المؤلفون: Battezzati, N, Rezgui, S, Sterpone, L, Violante, M, GERARDIN, SIMONE, MANUZZATO, ANDREA, PACCAGNELLA, ALESSANDRO

المساهمون: Battezzati, N, Gerardin, Simone, Manuzzato, Andrea, Paccagnella, Alessandro, Rezgui, S, Sterpone, L, Violante, M

Relation: info:eu-repo/semantics/altIdentifier/wos/WOS:000257879900021; ispartofbook:14th IEEE On-Line Testing Symposium 2008, IOLTS '08; 14th IEEE On-Line Testing Symposium 2008, IOLTS '08; firstpage:135; lastpage:140; numberofpages:6; http://hdl.handle.net/11577/2436392; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-52049119497

الاتاحة: http://hdl.handle.net/11577/2436392

المؤلفون: Battezzati, N., Colazzo, S., Maffione, M., Senepa, L.

المصدر: 2012 Design, Automation & Test in Europe Conference & Exhibition (DATE)

الاتاحة: http://dx.doi.org/10.1109/date.2012.6176451
http://xplorestaging.ieee.org/ielx5/6171057/6176405/06176451.pdf?arnumber=6176451

المؤلفون: Sterpone, L, Battezzati, N

المصدر: 2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010) ; page 1231-1236

الاتاحة: http://dx.doi.org/10.1109/date.2010.5456995
http://xplorestaging.ieee.org/ielx5/5450668/5456897/05456995.pdf?arnumber=5456995

المؤلفون: BATTEZZATI N, MERODIO D, POIVEY C, STERPONE L, VIOLANTE M., GERARDIN, SIMONE, MANUZZATO, ANDREA, PACCAGNELLA, ALESSANDRO

المساهمون: Battezzati, N, Gerardin, Simone, Manuzzato, Andrea, Merodio, D, Paccagnella, Alessandro, Poivey, C, Sterpone, L, Violante, M.

مصطلحات موضوعية: field programmable gate array (FPGA), single event effect, flash based FPGAs

وصف الملف: STAMPA

Relation: info:eu-repo/semantics/altIdentifier/wos/WOS:000272604900078; volume:56; firstpage:3534; lastpage:3541; numberofpages:8; journal:IEEE TRANSACTIONS ON NUCLEAR SCIENCE; http://hdl.handle.net/11577/2379715; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-72349090868

الاتاحة: http://hdl.handle.net/11577/2379715
https://doi.org/10.1109/TNS.2009.2034316

المؤلفون: Battezzati, N., Decuzzi, F., Violante, M., Briet, M.

المصدر: 2009 15th IEEE International On-Line Testing Symposium

الاتاحة: http://dx.doi.org/10.1109/iolts.2009.5195988
http://xplorestaging.ieee.org/ielx5/5176124/5195974/05195988.pdf?arnumber=5195988

المؤلفون: Sterpone, L., Battezzati, N., Ferlet-Cavrois, V.

المصدر: IEEE Transactions on Nuclear Science ; volume 57, issue 4, page 1820-1826 ; ISSN 0018-9499 1558-1578

الاتاحة: http://dx.doi.org/10.1109/tns.2010.2043686
http://xplorestaging.ieee.org/ielx5/23/5550295/05550412.pdf?arnumber=5550412

المؤلفون: Sterpone, L.¹, Battezzati, N.¹, Kastensmidt, F. Lima², Chipana, Raul²

المصدر: IEEE Transactions on Nuclear Science. 10/15/2011 Part 2, Vol. 58 Issue 5, p2333-2340. 8p.

مصطلحات موضوعية: *SIMULATION methods & models, *MATHEMATICAL models, FIELD programmable gate arrays, PHYSICS experiments, TRANSISTORS, ROUTING (Computer network management), SWITCHING theory

المؤلفون: Battezzati, N.¹, Margaglia, F.¹, Violante, M.¹, Decuzzi, F.², Codinachs, D. Merodio², Bancelin, B.³

المصدر: IEEE Transactions on Nuclear Science. Jun2011 Part 2, Vol. 58 Issue 3, p987-992. 6p.

مصطلحات موضوعية: *COMPUTER architecture, *PERFORMANCE evaluation, *RANDOM access memory, RADIATION hardening (Electronics), FIELD programmable gate arrays, SENSITIVITY analysis, NUCLEAR cross sections

المؤلفون: Sterpone, L., Battezzati, N.

المصدر: Proceedings of the Conference: Design, Automation & Test in Europe; 3/8/2010, p1231-1236, 6p

المؤلفون: Battezzati, N., Sterpone, L., Violante, M., Decuzzi, F.

المصدر: 2010 18th IEEE/IFIP VLSI System on Chip Conference (VLSI-SoC); 2010, p79-84, 6p

المؤلفون: Bolchini, C., Miele, A., Sandionigi, C., Battezzati, N., Sterpone, L., Violante, M.

المصدر: 2010 15th IEEE European Test Symposium (ETS); 2010, p214-219, 6p

المؤلفون: Sterpone, L., Battezzati, N.

المصدر: 2010 IEEE 13th International Symposium on Design & Diagnostics of Electronic Circuits & Systems (DDECS); 2010, p36-39, 4p

المؤلفون: Battezzati, N., Sterpone, L., Ferlet-Cavrois, V.

المصدر: 2009 European Conference on Radiation & Its Effects on Components & Systems (RADECS); 2009, p87-90, 4p

المؤلفون: Battezzati, N., Gerardin, S., Manuzzato, A., Paccagnella, A., Rezgui, S., Sterpone, L., Violante, M.

المصدر: 2008 14th IEEE International On-Line Testing Symposium; 2008, p135-140, 6p

المؤلفون: Sterpone, L., Battezzati, N.

المصدر: 2008 NASA/ESA Conference on Adaptive Hardware & Systems; 2008, p157-163, 7p

المؤلفون: Battezzati, N., Sterpone, L., Violante, M.

المصدر: 2008 IEEE International Symposium on Industrial Electronics; 2008, p2282-2287, 6p

المؤلفون: Battezzati, N., Gerardin, S., Manuzzato, A., Merodio, D., Paccagnella, A., Poivey, C., Sterpone, L., Violante, M.

المصدر: IEEE Transactions on Nuclear Science; Dec2009 Part 1 of 2, Vol. 56 Issue 6, p3534-3541, 8p

مصطلحات موضوعية: FIELD programmable gate arrays, ELECTRON configuration, HEAVY ions, LOGIC circuits, RADIATION hardening (Electronics), NEUTRON cross sections

المؤلفون: Battezzati, N., Simone Gerardin, Manuzzato, Andrea, Alessandro Paccagnella, Rezgui, S., Sterpone, L., Violante, M

المصدر: Università degli Studi di Padova-IRIS

URL الوصول: https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::d56bf0020227e50dc9a5fd471f41a8ce
https://www.research.unipd.it/handle/11577/2436392

المؤلفون: Battezzati, N., Colazzo, S., Maffione, M., Senepa, L.

المصدر: Proceedings of the Conference: Design, Automation & Test in Europe; 3/12/2012, p161-162, 2p

المؤلفون: Battezzati, N., Serrone, D., Violante, M.

المصدر: On-Line Testing Symposium (IOLTS), 2010 IEEE 16th International; 2010, p190-191, 2p