المؤلفون: Sadik, Diane-Perle, 1988

المساهمون: Nee, Hans-Peter, Ranstad, Per, Ph.D, Kaminski, Nando, Prof.

المصدر: TRITA-EE.

مصطلحات موضوعية: Silicon Carbide, Metal-Oxide-Semiconductor Field-Effect Transistor (MOSFET), Junction Field-Effect Transistor(JFET), Bipolar Junction Transistor (BJT), Reliability, Failure Analysis, Reliability Testing, Short- Circuit Currents, Humidity, Resonant converter, Series-resonant converter (SLR), Base drive circuits, Gate drive circuits, Life-Cycle Cost Analysis (LCCA), Kiselkarbid, MOSFETar, JFETar, Bipolär Junction Transistor (BJT), Tillförlitlighet, Robusthet, Felanalys, Tillförlitlighetstestning, Kortslutningsströmmar, Luftfuktighet, Resonansomvandlare, Serie-resonansomvandlare (SLR), Basdrivkretsar, Gate-drivkretsar, Felskydd, Livscykelkostnadsanalys, Electrical Engineering, Elektro- och systemteknik

وصف الملف: electronic

URL الوصول: https://urn.kb.se/resolve?urn=urn:nbn:se:kth:diva-207763
https://kth.diva-portal.org/smash/get/diva2:1098077/FULLTEXT01.pdf

المؤلفون: Tolstoy, Georg, 1981

المساهمون: Nee, Hans-Peter, Professor, Munk-Nielsen, Stig, Professor

المصدر: TRITA-EE.

مصطلحات موضوعية: Silicon Carbide, Bipolar Junction Transistor (BJT), Resonant converter, Series-resonant converter (SLR), Base drive circuits, High- Efficiency Converters, High-Frequency Converters, Electrical Engineering, Elektro- och systemteknik

وصف الملف: electronic

URL الوصول: https://urn.kb.se/resolve?urn=urn:nbn:se:kth:diva-168163
https://kth.diva-portal.org/smash/get/diva2:814732/FULLTEXT01.pdf