المؤلفون: Peter Verheyen, Andriy Hikavyy, Bertrand Vissouvanadin Soubaretty, Yasutoshi Okuno, Frederik Leys, Pierre Tomasini, R. Wise, Vladimir Machkaoutsan, Luc Geenen, Roger Loo, C. Claeys, Benny Van Daele, J.P. Lu, J.W. Weijtmans, Shawn G. Thomas, Nicole Thomas, Eddy Simoen, Mireia Bargallo Gonzalez

المصدر: ECS Transactions. 11:47-53

مصطلحات موضوعية: Materials science

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::54650f1444a348e7aece96b5fd1d4eb5
https://doi.org/10.1149/1.2778649

المؤلفون: Susan Felch, Pierre Eyben, B.J. Pawlak, Thomas Hoffman, R.J.P. Lander, Ray Duffy, Wilfried Vandervorst, Benny Van Daele, Simone Severi

المصدر: ECS Transactions. 6:351-364

مصطلحات موضوعية: Planar, Materials science, business.industry, Optoelectronics, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::82a288c6da4456a3ef1e446aaf9fc172
https://doi.org/10.1149/1.2727420

المؤلفون: Sonja Sioncke, David P. Brunco, Hugo Bender, Marc Heyns, Sven Van Elshocht, Paul Mertens, Thierry Conard, M. Scarozza, Karl Opsomer, Ali Pourghaderi, Michel Houssa, Gillis Winderickx, Ravi M. Todi, Roger Loo, Krtistien De Meyer, Matty Caymax, G. Nicholas, Koen Martens, Benny Van Daele, Florence Bellenger, Ben Kaczer, Frederik Leys, Paul Zimmerman, J. Van Steenbergen, Annelies Delabie, Trudo Clarysse, Eddy Simoen, Laurent Souriau, Daniel Nelis, Valentina Terzieva, A. Benedetti, Renaud Bonzom, Guy Brammertz, M. Meuris, Cedric Huyghebaert, A. Satta, Wilfried Vandervorst, B. De Jaegar, David Hellin

المصدر: ECS Transactions. 3:783-787

مصطلحات موضوعية: Development (topology), CMOS, Computer science, Hardware_INTEGRATEDCIRCUITS, Electronic engineering, Hardware_PERFORMANCEANDRELIABILITY, Key issues

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::8ba5d9ac5277e860ad23b4b456150a61
https://doi.org/10.1149/1.2355873

المؤلفون: Brigitte Parmentier, Gabriela Dilliway, Benny Van Daele, Olivier Richard, Eddy Simoen, Ruud Van Den Boom, Hugo Bender, Frederik Leys, Marc Meuris, Trudo Clarysse, Christophe Defranoux, A. Benedetti, Alain Moussa

المصدر: ECS Transactions. 3:599-609

مصطلحات موضوعية: In situ, Electron mobility, Materials science, Dopant, Solid solubility, business.industry, Doping, chemistry.chemical_element, Germanium, chemistry, Optoelectronics, Solubility, business, Phosphorus doping

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::fea5b8ad6a603559bf8b726396f85c07
https://doi.org/10.1149/1.2355857

المؤلفون: Sofie Mertens, Luc Geenen, Yihwan Kim, Wilfried Vandervorst, Caroline Demeurisse, Hugo Bender, Philip Absil, S. Kubicek, Zsolt Tokei, F. Nouri, Benny Van Daele, Olivier Richard, R. Schreutelkamp, Peter Verheyen, Johnny Steenbergen, Anne Lauwers, Christa Vrancken, Yonah Cho

المصدر: ECS Transactions. 3:139-147

مصطلحات موضوعية: chemistry.chemical_compound, Materials science, chemistry, Metallurgy, Silicide

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::0454638366659b104fbef0dcd9d13987
https://doi.org/10.1149/1.2356273

المؤلفون: Benny Van Daele, Yongsug Chung, Kee Hyun Kim, Jong Kyu Yoon, Gustaaf Van Tendeloo

المصدر: Advanced Materials Research. :159-163

مصطلحات موضوعية: Materials science, Metallurgy, General Engineering, Intermetallic, Aluminized steel, chemistry.chemical_element, Electron microprobe, engineering.material, Focused ion beam, chemistry, Transmission electron microscopy, Aluminium, engineering, Wafer, Spectroscopy

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::766647b39d74670f0f4cc94c27e6db39
https://doi.org/10.4028/www.scientific.net/amr.15-17.159

المؤلفون: Kee Hyun Kim, Benny van Daele, G. Van Tendeloo, Yong Sug Chung, Jong Kyu Yoon

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::3fcd8f9106868535b77d3bbe0164b4fb
https://doi.org/10.4028/0-87849-429-4.159

