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1Academic Journal
المؤلفون: Kujofsa, T., Ayers, J. E.
المصدر: Journal of Electronic Materials ; volume 49, issue 11, page 6990-6995 ; ISSN 0361-5235 1543-186X
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2Academic Journal
المؤلفون: Kujofsa, T., Ayers, J. E.
المصدر: Journal of Electronic Materials ; volume 49, issue 11, page 6977-6982 ; ISSN 0361-5235 1543-186X
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3Academic Journal
المؤلفون: Parent, Elisa, Raphael, Johanna, Kujofsa, Tedi, Ayers, J. E.
المصدر: International Journal of High Speed Electronics & Systems; Mar/Dec2022, Vol. 31 Issue 1/4, p1-6, 6p
مصطلحات موضوعية: CRYSTAL defects, PEROVSKITE, BROMINE
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4Academic Journal
المؤلفون: Parent, Elisa, Raphael, Johanna, Kujofsa, Tedi, Ayers, J. E.
المصدر: International Journal of High Speed Electronics & Systems; Mar/Dec2022, Vol. 31 Issue 1/4, p1-5, 5p
مصطلحات موضوعية: EPITAXIAL layers, THIN film deposition, CRYSTAL defects, PHOTOVOLTAIC power systems, SOLAR cells
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5Academic Journal
المؤلفون: Ayers, J. E.1 (AUTHOR) john.ayers@uconn.edu, Kujofsa, Tedi1 (AUTHOR) tedi.kujofsa@gmail.com, Raphael, Johanna2 (AUTHOR) johanna.raphael@gmail.com, Islam, Md Tanvirul1 (AUTHOR) tanvirislam.cs@gmail.com
المصدر: International Journal of High Speed Electronics & Systems. Mar-Dec2020, Vol. 29 Issue 1-4, pN.PAG-N.PAG. 9p.
مصطلحات موضوعية: *AUDITING standards, HETEROSTRUCTURES, DISLOCATION structure, SUPERLATTICES, THERMAL expansion, GETTERING, FLUX pinning
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6Academic Journal
المؤلفون: Kujofsa, Tedi1 (AUTHOR) tedi.kujofsa@gmail.com, Ayers, J. E.1 (AUTHOR) john.ayers@uconn.edu
المصدر: International Journal of High Speed Electronics & Systems. Mar-Dec2020, Vol. 29 Issue 1-4, pN.PAG-N.PAG. 6p.
مصطلحات موضوعية: *INVENTIONS, *AUDITING standards, GETTERING, HETEROSTRUCTURES, SEMICONDUCTORS
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7Academic Journal
المؤلفون: Kujofsa, Tedi1 (AUTHOR) tedi.kujofsa@gmail.com, Ayers, J. E.1 (AUTHOR) john.ayers@uconn.edu
المصدر: International Journal of High Speed Electronics & Systems. Mar-Dec2020, Vol. 29 Issue 1-4, pN.PAG-N.PAG. 5p.
مصطلحات موضوعية: *AUDITING standards, HETEROSTRUCTURES, WEAVING, SUPERLATTICES, WEAVING patterns, MULTILAYERS
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8Academic Journal
المؤلفون: Elwinger, G. F., Johnson, M. W., Hill, R. R., Ayers, J. E.
المصدر: Crop Science ; volume 30, issue 2, page 350-358 ; ISSN 0011-183X 1435-0653
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9Academic Journal
المؤلفون: Raphael, Johanna, Kujofsa, Tedi, Ayers, J. E.
المصدر: International Journal of High Speed Electronics & Systems; Mar-Dec2020, Vol. 29 Issue 1-4, pN.PAG-N.PAG, 6p
مصطلحات موضوعية: BUFFER layers, DISLOCATION density, AUDITING standards, INDIUM gallium arsenide, GALLIUM arsenide, SEMICONDUCTOR devices
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10Academic Journal
المؤلفون: Sidoti, D., Xhurxhi, S., Kujofsa, T., Cheruku, S., Correa, J. P., Bertoli, B., Rago, P. B., Suarez, E. N., Jain, F. C., Ayers, J. E.
