISSN 1084-4309 1557-7309

الاتاحة: http://dx.doi.org/10.1145/1059876.1059882
https://dl.acm.org/doi/pdf/10.1145/1059876.1059882

المؤلفون: Bhattacharya, Soumendu, Moss, Robert A., Ringsdorf, Helmut, Simon, Joachim

المصدر: Langmuir ; volume 13, issue 7, page 1869-1872 ; ISSN 0743-7463 1520-5827

الاتاحة: http://dx.doi.org/10.1021/la960992f
https://pubs.acs.org/doi/pdf/10.1021/la960992f

المؤلفون: Moss, Robert A., Bhattacharya, Soumendu

المصدر: Journal of the American Chemical Society ; volume 117, issue 33, page 8688-8689 ; ISSN 0002-7863 1520-5126

الاتاحة: http://dx.doi.org/10.1021/ja00138a034
https://pubs.acs.org/doi/pdf/10.1021/ja00138a034