المؤلفون: Tooley, O., Pointer, W., Radmall, R., Hall, M., Beyer, V., Stakem, K., Swift, Thomas, Town, J., Junkers, T., Wilson, P., Lester, D., Hadleton, D.

مصطلحات موضوعية: Diffusion-ordered spectroscopy, Macromolecule, Molecular weight, NMR spectroscopy, Polymer

الاتاحة: http://hdl.handle.net/10454/19863

المؤلفون: Beyer, V.

المصدر: Max-Planck-Institut für Wissenschaftsgeschichte : Preprint

وصف الملف: application/pdf

Relation: http://hdl.handle.net/21.11116/0000-0005-5CAD-2; http://hdl.handle.net/21.11116/0000-0005-5CAF-0

الاتاحة: http://hdl.handle.net/21.11116/0000-0005-5CAD-2
http://hdl.handle.net/21.11116/0000-0005-5CAF-0

المؤلفون: Yilmaz, G, Uzunova, V, Hartweg, M, Beyer, V, Napier, R, Becer, CR

وصف الملف: 611 - 618

Relation: POLYMER CHEMISTRY; http://qmro.qmul.ac.uk/xmlui/handle/123456789/39643

الاتاحة: http://qmro.qmul.ac.uk/xmlui/handle/123456789/39643
https://doi.org/10.1039/c7py01939d

المؤلفون: Talamo Blandin, A., Muehlematter, D., Bougeon, S., Gogniat, C., Porter, S., Beyer, V., Parlier, V., Beckmann, J., Van Melle, G., Jotterand, M.

المصدر: Regenerative medicine, CHUV Research Day, January 17, 2008, pp. ODE-26, 180

وصف الملف: application/pdf

Relation: info:eu-repo/semantics/altIdentifier/urn/urn:nbn:ch:serval-BIB_1410E84B49B96; https://serval.unil.ch/notice/serval:BIB_1410E84B49B9; https://serval.unil.ch/resource/serval:BIB_1410E84B49B9.P001/REF.pdf

الاتاحة: https://serval.unil.ch/notice/serval:BIB_1410E84B49B9
https://serval.unil.ch/resource/serval:BIB_1410E84B49B9.P001/REF.pdf
http://nbn-resolving.org/urn/resolver.pl?urn=urn:nbn:ch:serval-BIB_1410E84B49B96

المؤلفون: Drain, B. A., Beyer, V. P., Cattoz, B., Becer, C. R.

المصدر: Macromolecules ; volume 54, issue 12, page 5549-5556 ; ISSN 0024-9297 1520-5835

الاتاحة: http://dx.doi.org/10.1021/acs.macromol.1c00529
https://pubs.acs.org/doi/pdf/10.1021/acs.macromol.1c00529

المؤلفون: Vona, B., Neuner, C., El Hajj, N., Schneider, E., Farcas, R., Beyer, V., Zechner, U., Keilmann, A., Poot, M., Bartsch, O., Nanda, I., Haaf, T.

المصدر: Molecular Syndromology ; volume 5, issue 1, page 3-10 ; ISSN 1661-8769 1661-8777

الاتاحة: http://dx.doi.org/10.1159/000355443
https://www.karger.com/Article/Pdf/355443

المؤلفون: Pomelona Nurseries, Beyer, V. L., Henry G. Gilbert Nursery and Seed Trade Catalog Collection, V.L. Beyer (Firm)

المساهمون: U.S. Department of Agriculture, National Agricultural Library

مصطلحات موضوعية: Catalogs, Fruit trees, Mississippi, Nursery stock, Nut trees, Ocean Springs, Seedlings

URL الوصول: http://www.biodiversitylibrary.org/bibliography/100330

المؤلفون: Hoffarth, S, Zitzer, A, Wiewrodt, R, Hähnel, P S, Beyer, V, Kreft, A, Biesterfeld, S, Schuler, M

المصدر: Cell Death & Differentiation ; volume 15, issue 1, page 161-170 ; ISSN 1350-9047 1476-5403

الاتاحة: http://dx.doi.org/10.1038/sj.cdd.4402256
http://www.nature.com/articles/4402256.pdf
http://www.nature.com/articles/4402256

المؤلفون: Beyer V.

المساهمون: Société Française d'Archéologie

المصدر: Bulletin Monumental 120(1):110-111

URL الوصول: https://www.persee.fr/doc/bulmo_0007-473X_1962_num_120_1_8667_T1_0110_0000_2

المؤلفون: Rao, N.R.H., Beyer, V., Thielemans, W., Muylaert, K.

المصدر: Algal Research; Jul2024, Vol. 81, pN.PAG-N.PAG, 1p

المؤلفون: Beyer, V.¹, von Borany, J.¹, Klimenkov, M.², Müller, T.³

المصدر: Journal of Applied Physics. Sep2009, Vol. 106 Issue 6, p064505-1-064505-11. 11p. 7 Diagrams, 5 Charts, 14 Graphs.

