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المساهمون: Cain, Jason P., Sanchez, Martha I.

المصدر: SPIE Proceedings ; Metrology, Inspection, and Process Control for Microlithography XXIX ; ISSN 0277-786X

الاتاحة: http://dx.doi.org/10.1117/12.2085497

المؤلفون: van Haren, Richard, Cekli, Hakki Ergun, Beltman, Jan, Pastol, Anne, Sundermann, Frank, Gatefait, Maxime

المساهمون: Hayashi, Naoya, Kasprowicz, Bryan S.

المصدر: SPIE Proceedings ; Photomask Technology 2015 ; ISSN 0277-786X

الاتاحة: http://dx.doi.org/10.1117/12.2197556

المؤلفون: van Haren, Richard, Cekli, Hakki Ergun, Liu, Xing Lan, Beltman, Jan, Pastol, Anne, Massin, Jean, Dupre La Tour, Emilie, Gatefait, Maxime, Sundermann, Frank

المساهمون: Ackmann, Paul W., Hayashi, Naoya

المصدر: SPIE Proceedings ; Photomask Technology 2014 ; ISSN 0277-786X

الاتاحة: http://dx.doi.org/10.1117/12.2069315

المؤلفون: Gatefait, Maxime, Le-Gratiet, Bertrand, Goirand, Pierre Jerome, Lam, Auguste, Van Haren, Richard, Pastol, Anne, Doytcheva, Maya, Liu, Xing Lan, Beltman, Jan

المساهمون: Starikov, Alexander, Cain, Jason P.

المصدر: SPIE Proceedings ; Metrology, Inspection, and Process Control for Microlithography XXVII ; ISSN 0277-786X

الاتاحة: http://dx.doi.org/10.1117/12.2011099

المؤلفون: Blancquaert, Yoann, Dezauzier, Christophe, Depre, Jerome, Miqyass, Mohamed, Beltman, Jan

المساهمون: Starikov, Alexander, Cain, Jason P.

المصدر: SPIE Proceedings ; Metrology, Inspection, and Process Control for Microlithography XXVII ; ISSN 0277-786X

الاتاحة: http://dx.doi.org/10.1117/12.2011406

المؤلفون: Le-Gratiet, Bertrand, Finders, Jo, Mouraille, Orion, Queens, Rene, Escalante, Maryana, Smeets, Bart, Beltman, Jan, Jullian, Karine

المساهمون: Behringer, Uwe F.W., Maurer, Wilhelm

المصدر: SPIE Proceedings ; 28th European Mask and Lithography Conference ; ISSN 0277-786X

الاتاحة: http://dx.doi.org/10.1117/12.918535

المؤلفون: Beltman, Jan¹

المصدر: Tijdschrift voor Human Factors. apr2017, Vol. 42 Issue 1, p17-21. 5p.

المؤلفون: Cain, Jason P., Sanchez, Martha I., Lam, Auguste, Ypma, Alexander, Gatefait, Maxime, Deckers, David, Koopman, Arne, van Haren, Richard, Beltman, Jan

المصدر: Proceedings of SPIE; March 2015, Vol. 9424 Issue: 1 p94241L-94241L-10, 9329870p

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المصدر: Proceedings of SPIE; April 2013, Vol. 8681 Issue: 1 p86811F-86811F-13, 8594303p

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المصدر: Proceedings of SPIE; October 2015, Vol. 9635 Issue: 1 p963507-963507-11

المؤلفون: Cain, Jason P., Sanchez, Martha I., Smilde, Henk-Jan H., van Haren, Richard J. F., van Buël, Willy, Driessen, Lars H. D., Dépré, Jérôme, Beltman, Jan, Dettoni, Florent, Ducoté, Julien, Dezauzier, Christophe, Blancquaert, Yoann

المصدر: Proceedings of SPIE; March 2015, Vol. 9424 Issue: 1 p942412-942412-10

المؤلفون: Ackmann, Paul W., Hayashi, Naoya, van Haren, Richard, Cekli, Hakki Ergun, Liu, Xing Lan, Beltman, Jan, Pastol, Anne, Massin, Jean, Dupre La Tour, Emilie, Gatefait, Maxime, Sundermann, Frank

المصدر: Proceedings of SPIE; October 2014, Vol. 9235 Issue: 1 p923522-923522-9

المؤلفون: Starikov, Alexander, Cain, Jason P., Gatefait, Maxime, Le-Gratiet, Bertrand, Goirand, Pierre Jerome, Lam, Auguste, Van Haren, Richard, Pastol, Anne, Doytcheva, Maya, Liu, Xing Lan, Beltman, Jan

المصدر: Proceedings of SPIE; April 2013, Vol. 8681 Issue: 1 p868105-868105-8