المؤلفون: Bartosz Pruchnik, Krzysztof Kwoka, Ewelina Gacka, Dominik Badura, Piotr Kunicki, Andrzej Sierakowski, Paweł Janus, Tomasz Piasecki, Teodor Gotszalk

المصدر: Beilstein Journal of Nanotechnology, Vol 15, Iss 1, Pp 1273-1282 (2024)

مصطلحات موضوعية: febid, mems, mems bridge, nanowires, opmems, Technology, Chemical technology, TP1-1185, Science, Physics, QC1-999

وصف الملف: electronic resource

Relation: https://doaj.org/toc/2190-4286

URL الوصول: https://doaj.org/article/363290fd39664ea693adb047698c3626

المؤلفون: Maciej Wiesner, Jan Barciszewski, Agnieszka Belter, Andrzej Sierakowski, Adrian Drzazga, Marcin K. Chmielewski

المصدر: Scientific Reports, Vol 14, Iss 1, Pp 1-9 (2024)

مصطلحات موضوعية: DNA, Hole transport, Electron transport, Molecular junction, Tunneling, Emission, Medicine, Science

وصف الملف: electronic resource

Relation: https://doaj.org/toc/2045-2322

URL الوصول: https://doaj.org/article/b6d746e9a44d424eb4fd37d01c0f7223

المؤلفون: Bartosz Pruchnik, Karolina Orłowska, Bartosz Świadkowski, Ewelina Gacka, Andrzej Sierakowski, Paweł Janus, Teodor Gotszalk

المصدر: Scientific Reports, Vol 13, Iss 1, Pp 1-9 (2023)

مصطلحات موضوعية: Medicine, Science

وصف الملف: electronic resource

Relation: https://doaj.org/toc/2045-2322

URL الوصول: https://doaj.org/article/7a3cf20712664fd7882082ffbab250a5

المؤلفون: Daniel Kopiec, Wojciech Majstrzyk, Bartosz Pruchnik, Ewelina Gacka, Dominik Badura, Andrzej Sierakowski, Paweł Janus, Teodor Gotszalk

المصدر: Metrology and Measurement Systems, Vol vol. 28, Iss No 4, Pp 627-642 (2021)

مصطلحات موضوعية: optical beam deflection, thermomechanical noise, low frequency noise, electromagnetically actuated cantilever, lorentz force, Technology

وصف الملف: electronic resource

Relation: https://journals.pan.pl/Content/121797/PDF/art02_final.pdf; https://doaj.org/toc/2300-1941

URL الوصول: https://doaj.org/article/e8167a1e33684326bb9975c29c63622e

المؤلفون: Wojciech Majstrzyk, Karolina Orlowska, Andrzej Sierakowski, Rafał Dobrowolski, Teodor Gotszalk

المصدر: Proceedings, Vol 2, Iss 13, p 915 (2018)

مصطلحات موضوعية: Lorentz force, electromagnetic actuation, adhesion forces, cantilever sensor, active cantilever, General Works

وصف الملف: electronic resource

Relation: https://www.mdpi.com/2504-3900/2/13/915; https://doaj.org/toc/2504-3900

URL الوصول: https://doaj.org/article/cbbf576eb7b242fe9e493315100868c9

المؤلفون: Karolina Orłowska, Wojciech Majstrzyk, Andrzej Sierakowski, Tomasz Piasecki, Teodor Gotszalk

المصدر: Proceedings, Vol 2, Iss 13, p 921 (2018)

مصطلحات موضوعية: photon-force MEMS, mechanical impedance, dumped harmonic oscillator, General Works

وصف الملف: electronic resource

Relation: https://www.mdpi.com/2504-3900/2/13/921; https://doaj.org/toc/2504-3900

URL الوصول: https://doaj.org/article/504a2c32f35b49bfaf135d04b3db9ade

المؤلفون: Paolo Di Barba, Teodor Gotszalk, Wojciech Majstrzyk, Maria Evelina Mognaschi, Karolina Orłowska, Sławomir Wiak, Andrzej Sierakowski

المصدر: Sensors, Vol 18, Iss 8, p 2533 (2018)

مصطلحات موضوعية: electromagnetically actuated cantilevers, nanometrology, multiobjective optimization, active cantilevers, SOI-based prototyping, Chemical technology, TP1-1185

وصف الملف: electronic resource

Relation: http://www.mdpi.com/1424-8220/18/8/2533; https://doaj.org/toc/1424-8220

URL الوصول: https://doaj.org/article/0a25170b8d554ea4a6b95010c1de228b

المؤلفون: Krzysztof Kwoka, Tomasz Piasecki, Karolina Orłowska, Paulina Grabarczyk, Andrzej Sierakowski, Teodor Gotszalk, Ewelina Gacka, Adrianna Piejko, Krzysztof Gajewski

المصدر: Measurement. 215:112845

مصطلحات موضوعية: Applied Mathematics, Electrical and Electronic Engineering, Condensed Matter Physics, Instrumentation

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::c1b6c879a58242e2bc0f205b5949365e
https://doi.org/10.1016/j.measurement.2023.112845

