المؤلفون: Baker, Megan M., New, Alexander, Aguilar-Simon, Mario, Al-Halah, Ziad, Arnold, Sébastien M. R., Ben-Iwhiwhu, Ese, Brna, Andrew P., Brooks, Ethan, Brown, Ryan C., Daniels, Zachary, Daram, Anurag, Delattre, Fabien, Dellana, Ryan, Eaton, Eric, Fu, Haotian, Grauman, Kristen, Hostetler, Jesse, Iqbal, Shariq, Kent, Cassandra, Ketz, Nicholas, Kolouri, Soheil, Konidaris, George, Kudithipudi, Dhireesha, Learned-Miller, Erik, Lee, Seungwon, Littman, Michael L., Madireddy, Sandeep, Mendez, Jorge A., Nguyen, Eric Q., Piatko, Christine D., Pilly, Praveen K., Raghavan, Aswin, Rahman, Abrar, Ramakrishnan, Santhosh Kumar, Ratzlaff, Neale, Soltoggio, Andrea, Stone, Peter, Sur, Indranil, Tang, Zhipeng, Tiwari, Saket, Vedder, Kyle, Wang, Felix, Xu, Zifan, Yanguas-Gil, Angel, Yedidsion, Harel, Yu, Shangqun, Vallabha, Gautam K.

مصطلحات موضوعية: Computer Science - Machine Learning, Computer Science - Computer Vision and Pattern Recognition, Computer Science - Robotics

URL الوصول: http://arxiv.org/abs/2301.07799

المؤلفون: Johnson, Erik C., Nguyen, Eric Q., Schreurs, Blake, Ewulum, Chigozie S., Ashcraft, Chace, Fendley, Neil M., Baker, Megan M., New, Alexander, Vallabha, Gautam K.

مصطلحات موضوعية: Computer Science - Machine Learning, Computer Science - Artificial Intelligence

URL الوصول: http://arxiv.org/abs/2203.07454

المؤلفون: Ohiri, Korine A., Pyles, Connor O., Hamilton, Leslie H., Baker, Megan M., McGuire, Matthew T., Nguyen, Eric Q., Osborn, Luke E., Rossick, Katelyn M., McDowell, Emil G., Strohsnitter, Leah M., Currano, Luke J.

المساهمون: U.S. Department of Defense

المصدر: Scientific Reports ; volume 12, issue 1 ; ISSN 2045-2322

الاتاحة: http://dx.doi.org/10.1038/s41598-022-13701-4
https://www.nature.com/articles/s41598-022-13701-4.pdf
https://www.nature.com/articles/s41598-022-13701-4

المؤلفون: Bishop, Paul D., Baker, Megan M. L., Moore, Gavin

المصدر: Water Environment & Technology, 2015 May 01. 27(5), 42-45.

URL الوصول: http://www.jstor.org/stable/44010880

المؤلفون: Wilt, Miller L., Baker, Megan M., Papadakis, Stergios J.

المصدر: 2020 IEEE Physical Assurance and Inspection of Electronics (PAINE)

الاتاحة: http://dx.doi.org/10.1109/paine49178.2020.9337729
http://xplorestaging.ieee.org/ielx7/9337561/9337562/09337729.pdf?arnumber=9337729