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1Academic Journal
المؤلفون: Potvin, L., Bilodeau, A., Lefebvre, C., Galarneau, M., Bellavance, Y.
المصدر: Revue d'Épidémiologie et de Santé Publique ; volume 64, page S102 ; ISSN 0398-7620
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2Academic Journal
المؤلفون: Basile-Bellavance, Y., Blaquiere, Y., Savaria, Yvon
Relation: Basile-Bellavance, Y., Blaquiere, Y., & Savaria, Y. (juin 2009). Faults diagnosis methodology for the WaferNet interconnection network [Communication écrite]. Joint IEEE North-East Workshop on Circuits and Systems and TAISA Conference (NEWCAS-TAISA 2009), Toulouse, France.
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3Academic Journal
المؤلفون: Lepercq, E., Valorege, O., Basile-Bellavance, Y., Laflamme-Mayer, N., Blaquière, Y., Savaria, Yvon
Relation: Lepercq, E., Valorege, O., Basile-Bellavance, Y., Laflamme-Mayer, N., Blaquière, Y., & Savaria, Y. (octobre 2009). An interconnection network for a novel reconfigurable circuit board [Communication écrite]. 2nd Microsystems and Nanoelectronics Research Conference, Ottawa, Canada.
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4Academic Journal
المؤلفون: Basile-Bellavance, Y., Lepercq, E., Blaquiere, Y., Savaria, Yvon
Relation: Basile-Bellavance, Y., Lepercq, E., Blaquiere, Y., & Savaria, Y. (août 2008). Hardware/software system co-verification of an active reconfigurable board with SystemC-VHDL [Communication écrite]. 15th IEEE International Conference on Electronics, Circuits and Systems (ICECS 2008).
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5Academic Journal
المؤلفون: Norman, R., Lepercq, E., Blaquiere, Y., Valorge, O., Basile-Bellavance, Y., Prytula, R., Savaria, Yvon
Relation: Norman, R., Lepercq, E., Blaquiere, Y., Valorge, O., Basile-Bellavance, Y., Prytula, R., & Savaria, Y. (juin 2008). An interconnection network for a novel reconfigurable circuit board [Communication écrite]. Joint IEEE North-East Workshop on Circuits and Systems and TAISA Conference (NEWCAS-TAISA 2008).
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6Academic Journal
المؤلفون: Sirois, Frédéric, Cave, J. R., Basile-Bellavance, Y.
Relation: Sirois, F., Cave, J. R., & Basile-Bellavance, Y. (2007). Nonlinear Magnetic Diffusion in a Bi2212 Hollow Cylinder: Measurements and Numerical Simulations. IEEE Transactions on Applied Superconductivity, 17(2), 3652-3655.
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7Electronic Resource
المؤلفون: Pilote P., Allard G.O., Bellavance Y., Blais A., Boily B., Brisson H., Chown E.H., Daigneault R., de Corta H., Dion C., ed., Gervais D., Girard P.A., Girard R., Guha J., Kirkham R.V., Larouche V., Lavalliere G., Maltais G., Morin R., Mueller W., Robert F., Schmitt L., Simard M., Sinclair W.D.
مصطلحات الفهرس: ARCHAEAN, BASALTS, BASE METALS, BERRIGAN LAKE, CANADA, CHAPAIS, CHAPAIS-CHIBOUGAMAU 1998, CHIBOUGAMAU, CLARK LAKE, COMPLEX ORES, COPPER, COPPER-GOLD, COPPER-GOLD-MOLYBDENUM, COPPER-MOLYBDENUM, CORNER BAY, DEFORMATION, DORE LAKE, ECONOMIC GEOLOGY, EPITHERMAL DEPOSITS, EXPLORATION, GOLD, GREENSTONE BELTS, HYDROTHERMAL DEPOSITS, INTRUSIONS, INTRUSIVE ROCKS, ISLAND ARCS, JOE MANN, LAC CAOPATINA, LAC SHORTT, METALLOGENIC PROVINCES, MINERAL DEPOSITS, MOLYBDENUM, PORPHYRY DEPOSITS, PROTEROZOIC, QUEBEC, REGIONAL GEOLOGY, SILLS, STRATIGRAPHY, STRUCTURAL CONTROLS, STRUCTURAL GEOLOGY, SYNGENETIC DEPOSITS, TROILUS LAKE, VANADIUM, VEIN DEPOSITS, VOLCANIC ROCKS, text
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8Conference
المؤلفون: Norman, R., Valorge, O., Blaquiere, Y., Lepercq, E., Basile-Bellavance, Y., El-Alaoui, Y., Prytula, R., Savaria, Y.
المصدر: 2008 Joint 6th International IEEE Northeast Workshop on Circuits & Systems & TAISA Conference; 2008, p351-354, 4p