المؤلفون: Hogan-Lamarre, Pascal, Luo, Yi, Bücker, Robert, Miller, R. J. Dwayne, Zou, Xiaodong

المصدر: IUCrJ. 11(1):62-72

مصطلحات موضوعية: serial electron diffraction, scanning transmission electron microscopy, structure determination, nanocrystallography, beam-sensitive materials, zeolites

وصف الملف: print

URL الوصول: https://urn.kb.se/resolve?urn=urn:nbn:se:su:diva-228249
https://doi.org/10.1107/S2052252523009661

المؤلفون: Zhou, Jinfei, Wang, Yujiao, Lu, Binbin, Lyu, Jia, Wei, Nini, Huang, Jianfeng, Liu, Lingmei, Li, Xiao, Li, Xinghua, Zhang, Daliang

المصدر: Nano Materials Science.

مصطلحات موضوعية: Beam tilt, Electron beam-sensitive materials, Nanocrystals, Zone axis alignment

وصف الملف: print

URL الوصول: https://urn.kb.se/resolve?urn=urn:nbn:se:su:diva-236151
https://doi.org/10.1016/j.nanoms.2024.04.006

المؤلفون: López Haro, Miguel, Gómez-Recio, Isabel, Pan, Huiyan, Delgado Jaén, Juan José, Chen, Xiaowei, Cauqui López, Miguel Ángel, Pérez Omil, José Antonio, Ruiz-González, María Luisa, Hernando, María, Parras, Marina, González-Calbet, José M., Calvino Gámez, José Juan

المساهمون: Ciencia de los Materiales e Ingeniería Metalúrgica y Química Inorgánica

المصدر: Microscopy and Microanalysis, Vol. 29, Núm. 3, 2023, pp. 900-912

مصطلحات موضوعية: chrono-spectroscopy-electron tomographycombination, electron-beam sensitive materials, oxygen stoichiometry, potassium-manganese hollandites, quantitative XEDS at nanoscale

وصف الملف: application/pdf

Relation: http://hdl.handle.net/10498/32577

الاتاحة: http://hdl.handle.net/10498/32577
https://doi.org/10.1093/MICMIC/OZAD037

المؤلفون: Brent L. Nannenga

المصدر: IUCrJ, Vol 11, Iss 1, Pp 7-8 (2024)

مصطلحات موضوعية: serial electron diffraction, scanning transmission electron microscopy, structure determination, nanocrystallography, beam-sensitive materials, zeolites, Crystallography, QD901-999

Relation: http://scripts.iucr.org/cgi-bin/paper?S2052252523010953; https://doaj.org/toc/2052-2525; https://doaj.org/article/ad244f2f430f4aa3b221e773755b825f

الاتاحة: https://doi.org/10.1107/S2052252523010953
https://doaj.org/article/ad244f2f430f4aa3b221e773755b825f

المؤلفون: Calvino José J., Gómez-Recio Isabel, Pan Huiyan, Delgado Juan J., Chen Xiaowei, Cauqui Miguel A., Pérez-Omil José A., Ruiz-González María L., Hernando María, Parras Marina, González-Calbet José M., López-Haro Miguel

المصدر: BIO Web of Conferences, Vol 129, p 26023 (2024)

مصطلحات موضوعية: time-resolved-stem-xeds, oxygen-stoichiometry, quantitative-xeds-at-nanoscale, beam-sensitive-materials, ζ-factors, Microbiology, QR1-502, Physiology, QP1-981, Zoology, QL1-991

وصف الملف: electronic resource

Relation: https://www.bio-conferences.org/articles/bioconf/pdf/2024/48/bioconf_emc2024_26023.pdf; https://doaj.org/toc/2117-4458

URL الوصول: https://doaj.org/article/f9582379fbf641178d3e219717bb5231

المؤلفون: Jones, Lewys

مصطلحات موضوعية: ThermoFisher FEI Titan G2, beam-sensitive materials, Digital images, Image simulation, Chromatic aberration, Low- voltage imaging, Monochromation, Scanning transmission electron microscope (STEM)

Relation: Microscopy and Microanalysis; Quigley, Frances and McBean, Patrick and O'Donovan, Peter and Jones, Lewys, Cost & Capability Compromises in STEM Instrumentation for Low-Voltage Imaging, Microscopy and Microanalysis, 2022, 1437 - 1443; Y; http://hdl.handle.net/2262/98238; http://people.tcd.ie/jonesl1; 236997; https://arxiv.org/abs/2108.12356; orcid:0000-0002-6907-0731

الاتاحة: http://hdl.handle.net/2262/98238
http://people.tcd.ie/jonesl1
https://arxiv.org/abs/2108.12356

