المؤلفون: Prabhakara, Viveksharma, Jannis, Daen, Guzzinati, Giulio, Béché, Armand, Bender, Hugo, Verbeeck, Johan

المصدر: Ultramicroscopy, Volume 219, 2020, 113099, ISSN 0304-3991

مصطلحات موضوعية: Physics - Applied Physics

URL الوصول: http://arxiv.org/abs/2005.13674

المؤلفون: Prabhakara, Viveksharma, Jannis, Daen, Béché, Armand, Bender, Hugo, Verbeeck, Johan

مصطلحات موضوعية: Physics - Applied Physics

URL الوصول: http://arxiv.org/abs/1907.11661

المؤلفون: Mehta, Ankit Nalin, Gauquelin, Nicolas, Nord, Magnus, Orekhov, Andrey, Bender, Hugo, Cerbu, Dorin, Verbeeck, Johan, Vandervorst, Wilfried

المصدر: 0957-4484 ; Nanotechnology

مصطلحات موضوعية: Physics, Engineering sciences. Technology

Relation: info:eu-repo/semantics/altIdentifier/isi/000561424400001

الاتاحة: https://hdl.handle.net/10067/1711190151162165141
https://repository.uantwerpen.be/docstore/d:irua:2873

المؤلفون: Prabhakara, Viveksharma, Jannis, Daen, Béché, Armand, Bender, Hugo, Verbeeck, Johan

المصدر: 0268-1242 ; Semiconductor science and technology

مصطلحات موضوعية: Physics, Engineering sciences. Technology

وصف الملف: pdf

Relation: info:eu-repo/semantics/altIdentifier/isi/000537721200002

الاتاحة: https://hdl.handle.net/10067/1657940151162165141
https://repository.uantwerpen.be/docman/irua/ac1199/165794_2020_11_29.pdf

المؤلفون: Celano, Umberto, Gómez Rodríguez, Andrés, Piedimonte, Paola, Neumayer, Sabine, Collins, Liam, Popovici, Mihaela, Florent, Karine, McMitchell, Sean R. C., Favia, Paola, Drijbooms, Chris, Bender, Hugo, Paredis, Kristof, Di Piazza, Luca, Jesse, Stephen, Van Houdt, Jan, van der Heide, Paul

المساهمون: Department of Energy (US)

مصطلحات موضوعية: HfO2-based ferroelectrics, Si-doped HfO2, binary oxide ferroelectrics, Atomic force microscopy, Band-excitation piezoresponse force microscopy

Relation: Publisher's version; https://doi.org/10.3390/nano10081576; Sí; Nanomaterials 10(8): 1576 (2020); http://hdl.handle.net/10261/218452; http://dx.doi.org/10.13039/100000015

الاتاحة: http://hdl.handle.net/10261/218452
https://doi.org/10.3390/nano10081576
https://doi.org/10.13039/100000015

المؤلفون: Gupta, Somya, Simoen, Eddy, Loo, Roger, Shimura, Yosuke, Porret, Clement, Gencarelli, Federica, Paredis, Kristof, Bender, Hugo, Lauwaert, Johan, Vrielinck, Henk, Heyns, Marc

المصدر: APPLIED PHYSICS LETTERS ; ISSN: 0003-6951 ; ISSN: 1077-3118

مصطلحات موضوعية: Physics and Astronomy, MISFIT DISLOCATIONS, SEMICONDUCTORS, SILICON, SI, HETEROSTRUCTURES, RECOMBINATION, GROWTH, LAYERS

وصف الملف: application/pdf

Relation: https://biblio.ugent.be/publication/8569506; http://hdl.handle.net/1854/LU-8569506; http://dx.doi.org/10.1063/1.5034573; https://biblio.ugent.be/publication/8569506/file/8569507

الاتاحة: https://biblio.ugent.be/publication/8569506
http://hdl.handle.net/1854/LU-8569506
https://doi.org/10.1063/1.5034573
https://biblio.ugent.be/publication/8569506/file/8569507

المؤلفون: Vanhellemont, Jan, Anada, Satoshi, Yasuda, Hidehiro, Bender, Hugo, Rooyackers, Rita, Vandooren, Anne

