المؤلفون: Debez, M., Tarento, R.-J., Mekki, D.E.

المساهمون: Laboratoire de Physique des Solides (LPS), Université Paris-Sud - Paris 11 (UP11)-Centre National de la Recherche Scientifique (CNRS)

المصدر: ISSN: 0021-8979.

مصطلحات موضوعية: Charge carriers, Charge density, Electric currents, Electron beams, Electron optics, Matrix algebra, Metallic soaps, Particle beams, Semiconductor materials, Surface charge, Barrier height (BH), Defect concentrations, Doping concentrations, Electron-beam-induced current (EBIC), interface energies, Level model, Limiting cases, minority carriers, Monoenergetic, precipitate size, Quasi-fermi levels, recombination velocity, Self-consistent calculations, Semiconductor matrices, semiconductor parameters, Space charge region (SCR), Surface charge densities, Electric conductivity, [PHYS.COND]Physics [physics]/Condensed Matter [cond-mat]

الاتاحة: https://hal.science/hal-04896797
https://doi.org/10.1063/1.2936968