المؤلفون: Mazzillo, M., Condorelli, G., Sanfilippo, D., Fallica, G., Sciacca, E., Aurite, S., Lombardo, S., Rimini, E., Belluso, M., Billotta, S., Bonanno, G., Campisi, A., Cosentino, L., Finocchiaro, P., Musumeci, F., Privitera, S., Tudisco, S.

المصدر: Optoelectronics Letters ; volume 3, issue 3, page 177-180 ; ISSN 1673-1905 1993-5013

الاتاحة: https://doi.org/10.1007/s11801-007-6203-3
http://link.springer.com/content/pdf/10.1007/s11801-007-6203-3.pdf
http://link.springer.com/article/10.1007/s11801-007-6203-3/fulltext.html
http://link.springer.com/content/pdf/10.1007/s11801-007-6203-3

المؤلفون: Corso, D., Aurite, S., Sciacca, E., Naso, D., Lombardo, S., Santangelo, A., Nicotra, M.C., Cascino, S.

المصدر: Microelectronics Reliability ; volume 47, issue 4-5, page 806-809 ; ISSN 0026-2714

الاتاحة: https://doi.org/10.1016/j.microrel.2007.01.011
https://api.elsevier.com/content/article/PII:S0026271407000169?httpAccept=text/xml
https://api.elsevier.com/content/article/PII:S0026271407000169?httpAccept=text/plain

المؤلفون: Sciacca, Emilio, Condorelli, G., Aurite, S., Lombardo, S., Mazzillo, M., Sanfilippo, D., Fallica, G., Rimini, E.

المصدر: IEEE Electron Device Letters ; volume 29, issue 3, page 218-220 ; ISSN 0741-3106

الاتاحة: http://dx.doi.org/10.1109/led.2007.915373
http://xplorestaging.ieee.org/ielx5/55/4455672/04455683.pdf?arnumber=4455683

المؤلفون: Corso D, Aurite S, Sciacca E, Naso D, Lombardo S, Santangelo A, Nicotra MC, Cascino S

المصدر: Microelectronics and reliability 47 (2007): 806–809.
info:cnr-pdr/source/autori:Corso D, Aurite S, Sciacca E, Naso D, Lombardo S, Santangelo A, Nicotra MC, Cascino S/titolo:Measurement of the hot carrier damage profile in LDMOS devices stressed at high drain voltage/doi:/rivista:Microelectronics and reliability/anno:2007/pagina_da:806/pagina_a:809/intervallo_pagine:806–809/volume:47

URL الوصول: https://explore.openaire.eu/search/publication?articleId=cnr_________::bf4ec531306236636e68f375a652a58e
http://www.cnr.it/prodotto/i/36035