المصدر: Microscopy of semiconducting materials (MSM-XIX) : programme and abstracts

مصطلحات موضوعية: Physics and Astronomy

وصف الملف: application/pdf

Relation: https://biblio.ugent.be/publication/5909757; http://hdl.handle.net/1854/LU-5909757; https://biblio.ugent.be/publication/5909757/file/5909759

الاتاحة: https://biblio.ugent.be/publication/5909757
http://hdl.handle.net/1854/LU-5909757
https://biblio.ugent.be/publication/5909757/file/5909759

المؤلفون: Hsu, Min-Hsiang, Merckling, Clement, El Kazzi, Salim, Pantouvaki, Marianna, Richard, Oliver, Bender, Hugo, Meersschaut, Johan, Van Campenhout, Joris, Absil, Philippe, Van Thourhout, Dries

المصدر: JOURNAL OF APPLIED PHYSICS ; ISSN: 0021-8979 ; ISSN: 1089-7550

مصطلحات موضوعية: Technology and Engineering, TITANATE THIN-FILMS, CRYSTALLINE OXIDES, THERMAL-EXPANSION, SILICON, NONSTOICHIOMETRY, DEPOSITION, LAYER

وصف الملف: application/pdf

Relation: https://biblio.ugent.be/publication/8627065; http://hdl.handle.net/1854/LU-8627065; http://dx.doi.org/10.1063/1.4972101; https://biblio.ugent.be/publication/8627065/file/8627066

الاتاحة: https://biblio.ugent.be/publication/8627065
http://hdl.handle.net/1854/LU-8627065
https://doi.org/10.1063/1.4972101
https://biblio.ugent.be/publication/8627065/file/8627066

المؤلفون: Goossens, Jozefien, Berghmans, Bart, Franquet, Alexis, Nguyen, Ngoc Duy, Delmotte, Joris, Geenen, Luc, Richard, Olivier, Bender, Hugo, Vandervorst, Wilfried

المصدر: 17th International Conference on Secondary Ion Mass Spectrometry (SIMS XVII), Toronto, Canada [CA], 14-18/9/2009

مصطلحات موضوعية: Ultra low energy secondary ion mass spectrometry, Depth resolution, Surface transient, Engineering, computing & technology, Materials science & engineering, Ingénierie, informatique & technologie, Science des matériaux & ingénierie

Relation: http://www.simsxvii.org/

URL الوصول: https://orbi.uliege.be/handle/2268/69117

المؤلفون: MEURIS, Marc, Martens, K., De Jaegar, B., Van Steenbergen, J., Bonzom, Renaud, Caymax, Matty R., Houssa, M., Kaczer, Ben, Leys, Frederik, NELIS, Daniel, Opsomer, Karl, Pourghaderi, A. M., Satta, A., Simoen, Eddy R., Terzieva, Valentina, Souriau, Laurent, Bellenger, F., BRAMMERTZ, Guy, Nicholas, G., Scarozza, M., Huyghebaert, C., Winderickx, Gillis, Loo, Roger, Clarysse, Trudo, Conard, Thierry, Bender, Hugo, Benedetti, Alessandro, Todi, R., Delabie, A., Hellin, David, Van Daele, Benny, Sioncke, Sonja, Mertens, Paul W., De Meyer, Krtistien, Van Elshocht, Sven, Vandervorst, Wilfried, Zimmerman, Paul, Brunco, David P., Heyns, Marc M.

مصطلحات موضوعية: Drive currents, Gate stacks, Ge CMOS devices, Transistor equations, Density (specific gravity), Gates (transistor), Germanium compounds, Parameter estimation, Passivation, Semiconducting silicon compounds, CMOS integrated circuits

Relation: 3/7; ECS Transactions, , p. 783 -787; http://hdl.handle.net/1942/31633; 787; 783

الاتاحة: http://hdl.handle.net/1942/31633
https://doi.org/10.1149/1.2355873

المؤلفون: Porret, Clement, Srinivasan, Srinivasan Ashwyn, Balakrishnan, Sadhishkumar, Verheyen, Peter, Favia, Paola, Bender, Hugo, Ong, Patrick, Loo, Roger, Van Campenhout, Joris, Pantouvaki, Marianna