المؤلفون: Hongyi Wang, Linlin Liu, Jiaxing Wang, Chen Li, Jixiang Hou, Kun Zheng

المصدر: Molecules; Volume 27; Issue 12; Pages: 3829

مصطلحات موضوعية: electron beam sensitive materials, electron microscopic characterization, low dose, iDPC-STEM

جغرافية الموضوع: agris

وصف الملف: application/pdf

Relation: Materials Chemistry; https://dx.doi.org/10.3390/molecules27123829

الاتاحة: https://doi.org/10.3390/molecules27123829

المؤلفون: Holger Klein, Stéphanie Kodjikian, Emre Yörük, Pierre Bordet

المصدر: Symmetry; Volume 14; Issue 2; Pages: 245

مصطلحات موضوعية: electron crystallography, beam sensitive materials, structure solution, structure refinement, 3D electron diffraction

وصف الملف: application/pdf

Relation: Physics and Symmetry/Asymmetry; https://dx.doi.org/10.3390/sym14020245

الاتاحة: https://doi.org/10.3390/sym14020245

المؤلفون: Akiho Nakamura, Kousuke Ooe, Naoya Shibata, Takehito Seki, Yuichi Ikuhara, Yuji Kohno, 中村 明穂, 大江 耕介, 幾原 雄一, 柴田 直哉, 河野 祐二, 関 岳人

المصدر: 顕微鏡 / KENBIKYO. 2022, 57(2):49

المؤلفون: Ioannina Castano (2566852), Austin M. Evans (3632506), Roberto dos Reis (10097681), Vinayak P. Dravid (1318659), Nathan C. Gianneschi (1320738), William R. Dichtel (1368834)

مصطلحات موضوعية: Biophysics, Biochemistry, Medicine, Biotechnology, Sociology, Developmental Biology, Space Science, Biological Sciences not elsewhere classified, Physical Sciences not elsewhere classified, domain sizes, 2 D Fourier, 2 D COF films, postprocessing script, mapping approach, 2 D COFs, Fourier mapping technique, nanoscale features, beam-sensitive materials, electron flux imaging conditions, HR-TEM, domain orientations, future 2 D polymerization strategies, Mapping Grains, grain boundaries, TEM image, boronate ester-linked COF, chemical phenomena, TEM images, transmission electron microscopy, thin-film device architectures

Relation: https://figshare.com/articles/journal_contribution/Mapping_Grains_Boundaries_and_Defects_in_2D_Covalent_Organic_Framework_Thin_Films/13713554

الاتاحة: https://doi.org/10.1021/acs.chemmater.0c04382.s001

المؤلفون: Ting Li, Hejing Wang

المصدر: Crystals; Volume 9; Issue 2; Pages: 62

مصطلحات موضوعية: formulae of lattice row distance, indexing, beam-sensitive materials, selected area electron diffraction (SAED), high resolution transmission electron microscope (HRTEM)

وصف الملف: application/pdf

Relation: https://dx.doi.org/10.3390/cryst9020062

الاتاحة: https://doi.org/10.3390/cryst9020062

المؤلفون: Pascal Hogan-Lamarre, Yi Luo, Xiaodong Zou

مصطلحات موضوعية: Serial crystallography, Serial electron diffraction, Beam sensitive materials, Zeolites

Relation: https://doi.org/10.5281/zenodo.7844519; https://doi.org/10.5281/zenodo.10073890; oai:zenodo.org:10073890

الاتاحة: https://doi.org/10.5281/zenodo.10073890

المؤلفون: Karthikeyan Gnanasekaran, Gijsbertus de With, Heiner Friedrich

المصدر: Royal Society Open Science, Vol 5, Iss 5 (2018)

مصطلحات موضوعية: scanning transmission electron microscopy, monte carlo simulations, image contrast, beam-sensitive materials, low-contrast materials, electron dose, Science

وصف الملف: electronic resource

Relation: https://doaj.org/toc/2054-5703

URL الوصول: https://doaj.org/article/02a0519af4904c28bb8623fc07b4f783

المؤلفون: Mugnaioli, E., Gemmi, M., David, J., Bereciartua, P. J., Jorda, J. L., Rey, F., Diaz-Canales, E. M., Diaz Cabañas, M. J.

المساهمون: Mugnaioli, E., Gemmi, M., David, J., Bereciartua, P. J., Jorda, J. L., Rey, F., Diaz-Canales, E. M., Diaz Cabañas, M. J.

