المؤلفون: Alqaysi, M H, Martinez, A, Ubochi, B, Batcup, S, Ahmeda, K

المصدر: Engineering Research Express ; volume 2, issue 4, page 045020 ; ISSN 2631-8695

الاتاحة: http://dx.doi.org/10.1088/2631-8695/abc52b
https://iopscience.iop.org/article/10.1088/2631-8695/abc52b
https://iopscience.iop.org/article/10.1088/2631-8695/abc52b/pdf

المؤلفون: Alqaysi, M. H., Martinez, A., Ubochi, B., Batcup, S., Ahmeda, Khaled

Relation: Engineering Research Express; Alqaysi, M.H., Martinez, A., Ubochi, B., Batcup, S. and Ahmeda, K. (2020) 'Influence of temperature and dimension in a 4H-SiC vertical power MOSFET', Engineering Research Express, 2(4), p.045020.; http://hdl.handle.net/10369/11377

الاتاحة: http://hdl.handle.net/10369/11377

المؤلفون: Lodzinski, M., Perez-Tomas, A., Guy, O.J., Penny, M., Batcup, S., Al-Hartomy, O.A, Dunstan, P., Wilks, S., Igic, P.

المصدر: 2008 26th International Conference on Microelectronics ; page 541-543

الاتاحة: http://dx.doi.org/10.1109/icmel.2008.4559342
http://xplorestaging.ieee.org/ielx5/4545382/4559204/04559342.pdf?arnumber=4559342

المؤلفون: Igic, P.M., Mawby, P.A., Towers, M.S., Batcup, S.

المصدر: 2002 23rd International Conference on Microelectronics. Proceedings (Cat. No.02TH8595) ; volume 1, page 171-174

الاتاحة: http://dx.doi.org/10.1109/miel.2002.1003167
http://xplorestaging.ieee.org/ielx5/7858/21636/01003167.pdf?arnumber=1003167

المؤلفون: Janković, N., Pantić, D., Batcup, S., Igić, P.

المصدر: Applied Physics Letters ; volume 100, issue 26 ; ISSN 0003-6951 1077-3118

الاتاحة: http://dx.doi.org/10.1063/1.4731630
https://pubs.aip.org/aip/apl/article-pdf/doi/10.1063/1.4731630/13843722/263507_1_online.pdf

المؤلفون: Igic, P.M., Mawby, P.A., Towers, M.S., Jamal, W., Batcup, S.

المصدر: Microelectronics Reliability ; volume 42, issue 7, page 1045-1052 ; ISSN 0026-2714

الاتاحة: http://dx.doi.org/10.1016/s0026-2714(02)00016-1
https://api.elsevier.com/content/article/PII:S0026271402000161?httpAccept=text/xml
https://api.elsevier.com/content/article/PII:S0026271402000161?httpAccept=text/plain

المؤلفون: Igic, P., Holland, P., Batcup, S., Lerner, R., Menz, A.

المصدر: 2006 IEEE International Symposium on Power Semiconductor Devices & IC's; 2006, p1-4, 4p

المؤلفون: Jankovic, N., Zhongfu Zhou, Batcup, S., Igic, P.

المصدر: 2006 IEEE International Symposium on Industrial Electronics; 2006, p447-452, 6p

المؤلفون: Igic, P.M., Mawby, P.A., Towers, M.S., Batcup, S.

المصدر: Seventeenth Annual IEEE Semiconductor Thermal Measurement & Management Symposium (Cat. No.01CH37189); 2001, p35-42, 8p

المؤلفون: Igic, P.M., Mawby, P.A., Towers, M.S., Batcup, S.

المصدر: IEE Proceedings -- Circuits, Devices & Systems; Aug2002, Vol. 149 Issue 4, p257-263, 7p

المؤلفون: Holland, P.M., Elwin, M.P., Batcup, S., Zhou, Z., Igic, P.M.

المصدر: 2008 26th International Conference on Microelectronics; 2008, p177-179, 3p

المؤلفون: Lodzinski, M., Guy, O.J., Castaing, A., Batcup, S., Wilks, S.P., Igic, P., Balmer, R.S., Wort, C.J.H., Lang, R.

المصدر: Materials Science Forum; March 2009, Vol. 615 Issue: 1 p995-998, 4p

المؤلفون: Igic, P.M., Mawby, P.A., Towers, M.S., Batcup, S.

المصدر: 2002 23rd International Conference on Microelectronics. Proceedings (Cat. No.02TH8595); 2002, p171-171, 1p