المصدر: 2020 IEEE Symposium on VLSI Technology

الاتاحة: http://dx.doi.org/10.1109/vlsitechnology18217.2020.9265082
http://xplorestaging.ieee.org/ielx7/9264988/9264985/09265082.pdf?arnumber=9265082

المؤلفون: Chiodarelli, Nicolo′, Xu, Cigang, Richard, Olivier, Bender, Hugo, Klekachev, Alexander, Cooke, Mike, Heyns, Marc, De Gendt, Stefan, Groeseneken, Guido, Vereecken, Philippe M.

المساهمون: Huang, Jianyu, European Commission

المصدر: Journal of Nanomaterials ; volume 2012, issue 1 ; ISSN 1687-4110 1687-4129

الاتاحة: http://dx.doi.org/10.1155/2012/130725
http://downloads.hindawi.com/journals/jnm/2012/130725.pdf
http://downloads.hindawi.com/journals/jnm/2012/130725.xml
https://onlinelibrary.wiley.com/doi/pdf/10.1155/2012/130725

المؤلفون: Wang, Gang, Leys, Maarten, Nguyen, Ngoc Duy, Loo, Roger, Richard, Olivier, Bender, Hugo, Heyns, Marc, Caymax, Matty

المصدر: Journal of Crystal Growth, 315, 32 (2011)

مصطلحات موضوعية: InP, III-V compound, Selective epitaxial growth, STI, Engineering, computing & technology, Materials science & engineering, Ingénierie, informatique & technologie, Science des matériaux & ingénierie

Relation: urn:issn:0022-0248; https://orbi.uliege.be/handle/2268/68891; info:hdl:2268/68891; https://orbi.uliege.be/bitstream/2268/68891/1/Wang_Leys_Nguyen_JCG_315_32_2011_author_postprint.pdf

الاتاحة: https://orbi.uliege.be/handle/2268/68891
https://orbi.uliege.be/bitstream/2268/68891/1/Wang_Leys_Nguyen_JCG_315_32_2011_author_postprint.pdf
https://doi.org/10.1016/j.jcrysgro.2010.07.039

المؤلفون: Hüe, Florian, Hÿtch, Martin, Houdellier, Florent, Bender, Hugo, Claverie, Alain

المساهمون: Centre d'élaboration de matériaux et d'études structurales (CEMES), Institut National des Sciences Appliquées - Toulouse (INSA Toulouse), Institut National des Sciences Appliquées (INSA)-Université de Toulouse (UT)-Institut National des Sciences Appliquées (INSA)-Université de Toulouse (UT)-Institut de Chimie de Toulouse (ICT), Institut de Recherche pour le Développement (IRD)-Université Toulouse III - Paul Sabatier (UT3), Université de Toulouse (UT)-Université de Toulouse (UT)-Institut de Chimie - CNRS Chimie (INC-CNRS)-Centre National de la Recherche Scientifique (CNRS)-Institut National Polytechnique (Toulouse) (Toulouse INP), Université de Toulouse (UT)-Institut de Recherche pour le Développement (IRD)-Université Toulouse III - Paul Sabatier (UT3), Université de Toulouse (UT)-Institut de Chimie - CNRS Chimie (INC-CNRS)-Centre National de la Recherche Scientifique (CNRS)-Institut National Polytechnique (Toulouse) (Toulouse INP), Université de Toulouse (UT)-Centre National de la Recherche Scientifique (CNRS), Interférométrie, In situ et Instrumentation pour la Microscopie Electronique (CEMES-I3EM), Université de Toulouse (UT)-Centre National de la Recherche Scientifique (CNRS)-Institut National des Sciences Appliquées - Toulouse (INSA Toulouse), IMEC, Matériaux et dispositifs pour l'Electronique et le Magnétisme (CEMES-MEM)

المصدر: ISSN: 0003-6951.