مصطلحات موضوعية: electron diffraction tomography, zeolite, beam-sensitive materials

وصف الملف: STAMPA

Relation: info:eu-repo/semantics/altIdentifier/wos/WOS:000481522000065; ispartofbook:24th Congress of the International Union of Crystallography; 24th Congress of the International Union of Crystallography; volume:73; firstpage:C64; lastpage:C64; numberofpages:1; http://hdl.handle.net/11568/1131330

الاتاحة: http://hdl.handle.net/11568/1131330
https://doi.org/10.1107/S2053273317095067

المؤلفون: Gnanasekaran, K., de With, G., Friedrich, H.

مصطلحات موضوعية: Scanning transmission electron microscopy, Monte Carlo simulations, image contrast, beam-sensitive materials, low contrast materials, electron dose

Relation: Gnanasekaran K, de With G, Friedrich H (2018) Quantification and optimization of ADF-STEM image contrast for beam-sensitive materials. Royal Society Open Science 5(5): 171838.; http://hdl.handle.net/10255/dryad.172034

الاتاحة: http://hdl.handle.net/10255/dryad.172034
https://doi.org/10.5061/dryad.tq525v7

المؤلفون: Karthikeyan Gnanasekaran, Gijsbertus de With, Heiner Friedrich

المساهمون: Materials and Interface Chemistry, Institute for Complex Molecular Systems

المصدر: Royal Society Open Science
Royal Society Open Science, 5(5):171838. The Royal Society
Royal Society Open Science, Vol 5, Iss 5 (2018)

مصطلحات موضوعية: 0301 basic medicine, Materials science, Polymer nanocomposite, Monte Carlo method, 02 engineering and technology, Carbon nanotube, law.invention, Monte Carlo simulations, 03 medical and health sciences, Optics, image contrast, law, Scanning transmission electron microscopy, Sensitivity (control systems), lcsh:Science, Multidisciplinary, business.industry, beam-sensitive materials, Detector, 021001 nanoscience & nanotechnology, Chemistry, 030104 developmental biology, electron dose, scanning transmission electron microscopy, Nanometre, lcsh:Q, low-contrast materials, 0210 nano-technology, business, Beam (structure), Research Article

وصف الملف: application/pdf

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::3724573bc2a859946a497d49a2df93cf
https://pubmed.ncbi.nlm.nih.gov/29892376

المؤلفون: Gnanasekaran, K., de With, G., Friedrich, H.

مصطلحات موضوعية: Scanning transmission electron microscopy, Monte Carlo simulations, image contrast, beam-sensitive materials, low contrast materials, electron dose

Relation: http://hdl.handle.net/10255/dryad.172038

الاتاحة: http://hdl.handle.net/10255/dryad.172038
https://doi.org/10.5061/dryad.tq525v7/1

المؤلفون: Dolph, Melissa C, Santeufemio, Christopher

المساهمون: MITRE CORP MCLEAN VA

المصدر: DTIC

مصطلحات موضوعية: Particle Accelerators, ION BEAMS, CHEMICAL PROPERTIES, GROUP III COMPOUNDS, GROUP V COMPOUNDS, ROOM TEMPERATURE, SEMICONDUCTORS, STRUCTURAL PROPERTIES, CRYOGENIC FOCUSED ION BEAM MILLING, CRYOFIB, GROUP III-V, STRAINED LAYER SUPERLATTICE, BEAM SENSITIVE MATERIALS

وصف الملف: text/html

Relation: http://www.dtic.mil/docs/citations/ADA597233

الاتاحة: http://www.dtic.mil/docs/citations/ADA597233
http://oai.dtic.mil/oai/oai?&verb=getRecord&metadataPrefix=html&identifier=ADA597233

المؤلفون: Melissa Commisso Dolph, Christopher Santeufemio

المصدر: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. :33-41

مصطلحات موضوعية: Nuclear and High Energy Physics, Materials science, Fabrication, business.industry, Superlattice, Beam sensitive materials, Cryogenic focused ion beam milling, Focused ion beam, Group III–V, Crystallography, Semiconductor, Cryo-FIB, Optoelectronics, Ion milling machine, business, Strained layer superlattice, Instrumentation, Layer (electronics), Beam (structure)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::20b40148147d7401a284c7cdddd3783c

المؤلفون: Gnanasekaran, Karthikeyan, de With, Gijsbertus, Friedrich, Heiner

المصدر: Royal Society Open Science vol.5 (2018) date: 2018-05-02 nr.5 [ISSN 2054-5703]

مصطلحات الفهرس: Beam-sensitive materials, Electron dose, Image contrast, Low-contrast materials, Monte Carlo simulations, Scanning transmission electron microscopy, Tijdschriftartikel, Article

URL: https://research.tue.nl/en/publications/e07dc321-de9a-40c2-a2fa-d953b13d5a27
https://pure.tue.nl/ws/files/98100749/171838.full.pdf
https://pure.tue.nl/ws/files/98100749/171838.full.pdf