المصدر: Journal of Applied Physics; Jan2011, Vol. 109 Issue 2, p023510, 5p, 1 Diagram, 1 Chart, 3 Graphs
مصطلحات موضوعية: DISLOCATIONS in crystals, CRYSTALS, EPITAXY, HETEROJUNCTIONS, PHYSICS
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11Academic Journal
المؤلفون: Bertoli, B., Sidoti, D., Xhurxhi, S., Kujofsa, T., Cheruku, S., Correa, J. P., Rago, P. B., Suarez, E. N., Jain, F. C., Ayers, J. E.
المصدر: Journal of Applied Physics; Dec2010, Vol. 108 Issue 11, p113525, 5p, 6 Graphs
مصطلحات موضوعية: SEMICONDUCTORS, SILICON, GERMANIUM, LIGHT emitting diodes, TRANSISTORS
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12Academic Journal
المؤلفون: Bertoli, B., Suarez, E. N., Ayers, J. E., Jain, F. C.
المصدر: Journal of Applied Physics; Oct2009, Vol. 106 Issue 7, p073519-073526, 7p, 1 Chart, 9 Graphs
مصطلحات موضوعية: HETEROSTRUCTURES, SUPERLATTICES, EQUILIBRIUM, SEMICONDUCTORS, DENSITY, CRYSTALS, HETEROJUNCTIONS
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13Academic Journal
المؤلفون: Zhang, X. G., Rodriguez, A., Li, P., Jain, F. C., Ayers, J. E.
المصدر: Journal of Applied Physics; 3/15/2002, Vol. 91 Issue 6, p3912, 6p, 3 Black and White Photographs, 3 Graphs
مصطلحات موضوعية: DISLOCATIONS in metals, GLIDE (Crystallography)
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14Academic Journal
المؤلفون: Kujofsa, Tedi, Ayers, J. E.
المصدر: Journal of Electronic Materials ; volume 45, issue 9, page 4580-4586 ; ISSN 0361-5235 1543-186X
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15Academic Journal
المؤلفون: Islam, Md Tanvirul, Kujofsa, Tedi, Chen, Xinkang, Ayers, J. E.
المصدر: International Journal of High Speed Electronics & Systems; Sep-Dec2019, Vol. 38 Issue 3/4, pN.PAG-N.PAG, 9p
مصطلحات موضوعية: BUFFER layers, AUDITING standards, DISLOCATION density, SUPERLATTICES, INDIUM gallium arsenide, INDIUM
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16Academic Journal
المؤلفون: Althowibi, F. A.1 fhdamer@gmail.com, Ayers, J. E.2 john.ayers@uconn.edu
المصدر: International Journal of High Speed Electronics & Systems. Mar-Jun2018, Vol. 27 Issue 1/2, pN.PAG-N.PAG. 11p.
مصطلحات موضوعية: X-ray diffraction, GALLIUM arsenide, QUANTUM wells, BRAGG gratings, LATTICE constants
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17Academic Journal
المؤلفون: Kujofsa, T., Ayers, J. E.
المصدر: Journal of Electronic Materials ; volume 44, issue 9, page 3030-3035 ; ISSN 0361-5235 1543-186X
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18Academic Journal
المؤلفون: Kujofsa, T., Antony, A., Xhurxhi, S., Obst, F., Sidoti, D., Bertoli, B., Cheruku, S., Correa, J. P., Rago, P. B., Suarez, E. N., Jain, F. C., Ayers, J. E.
المصدر: Journal of Electronic Materials ; volume 42, issue 12, page 3408-3420 ; ISSN 0361-5235 1543-186X
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19Academic Journal
المؤلفون: Kujofsa, T., Cheruku, S., Yu, W., Outlaw, B., Xhurxhi, S., Obst, F., Sidoti, D., Bertoli, B., Rago, P. B., Suarez, E. N., Jain, F. C., Ayers, J. E.
المصدر: Journal of Electronic Materials ; volume 42, issue 9, page 2764-2770 ; ISSN 0361-5235 1543-186X
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20Academic Journal
المؤلفون: Chan, P.-Y., Gogna, M., Suarez, E., Al-Amoody, F., Karmakar, S., Miller, B. I., Heller, E. K., Ayers, J. E., Jain, F. C.
المصدر: Journal of Electronic Materials ; volume 42, issue 11, page 3259-3266 ; ISSN 0361-5235 1543-186X