مصطلحات موضوعية: [PHYS.PHYS.PHYS-OPTICS]Physics [physics]/Physics [physics]/Optics [physics.optics], [PHYS.HEXP]Physics [physics]/High Energy Physics - Experiment [hep-ex], [PHYS.QPHY]Physics [physics]/Quantum Physics [quant-ph], [PHYS.PHYS.PHYS-ACC-PH]Physics [physics]/Physics [physics]/Accelerator Physics [physics.acc-ph], [SPI.ELEC]Engineering Sciences [physics]/Electromagnetism, [SPI.MAT]Engineering Sciences [physics]/Materials, [SPI.OPTI]Engineering Sciences [physics]/Optics / Photonic, [SPI.SIGNAL]Engineering Sciences [physics]/Signal and Image processing

Relation: hal-01742020; https://hal.science/hal-01742020; https://hal.science/hal-01742020/document; https://hal.science/hal-01742020/file/1.3192356.pdf

الاتاحة: https://hal.science/hal-01742020
https://hal.science/hal-01742020/document
https://hal.science/hal-01742020/file/1.3192356.pdf
https://doi.org/10.1063/1.3192356

المؤلفون: Nguyen, Ngoc Duy, Rosseel, Erik, Takeuchi, Shotaro, Everaert, Jean-Luc, Yang, Lijun, Goossens, Jozefien, Moussa, Alain, Clarysse, Trudo, Richard, Olivier, Bender, Hugo, Zaima, Shigeaki, Sakai, Akira, Loo, Roger, Lin, J. C., Vandervorst, Wilfried, Caymax, Matty

المصدر: Thin Solid Films, 518 (6), S48 (2009)

مصطلحات موضوعية: Vapor phase doping, Atomic layer epitaxy, Electrical activation, Conformal doping, Heavy doping, Ultra shallow junction, Laser anneal, Engineering, computing & technology, Electrical & electronics engineering, Ingénierie, informatique & technologie, Ingénierie électrique & électronique

Relation: urn:issn:0040-6090; https://orbi.uliege.be/handle/2268/68760; info:hdl:2268/68760; https://orbi.uliege.be/bitstream/2268/68760/1/Nguyen_TSF_518_S48_2009_author_postprint.pdf

الاتاحة: https://orbi.uliege.be/handle/2268/68760
https://orbi.uliege.be/bitstream/2268/68760/1/Nguyen_TSF_518_S48_2009_author_postprint.pdf
https://doi.org/10.1016/j.tsf.2009.10.053

المؤلفون: Hüe, Florian, Hÿtch, Martin, Bender, Hugo, Houdellier, Florent, Claverie, Alain

المساهمون: Centre d'élaboration de matériaux et d'études structurales (CEMES), Institut National des Sciences Appliquées - Toulouse (INSA Toulouse), Institut National des Sciences Appliquées (INSA)-Université de Toulouse (UT)-Institut National des Sciences Appliquées (INSA)-Université de Toulouse (UT)-Institut de Chimie de Toulouse (ICT), Institut de Recherche pour le Développement (IRD)-Université Toulouse III - Paul Sabatier (UT3), Université de Toulouse (UT)-Université de Toulouse (UT)-Institut de Chimie - CNRS Chimie (INC-CNRS)-Centre National de la Recherche Scientifique (CNRS)-Institut National Polytechnique (Toulouse) (Toulouse INP), Université de Toulouse (UT)-Institut de Recherche pour le Développement (IRD)-Université Toulouse III - Paul Sabatier (UT3), Université de Toulouse (UT)-Institut de Chimie - CNRS Chimie (INC-CNRS)-Centre National de la Recherche Scientifique (CNRS)-Institut National Polytechnique (Toulouse) (Toulouse INP), Université de Toulouse (UT)-Centre National de la Recherche Scientifique (CNRS), IMEC

المصدر: ISSN: 0031-9007.

