المؤلفون: Mehdi Ghanbarzadeh Lak, Mir Javad Gheybi, Sajjad Chehreghani

المصدر: Heliyon, Vol 11, Iss 2, Pp e41808- (2025)

مصطلحات موضوعية: RIAM method, Band limit, Landfill, MRF, Compost, Urmia, Science (General), Q1-390, Social sciences (General), H1-99

وصف الملف: electronic resource

Relation: http://www.sciencedirect.com/science/article/pii/S2405844025001884; https://doaj.org/toc/2405-8440

URL الوصول: https://doaj.org/article/c7dee59733a94136ae3f4f8d64ac46a4

المؤلفون: Tamar Zelovich (2871908), Thorsten Hansen (1313850), Mark E. Tuckerman (1278969)

مصطلحات موضوعية: Biological Sciences not elsewhere classified, Chemical Sciences not elsewhere classified, optimal electron transport, molecular energy levels, method extends beyond, electronic structure theory, band limit approximation, two mels adsorbed, usual wide, theoretical construct, rigorous parameter, intramolecular coupling, green ’, generality allows, fundamental observable, free framework, experimental characterization, electrochemical devices, built upon

Relation: https://figshare.com/articles/journal_contribution/A_Green_s_Function_Approach_for_Determining_Surface_Induced_Broadening_and_Shifting_of_Molecular_Energy_Levels/21743445

الاتاحة: https://doi.org/10.1021/acs.nanolett.2c02910.s001

المؤلفون: Poljak, Mirko, Matić, Mislav

المساهمون: Skala, Karolj

مصطلحات موضوعية: silicene, nanoribbon, quasi-one-dimensional, bandgap, transport gap, bandgap narrowing, metallization, quantum transport, NEGF, wide-band limit, edge contact

URL الوصول: https://explore.openaire.eu/search/publication?articleId=57a035e5b1ae::304449fe414a7a678108ee773d2fdacf
https://www.bib.irb.hr/1274723

المؤلفون: Vladimir Rokhlin, Hong Xiao

المصدر: Applied and Computational Harmonic Analysis. 22:105-123

مصطلحات موضوعية: Applied Mathematics, 010102 general mathematics, Mathematical analysis, Prolate spheroidal wave functions, Prolate spheroid, Prolate spheroidal coordinates, 01 natural sciences, 010101 applied mathematics, Bounded function, Asymptotic, Order (group theory), Band-limit, Limit (mathematics), 0101 mathematics, Wave function, Approximation, Eigenvalues and eigenvectors, Mathematics

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::4b201a80bcc744ea5a4cc5e68d57d0f8
https://doi.org/10.1016/j.acha.2006.05.004

المؤلفون: Duparre, A., Ferre-Borrull, J., Gliech, S., Notni, G., Steinert, J., Bennett, J.M.

مصطلحات موضوعية: surface characterization technique, root-mean-square roughness, power spectral density, optical component, light scattering, surface topography, atomic force microscope, mechanical profiler, optical profiler, Confocal laserscanning microscopy, angle resolved scattering, total scattering, ground fused silica, silicon carbide, sapphire, electroplated gold, diamond-turned brass, measurement instrument, surface spatial wavelength band limit, rms roughnesses, integrating area, surface topographical feature, Au, SiC

Time: 620, 535

Relation: Applied optics; https://publica.fraunhofer.de/handle/publica/202751

الاتاحة: https://publica.fraunhofer.de/handle/publica/202751
https://doi.org/10.1364/AO.41.000154

المؤلفون: Gunther Notni, Stefan Gliech, Jörg Steinert, Angela Duparré, Josep Ferré-Borrull, Jean M Bennett

المساهمون: Universitat de Barcelona, Publica

المصدر: Recercat. Dipósit de la Recerca de Catalunya
instname
Scopus-Elsevier
Dipòsit Digital de la UB
Universidad de Barcelona

مصطلحات موضوعية: SiC, measurement instrument, Materials science, sapphire, Materials Science (miscellaneous), total scattering, electroplated gold, surface characterization technique, Surface finish, power spectral density, light scattering, integrating area, Industrial and Manufacturing Engineering, Light scattering, mechanical profiler, Root mean square, Scanning probe microscopy, diamond-turned brass, Optics, optical component, silicon carbide, atomic force microscope, root-mean-square roughness, surface spatial wavelength band limit, Au, Business and International Management, Òptica electrònica, ground fused silica, angle resolved scattering, Scattering, business.industry, Electron optics, surface topographical feature, Confocal laserscanning microscopy, surface topography, optical profiler, Characterization (materials science), Measuring instrument, Sapphire, rms roughnesses, business

وصف الملف: application/pdf

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::150164e920d57644f50215aa50eb54d3
http://hdl.handle.net/2445/24303