المؤلفون: Wang, Fulin, Echlin, McLean P., Taylor, Aidan A., Shin, Jungho, Bammes, Benjamin, Levin, Barnaby D. A., De Graef, Marc, Pollock, Tresa M., Gianola, Daniel S.

مصطلحات موضوعية: Condensed Matter - Materials Science, Physics - Applied Physics

URL الوصول: http://arxiv.org/abs/2008.11411

المؤلفون: Peng, Ruizhi, Fu, Xiaofeng, Mendez, Joshua H., Randolph, Peter S., Bammes, Benjamin E., Stagg, Scott M.

المساهمون: National Institutes of Health, U.S. Department of Energy

المصدر: Journal of Structural Biology: X ; volume 7, page 100080 ; ISSN 2590-1524

الاتاحة: http://dx.doi.org/10.1016/j.yjsbx.2022.100080
https://api.elsevier.com/content/article/PII:S2590152422000216?httpAccept=text/xml
https://api.elsevier.com/content/article/PII:S2590152422000216?httpAccept=text/plain

المؤلفون: Zhou, Weijiang, Bammes, Benjamin, Mitchell, Patrick G., Betz, Kerry, Chiu, Wah

المصدر: Ultramicroscopy ; volume 235, page 113474 ; ISSN 0304-3991

الاتاحة: https://doi.org/10.1016/j.ultramic.2022.113474
https://api.elsevier.com/content/article/PII:S0304399122000110?httpAccept=text/xml
https://api.elsevier.com/content/article/PII:S0304399122000110?httpAccept=text/plain

المؤلفون: Zhou, Weijiang, Bammes, Benjamin, Mitchell, Patrick G., Betz, Kerry, Chiu, Wah

المساهمون: U.S. Department of Energy, NIH

المصدر: Ultramicroscopy ; volume 232, page 113417 ; ISSN 0304-3991

الاتاحة: http://dx.doi.org/10.1016/j.ultramic.2021.113417
https://api.elsevier.com/content/article/PII:S0304399121001959?httpAccept=text/xml
https://api.elsevier.com/content/article/PII:S0304399121001959?httpAccept=text/plain

المؤلفون: Bammes, Benjamin, Spilman, Michael

المصدر: Microscopy & Microanalysis; 2024 Supplement, Vol. 30, p1-4, 4p

المؤلفون: Bammes, Benjamin, Moore, Kalani, Levin, Barnaby D A

المصدر: Microscopy & Microanalysis; 2024 Supplement, Vol. 30, p1-4, 4p

المؤلفون: Chatterjee, Debaditya, Wei, Jingrui, kvit, Alex, Bammes, Benjamin, Levin, Barnaby, Bilhorn, Robert, Voyles, Paul

المصدر: Microscopy and Microanalysis ; volume 27, issue S1, page 1004-1006 ; ISSN 1431-9276 1435-8115

الاتاحة: https://doi.org/10.1017/s1431927621003809
https://www.cambridge.org/core/services/aop-cambridge-core/content/view/S1431927621003809

المؤلفون: Bammes, Benjamin, Bilhorn, Robert

المصدر: Microscopy and Microanalysis ; volume 27, issue S1, page 1334-1336 ; ISSN 1431-9276 1435-8115

الاتاحة: http://dx.doi.org/10.1017/s1431927621004979
https://www.cambridge.org/core/services/aop-cambridge-core/content/view/S1431927621004979

المؤلفون: Wang, Fulin, Echlin, McLean P., Taylor, Aidan A., Shin, Jungho, Bammes, Benjamin, Levin, Barnaby D.A., De Graef, Marc, Pollock, Tresa M., Gianola, Daniel S.

المساهمون: U.S. Department of Energy, National Science Foundation, U.S. Department of Defense

المصدر: Ultramicroscopy ; volume 220, page 113160 ; ISSN 0304-3991

الاتاحة: http://dx.doi.org/10.1016/j.ultramic.2020.113160
https://api.elsevier.com/content/article/PII:S030439912030303X?httpAccept=text/xml
https://api.elsevier.com/content/article/PII:S030439912030303X?httpAccept=text/plain

المؤلفون: Wang, Fulin, Echlin, McLean, Shin, Jungho, Bammes, Benjamin, Graef, Marc De, Pollock, Tresa, Gianola, Daniel

المصدر: Microscopy and Microanalysis ; volume 26, issue S2, page 1164-1165 ; ISSN 1431-9276 1435-8115

مصطلحات موضوعية: Instrumentation

الاتاحة: http://dx.doi.org/10.1017/s1431927620017171
https://www.cambridge.org/core/services/aop-cambridge-core/content/view/S1431927620017171