مصطلحات موضوعية: *METAL oxide semiconductors, *ELECTRON distribution, *NANOSILICON, *GERMANIUM crystals, *CHARGE transfer, *MATHEMATICAL physics

المؤلفون: Beyer, V.¹, Eichhorn, F.¹, von Borany, J.¹, Mücklich, A.¹, Müller, T.²

المصدر: Journal of Applied Physics. Jul2008, Vol. 104 Issue 2, p024512. 7p. 5 Diagrams, 2 Charts, 7 Graphs.

مصطلحات موضوعية: *CHARGE coupled devices, *SEMICONDUCTORS, *METALLIC oxides, *ION bombardment, *DIELECTRIC devices, *METAL oxide semiconductors, *NANOCRYSTALS

المؤلفون: Beyer, V.¹, von Borany, J.¹, Klimenkov, M.²

المصدر: Journal of Applied Physics. 5/1/2007, Vol. 101 Issue 9, p094507. 7p. 6 Diagrams, 2 Charts, 7 Graphs.

مصطلحات موضوعية: *QUANTUM tunneling, *NANOCRYSTALS, *SPUTTERING (Physics), *SPECTROMETRY, *SCANNING transmission electron microscopy, *OXIDES

المؤلفون: Beyer, V.¹, von Borany, J.¹, Heinig, K.-H.¹

المصدر: Journal of Applied Physics. 3/1/2007, Vol. 101 Issue 5, p053516-N.Pag. 6p. 5 Diagrams, 6 Graphs.

مصطلحات موضوعية: *DISSOCIATION (Chemistry), *ELECTRON microscopy, *DIFFUSION, *ION implantation, *ANNEALING of crystals, *BACKSCATTERING, *INDUSTRIAL use of oxygen

المؤلفون: Stöger-Pollach, M., Schachinger, T., Biedermann, K., Beyer, V.

Time: 621, 530

Relation: Ultramicroscopy; https://publica.fraunhofer.de/handle/publica/252241

الاتاحة: https://publica.fraunhofer.de/handle/publica/252241
https://doi.org/10.1016/j.ultramic.2016.11.022

المؤلفون: Ocker, J., Slesazeck, S., Hoffmann, R., Beyer, V., Skouris, A., Srowik, R., Buschbeck, S., Gunther, S., Mikolajick, T.

المصدر: 2015 IEEE International Integrated Reliability Workshop (IIRW) ; volume 56, page 13-16

الاتاحة: http://dx.doi.org/10.1109/iirw.2015.7437058
http://xplorestaging.ieee.org/ielx7/7430433/7437006/07437058.pdf?arnumber=7437058

المؤلفون: Ocker, J., Slesazeck, S., Mikolajick, T., Buschbeck, S., Gunther, S., Yurchuk, E., Hoffmann, R., Beyer, V.

المصدر: 2015 45th European Solid State Device Research Conference (ESSDERC) ; volume 25, page 118-121

الاتاحة: http://dx.doi.org/10.1109/essderc.2015.7324727
http://xplorestaging.ieee.org/ielx7/7300344/7324696/07324727.pdf?arnumber=7324727

المؤلفون: Weinreich, W., Seidel, K., Rudolph, M., Koch, J., Paul, J., Riedel, S., Sundqvist, J., Steidel, K., Gutsch, M., Beyer, V., Hohle, C.

Relation: International Semiconductor Conference Dresden-Grenoble (ISCDG) 2013; International Semiconductor Conference Dresden-Grenoble, ISCDG 2013; https://publica.fraunhofer.de/handle/publica/383367

الاتاحة: https://publica.fraunhofer.de/handle/publica/383367
https://doi.org/10.1109/ISCDG.2013.6656306

المؤلفون: Kuligk, A., Nguyen, C.D., Löhr, D.-A., Beyer, V., Meinerzhagen, B.

Time: 621

Relation: International Conference on Ultimate Integration on Silicon (ULIS) 2013; ULIS 2013, 14th International Conference on Ultimate Integration on Silicon; https://publica.fraunhofer.de/handle/publica/380923

الاتاحة: https://publica.fraunhofer.de/handle/publica/380923
https://doi.org/10.1109/ULIS.2013.6523507

المؤلفون: Paul, J., Rudolph, M., Riedel, S., Thrun, X., Beyer, V., Wege, S., Hohle, C.

Time: 620

Relation: Symposium "Plasma Processing" 2012; Pacific Rim Meeting on Electrochemical and Solid-State Science (PRiME) 2012; Plasma Processing 19; https://publica.fraunhofer.de/handle/publica/383052

الاتاحة: https://publica.fraunhofer.de/handle/publica/383052
https://doi.org/10.1149/05046.0021ecst