المؤلفون: Daniel Stanley, Can Wang, Sung-Jin Kim, Steven Herbst, Jaeha Kim, Mark Horowitz

المصدر: IEEE Open Journal of the Solid-State Circuits Society, Vol 1, Pp 184-195 (2021)

مصطلحات موضوعية: Analog validation, behavioral modeling, event-driven simulation, equivalence checking, linear abstraction, mixed-signal circuits, Electric apparatus and materials. Electric circuits. Electric networks, TK452-454.4

وصف الملف: electronic resource

Relation: https://ieeexplore.ieee.org/document/9585345/; https://doaj.org/toc/2644-1349

URL الوصول: https://doaj.org/article/f4faf073039c460e8f4e478a8123e423