المؤلفون: Dimitrios N. Kouvatsos, N. A. Hastas, Christoforos G. Theodorou, A. Tsormpatzoglou, Charalabos A. Dimitriadis, Apostolos T. Voutsas, Despina Moschou

المصدر: Journal of Display Technology. 9:747-754

مصطلحات موضوعية: Materials science, Condensed matter physics, business.industry, Infrasound, Transistor, Electrical engineering, Spectral density, Condensed Matter Physics, Noise (electronics), Electronic, Optical and Magnetic Materials, law.invention, Thin-film transistor, law, Logic gate, Grain boundary, Electrical and Electronic Engineering, business, Scaling

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::069ac0ed5de109ad5d12124e0e8277a0
https://doi.org/10.1109/jdt.2012.2231049

المؤلفون: Dimitrios N. Kouvatsos, Giannis P. Kontogiannopoulos, Despina Moschou, Filippos Farmakis, Apostolos T. Voutsas

المصدر: Facta universitatis - series: Electronics and Energetics. 26:247-280

مصطلحات موضوعية: Materials science, Fabrication, business.industry, Transistor, Low-temperature polycrystalline silicon, engineering.material, Microstructure, law.invention, Polycrystalline silicon, Thin-film transistor, law, Electronic engineering, engineering, General Earth and Planetary Sciences, Optoelectronics, Degradation (geology), Electronics, business, General Environmental Science

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::e9c3a44f9f39cbc5b09b0ae910a94c68
https://doi.org/10.2298/fuee1303247m

المؤلفون: Matroni Koutsoureli, Dimitrios N. Kouvatsos, Apostolos T. Voutsas, Loukas Michalas, George J. Papaioannou

المصدر: Microelectronic Engineering. 90:72-75

مصطلحات موضوعية: Work (thermodynamics), Materials science, Passivation, Hydrogen, business.industry, Band gap, Field effect, chemistry.chemical_element, Condensed Matter Physics, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, chemistry, Thin-film transistor, Density of states, Optoelectronics, Electrical and Electronic Engineering, business, Voltage

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::7a055c64a56fc488a7a38ca8439c9aa8
https://doi.org/10.1016/j.mee.2011.04.039

المؤلفون: Apostolos T. Voutsas, George J. Papaioannou, Loukas Michalas

المصدر: Microelectronics Reliability. 50:1848-1851

مصطلحات موضوعية: Materials science, Silicon, Condensed matter physics, Band gap, chemistry.chemical_element, engineering.material, Condensed Matter Physics, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, Threshold voltage, Polycrystalline silicon, chemistry, Thin-film transistor, engineering, Radiation damage, Electronic engineering, Grain boundary, Irradiation, Electrical and Electronic Engineering, Safety, Risk, Reliability and Quality

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::0cb42546d571f3dfafb7c1703f505d0d
https://doi.org/10.1016/j.microrel.2010.07.090

المؤلفون: George J. Papaioannou, Apostolos T. Voutsas, Giannis P. Kontogiannopoulos, Dimitrios N. Kouvatsos, Filippos Farmakis

المصدر: IEEE Transactions on Electron Devices. 57:1390-1398

مصطلحات موضوعية: Materials science, business.industry, Transistor, engineering.material, Electronic, Optical and Magnetic Materials, law.invention, Threshold voltage, Stress (mechanics), Polycrystalline silicon, Thin-film transistor, law, Logic gate, Electronic engineering, engineering, Degradation (geology), Optoelectronics, Electrical and Electronic Engineering, business, Communication channel

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::8c692f86eb091848fd28bba618de6611
https://doi.org/10.1109/ted.2010.2046107

المؤلفون: Despina Moschou, Giannis P. Kontogiannopoulos, Apostolos T. Voutsas, Dimitrios N. Kouvatsos

المصدر: Microelectronics Reliability. 50:190-194

مصطلحات موضوعية: Work (thermodynamics), Materials science, Condensed matter physics, business.industry, Transconductance, Electrical engineering, Extrapolation, Condensed Matter Physics, Gate voltage, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, Threshold voltage, Stress (mechanics), Thin-film transistor, Degradation (geology), Electrical and Electronic Engineering, Safety, Risk, Reliability and Quality, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::58d0560ea6eef1f0e77fab3322129c5d
https://doi.org/10.1016/j.microrel.2009.10.014

المؤلفون: Despina Moschou, Dimitrios N. Kouvatsos, Apostolos T. Voutsas, George J. Papaioannou, M. A. Exarchos, A. Arapoyanni