مصطلحات موضوعية: numbers: 8530De, 0710Pz, 6837Lp, 7765Ly, [PHYS.PHYS.PHYS-OPTICS]Physics [physics]/Physics [physics]/Optics [physics.optics], [PHYS.HEXP]Physics [physics]/High Energy Physics - Experiment [hep-ex], [PHYS.QPHY]Physics [physics]/Quantum Physics [quant-ph], [PHYS.PHYS.PHYS-ACC-PH]Physics [physics]/Physics [physics]/Accelerator Physics [physics.acc-ph], [SPI.ELEC]Engineering Sciences [physics]/Electromagnetism, [SPI.MAT]Engineering Sciences [physics]/Materials, [SPI.OPTI]Engineering Sciences [physics]/Optics / Photonic, [SPI.SIGNAL]Engineering Sciences [physics]/Signal and Image processing

Relation: hal-01741994; https://hal.science/hal-01741994; https://hal.science/hal-01741994/document; https://hal.science/hal-01741994/file/PhysRevLett.100.156602.pdf

الاتاحة: https://hal.science/hal-01741994
https://hal.science/hal-01741994/document
https://hal.science/hal-01741994/file/PhysRevLett.100.156602.pdf
https://doi.org/10.1103/PhysRevLett.100.156602

المؤلفون: Simoen, Eddy Roger, Bargallo Gonzalez, Mireia, Eneman, Geert, Verheyen, Peter, Benedetti, Aldo, Bender, Hugo, Loo, Roger, Claeys, Cor

المصدر: Journal of Materials Science: Materials in Electronics ; volume 18, issue 7, page 787-791 ; ISSN 0957-4522 1573-482X

الاتاحة: https://doi.org/10.1007/s10854-006-9102-7
https://link.springer.com/content/pdf/10.1007/s10854-006-9102-7.pdf
https://link.springer.com/article/10.1007/s10854-006-9102-7/fulltext.html
http://link.springer.com/content/pdf/10.1007/s10854-006-9102-7

المؤلفون: Ghica, Corneliu, Nistor, Leona Cristina, Bender, Hugo, Richard, Olivier, van Tendeloo, Gustaaf, Ulyashyn, Alexander

المساهمون: National Institute for Materials Physics, IMEC, EMAT, University of Antwerp (UA), University of Oslo (UiO)

المصدر: ISSN: 1478-6435.

مصطلحات موضوعية: Physical Sciences

Relation: hal-00513718; https://hal.science/hal-00513718; https://hal.science/hal-00513718/document; https://hal.science/hal-00513718/file/PEER_stage2_10.1080%252F14786430600801443.pdf

الاتاحة: https://hal.science/hal-00513718
https://hal.science/hal-00513718/document
https://hal.science/hal-00513718/file/PEER_stage2_10.1080%252F14786430600801443.pdf
https://doi.org/10.1080/14786430600801443

المؤلفون: Wang, Gang, Leys, Maarten, Loo, Roger, Richard, Olivier, Bender, Hugo, BRAMMERTZ, Guy, Waldron, Niamh, Wang, Wei-E, Dekoster, Johan, Caymax, Matty, Seefeldt, Marc, Heyns, Marc

المساهمون: heyns, marc/0000-0002-1199-4341, Loo, Roger/0000-0003-3513-6058, Brammertz, Guy/0000-0003-1404-7339

مصطلحات موضوعية: VICINAL SI(001) SURFACES, HIGH-QUALITY GE, EPITAXIAL-GROWTH, PHASE-DIAGRAM, MOCVD, GAAS

Relation: Journal of the Electrochemical Society, 158 (6) , p. H645 -H650; http://hdl.handle.net/1942/31595; H650; H645; 158; WOS:000289854700091

الاتاحة: http://hdl.handle.net/1942/31595
https://doi.org/10.1149/1.3571248

المؤلفون: Mehta, Ankit Nalin, Mo, Jiongjiong, Pourtois, Geoffrey, Dabral, Ashish, Groven, Benjamin, Bender, Hugo, Favia, Paola, Caymax, Matty, Vandervorst, Wilfried

المصدر: 1932-7447 ; The journal of physical chemistry: C : nanomaterials and interfaces

مصطلحات موضوعية: Physics, Chemistry, Engineering sciences. Technology

Relation: info:eu-repo/semantics/altIdentifier/isi/000526396000067

الاتاحة: https://hdl.handle.net/10067/1686250151162165141