المؤلفون: Piotr Niedzielski, W. Kaczorowski, Sami Ramadan, Krzysztof Gajewski, Norbert Klein, Andrzej Sierakowski, Ling Hao, Olena Shaforost, Witold Szymanski, Teodor Gotszalk, Piotr Kunicki

المصدر: Microelectronic Engineering. 212:1-8

مصطلحات موضوعية: 010302 applied physics, Kelvin probe force microscope, Materials science, Annealing (metallurgy), Graphene, Metallurgy, 02 engineering and technology, 021001 nanoscience & nanotechnology, Condensed Matter Physics, 01 natural sciences, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, law.invention, symbols.namesake, Electrical resistivity and conductivity, law, 0103 physical sciences, Microscopy, Potential gradient, symbols, Electrical and Electronic Engineering, 0210 nano-technology, Raman spectroscopy, Quantum tunnelling

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::3d3349c1e178f4c98297ec700623e8ff
https://doi.org/10.1016/j.mee.2019.03.023

المؤلفون: Andrzej Sierakowski, B Świadkowski, Piotr Kunicki, Wojciech Majstrzyk, Teodor Gotszalk

المصدر: Nanotechnology. 31(42)

مصطلحات موضوعية: Cantilever, Materials science, Bioengineering, 02 engineering and technology, 010402 general chemistry, 01 natural sciences, Contact force, symbols.namesake, Optics, Deflection (engineering), General Materials Science, Electrical and Electronic Engineering, business.industry, Mechanical Engineering, General Chemistry, 021001 nanoscience & nanotechnology, 0104 chemical sciences, Magnetic field, Mechanics of Materials, symbols, Electric current, 0210 nano-technology, business, Actuator, Lorentz force, Beam (structure)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::2502fc877d546a3568b208a609ad0b4d
https://pubmed.ncbi.nlm.nih.gov/32599567

المؤلفون: Karolina Orłowska, Wojciech Majstrzyk, Daniel Tomaszewski, Piotr Kunicki, Piotr Prokaryn, Piotr Grabiec, Teodor Gotszalk, Andrzej Sierakowski, Bartosz Pruchnik

المصدر: Microelectronic Engineering. 201:10-15

مصطلحات موضوعية: Microelectromechanical systems, Cantilever, Materials science, business.industry, Photothermal effect, 02 engineering and technology, Photothermal therapy, 021001 nanoscience & nanotechnology, Condensed Matter Physics, Laser, 01 natural sciences, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, law.invention, Radiation pressure, law, 0103 physical sciences, Calibration, Optoelectronics, Electrical and Electronic Engineering, 010306 general physics, 0210 nano-technology, business, Optomechanics

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::663c60af876b0377ec8f31734a038a1b
https://doi.org/10.1016/j.mee.2018.09.003

المؤلفون: J. Radojewski, Magdalena Moczała, Teodor Gotszalk, Rafał Dobrowolski, Krzysztof Kwoka, Andrzej Sierakowski, Michał Babij, Tomasz Piasecki

المصدر: Sensors and Actuators A: Physical. 284:181-185

مصطلحات موضوعية: Wheatstone bridge, Materials science, 02 engineering and technology, 01 natural sciences, law.invention, Resonator, law, 0103 physical sciences, Electrical and Electronic Engineering, Instrumentation, 010302 applied physics, Microelectromechanical systems, business.industry, Metals and Alloys, Resonance, Dissipation, 021001 nanoscience & nanotechnology, Condensed Matter Physics, Computer Science::Other, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, Vibration, Optoelectronics, Resistor, 0210 nano-technology, business, Beam (structure)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::1b591e021fb7f11aa85c2b2af07a643d
https://doi.org/10.1016/j.sna.2018.10.028

المؤلفون: Teodor Gotszalk, G. Jóźwiak, Andrzej Sierakowski, Magdalena Moczała, Daniel Kopiec

المصدر: Ultramicroscopy. 194:100-107

مصطلحات موضوعية: Kelvin probe force microscope, Cantilever, Materials science, Channel (digital image), Image quality, business.industry, Resolution (electron density), 02 engineering and technology, Microscopy, Atomic Force, 010402 general chemistry, 021001 nanoscience & nanotechnology, 01 natural sciences, Atomic and Molecular Physics, and Optics, 0104 chemical sciences, Electronic, Optical and Magnetic Materials, Quality (physics), Optics, Electricity, Evaluation Studies as Topic, Microscopy, 0210 nano-technology, business, Instrumentation, Volta potential, Algorithms

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::b16239cfe9375e0dda573a204569a646
https://doi.org/10.1016/j.ultramic.2018.08.002

المؤلفون: Maria Evelina Mognaschi, Andrzej Sierakowski, Rafał Dobrowolski, Piotr Grabiec, Teodor Gotszalk, P. Di Barba, Wojciech Majstrzyk, Karolina Orłowska