المصدر: Thin Solid Films. 517:6375-6378

مصطلحات موضوعية: Materials science, business.industry, Transconductance, Metals and Alloys, Surfaces and Interfaces, Trapping, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, Threshold voltage, law.invention, P channel, Thin-film transistor, Gate oxide, law, Materials Chemistry, Optoelectronics, Degradation (geology), Crystallization, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::f1a73a58b5174dd2861c1f937611fcbc
https://doi.org/10.1016/j.tsf.2009.02.052

المؤلفون: George J. Papaioannou, Dimitrios N. Kouvatsos, Despina Moschou, M. A. Exarchos, Apostolos T. Voutsas

المصدر: physica status solidi c. 5:3634-3637

مصطلحات موضوعية: Deep-level transient spectroscopy, Materials science, business.industry, Transconductance, Gate dielectric, Transistor, Condensed Matter Physics, law.invention, Crystal, law, Thin-film transistor, Optoelectronics, Crystallization, business, Polarization (electrochemistry)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::6ed90a1af114a667b4e84f254fa633cb
https://doi.org/10.1002/pssc.200780122

المؤلفون: Despina Moschou, Giannis P. Kontogiannopoulos, Apostolos T. Voutsas, Dimitrios N. Kouvatsos

المصدر: physica status solidi c. 5:3630-3633

مصطلحات موضوعية: Fabrication, Materials science, business.industry, Polysilicon depletion effect, Chemical vapor deposition, Condensed Matter Physics, law.invention, Gate oxide, Thin-film transistor, Plasma-enhanced chemical vapor deposition, law, Optoelectronics, Crystallization, business, AND gate

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::3d75455608bfde9d67bf3f8c34248024
https://doi.org/10.1002/pssc.200780146

المؤلفون: Loukas Michalas, George J. Papaioannou, Apostolos T. Voutsas, Dimitrios N. Kouvatsos

المصدر: physica status solidi c. 5:3613-3616

مصطلحات موضوعية: Work (thermodynamics), Polycrystalline silicon, Condensed matter physics, Thin-film transistor, Band gap, Chemistry, engineering, Overshoot (microwave communication), Density of states, Transient (oscillation), engineering.material, Condensed Matter Physics, Characterization (materials science)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::49a31c3a80eaf6126c105100881ddfc5
https://doi.org/10.1002/pssc.200780166

المؤلفون: Loukas Michalas, Apostolos T. Voutsas, George J. Papaioannou

المصدر: ECS Transactions. 16:79-84

مصطلحات موضوعية: Materials science, business.industry, Band gap, Optoelectronics, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::04ef7df6cd61ddd959097fca4fa1a914
https://doi.org/10.1149/1.2980534

المؤلفون: Despina Moschou, M. A. Exarchos, Dimitrios N. Kouvatsos, Apostolos T. Voutsas, George J. Papaioannou, A. Arapoyanni

المصدر: Microelectronics Reliability. 48:1544-1548

مصطلحات موضوعية: Novel technique, Materials science, business.industry, Condensed Matter Physics, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, law.invention, Reliability (semiconductor), P channel, Thin-film transistor, law, Electronic engineering, N channel, Optoelectronics, Degradation (geology), Electrical and Electronic Engineering, Crystallization, Safety, Risk, Reliability and Quality, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::08a7dbc280afe59999ec60d974bfebc8
https://doi.org/10.1016/j.microrel.2008.06.006

المؤلفون: M. A. Exarchos, Despina Moschou, Apostolos T. Voutsas, Dimitrios N. Kouvatsos, George J. Papaioannou

المصدر: Microelectronic Engineering. 85:1447-1452

مصطلحات موضوعية: Materials science, business.industry, Condensed Matter Physics, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, law.invention, Stress (mechanics), Reliability (semiconductor), Thin-film transistor, law, Forensic engineering, Optoelectronics, Electrical and Electronic Engineering, Crystallization, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::fa59fdc17223b95564b5c3319c4cb910
https://doi.org/10.1016/j.mee.2008.01.083

المؤلفون: Dimitrios N. Kouvatsos, George J. Papaioannou, Apostolos T. Voutsas, Giannis P. Kontogiannopoulos, Filippos Farmakis

المصدر: Solid-State Electronics. 52:388-393

مصطلحات موضوعية: Materials science, Silicon, business.industry, Transconductance, Electrical engineering, chemistry.chemical_element, Condensed Matter Physics, Subthreshold slope, Electronic, Optical and Magnetic Materials, Threshold voltage, chemistry, Thin-film transistor, Orientation (geometry), Materials Chemistry, Optoelectronics, Degradation (geology), Grain boundary, Electrical and Electronic Engineering, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::8534c667350a283ce41e211020414fd0
https://doi.org/10.1016/j.sse.2007.10.008

