المؤلفون: Arunachalam, Ayush, Kintz, Ian, Banerjee, Suvadeep, Raha, Arnab, Jin, Xiankun, Su, Fei, Prasanth, Viswanathan Pillai, Parekhji, Rubin A., Natarajan, Suriyaprakash, Basu, Kanad

مصطلحات موضوعية: Computer Science - Machine Learning, Electrical Engineering and Systems Science - Systems and Control

URL الوصول: http://arxiv.org/abs/2404.01632

المؤلفون: Meng, Xingyu, Srivastava, Amisha, Arunachalam, Ayush, Ray, Avik, Silva, Pedro Henrique, Psiakis, Rafail, Makris, Yiorgos, Basu, Kanad

مصطلحات موضوعية: Computer Science - Cryptography and Security, Computer Science - Hardware Architecture

URL الوصول: http://arxiv.org/abs/2308.11042

المؤلفون: Arunachalam, Ayush, Berriel, S. Novia, Banerjee, Parag, Basu, Kanad

مصطلحات موضوعية: Condensed Matter - Materials Science, Computer Science - Machine Learning

URL الوصول: http://arxiv.org/abs/2201.04933

المؤلفون: Mishra, Vinod K., Basu, Kanad, Arunachalam, Ayush

المساهمون: Solomon, Latasha, Schwartz, Peter J.

المصدر: Artificial Intelligence and Machine Learning for Multi-Domain Operations Applications V

الاتاحة: http://dx.doi.org/10.1117/12.2663175

المؤلفون: Srivastava, Amisha, Lu, Chao, Choudhury, Navnil, Arunachalam, Ayush, Basu, Kanad

المساهمون: National Science Foundation

المصدر: Proceedings of the Great Lakes Symposium on VLSI 2023

الاتاحة: http://dx.doi.org/10.1145/3583781.3590223
https://dl.acm.org/doi/pdf/10.1145/3583781.3590223

المؤلفون: Kumar, Udit, Arunachalam, Ayush, Feit, Corbin, Berriel, S. Novia, Basu, Kanad, Banerjee, Parag, Seal, Sudipta

المصدر: Journal of Vacuum Science & Technology: Part A-Vacuums, Surfaces & Films; Dec2023, Vol. 41 Issue 6, p1-10, 10p

مصطلحات موضوعية: ARTIFICIAL intelligence, K-nearest neighbor classification, MACHINE learning, ATOMIC layer deposition, NANOSTRUCTURES, RANDOM forest algorithms, ENGINEERING

المؤلفون: Arunachalam, Ayush, Kundu, Shamik, Raha, Arnab, Banerjee, Suvadeep, Natarajan, Suriyaprakash, Basu, Kanad

المساهمون: Semiconductor Research Corporation

المصدر: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ; volume 42, issue 4, page 1085-1098 ; ISSN 0278-0070 1937-4151

الاتاحة: http://dx.doi.org/10.1109/tcad.2022.3198036
http://xplorestaging.ieee.org/ielx7/43/10077488/09854180.pdf?arnumber=9854180

المؤلفون: Lu, Chao, Kundu, Shamik, Arunachalam, Ayush, Basu, Kanad

المصدر: 2022 IEEE 15th Dallas Circuit And System Conference (DCAS)

الاتاحة: http://dx.doi.org/10.1109/dcas53974.2022.9845619
http://xplorestaging.ieee.org/ielx7/9845496/9845497/09845619.pdf?arnumber=9845619

المؤلفون: Arunachalam, Ayush, Kundu, Shamik, Raha, Arnab, Banerjee, Suvadeep, Natarajan, Suriyaprakash, Basu, Kanad

المصدر: 2021 22nd International Symposium on Quality Electronic Design (ISQED)

الاتاحة: http://dx.doi.org/10.1109/isqed51717.2021.9424301
http://xplorestaging.ieee.org/ielx7/9424228/9424248/09424301.pdf?arnumber=9424301

المؤلفون: Solomon, Latasha, Schwartz, Peter J., Mishra, Vinod K., Basu, Kanad, Arunachalam, Ayush

المصدر: Proceedings of SPIE; June 2023, Vol. 12538 Issue: 1 p125381C-125381C-10, 12412730p

المؤلفون: Arunachalam, Ayush, Berriel, S. Novia, Feit, Corbin, Kumar, Udit, Seal, Sudipta, Basu, Kanad, Banerjee, Parag

المصدر: Journal of Vacuum Science & Technology: Part A-Vacuums, Surfaces & Films; Jan2022, Vol. 40 Issue 1, p1-10, 10p

مصطلحات موضوعية: ATOMIC layer deposition, MACHINE learning, ELLIPSOMETRY, K-nearest neighbor classification, RANDOM forest algorithms, SUPPORT vector machines, NAIVE Bayes classification

المؤلفون: Kumar, Udit, Feit, Corbin, Berriel, S. Novia, Arunachalam, Ayush, Sakthivel, Tamil Selvan, Basu, Kanad, Banerjee, Parag, Seal, Sudipta

المصدر: Journal of Vacuum Science & Technology: Part A-Vacuums, Surfaces & Films; Nov2021, Vol. 39 Issue 6, p1-6, 6p

مصطلحات موضوعية: CERIUM oxides, ATOMIC layer deposition, ELLIPSOMETRY, NANOFILMS, X-ray photoelectron spectroscopy, ATOMIC force microscopy

المؤلفون: Arunachalam, Ayush

المساهمون: Daescu, Ovidiu, Basu, Kanad, Banerjee, Parag, Prasad, Shalini, Hansen, John H.L., Tamil, Lakshman

مصطلحات موضوعية: Engineering, Electronics and Electrical

وصف الملف: application/pdf

Relation: https://hdl.handle.net/10735.1/9993

الاتاحة: https://hdl.handle.net/10735.1/9993