المصدر: Sensors and Actuators A: Physical. 282:149-156

مصطلحات موضوعية: Electromagnetic field, Scanner, Cantilever, Computer science, Acoustics, Detector, Astrophysics::Instrumentation and Methods for Astrophysics, Metals and Alloys, 02 engineering and technology, 021001 nanoscience & nanotechnology, Condensed Matter Physics, 01 natural sciences, Finite element method, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, 010309 optics, Deflection (engineering), 0103 physical sciences, Calibration, Fluidics, Electrical and Electronic Engineering, 0210 nano-technology, Instrumentation

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::737d65c3a07fd66f8233e7482fe57f36
https://doi.org/10.1016/j.sna.2018.09.016

المؤلفون: Andrzej Sierakowski, Bartosz Michał Świadkowski, Karolina Anna Orłowska, Teodor Gotszalk

المصدر: Measurement Science and Technology. 33:027001

مصطلحات موضوعية: Microelectromechanical systems, Materials science, Photon, Cantilever, Optic system, business.industry, Applied Mathematics, Optoelectronics, business, Instrumentation, Engineering (miscellaneous)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::eacc48e303918202c9a1eaddfbda212b
https://doi.org/10.1088/1361-6501/ac3678

المؤلفون: Teodor Gotszalk, Wojciech Majstrzyk, Piotr Grabiec, Andrzej Sierakowski, Maciej Rudek, Pawe Janus

المصدر: Microelectronic Engineering. 174:70-73

مصطلحات موضوعية: Materials science, Cantilever, Microscope, Silicon, chemistry.chemical_element, Nanotechnology, 02 engineering and technology, Scanning thermal microscopy, 01 natural sciences, law.invention, 010309 optics, law, 0103 physical sciences, Electrical and Electronic Engineering, Microelectromechanical systems, business.industry, Dissipation, 021001 nanoscience & nanotechnology, Condensed Matter Physics, Piezoresistive effect, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, chemistry, Heat transfer, Optoelectronics, 0210 nano-technology, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::2a92a82454e07731e5276df73fd336ef
https://doi.org/10.1016/j.mee.2017.02.010

المؤلفون: Magdalena, Tamulewicz, Joanna, Kutrowska-Girzycka, Krzysztof, Gajewski, Jarosław, Serafińczuk, Andrzej, Sierakowski, Joanna, Jadczak, Leszek, Bryja, Teodor P, Gotszalk

المصدر: Nanotechnology. 30(24)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=pmid________::464725c066f9fefee5cfd18cddbd6a33
https://pubmed.ncbi.nlm.nih.gov/30836333

المؤلفون: Michał Babij, Teodor Gotszalk, Andrzej Sierakowski, Andrew Yacoot, Wojciech Majstrzyk, Piotr Grabiec, Z Ramotowski, Paweł Janus

المصدر: Measurement Science and Technology. 32:065903

مصطلحات موضوعية: Microelectromechanical systems, Cantilever, Materials science, Microscope, Wheatstone bridge, business.industry, Applied Mathematics, Simple harmonic motion, Computer Science::Other, law.invention, symbols.namesake, Scanning probe microscopy, Nanometrology, law, symbols, Optoelectronics, business, Instrumentation, Engineering (miscellaneous), Lorentz force

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::476593d414a07871d325ca1d8993f9c2
https://doi.org/10.1088/1361-6501/abc28a

المؤلفون: Piotr Grabiec, Andrzej Sierakowski, Magdalena Moczała, R. Dobrowolski, Wojciech Majstrzyk, Teodor Gotszalk

المصدر: Micron. 84:1-6

مصطلحات موضوعية: Materials science, General Physics and Astronomy, Nanotechnology, 02 engineering and technology, 01 natural sciences, symbols.namesake, chemistry.chemical_compound, Structural Biology, Deflection (engineering), 0103 physical sciences, Thermal, General Materials Science, Thin film, 010302 applied physics, Microelectromechanical systems, business.industry, Atomic force microscopy, Cell Biology, 021001 nanoscience & nanotechnology, Computer Science::Other, Metrology, Silicon nitride, chemistry, symbols, Optoelectronics, 0210 nano-technology, business, Lorentz force

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::87e4314cdefa354ef0b9e278c035a4c2
https://doi.org/10.1016/j.micron.2016.02.008

المؤلفون: Andrzej Sierakowski, Wojciech Majstrzyk, Teodor Gotszalk, Magdalena Moczała, Michał Babij, Rafał Dobrowolski, Piotr Grabiec, Paweł Janus

المصدر: Sensors and Actuators A: Physical. 240:17-22

مصطلحات موضوعية: 010302 applied physics, Microelectromechanical systems, Materials science, Electromotive force, business.industry, Metals and Alloys, Electrical engineering, Resonance, 02 engineering and technology, 021001 nanoscience & nanotechnology, Condensed Matter Physics, 01 natural sciences, Signal, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, Magnetic field, Vibration, Frequency domain, 0103 physical sciences, Optoelectronics, Electrical and Electronic Engineering, 0210 nano-technology, business, Joule heating, Instrumentation

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::45f6226715d415be9f07f61bbdef5495
https://doi.org/10.1016/j.sna.2016.01.041