المؤلفون: Loukas Michalas, Dimitrios N. Kouvatsos, George J. Papaioannou, Apostolos T. Voutsas

المصدر: Solid-State Electronics. 52:394-399

مصطلحات موضوعية: Materials science, Silicon, Condensed matter physics, Band gap, business.industry, Electrical engineering, Time constant, chemistry.chemical_element, Trapping, Electron, Atmospheric temperature range, engineering.material, Condensed Matter Physics, Electronic, Optical and Magnetic Materials, Polycrystalline silicon, chemistry, Thin-film transistor, Materials Chemistry, engineering, Electrical and Electronic Engineering, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::1ae316d6a7a046a5273a920f6e2b506f
https://doi.org/10.1016/j.sse.2007.10.018

المؤلفون: Loukas Michalas, George J. Papaioannou, Apostolos T. Voutsas, Dimitrios N. Kouvatsos, M. A. Exarchos

المصدر: Microelectronics Reliability. 47:2058-2064

مصطلحات موضوعية: Materials science, business.industry, Electrical engineering, engineering.material, Condensed Matter Physics, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, law.invention, Polycrystalline silicon, law, Thin-film transistor, Overshoot (microwave communication), engineering, Optoelectronics, Crystallite, Transient response, Transient (oscillation), Electrical and Electronic Engineering, Crystallization, Safety, Risk, Reliability and Quality, Material properties, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::e8c3661c344533e85a34583827db724f
https://doi.org/10.1016/j.microrel.2006.11.016

المؤلفون: Filippos Farmakis, Giannis P. Kontogiannopoulos, Dimitrios N. Kouvatsos, Apostolos T. Voutsas

المصدر: Microelectronics Reliability. 47:1434-1438

مصطلحات موضوعية: Materials science, business.industry, Electrical engineering, engineering.material, Condensed Matter Physics, Hot carrier stress, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, Stress (mechanics), Polycrystalline silicon, Thin-film transistor, engineering, Degradation (geology), Optoelectronics, Electrical performance, Double gate, Electrical and Electronic Engineering, Safety, Risk, Reliability and Quality, business, Voltage

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::d0d2912cdab1d3f0665992214da05d6e
https://doi.org/10.1016/j.microrel.2007.07.030

المؤلفون: Despina Moschou, Dimitrios N. Kouvatsos, George J. Papaioannou, Apostolos T. Voutsas, M. A. Exarchos

المصدر: Microelectronics Reliability. 47:1378-1383

مصطلحات موضوعية: Materials science, business.industry, Condensed Matter Physics, Microstructure, Polarization (waves), Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, law.invention, law, Gate oxide, Thin-film transistor, Trap density, Electronic engineering, Optoelectronics, Grain boundary, Electrical and Electronic Engineering, Crystallization, Safety, Risk, Reliability and Quality, business, Drain current

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::94671880cf3bcd3529e1f04bf5fb5449
https://doi.org/10.1016/j.microrel.2007.07.073

المؤلفون: Ninoslav Stojadinovic, Dimitrios N. Kouvatsos, Apostolos T. Voutsas, Vojkan Davidovic

المصدر: Microelectronics Reliability. 47:1841-1845

مصطلحات موضوعية: Materials science, medicine.medical_treatment, Polysilicon depletion effect, Oxide, engineering.material, law.invention, chemistry.chemical_compound, Optics, law, medicine, Irradiation, Electrical and Electronic Engineering, Safety, Risk, Reliability and Quality, Excimer laser, business.industry, Transistor, Condensed Matter Physics, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, Polycrystalline silicon, chemistry, Thin-film transistor, engineering, Optoelectronics, Grain boundary, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::259bb65ecb5b0c3e827c408285cf54e7
https://doi.org/10.1016/j.microrel.2007.07.025

المؤلفون: John W. Hartzell, Pooran Chandra Joshi, Apostolos T. Voutsas

المصدر: Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films. 25:1161-1165

مصطلحات موضوعية: Materials science, business.industry, Gate dielectric, Surfaces and Interfaces, Substrate (electronics), Dielectric, Condensed Matter Physics, Flexible electronics, Surfaces, Coatings and Films, law.invention, Capacitor, Thin-film transistor, law, Optoelectronics, Field-effect transistor, Thin film, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::8d24f625b41dcb1bc39acf70d60b5fa2
https://doi.org/10.1116/1.2723765