المؤلفون: Bammes, Benjamin, Zhou, Weijiang, Chiu, Wah

المصدر: Microscopy and Microanalysis ; volume 26, issue S2, page 1524-1526 ; ISSN 1431-9276 1435-8115

مصطلحات موضوعية: Instrumentation

الاتاحة: http://dx.doi.org/10.1017/s1431927620018401
https://www.cambridge.org/core/services/aop-cambridge-core/content/view/S1431927620018401

المؤلفون: Bammes, Benjamin

المصدر: Microscopy and Microanalysis ; volume 26, issue S2, page 922-922 ; ISSN 1431-9276 1435-8115

الاتاحة: https://doi.org/10.1017/s1431927620016335
https://www.cambridge.org/core/services/aop-cambridge-core/content/view/S1431927620016335

المؤلفون: Wei, Jingrui, Moore, Kalani, Bammes, Benjamin, Levin, Barnaby D A, Hagopian, Nicholas, Jacobs, Ryan, Morgan, Dane, Voyles, Paul M

المصدر: Microscopy & Microanalysis; Dec2023, Vol. 29 Issue 6, p2026-2036, 11p

المؤلفون: Bammes, Benjamin, Ramachandra, Ranjan, Mackey, Mason R., Bilhorn, Robert, Ellisman, Mark

المصدر: Microscopy and Microanalysis ; volume 25, issue S2, page 1060-1061 ; ISSN 1431-9276 1435-8115

الاتاحة: http://dx.doi.org/10.1017/s1431927619006032
https://www.cambridge.org/core/services/aop-cambridge-core/content/view/S1431927619006032

المؤلفون: Bammes, Benjamin, Spilman, Michael, Streetley, James, Bhella, David

المصدر: Microscopy and Microanalysis ; volume 25, issue S2, page 1000-1001 ; ISSN 1431-9276 1435-8115

مصطلحات موضوعية: Instrumentation

الاتاحة: http://dx.doi.org/10.1017/s1431927619005737
https://www.cambridge.org/core/services/aop-cambridge-core/content/view/S1431927619005737

المؤلفون: Bammes, Benjamin, Zhang, Chenyu, Bilhorn, Robert, Voyles, Paul M.

المصدر: Microscopy and Microanalysis ; volume 25, issue S2, page 68-69 ; ISSN 1431-9276 1435-8115

مصطلحات موضوعية: Instrumentation

الاتاحة: http://dx.doi.org/10.1017/s1431927619001077
https://www.cambridge.org/core/services/aop-cambridge-core/content/view/S1431927619001077

المؤلفون: Bammes, Benjamin, Amari, Houari, Mehdi, BL, Bilhorn, Robert, Browning, Nigel D.

المصدر: Microscopy and Microanalysis ; volume 25, issue S2, page 1466-1467 ; ISSN 1431-9276 1435-8115

الاتاحة: https://doi.org/10.1017/s1431927619008067
https://www.cambridge.org/core/services/aop-cambridge-core/content/view/S1431927619008067

المؤلفون: Mücke, David, Linck, Martin, Guzzinati, Giulio, Müller, Heiko, Levin, Barnaby D. A., Bammes, Benjamin E., Brouwer, Raúl González, Jelezko, Fedor, Qi, Haoyuan, Kaiser, Ute

المصدر: Micron, 174, Article no: 103525 ; ISSN: 0968-4328

مصطلحات موضوعية: ddc:600, Technology, info:eu-repo/classification/ddc/600

Relation: info:eu-repo/semantics/altIdentifier/wos/001069198100001; info:eu-repo/semantics/altIdentifier/issn/0968-4328; https://publikationen.bibliothek.kit.edu/1000161695

الاتاحة: https://publikationen.bibliothek.kit.edu/1000161695

المؤلفون: Wei, Jingrui, Moore, Kalani, Bammes, Benjamin, Levin, Barnaby D A, Morgan, Dane, Voyles, Paul M

المصدر: Microscopy and Microanalysis ; volume 29, issue Supplement_1, page 702-704 ; ISSN 1431-9276 1435-8115

مصطلحات موضوعية: Instrumentation

الاتاحة: http://dx.doi.org/10.1093/micmic/ozad067.346
https://academic.oup.com/mam/article-pdf/29/Supplement_1/702/50932364/ozad067.346.pdf

المؤلفون: Datta, Abhik, Wee Chee, See, Bammes, Benjamin, Jin, Liang, Loh, Duane

المصدر: Microscopy and Microanalysis ; volume 23, issue S1, page 190-191 ; ISSN 1431-9276 1435-8115

مصطلحات موضوعية: Instrumentation

الاتاحة: http://dx.doi.org/10.1017/s1431927617001635
https://www.cambridge.org/core/services/aop-cambridge-core/content/view/S1431927617001635