المؤلفون: Benny Van Daele, Gustaaf Van Tendeloo, Kee Hyun Kim, Jong Kyu Yoon

المصدر: Materials science forum

مصطلحات موضوعية: Materials science, Scanning electron microscope, Mechanical Engineering, Physics, Metallurgy, Aluminized steel, Intermetallic, Substrate (electronics), engineering.material, Condensed Matter Physics, Focused ion beam, Galvanization, symbols.namesake, Coating, Mechanics of Materials, Transmission electron microscopy, engineering, symbols, General Materials Science

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::46d3d0b1434642462241aef7f4a6e6a5
https://hdl.handle.net/10067/1040620151162165141

المؤلفون: Jef Poortmans, Benny Van Daele, Staf Van Tendeloo, Gustaaf Borghs, Maarten Leys, Marianne Germain, Ronnie Belmans, Steven Boeykens

المصدر: MRS Proceedings. 892

مصطلحات موضوعية: Materials science, Thermal conductivity, Electrical resistivity and conductivity, business.industry, Bipolar junction transistor, Sapphire, Nucleation, Optoelectronics, Heterojunction, Metalorganic vapour phase epitaxy, business, Diode

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::6d900931bf576a66a001adaa26080b90
https://doi.org/10.1557/proc-0892-ff13-08

المؤلفون: Benny Van Daele, Marianne Germain, Stefan Degroote, Kang-Hoon Choi, Dominique Schreurs, Steven Boeykens, Wouter Ruythooren, Gustaaf Van Tendeloo, Wenfei Wang, Maarten Leys, Gustaaf Borghs

المصدر: Materials Research Society symposium proceedings

مصطلحات موضوعية: Materials science, Strain engineering, business.industry, Nucleation, Sapphire, Optoelectronics, Heterojunction, High-electron-mobility transistor, Dislocation, business, Layer (electronics), Sheet resistance

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::71453e57ade44e14087e9105c2e5fee1
https://doi.org/10.1557/proc-798-y10.22

المؤلفون: Olivier Richard, Alessandra Satta, Jan Geypen, Marc Meuris, Wilfried Vandervorst, Benny Van Daele, Eddy Simoen, Antoine Brugere, Bert Brijs

المصدر: ECS Meeting Abstracts. :2490-2490

مصطلحات موضوعية: Materials science, chemistry, Phosphorus, Phase (matter), Analytical chemistry, chemistry.chemical_element, Germanium, Epitaxy

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::853fc210141535bf6d550a0b1dfb349e
https://doi.org/10.1149/ma2008-02/37/2490

المؤلفون: Wilfried Vandervorst, Benny Van Daele, Subhendu Sarkar

المصدر: New Journal of Physics. 10:083012

مصطلحات موضوعية: Physics, Condensed matter physics, business.industry, Isotropy, Ripple, Relaxation (NMR), General Physics and Astronomy, Crystal growth, Crystallographic defect, Wavelength, Optics, Crystallite, Dislocation, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::c420a4da31b5be2f1ef9725db33fbb38
https://doi.org/10.1088/1367-2630/10/8/083012

المؤلفون: Peter Folmer Nielsen, Benny Van Daele, Brigitte Parmentier, Pierre Eyben, Dirch Hjorth Petersen, Rong Lin, Wilfried Vandervorst, Alessandra Satta, Trudo Clarysse

المصدر: Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures. 26:317

مصطلحات موضوعية: Profiling (computer programming), Materials science, Spreading resistance profiling, Dopant, business.industry, chemistry.chemical_element, Nanotechnology, Germanium, Condensed Matter Physics, Bevel, Semiconductor, chemistry, Optoelectronics, Sensitivity (control systems), Electrical and Electronic Engineering, business, Sheet resistance

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::dd929836db7a6a7269f1e1965e3a29ff
https://doi.org/10.1116/1.2802101

المؤلفون: Sofie Mertens, Yonah Cho, Faran Nouri, Robert Schreutelkamp, Yihwan Kim, Peter verheyen, Johnny Steenbergen, Christa Vrancken, Hugo Bender, Olivier Richard, Benny Van Daele, Wilfried Vandervorst, Philip Absil, Stefan Kubicek, Caroline Demeurisse, Zsolt Tokei, Anne Lauwers

المصدر: ECS Meeting Abstracts. :1011-1011

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::949cdaef5d677a997bd37edd49cda000
https://doi.org/10.1149/ma2006-02/20/1011

المؤلفون: Gabriela DILLIWAY, Ruud van den BOOM, Renaud Bonzom, Frederik Leys, Benny Van Daele, Brigitte PARMENTIER, Trudo CLARYSSE, Eddy R. Simoen, Roger Loo, Marc M. Meuris, Wilfried Vandervorst, Matty R. Caymax

المصدر: ECS Meeting Abstracts. :1464-1464

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::9cfe6f73f12ef4eb9b859c8c103acd7e
https://doi.org/10.1149/ma2006-02/31/1464